Search

Marcus Smith

Examiner (ID: 7124, Phone: (571)270-1096 , Office: P/2467 )

Most Active Art Unit
2467
Art Unit(s)
2616, 2468, 2419, 2467, 2619
Total Applications
664
Issued Applications
499
Pending Applications
20
Abandoned Applications
148

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6504923 [patent_doc_number] => 20100010779 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-01-14 [patent_title] => 'Electromagnetic Coupling Device fo an Electromagnetic Radiation Detector' [patent_app_type] => utility [patent_app_number] => 12/443984 [patent_app_country] => US [patent_app_date] => 2007-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2366 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0010/20100010779.pdf [firstpage_image] =>[orig_patent_app_number] => 12443984 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/443984
Electromagnetic coupling device of an electromagnetic radiation detector Oct 9, 2007 Issued
Array ( [id] => 7965795 [patent_doc_number] => 07939399 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-10 [patent_title] => 'Semiconductor device having a strained semiconductor alloy concentration profile' [patent_app_type] => utility [patent_app_number] => 11/866461 [patent_app_country] => US [patent_app_date] => 2007-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 14 [patent_no_of_words] => 7879 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 226 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/939/07939399.pdf [firstpage_image] =>[orig_patent_app_number] => 11866461 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/866461
Semiconductor device having a strained semiconductor alloy concentration profile Oct 2, 2007 Issued
Array ( [id] => 4745759 [patent_doc_number] => 20080090361 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-17 [patent_title] => 'CORNER DOMINATED TRIGATE FIELD EFFECT TRANSISTOR' [patent_app_type] => utility [patent_app_number] => 11/866435 [patent_app_country] => US [patent_app_date] => 2007-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6620 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20080090361.pdf [firstpage_image] =>[orig_patent_app_number] => 11866435 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/866435
Corner dominated trigate field effect transistor Oct 2, 2007 Issued
Array ( [id] => 4942132 [patent_doc_number] => 20080079455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-03 [patent_title] => 'IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package' [patent_app_type] => utility [patent_app_number] => 11/866677 [patent_app_country] => US [patent_app_date] => 2007-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3080 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20080079455.pdf [firstpage_image] =>[orig_patent_app_number] => 11866677 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/866677
IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package Oct 2, 2007 Abandoned
Array ( [id] => 8621794 [patent_doc_number] => 08354709 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-15 [patent_title] => 'Semiconductor component with improved robustness' [patent_app_type] => utility [patent_app_number] => 11/865316 [patent_app_country] => US [patent_app_date] => 2007-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 4483 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11865316 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/865316
Semiconductor component with improved robustness Sep 30, 2007 Issued
Array ( [id] => 5506248 [patent_doc_number] => 20090079455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-26 [patent_title] => 'REDUCED SCRUB CONTACT ELEMENT' [patent_app_type] => utility [patent_app_number] => 11/862172 [patent_app_country] => US [patent_app_date] => 2007-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8266 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20090079455.pdf [firstpage_image] =>[orig_patent_app_number] => 11862172 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/862172
REDUCED SCRUB CONTACT ELEMENT Sep 25, 2007 Abandoned
Array ( [id] => 5506240 [patent_doc_number] => 20090079447 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-26 [patent_title] => 'TESTING SYSTEM FOR A RADIO FREQUENCY MODULE' [patent_app_type] => utility [patent_app_number] => 11/858401 [patent_app_country] => US [patent_app_date] => 2007-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1832 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20090079447.pdf [firstpage_image] =>[orig_patent_app_number] => 11858401 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/858401
TESTING SYSTEM FOR A RADIO FREQUENCY MODULE Sep 19, 2007 Abandoned
Array ( [id] => 4446356 [patent_doc_number] => 07863920 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-01-04 [patent_title] => 'Electrostatic discharge test system and electrostatic discharge test method' [patent_app_type] => utility [patent_app_number] => 11/854275 [patent_app_country] => US [patent_app_date] => 2007-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 4678 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/863/07863920.pdf [firstpage_image] =>[orig_patent_app_number] => 11854275 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/854275
Electrostatic discharge test system and electrostatic discharge test method Sep 11, 2007 Issued
Array ( [id] => 4743730 [patent_doc_number] => 20080088331 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-17 [patent_title] => 'Socket for test' [patent_app_type] => utility [patent_app_number] => 11/898311 [patent_app_country] => US [patent_app_date] => 2007-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7632 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20080088331.pdf [firstpage_image] =>[orig_patent_app_number] => 11898311 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/898311
Socket for test Sep 10, 2007 Abandoned
Array ( [id] => 191487 [patent_doc_number] => 07642801 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-05 [patent_title] => 'Circuit testing apparatus for testing a device under test' [patent_app_type] => utility [patent_app_number] => 11/898317 [patent_app_country] => US [patent_app_date] => 2007-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1676 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/642/07642801.pdf [firstpage_image] =>[orig_patent_app_number] => 11898317 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/898317
Circuit testing apparatus for testing a device under test Sep 10, 2007 Issued
Array ( [id] => 14859 [patent_doc_number] => 07808264 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-10-05 [patent_title] => 'Isolated conductive leads extending across to opposite sides of IC' [patent_app_type] => utility [patent_app_number] => 11/850436 [patent_app_country] => US [patent_app_date] => 2007-09-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 85 [patent_no_of_words] => 9571 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/808/07808264.pdf [firstpage_image] =>[orig_patent_app_number] => 11850436 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/850436
Isolated conductive leads extending across to opposite sides of IC Sep 4, 2007 Issued
Array ( [id] => 5320454 [patent_doc_number] => 20090058444 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-05 [patent_title] => 'METHOD AND APPARATUS FOR RELATIVE TESTING OF INTEGRATED CIRCUIT DEVICES' [patent_app_type] => utility [patent_app_number] => 11/849702 [patent_app_country] => US [patent_app_date] => 2007-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4088 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0058/20090058444.pdf [firstpage_image] =>[orig_patent_app_number] => 11849702 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/849702
Method and apparatus for relative testing of integrated circuit devices Sep 3, 2007 Issued
Array ( [id] => 204438 [patent_doc_number] => 07629194 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-12-08 [patent_title] => 'Metal contact RF MEMS single pole double throw latching switch' [patent_app_type] => utility [patent_app_number] => 11/845602 [patent_app_country] => US [patent_app_date] => 2007-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 13 [patent_no_of_words] => 5651 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 242 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/629/07629194.pdf [firstpage_image] =>[orig_patent_app_number] => 11845602 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/845602
Metal contact RF MEMS single pole double throw latching switch Aug 26, 2007 Issued
Array ( [id] => 5444604 [patent_doc_number] => 20090045830 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-19 [patent_title] => 'AUTOMATED CONTACT ALIGNMENT TOOL' [patent_app_type] => utility [patent_app_number] => 11/838706 [patent_app_country] => US [patent_app_date] => 2007-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2865 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20090045830.pdf [firstpage_image] =>[orig_patent_app_number] => 11838706 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/838706
Automated contact alignment tool Aug 13, 2007 Issued
Array ( [id] => 196599 [patent_doc_number] => 07638403 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-29 [patent_title] => 'Manufacturing method of integrated circuit structure' [patent_app_type] => utility [patent_app_number] => 11/837362 [patent_app_country] => US [patent_app_date] => 2007-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 4664 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/638/07638403.pdf [firstpage_image] =>[orig_patent_app_number] => 11837362 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/837362
Manufacturing method of integrated circuit structure Aug 9, 2007 Issued
Array ( [id] => 4909761 [patent_doc_number] => 20080020527 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-24 [patent_title] => 'NON-VOLATILE MEMORY CELL HAVING A SILICON-OXIDE-NITRIDE-OXIDE-SILICON GATE STRUCTURE AND FABRICATION METHOD OF SUCH CELL' [patent_app_type] => utility [patent_app_number] => 11/833132 [patent_app_country] => US [patent_app_date] => 2007-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5529 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20080020527.pdf [firstpage_image] =>[orig_patent_app_number] => 11833132 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/833132
NON-VOLATILE MEMORY CELL HAVING A SILICON-OXIDE-NITRIDE-OXIDE-SILICON GATE STRUCTURE AND FABRICATION METHOD OF SUCH CELL Aug 1, 2007 Abandoned
Array ( [id] => 5028472 [patent_doc_number] => 20070269919 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-22 [patent_title] => 'CONTROLLING OVERSPRAY COATING IN SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 11/832711 [patent_app_country] => US [patent_app_date] => 2007-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4059 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0269/20070269919.pdf [firstpage_image] =>[orig_patent_app_number] => 11832711 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/832711
Controlling overspray coating in semiconductor devices Aug 1, 2007 Issued
Array ( [id] => 4731709 [patent_doc_number] => 20080048687 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'PROBE, METHOD OF MANUFACTURING THE PROBE AND PROBE CARD HAVING THE PROBE' [patent_app_type] => utility [patent_app_number] => 11/830405 [patent_app_country] => US [patent_app_date] => 2007-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 33 [patent_no_of_words] => 9407 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048687.pdf [firstpage_image] =>[orig_patent_app_number] => 11830405 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/830405
PROBE, METHOD OF MANUFACTURING THE PROBE AND PROBE CARD HAVING THE PROBE Jul 29, 2007 Abandoned
Array ( [id] => 4687855 [patent_doc_number] => 20080032036 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'MANUFACTURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE' [patent_app_type] => utility [patent_app_number] => 11/828771 [patent_app_country] => US [patent_app_date] => 2007-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3188 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0032/20080032036.pdf [firstpage_image] =>[orig_patent_app_number] => 11828771 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/828771
Manufacturing apparatus for semiconductor device and manufacturing method for semiconductor device Jul 25, 2007 Issued
Array ( [id] => 4731731 [patent_doc_number] => 20080048709 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Module and method for detecting defect of thin film transistor substrate' [patent_app_type] => utility [patent_app_number] => 11/881776 [patent_app_country] => US [patent_app_date] => 2007-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8218 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048709.pdf [firstpage_image] =>[orig_patent_app_number] => 11881776 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/881776
Module and method for detecting defect of thin film transistor substrate Jul 25, 2007 Issued
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