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Marcus E Windrich

Examiner (ID: 3380, Phone: (571)272-6417 , Office: P/3646 )

Most Active Art Unit
3646
Art Unit(s)
3619, 3646
Total Applications
816
Issued Applications
604
Pending Applications
68
Abandoned Applications
144

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 15874065 [patent_doc_number] => 20200144436 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-05-07 [patent_title] => SINGLE-PHOTON AVALANCHE DIODE AND METHOD FOR OPERATING A SINGLE-PHOTON AVALANCHE DIODE [patent_app_type] => utility [patent_app_number] => 16/625200 [patent_app_country] => US [patent_app_date] => 2018-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12558 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -32 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16625200 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/625200
SINGLE-PHOTON AVALANCHE DIODE AND METHOD FOR OPERATING A SINGLE-PHOTON AVALANCHE DIODE Jun 25, 2018 Pending
Array ( [id] => 18371772 [patent_doc_number] => 11651954 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-16 [patent_title] => Method for porosifying a material and semiconductor structure [patent_app_type] => utility [patent_app_number] => 16/651055 [patent_app_country] => US [patent_app_date] => 2017-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 20 [patent_no_of_words] => 12017 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16651055 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/651055
Method for porosifying a material and semiconductor structure Sep 26, 2017 Issued
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