Search

Marcus Smith

Examiner (ID: 7124, Phone: (571)270-1096 , Office: P/2467 )

Most Active Art Unit
2467
Art Unit(s)
2616, 2468, 2419, 2467, 2619
Total Applications
664
Issued Applications
499
Pending Applications
20
Abandoned Applications
148

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4715930 [patent_doc_number] => 20080238452 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'Vertical micro probes' [patent_app_type] => utility [patent_app_number] => 11/731072 [patent_app_country] => US [patent_app_date] => 2007-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4194 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0238/20080238452.pdf [firstpage_image] =>[orig_patent_app_number] => 11731072 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/731072
Vertical micro probes Mar 29, 2007 Abandoned
Array ( [id] => 4715139 [patent_doc_number] => 20080237661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-02 [patent_title] => 'ULTRA-ABRUPT SEMICONDUCTOR JUNCTION PROFILE' [patent_app_type] => utility [patent_app_number] => 11/694936 [patent_app_country] => US [patent_app_date] => 2007-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3561 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20080237661.pdf [firstpage_image] =>[orig_patent_app_number] => 11694936 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/694936
Ultra-abrupt semiconductor junction profile Mar 29, 2007 Issued
Array ( [id] => 4737607 [patent_doc_number] => 20080231259 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-25 [patent_title] => 'INTERLOCKING ELECTRICAL TEST PROBES' [patent_app_type] => utility [patent_app_number] => 11/726750 [patent_app_country] => US [patent_app_date] => 2007-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1236 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20080231259.pdf [firstpage_image] =>[orig_patent_app_number] => 11726750 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/726750
Interlocking electrical test probes Mar 22, 2007 Issued
Array ( [id] => 178472 [patent_doc_number] => 07656182 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-02 [patent_title] => 'Testing method using a scalable parametric measurement macro' [patent_app_type] => utility [patent_app_number] => 11/689150 [patent_app_country] => US [patent_app_date] => 2007-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 7096 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/656/07656182.pdf [firstpage_image] =>[orig_patent_app_number] => 11689150 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/689150
Testing method using a scalable parametric measurement macro Mar 20, 2007 Issued
Array ( [id] => 4975209 [patent_doc_number] => 20070216439 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-20 [patent_title] => 'MOS transistor characteristic detection apparatus and CMOS circuit characteristic automatic adjustment apparatus' [patent_app_type] => utility [patent_app_number] => 11/723234 [patent_app_country] => US [patent_app_date] => 2007-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6558 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0216/20070216439.pdf [firstpage_image] =>[orig_patent_app_number] => 11723234 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/723234
MOS transistor characteristic detection apparatus and CMOS circuit characteristic automatic adjustment apparatus Mar 18, 2007 Issued
Array ( [id] => 5163505 [patent_doc_number] => 20070285089 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-13 [patent_title] => 'CURRENT DETECTION PRINTED BOARD, VOLTAGE DETECTION PRINTED BOARD, CURRENT/VOLTAGE DETECTION PRINTED BOARD, CURRENT/VOLTAGE DETECTOR, CURRENT DETECTOR AND VOLTAGE DETECTOR' [patent_app_type] => utility [patent_app_number] => 11/687973 [patent_app_country] => US [patent_app_date] => 2007-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 18906 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0285/20070285089.pdf [firstpage_image] =>[orig_patent_app_number] => 11687973 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/687973
CURRENT DETECTION PRINTED BOARD, VOLTAGE DETECTION PRINTED BOARD, CURRENT/VOLTAGE DETECTION PRINTED BOARD, CURRENT/VOLTAGE DETECTOR, CURRENT DETECTOR AND VOLTAGE DETECTOR Mar 18, 2007 Abandoned
Array ( [id] => 4975199 [patent_doc_number] => 20070216429 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-20 [patent_title] => 'PROBE CARD, METHOD OF DESIGNING THE PROBE CARD, AND METHOD OF TESTING SEMICONDUCTOR CHIPS USING THE PROBE CARD' [patent_app_type] => utility [patent_app_number] => 11/685645 [patent_app_country] => US [patent_app_date] => 2007-03-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 3812 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0216/20070216429.pdf [firstpage_image] =>[orig_patent_app_number] => 11685645 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/685645
PROBE CARD, METHOD OF DESIGNING THE PROBE CARD, AND METHOD OF TESTING SEMICONDUCTOR CHIPS USING THE PROBE CARD Mar 12, 2007 Abandoned
Array ( [id] => 9662203 [patent_doc_number] => 08809179 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-08-19 [patent_title] => 'Method for reducing topography of non-volatile memory and resulting memory cells' [patent_app_type] => utility [patent_app_number] => 11/716164 [patent_app_country] => US [patent_app_date] => 2007-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 22 [patent_no_of_words] => 4444 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11716164 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/716164
Method for reducing topography of non-volatile memory and resulting memory cells Mar 8, 2007 Issued
Array ( [id] => 4696002 [patent_doc_number] => 20080218186 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-09-11 [patent_title] => 'Image sensing integrated circuit test apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/715535 [patent_app_country] => US [patent_app_date] => 2007-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4600 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0218/20080218186.pdf [firstpage_image] =>[orig_patent_app_number] => 11715535 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/715535
Image sensing integrated circuit test apparatus and method Mar 6, 2007 Abandoned
Array ( [id] => 63844 [patent_doc_number] => 07764072 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-07-27 [patent_title] => 'Differential signal probing system' [patent_app_type] => utility [patent_app_number] => 11/710225 [patent_app_country] => US [patent_app_date] => 2007-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 6553 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/764/07764072.pdf [firstpage_image] =>[orig_patent_app_number] => 11710225 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/710225
Differential signal probing system Feb 21, 2007 Issued
Array ( [id] => 1077471 [patent_doc_number] => 07615988 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-10 [patent_title] => 'Wide range current sensing method and system' [patent_app_type] => utility [patent_app_number] => 11/705373 [patent_app_country] => US [patent_app_date] => 2007-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3790 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/615/07615988.pdf [firstpage_image] =>[orig_patent_app_number] => 11705373 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/705373
Wide range current sensing method and system Feb 11, 2007 Issued
Array ( [id] => 5003009 [patent_doc_number] => 20070200576 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-30 [patent_title] => 'Multi-layered probes' [patent_app_type] => utility [patent_app_number] => 11/703875 [patent_app_country] => US [patent_app_date] => 2007-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4396 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0200/20070200576.pdf [firstpage_image] =>[orig_patent_app_number] => 11703875 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/703875
Multi-layered probes Feb 6, 2007 Abandoned
Array ( [id] => 311591 [patent_doc_number] => 07528623 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-05-05 [patent_title] => 'Distributing data among test boards to determine test parameters' [patent_app_type] => utility [patent_app_number] => 11/670750 [patent_app_country] => US [patent_app_date] => 2007-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5735 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/528/07528623.pdf [firstpage_image] =>[orig_patent_app_number] => 11670750 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/670750
Distributing data among test boards to determine test parameters Feb 1, 2007 Issued
Array ( [id] => 4843726 [patent_doc_number] => 20080180134 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-31 [patent_title] => 'Electronic Circuit for Measurement of Transistor Variability and the Like' [patent_app_type] => utility [patent_app_number] => 11/669250 [patent_app_country] => US [patent_app_date] => 2007-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6106 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0180/20080180134.pdf [firstpage_image] =>[orig_patent_app_number] => 11669250 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/669250
Electronic circuit for measurement of transistor variability and the like Jan 30, 2007 Issued
Array ( [id] => 4845964 [patent_doc_number] => 20080182372 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-31 [patent_title] => 'METHOD OF FORMING DISPOSABLE SPACERS FOR IMPROVED STRESSED NITRIDE FILM EFFECTIVENESS' [patent_app_type] => utility [patent_app_number] => 11/669645 [patent_app_country] => US [patent_app_date] => 2007-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1822 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0182/20080182372.pdf [firstpage_image] =>[orig_patent_app_number] => 11669645 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/669645
METHOD OF FORMING DISPOSABLE SPACERS FOR IMPROVED STRESSED NITRIDE FILM EFFECTIVENESS Jan 30, 2007 Abandoned
Array ( [id] => 178440 [patent_doc_number] => 07656150 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-02 [patent_title] => 'Test handler and loading method thereof' [patent_app_type] => utility [patent_app_number] => 11/627276 [patent_app_country] => US [patent_app_date] => 2007-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5047 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 282 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/656/07656150.pdf [firstpage_image] =>[orig_patent_app_number] => 11627276 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/627276
Test handler and loading method thereof Jan 24, 2007 Issued
Array ( [id] => 4763119 [patent_doc_number] => 20080174329 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-24 [patent_title] => 'METHOD AND DEVICE FOR DETERMINING AN OPERATIONAL LIFETIME OF AN INTEGRATED CIRCUIT DEVICE' [patent_app_type] => utility [patent_app_number] => 11/624258 [patent_app_country] => US [patent_app_date] => 2007-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6184 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20080174329.pdf [firstpage_image] =>[orig_patent_app_number] => 11624258 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/624258
Method and device for determining an operational lifetime of an integrated circuit device Jan 17, 2007 Issued
Array ( [id] => 23603 [patent_doc_number] => 07795102 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2010-09-14 [patent_title] => 'ESD high frequency diodes' [patent_app_type] => utility [patent_app_number] => 11/654735 [patent_app_country] => US [patent_app_date] => 2007-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1784 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/795/07795102.pdf [firstpage_image] =>[orig_patent_app_number] => 11654735 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/654735
ESD high frequency diodes Jan 16, 2007 Issued
Array ( [id] => 9676839 [patent_doc_number] => 08815748 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2014-08-26 [patent_title] => 'Method of forming semiconductor device with multiple level patterning' [patent_app_type] => utility [patent_app_number] => 11/623036 [patent_app_country] => US [patent_app_date] => 2007-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 3913 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11623036 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/623036
Method of forming semiconductor device with multiple level patterning Jan 11, 2007 Issued
Array ( [id] => 4805546 [patent_doc_number] => 20080169124 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-17 [patent_title] => 'Padless via and method for making same' [patent_app_type] => utility [patent_app_number] => 11/652735 [patent_app_country] => US [patent_app_date] => 2007-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3813 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20080169124.pdf [firstpage_image] =>[orig_patent_app_number] => 11652735 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/652735
Padless via and method for making same Jan 11, 2007 Abandoned
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