Search

Ly Hua

Examiner (ID: 11788)

Most Active Art Unit
2785
Art Unit(s)
2785, 2135, 2306, 2413, 2313, 2131
Total Applications
708
Issued Applications
573
Pending Applications
66
Abandoned Applications
69

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18023552 [patent_doc_number] => 20220375051 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-24 [patent_title] => DEEP GENERATIVE MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS [patent_app_type] => utility [patent_app_number] => 17/308878 [patent_app_country] => US [patent_app_date] => 2021-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15067 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17308878 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/308878
Deep generative model-based alignment for semiconductor applications May 4, 2021 Issued
Array ( [id] => 17187684 [patent_doc_number] => 20210334569 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-28 [patent_title] => IMAGE DEPTH DETERMINING METHOD AND LIVING BODY IDENTIFICATION METHOD, CIRCUIT, DEVICE, AND MEDIUM [patent_app_type] => utility [patent_app_number] => 17/239302 [patent_app_country] => US [patent_app_date] => 2021-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11180 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 255 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17239302 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/239302
Image depth determining method and living body identification method, circuit, device, and medium Apr 22, 2021 Issued
Array ( [id] => 18493807 [patent_doc_number] => 11699228 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-11 [patent_title] => Arrangement detector for plate-shaped object and load port including same [patent_app_type] => utility [patent_app_number] => 17/239223 [patent_app_country] => US [patent_app_date] => 2021-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 9062 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17239223 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/239223
Arrangement detector for plate-shaped object and load port including same Apr 22, 2021 Issued
Array ( [id] => 17962898 [patent_doc_number] => 20220343479 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-27 [patent_title] => IMAGE PROCESSING METHOD AND SYSTEM, AND NON-TRANSITORY COMPUTER READABLE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/237642 [patent_app_country] => US [patent_app_date] => 2021-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10963 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17237642 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/237642
Image processing method and system, and non-transitory computer readable medium Apr 21, 2021 Issued
Array ( [id] => 17261943 [patent_doc_number] => 20210374928 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-12-02 [patent_title] => DEFECT DETECTION METHOD AND APPARATUS [patent_app_type] => utility [patent_app_number] => 17/232765 [patent_app_country] => US [patent_app_date] => 2021-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11818 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 262 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17232765 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/232765
Defect detection method and apparatus Apr 15, 2021 Issued
Array ( [id] => 19153277 [patent_doc_number] => 11978194 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-07 [patent_title] => Data analysis system, data analysis method, and non-transitory computer-readable medium [patent_app_type] => utility [patent_app_number] => 17/231494 [patent_app_country] => US [patent_app_date] => 2021-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 6560 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17231494 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/231494
Data analysis system, data analysis method, and non-transitory computer-readable medium Apr 14, 2021 Issued
Array ( [id] => 18472136 [patent_doc_number] => 20230206422 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => SEMICONDUCTOR INSPECTING METHOD AND SEMICONDUCTOR INSPECTING DEVICE [patent_app_type] => utility [patent_app_number] => 17/925625 [patent_app_country] => US [patent_app_date] => 2021-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12053 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17925625 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/925625
Semiconductor inspecting method and semiconductor inspecting device Mar 30, 2021 Issued
Array ( [id] => 19260384 [patent_doc_number] => 12020445 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-25 [patent_title] => Method and computing device using a neural network to localize an overlap between two thermal images respectively generated by two infrared sensors [patent_app_type] => utility [patent_app_number] => 17/217610 [patent_app_country] => US [patent_app_date] => 2021-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 12398 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 240 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17217610 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/217610
Method and computing device using a neural network to localize an overlap between two thermal images respectively generated by two infrared sensors Mar 29, 2021 Issued
Array ( [id] => 17325914 [patent_doc_number] => 11216932 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-01-04 [patent_title] => Electronic substrate defect detection [patent_app_type] => utility [patent_app_number] => 17/214491 [patent_app_country] => US [patent_app_date] => 2021-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 14 [patent_no_of_words] => 12053 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17214491 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/214491
Electronic substrate defect detection Mar 25, 2021 Issued
Array ( [id] => 17121468 [patent_doc_number] => 11132607 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2021-09-28 [patent_title] => Method for explainable active learning, to be used for object detector, by using deep encoder and active learning device using the same [patent_app_type] => utility [patent_app_number] => 17/211123 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8003 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 410 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211123 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/211123
Method for explainable active learning, to be used for object detector, by using deep encoder and active learning device using the same Mar 23, 2021 Issued
Array ( [id] => 18408401 [patent_doc_number] => 20230169754 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => INFORMATION PROCESSING DEVICE AND PROGRAM [patent_app_type] => utility [patent_app_number] => 17/920276 [patent_app_country] => US [patent_app_date] => 2021-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9330 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17920276 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/920276
Information processing device and program Mar 17, 2021 Issued
Array ( [id] => 18573661 [patent_doc_number] => 11730162 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-22 [patent_title] => Methods and systems for crop pest management utilizing geospatial images and microclimate data [patent_app_type] => utility [patent_app_number] => 17/202910 [patent_app_country] => US [patent_app_date] => 2021-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 17387 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17202910 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/202910
Methods and systems for crop pest management utilizing geospatial images and microclimate data Mar 15, 2021 Issued
Array ( [id] => 17144877 [patent_doc_number] => 20210312890 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-07 [patent_title] => ELECTRONIC DISPLAY OF SERIAL TEXT USING OPTIMAL RECOGNITION POSITIONS [patent_app_type] => utility [patent_app_number] => 17/202218 [patent_app_country] => US [patent_app_date] => 2021-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7934 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17202218 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/202218
ELECTRONIC DISPLAY OF SERIAL TEXT USING OPTIMAL RECOGNITION POSITIONS Mar 14, 2021 Abandoned
Array ( [id] => 18371304 [patent_doc_number] => 11651484 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-16 [patent_title] => Quality control of a laser machining process using machine learning [patent_app_type] => utility [patent_app_number] => 17/906801 [patent_app_country] => US [patent_app_date] => 2021-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 10876 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 40 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17906801 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/906801
Quality control of a laser machining process using machine learning Mar 2, 2021 Issued
Array ( [id] => 19260407 [patent_doc_number] => 12020468 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-25 [patent_title] => Defect inspection apparatus, method and program [patent_app_type] => utility [patent_app_number] => 17/187031 [patent_app_country] => US [patent_app_date] => 2021-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 8419 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17187031 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/187031
Defect inspection apparatus, method and program Feb 25, 2021 Issued
Array ( [id] => 17463098 [patent_doc_number] => 20220076404 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-10 [patent_title] => DEFECT MANAGEMENT APPARATUS, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/186402 [patent_app_country] => US [patent_app_date] => 2021-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11744 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17186402 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/186402
Defect management apparatus, method and non-transitory computer readable medium Feb 25, 2021 Issued
Array ( [id] => 18228032 [patent_doc_number] => 20230067026 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => AUTOMATED DATA ANALYTICS METHODS FOR NON-TABULAR DATA, AND RELATED SYSTEMS AND APPARATUS [patent_app_type] => utility [patent_app_number] => 17/800173 [patent_app_country] => US [patent_app_date] => 2021-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 36611 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17800173 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/800173
AUTOMATED DATA ANALYTICS METHODS FOR NON-TABULAR DATA, AND RELATED SYSTEMS AND APPARATUS Feb 16, 2021 Pending
Array ( [id] => 17186340 [patent_doc_number] => 20210333225 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-28 [patent_title] => INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHARGED PARTICLES [patent_app_type] => utility [patent_app_number] => 17/175173 [patent_app_country] => US [patent_app_date] => 2021-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13127 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17175173 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/175173
Inspection apparatus for inspecting semiconductor devices using charged particles Feb 11, 2021 Issued
Array ( [id] => 17992735 [patent_doc_number] => 20220358772 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-10 [patent_title] => PLANT BLOOMING PERIOD BROADCAST METHOD AND SYSTEM, AND COMPUTER-READABLE STORAGE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/629413 [patent_app_country] => US [patent_app_date] => 2021-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7710 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17629413 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/629413
Plant blooming period broadcast method and system, and computer-readable storage medium Feb 1, 2021 Issued
Array ( [id] => 16857281 [patent_doc_number] => 20210158026 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-05-27 [patent_title] => Systems and Methods for Real-Time User Verification in Online Education [patent_app_type] => utility [patent_app_number] => 17/164501 [patent_app_country] => US [patent_app_date] => 2021-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 21422 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17164501 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/164501
Systems and methods for real-time user verification in online education Jan 31, 2021 Issued
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