Mang Hang Yeung
Examiner (ID: 1315, Phone: (571)270-7319 , Office: P/2463 )
Most Active Art Unit | 2463 |
Art Unit(s) | 2416, 2463 |
Total Applications | 761 |
Issued Applications | 610 |
Pending Applications | 64 |
Abandoned Applications | 87 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 1225977
[patent_doc_number] => 06704903
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[patent_title] => 'Simplified branch metric and method'
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Array
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[patent_issue_date] => 2003-05-06
[patent_title] => 'Method and apparatus for testing a non-volatile memory array having a low number of output pins'
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Array
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[patent_issue_date] => 2003-07-22
[patent_title] => 'System and method of turbo decoding'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/507545 | System and method of turbo decoding | Feb 17, 2000 | Issued |
Array
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[patent_issue_date] => 2003-05-20
[patent_title] => 'Merged data line test circuit for classifying and testing a plurality of data lines, and test method performed by the same'
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[patent_app_number] => 09/507764
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Array
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[patent_title] => 'Data error correction apparatus'
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Array
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Array
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[patent_title] => 'Viterbi decoder and viterbi decoding method'
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Array
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[patent_issue_date] => 2003-04-15
[patent_title] => 'Built-in self test for content addressable memory'
[patent_app_type] => B1
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Array
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[patent_title] => 'Method for adding scan controllability and observability to domino CMOS with low area and delay overhead'
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[patent_app_number] => 09/505383
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Array
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[patent_issue_date] => 2003-04-15
[patent_title] => 'Method and apparatus for exercising external memory with a memory built-in test'
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[patent_app_number] => 09/504907
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Array
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[patent_title] => 'Method and apparatus for holding failing information of a memory built-in self-test'
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Array
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[patent_title] => 'Method of encoding a signal'
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Array
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Array
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Array
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Array
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