
Long Pham
Examiner (ID: 5269, Phone: (571)272-1714 , Office: P/2814 )
| Most Active Art Unit | 2814 |
| Art Unit(s) | 2822, 2899, 2897, 2823, 1107, 2814, 2812, 1763 |
| Total Applications | 3774 |
| Issued Applications | 3306 |
| Pending Applications | 160 |
| Abandoned Applications | 335 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1385346
[patent_doc_number] => 06548333
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-04-15
[patent_title] => 'Aluminum gallium nitride/gallium nitride high electron mobility transistors having a gate contact on a gallium nitride based cap segment'
[patent_app_type] => B2
[patent_app_number] => 09/904333
[patent_app_country] => US
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[pdf_file] => patents/06/548/06548333.pdf
[firstpage_image] =>[orig_patent_app_number] => 09904333
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/904333 | Aluminum gallium nitride/gallium nitride high electron mobility transistors having a gate contact on a gallium nitride based cap segment | Jul 11, 2001 | Issued |
Array
(
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[patent_doc_number] => 06709920
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[patent_issue_date] => 2004-03-23
[patent_title] => 'Method of fabricating a non-volatile memory device having a tunnel-insulating layer including more than two portions of different thickness'
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[patent_app_number] => 09/902243
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Array
(
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[patent_issue_date] => 2002-01-17
[patent_title] => 'Process for producing semiconductor device'
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Array
(
[id] => 6651389
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[patent_issue_date] => 2003-01-09
[patent_title] => 'Selective barrier metal fabricated for interconnect structure manufacturing process'
[patent_app_type] => new
[patent_app_number] => 09/897134
[patent_app_country] => US
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Array
(
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[patent_title] => 'Method of fabricating a SRAM device'
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Array
(
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Array
(
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Array
(
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[patent_issue_date] => 2004-11-02
[patent_title] => 'Electric fuse whose dielectric breakdown resistance is controlled by injecting impurities into an insulating film of a capacitor structure, and a method for manufacturing the same'
[patent_app_type] => B2
[patent_app_number] => 09/892713
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/892713 | Electric fuse whose dielectric breakdown resistance is controlled by injecting impurities into an insulating film of a capacitor structure, and a method for manufacturing the same | Jun 27, 2001 | Issued |
Array
(
[id] => 1393029
[patent_doc_number] => 06541286
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[patent_title] => 'Imaging of integrated circuit interconnects'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/894284 | Imaging of integrated circuit interconnects | Jun 26, 2001 | Issued |
Array
(
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Array
(
[id] => 6327221
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[patent_title] => 'Method for forming a metal oxide semiconductor type field effect transistor'
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Array
(
[id] => 6320093
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Array
(
[id] => 1358628
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[patent_title] => 'Method of forming zero marks'
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Array
(
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Array
(
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Array
(
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Array
(
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Array
(
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Array
(
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Array
(
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