Marcus Smith

Array ( [id] => 4897266 [patent_doc_number] => 20080116879 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'VOLTAGE MEASURING DEVICE' [patent_app_type] => utility [patent_app_number] => 11/778077 [patent_app_country] => US [patent_app_date] => 2007-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1826 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116879.pdf [firstpage_image] =>[orig_patent_app_number] => 11778077 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4533423 [patent_doc_number] => 07923986 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-12 [patent_title] => 'Device and method for measuring a current flowing in an electrical conductor' [patent_app_type] => utility [patent_app_number] => 11/879013 [patent_app_country] => US [patent_app_date] => 2007-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 4573 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/923/07923986.pdf [firstpage_image] =>[orig_patent_app_number] => 11879013 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4715939 [patent_doc_number] => 20080238461 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'Multi-type test interface system and method' [patent_app_type] => utility [patent_app_number] => 11/827274 [patent_app_country] => US [patent_app_date] => 2007-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 2679 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238461.pdf [firstpage_image] =>[orig_patent_app_number] => 11827274 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 153178 [patent_doc_number] => 07679385 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-16 [patent_title] => 'Probe card for inspecting electric properties of an object' [patent_app_type] => utility [patent_app_number] => 11/822577 [patent_app_country] => US [patent_app_date] => 2007-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 6415 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/679/07679385.pdf [firstpage_image] =>[orig_patent_app_number] => 11822577 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5307954 [patent_doc_number] => 20090015235 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-15 [patent_title] => 'METHOD AND APPARATUS FOR TESTING A SYSTEM MODULE' [patent_app_type] => utility [patent_app_number] => 11/775115 [patent_app_country] => US [patent_app_date] => 2007-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1787 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0015/20090015235.pdf [firstpage_image] =>[orig_patent_app_number] => 11775115 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5293868 [patent_doc_number] => 20090008794 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'Thickness Indicators for Wafer Thinning' [patent_app_type] => utility [patent_app_number] => 11/773171 [patent_app_country] => US [patent_app_date] => 2007-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5415 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20090008794.pdf [firstpage_image] =>[orig_patent_app_number] => 11773171 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 572931 [patent_doc_number] => 07466162 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-16 [patent_title] => 'Electronic load' [patent_app_type] => utility [patent_app_number] => 11/770748 [patent_app_country] => US [patent_app_date] => 2007-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2140 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/466/07466162.pdf [firstpage_image] =>[orig_patent_app_number] => 11770748 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4850120 [patent_doc_number] => 20080315862 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-25 [patent_title] => 'SMART PARALLEL CONTROLLER FOR SEMICONDUCTOR EXPERIMENTS' [patent_app_type] => utility [patent_app_number] => 11/766706 [patent_app_country] => US [patent_app_date] => 2007-06-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 2667 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20080315862.pdf [firstpage_image] =>[orig_patent_app_number] => 11766706 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4757124 [patent_doc_number] => 20080309349 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'Flexible interposer system' [patent_app_type] => utility [patent_app_number] => 11/818583 [patent_app_country] => US [patent_app_date] => 2007-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9083 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0309/20080309349.pdf [firstpage_image] =>[orig_patent_app_number] => 11818583 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4757140 [patent_doc_number] => 20080309365 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-18 [patent_title] => 'Method for Determining Time Dependent Dielectric Breakdown' [patent_app_type] => utility [patent_app_number] => 11/763077 [patent_app_country] => US [patent_app_date] => 2007-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7103 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0309/20080309365.pdf [firstpage_image] =>[orig_patent_app_number] => 11763077 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5063158 [patent_doc_number] => 20070224798 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-27 [patent_title] => 'Semiconductor device and medium of fabricating the same' [patent_app_type] => utility [patent_app_number] => 11/802131 [patent_app_country] => US [patent_app_date] => 2007-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3237 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0224/20070224798.pdf [firstpage_image] =>[orig_patent_app_number] => 11802131 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4776412 [patent_doc_number] => 20080284410 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-20 [patent_title] => 'Clamp-on current and voltage module for a power monitoring system' [patent_app_type] => utility [patent_app_number] => 11/803976 [patent_app_country] => US [patent_app_date] => 2007-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 4609 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20080284410.pdf [firstpage_image] =>[orig_patent_app_number] => 11803976 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4582995 [patent_doc_number] => 07834402 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-11-16 [patent_title] => 'Semiconductor integrated circuit device' [patent_app_type] => utility [patent_app_number] => 11/798376 [patent_app_country] => US [patent_app_date] => 2007-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 6433 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/834/07834402.pdf [firstpage_image] =>[orig_patent_app_number] => 11798376 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4485612 [patent_doc_number] => 07883937 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-02-08 [patent_title] => 'Electronic package and method of forming the same' [patent_app_type] => utility [patent_app_number] => 11/742521 [patent_app_country] => US [patent_app_date] => 2007-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1950 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/883/07883937.pdf [firstpage_image] =>[orig_patent_app_number] => 11742521 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4661423 [patent_doc_number] => 20080252330 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-16 [patent_title] => 'METHOD AND APPARATUS FOR SINGULATED DIE TESTING' [patent_app_type] => utility [patent_app_number] => 11/735871 [patent_app_country] => US [patent_app_date] => 2007-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5521 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20080252330.pdf [firstpage_image] =>[orig_patent_app_number] => 11735871 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6294758 [patent_doc_number] => 20100065825 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-03-18 [patent_title] => 'Light-Emitting Component' [patent_app_type] => utility [patent_app_number] => 12/297506 [patent_app_country] => US [patent_app_date] => 2007-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 7929 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0065/20100065825.pdf [firstpage_image] =>[orig_patent_app_number] => 12297506 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4661414 [patent_doc_number] => 20080252321 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-16 [patent_title] => 'Apparatus for testing micro SD devices' [patent_app_type] => utility [patent_app_number] => 11/786777 [patent_app_country] => US [patent_app_date] => 2007-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 5653 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20080252321.pdf [firstpage_image] =>[orig_patent_app_number] => 11786777 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4661406 [patent_doc_number] => 20080252313 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-16 [patent_title] => 'Method for testing system-in-package devices' [patent_app_type] => utility [patent_app_number] => 11/786766 [patent_app_country] => US [patent_app_date] => 2007-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 5703 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20080252313.pdf [firstpage_image] =>[orig_patent_app_number] => 11786766 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4661410 [patent_doc_number] => 20080252317 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-16 [patent_title] => 'Apparatus for testing system-in-package devices' [patent_app_type] => utility [patent_app_number] => 11/786774 [patent_app_country] => US [patent_app_date] => 2007-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 5539 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20080252317.pdf [firstpage_image] =>[orig_patent_app_number] => 11786774 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4715938 [patent_doc_number] => 20080238460 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'Accurate alignment of semiconductor devices and sockets' [patent_app_type] => utility [patent_app_number] => 11/731777 [patent_app_country] => US [patent_app_date] => 2007-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2633 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238460.pdf [firstpage_image] =>[orig_patent_app_number] => 11731777 [rel_patent_id] =>[rel_patent_doc_number] =>)