
Marcus Smith
Examiner (ID: 7124, Phone: (571)270-1096 , Office: P/2467 )
| Most Active Art Unit | 2467 |
| Art Unit(s) | 2616, 2468, 2419, 2467, 2619 |
| Total Applications | 664 |
| Issued Applications | 499 |
| Pending Applications | 20 |
| Abandoned Applications | 148 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6504923
[patent_doc_number] => 20100010779
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-14
[patent_title] => 'Electromagnetic Coupling Device fo an Electromagnetic Radiation Detector'
[patent_app_type] => utility
[patent_app_number] => 12/443984
[patent_app_country] => US
[patent_app_date] => 2007-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2366
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0010/20100010779.pdf
[firstpage_image] =>[orig_patent_app_number] => 12443984
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/443984 | Electromagnetic coupling device of an electromagnetic radiation detector | Oct 9, 2007 | Issued |
Array
(
[id] => 7965795
[patent_doc_number] => 07939399
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-10
[patent_title] => 'Semiconductor device having a strained semiconductor alloy concentration profile'
[patent_app_type] => utility
[patent_app_number] => 11/866461
[patent_app_country] => US
[patent_app_date] => 2007-10-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 7879
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[pdf_file] => patents/07/939/07939399.pdf
[firstpage_image] =>[orig_patent_app_number] => 11866461
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/866461 | Semiconductor device having a strained semiconductor alloy concentration profile | Oct 2, 2007 | Issued |
Array
(
[id] => 4745759
[patent_doc_number] => 20080090361
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-17
[patent_title] => 'CORNER DOMINATED TRIGATE FIELD EFFECT TRANSISTOR'
[patent_app_type] => utility
[patent_app_number] => 11/866435
[patent_app_country] => US
[patent_app_date] => 2007-10-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
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[patent_no_of_words] => 6620
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0090/20080090361.pdf
[firstpage_image] =>[orig_patent_app_number] => 11866435
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/866435 | Corner dominated trigate field effect transistor | Oct 2, 2007 | Issued |
Array
(
[id] => 4942132
[patent_doc_number] => 20080079455
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-03
[patent_title] => 'IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package'
[patent_app_type] => utility
[patent_app_number] => 11/866677
[patent_app_country] => US
[patent_app_date] => 2007-10-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3080
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0079/20080079455.pdf
[firstpage_image] =>[orig_patent_app_number] => 11866677
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/866677 | IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package | Oct 2, 2007 | Abandoned |
Array
(
[id] => 8621794
[patent_doc_number] => 08354709
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-01-15
[patent_title] => 'Semiconductor component with improved robustness'
[patent_app_type] => utility
[patent_app_number] => 11/865316
[patent_app_country] => US
[patent_app_date] => 2007-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11865316
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/865316 | Semiconductor component with improved robustness | Sep 30, 2007 | Issued |
Array
(
[id] => 5506248
[patent_doc_number] => 20090079455
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-26
[patent_title] => 'REDUCED SCRUB CONTACT ELEMENT'
[patent_app_type] => utility
[patent_app_number] => 11/862172
[patent_app_country] => US
[patent_app_date] => 2007-09-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0079/20090079455.pdf
[firstpage_image] =>[orig_patent_app_number] => 11862172
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/862172 | REDUCED SCRUB CONTACT ELEMENT | Sep 25, 2007 | Abandoned |
Array
(
[id] => 5506240
[patent_doc_number] => 20090079447
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-26
[patent_title] => 'TESTING SYSTEM FOR A RADIO FREQUENCY MODULE'
[patent_app_type] => utility
[patent_app_number] => 11/858401
[patent_app_country] => US
[patent_app_date] => 2007-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1832
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0079/20090079447.pdf
[firstpage_image] =>[orig_patent_app_number] => 11858401
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/858401 | TESTING SYSTEM FOR A RADIO FREQUENCY MODULE | Sep 19, 2007 | Abandoned |
Array
(
[id] => 4446356
[patent_doc_number] => 07863920
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-01-04
[patent_title] => 'Electrostatic discharge test system and electrostatic discharge test method'
[patent_app_type] => utility
[patent_app_number] => 11/854275
[patent_app_country] => US
[patent_app_date] => 2007-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 4678
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/863/07863920.pdf
[firstpage_image] =>[orig_patent_app_number] => 11854275
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/854275 | Electrostatic discharge test system and electrostatic discharge test method | Sep 11, 2007 | Issued |
Array
(
[id] => 4743730
[patent_doc_number] => 20080088331
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-17
[patent_title] => 'Socket for test'
[patent_app_type] => utility
[patent_app_number] => 11/898311
[patent_app_country] => US
[patent_app_date] => 2007-09-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 7632
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0088/20080088331.pdf
[firstpage_image] =>[orig_patent_app_number] => 11898311
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/898311 | Socket for test | Sep 10, 2007 | Abandoned |
Array
(
[id] => 191487
[patent_doc_number] => 07642801
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-05
[patent_title] => 'Circuit testing apparatus for testing a device under test'
[patent_app_type] => utility
[patent_app_number] => 11/898317
[patent_app_country] => US
[patent_app_date] => 2007-09-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/642/07642801.pdf
[firstpage_image] =>[orig_patent_app_number] => 11898317
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/898317 | Circuit testing apparatus for testing a device under test | Sep 10, 2007 | Issued |
Array
(
[id] => 14859
[patent_doc_number] => 07808264
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-10-05
[patent_title] => 'Isolated conductive leads extending across to opposite sides of IC'
[patent_app_type] => utility
[patent_app_number] => 11/850436
[patent_app_country] => US
[patent_app_date] => 2007-09-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/808/07808264.pdf
[firstpage_image] =>[orig_patent_app_number] => 11850436
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/850436 | Isolated conductive leads extending across to opposite sides of IC | Sep 4, 2007 | Issued |
Array
(
[id] => 5320454
[patent_doc_number] => 20090058444
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-05
[patent_title] => 'METHOD AND APPARATUS FOR RELATIVE TESTING OF INTEGRATED CIRCUIT DEVICES'
[patent_app_type] => utility
[patent_app_number] => 11/849702
[patent_app_country] => US
[patent_app_date] => 2007-09-04
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0058/20090058444.pdf
[firstpage_image] =>[orig_patent_app_number] => 11849702
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/849702 | Method and apparatus for relative testing of integrated circuit devices | Sep 3, 2007 | Issued |
Array
(
[id] => 204438
[patent_doc_number] => 07629194
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-12-08
[patent_title] => 'Metal contact RF MEMS single pole double throw latching switch'
[patent_app_type] => utility
[patent_app_number] => 11/845602
[patent_app_country] => US
[patent_app_date] => 2007-08-27
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[pdf_file] => patents/07/629/07629194.pdf
[firstpage_image] =>[orig_patent_app_number] => 11845602
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/845602 | Metal contact RF MEMS single pole double throw latching switch | Aug 26, 2007 | Issued |
Array
(
[id] => 5444604
[patent_doc_number] => 20090045830
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-19
[patent_title] => 'AUTOMATED CONTACT ALIGNMENT TOOL'
[patent_app_type] => utility
[patent_app_number] => 11/838706
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[firstpage_image] =>[orig_patent_app_number] => 11838706
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/838706 | Automated contact alignment tool | Aug 13, 2007 | Issued |
Array
(
[id] => 196599
[patent_doc_number] => 07638403
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[patent_kind] => B2
[patent_issue_date] => 2009-12-29
[patent_title] => 'Manufacturing method of integrated circuit structure'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/837362 | Manufacturing method of integrated circuit structure | Aug 9, 2007 | Issued |
Array
(
[id] => 4909761
[patent_doc_number] => 20080020527
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-24
[patent_title] => 'NON-VOLATILE MEMORY CELL HAVING A SILICON-OXIDE-NITRIDE-OXIDE-SILICON GATE STRUCTURE AND FABRICATION METHOD OF SUCH CELL'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0020/20080020527.pdf
[firstpage_image] =>[orig_patent_app_number] => 11833132
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/833132 | NON-VOLATILE MEMORY CELL HAVING A SILICON-OXIDE-NITRIDE-OXIDE-SILICON GATE STRUCTURE AND FABRICATION METHOD OF SUCH CELL | Aug 1, 2007 | Abandoned |
Array
(
[id] => 5028472
[patent_doc_number] => 20070269919
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-11-22
[patent_title] => 'CONTROLLING OVERSPRAY COATING IN SEMICONDUCTOR DEVICES'
[patent_app_type] => utility
[patent_app_number] => 11/832711
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11832711
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/832711 | Controlling overspray coating in semiconductor devices | Aug 1, 2007 | Issued |
Array
(
[id] => 4731709
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Array
(
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[patent_title] => 'MANUFACTURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/828771 | Manufacturing apparatus for semiconductor device and manufacturing method for semiconductor device | Jul 25, 2007 | Issued |
Array
(
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[patent_title] => 'Module and method for detecting defect of thin film transistor substrate'
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[patent_app_number] => 11/881776
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[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11881776
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/881776 | Module and method for detecting defect of thin film transistor substrate | Jul 25, 2007 | Issued |