
Liliana P. Cerullo
Examiner (ID: 2762, Phone: (571)270-5882 , Office: P/2621 )
| Most Active Art Unit | 2621 |
| Art Unit(s) | 2629, 4163, 2621, 2691 |
| Total Applications | 1062 |
| Issued Applications | 759 |
| Pending Applications | 73 |
| Abandoned Applications | 253 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 19755534
[patent_doc_number] => 20250044099
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-02-06
[patent_title] => INERTIAL SENSOR
[patent_app_type] => utility
[patent_app_number] => 18/758008
[patent_app_country] => US
[patent_app_date] => 2024-06-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12967
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -2
[patent_words_short_claim] => 332
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18758008
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/758008 | INERTIAL SENSOR | Jun 27, 2024 | Pending |
Array
(
[id] => 19755534
[patent_doc_number] => 20250044099
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-02-06
[patent_title] => INERTIAL SENSOR
[patent_app_type] => utility
[patent_app_number] => 18/758008
[patent_app_country] => US
[patent_app_date] => 2024-06-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12967
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -2
[patent_words_short_claim] => 332
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18758008
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/758008 | INERTIAL SENSOR | Jun 27, 2024 | Pending |
Array
(
[id] => 19659636
[patent_doc_number] => 20240426701
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-12-26
[patent_title] => Collimated Phase Measuring Deflectometry
[patent_app_type] => utility
[patent_app_number] => 18/752616
[patent_app_country] => US
[patent_app_date] => 2024-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5513
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18752616
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/752616 | Collimated Phase Measuring Deflectometry | Jun 23, 2024 | Pending |
Array
(
[id] => 19659636
[patent_doc_number] => 20240426701
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-12-26
[patent_title] => Collimated Phase Measuring Deflectometry
[patent_app_type] => utility
[patent_app_number] => 18/752616
[patent_app_country] => US
[patent_app_date] => 2024-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5513
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18752616
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/752616 | Collimated Phase Measuring Deflectometry | Jun 23, 2024 | Pending |
Array
(
[id] => 19465440
[patent_doc_number] => 20240319110
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-26
[patent_title] => OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY DEVICE AND OPTICAL INSPECTION METHOD USING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/732934
[patent_app_country] => US
[patent_app_date] => 2024-06-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10317
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 121
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18732934
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/732934 | Optical inspection device for optical performance test of display device and optical inspection method using the same | Jun 3, 2024 | Issued |
Array
(
[id] => 20394276
[patent_doc_number] => 20250369751
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-12-04
[patent_title] => WHITE LIGHT INTERFEROMETER FOR MEASURING RADIAL GROWTH IN COMPONENTS EXPERIENCING ROTATING STRESSES
[patent_app_type] => utility
[patent_app_number] => 18/680816
[patent_app_country] => US
[patent_app_date] => 2024-05-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 133
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18680816
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/680816 | WHITE LIGHT INTERFEROMETER FOR MEASURING RADIAL GROWTH IN COMPONENTS EXPERIENCING ROTATING STRESSES | May 30, 2024 | Pending |
Array
(
[id] => 20214769
[patent_doc_number] => 12411420
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-09
[patent_title] => Small in-die target design for overlay measurement
[patent_app_type] => utility
[patent_app_number] => 18/673905
[patent_app_country] => US
[patent_app_date] => 2024-05-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 13
[patent_no_of_words] => 4009
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 325
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18673905
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/673905 | Small in-die target design for overlay measurement | May 23, 2024 | Issued |
Array
(
[id] => 20227917
[patent_doc_number] => 12416565
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-16
[patent_title] => Methods and systems for characterizing spillover spreading in flow cytometer data
[patent_app_type] => utility
[patent_app_number] => 18/641020
[patent_app_country] => US
[patent_app_date] => 2024-04-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 16
[patent_no_of_words] => 16967
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 201
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18641020
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/641020 | Methods and systems for characterizing spillover spreading in flow cytometer data | Apr 18, 2024 | Issued |
Array
(
[id] => 20248986
[patent_doc_number] => 20250297855
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-09-25
[patent_title] => SYSTEM AND METHOD FOR DEVICE-LIKE OVERLAY TARGETS MEASUREMENT
[patent_app_type] => utility
[patent_app_number] => 18/612383
[patent_app_country] => US
[patent_app_date] => 2024-03-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4359
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18612383
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/612383 | SYSTEM AND METHOD FOR DEVICE-LIKE OVERLAY TARGETS MEASUREMENT | Mar 20, 2024 | Pending |
Array
(
[id] => 20316615
[patent_doc_number] => 12455160
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-10-28
[patent_title] => Package structure and measurement method for the package structure
[patent_app_type] => utility
[patent_app_number] => 18/608956
[patent_app_country] => US
[patent_app_date] => 2024-03-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 41
[patent_no_of_words] => 3207
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18608956
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/608956 | Package structure and measurement method for the package structure | Mar 18, 2024 | Issued |
Array
(
[id] => 20086404
[patent_doc_number] => 20250216340
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-03
[patent_title] => METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE
[patent_app_type] => utility
[patent_app_number] => 18/604508
[patent_app_country] => US
[patent_app_date] => 2024-03-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 1147
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 156
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18604508
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/604508 | METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE | Mar 13, 2024 | Pending |
Array
(
[id] => 19911262
[patent_doc_number] => 12287470
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-04-29
[patent_title] => Dark field microscope
[patent_app_type] => utility
[patent_app_number] => 18/441710
[patent_app_country] => US
[patent_app_date] => 2024-02-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 18
[patent_no_of_words] => 4863
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18441710
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/441710 | Dark field microscope | Feb 13, 2024 | Issued |
Array
(
[id] => 20387808
[patent_doc_number] => 12487533
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-12-02
[patent_title] => Amplitude asymmetry measurements in overlay metrology
[patent_app_type] => utility
[patent_app_number] => 18/422668
[patent_app_country] => US
[patent_app_date] => 2024-01-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 27
[patent_figures_cnt] => 27
[patent_no_of_words] => 10217
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 173
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18422668
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/422668 | Amplitude asymmetry measurements in overlay metrology | Jan 24, 2024 | Issued |
Array
(
[id] => 19521991
[patent_doc_number] => 12123705
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-10-22
[patent_title] => Combiner alignment detector
[patent_app_type] => utility
[patent_app_number] => 18/421517
[patent_app_country] => US
[patent_app_date] => 2024-01-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5479
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 223
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18421517
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/421517 | Combiner alignment detector | Jan 23, 2024 | Issued |
Array
(
[id] => 19189028
[patent_doc_number] => 20240167941
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-23
[patent_title] => POLARIZER AND ANALYZER CONFIGURATION OPTIMIZATION METHOD AND POLARIZING AND ANALYZING SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/415388
[patent_app_country] => US
[patent_app_date] => 2024-01-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 14852
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18415388
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/415388 | POLARIZER AND ANALYZER CONFIGURATION OPTIMIZATION METHOD AND POLARIZING AND ANALYZING SYSTEM | Jan 16, 2024 | Pending |
Array
(
[id] => 19319505
[patent_doc_number] => 20240241048
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-18
[patent_title] => SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER
[patent_app_type] => utility
[patent_app_number] => 18/413139
[patent_app_country] => US
[patent_app_date] => 2024-01-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 18000
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 238
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18413139
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/413139 | SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER | Jan 15, 2024 | Pending |
Array
(
[id] => 20101147
[patent_doc_number] => 20250231083
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-17
[patent_title] => MULTIPLE MAGNIFICATION INSPECTION OF DUTS
[patent_app_type] => utility
[patent_app_number] => 18/412079
[patent_app_country] => US
[patent_app_date] => 2024-01-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6752
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18412079
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/412079 | MULTIPLE MAGNIFICATION INSPECTION OF DUTS | Jan 11, 2024 | Pending |
Array
(
[id] => 19302665
[patent_doc_number] => 20240231244
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-11
[patent_title] => MEASURING DEVICE AND MEASURING METHOD
[patent_app_type] => utility
[patent_app_number] => 18/405339
[patent_app_country] => US
[patent_app_date] => 2024-01-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7350
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 186
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18405339
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/405339 | MEASURING DEVICE AND MEASURING METHOD | Jan 4, 2024 | Pending |
Array
(
[id] => 19390565
[patent_doc_number] => 20240280435
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-22
[patent_title] => OPTICAL MEASUREMENT APPARATUS
[patent_app_type] => utility
[patent_app_number] => 18/402505
[patent_app_country] => US
[patent_app_date] => 2024-01-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7368
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 66
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402505
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/402505 | OPTICAL MEASUREMENT APPARATUS | Jan 1, 2024 | Pending |
Array
(
[id] => 19101003
[patent_doc_number] => 20240120231
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-11
[patent_title] => OFFSET ALIGNMENT AND REPAIR IN MICRO DEVICE TRANSFER
[patent_app_type] => utility
[patent_app_number] => 18/390304
[patent_app_country] => US
[patent_app_date] => 2023-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2966
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 69
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18390304
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/390304 | Offset alignment and repair in micro device transfer | Dec 19, 2023 | Issued |