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Mark A. Wardas

Examiner (ID: 12816, Phone: (571)270-3977 , Office: P/3778 )

Most Active Art Unit
3778
Art Unit(s)
2213, 2607, 3778
Total Applications
282
Issued Applications
154
Pending Applications
9
Abandoned Applications
118
Applications
StatisticsSubscription-Only

Applications

Application numberTitle of the applicationFiling DateStatus
08/108091 ANALOG TEST CELL CIRCUIT Aug 16, 1993 Abandoned
08/107212 SEMICONDUCTOR DIE TEST MEANS AND METHOD Aug 15, 1993 Abandoned
Array ( [id] => 3119761 [patent_doc_number] => 05396186 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-03-07 [patent_title] => 'Vacuum actuated multiple level printed circuit board test fixture' [patent_app_type] => 1 [patent_app_number] => 8/103112 [patent_app_country] => US [patent_app_date] => 1993-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2548 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 376 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/396/05396186.pdf [firstpage_image] =>[orig_patent_app_number] => 103112 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/103112 		Vacuum actuated multiple level printed circuit board test fixture Aug 8, 1993 Issued
08/088231 INTERCONNECT STRESS TEST COUPON Jul 5, 1993 Pending
Array ( [id] => 3413824 [patent_doc_number] => 05438256 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-01 [patent_title] => 'Apparatus and method for measurement from the ground for high voltage overhead lines' [patent_app_type] => 1 [patent_app_number] => 8/086393 [patent_app_country] => US [patent_app_date] => 1993-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2329 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 327 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/438/05438256.pdf [firstpage_image] =>[orig_patent_app_number] => 086393 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/086393 		Apparatus and method for measurement from the ground for high voltage overhead lines Jul 5, 1993 Issued
Array ( [id] => 3430827 [patent_doc_number] => 05416408 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-16 [patent_title] => 'Current sensor employing a mutually inductive current sensing scheme with a magnetic field substantially uniform in angular direction' [patent_app_type] => 1 [patent_app_number] => 8/085790 [patent_app_country] => US [patent_app_date] => 1993-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 4412 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/416/05416408.pdf [firstpage_image] =>[orig_patent_app_number] => 085790 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/085790 		Current sensor employing a mutually inductive current sensing scheme with a magnetic field substantially uniform in angular direction Jul 5, 1993 Issued
08/082403 SEMI-AUTOMATIC PROBE CARD CHANGER SYSTEM AND METHOD Jun 23, 1993 Pending
08/081681 TRANSLATOR FIXTURE WITH MODULE FOR EXPANDING TEST POINTS Jun 22, 1993 Pending
08/079721 TEST ADAPTER FOR PACKAGED INTEGRATED CIRCUITS Jun 17, 1993 Pending
Array ( [id] => 3450952 [patent_doc_number] => 05420506 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-30 [patent_title] => 'Apparatus and method for testing packaged integrated circuits' [patent_app_type] => 1 [patent_app_number] => 8/079623 [patent_app_country] => US [patent_app_date] => 1993-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3172 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/420/05420506.pdf [firstpage_image] =>[orig_patent_app_number] => 079623 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/079623 		Apparatus and method for testing packaged integrated circuits Jun 17, 1993 Issued
Array ( [id] => 3545094 [patent_doc_number] => 05481202 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-02 [patent_title] => 'Optical scan and alignment of devices under test' [patent_app_type] => 1 [patent_app_number] => 8/079180 [patent_app_country] => US [patent_app_date] => 1993-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 10 [patent_no_of_words] => 3982 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/481/05481202.pdf [firstpage_image] =>[orig_patent_app_number] => 079180 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/079180 		Optical scan and alignment of devices under test Jun 16, 1993 Issued
08/079242 INTERCONNECTION DEVICE FOR CONNECTING TEST EQUIPMENT WITH A CIRCUIT BOARD DESIGNED FOR FINE PITCH SOLDER LEAD INTEGRATED CIRCUIT COMPONENTS Jun 16, 1993 Pending
Array ( [id] => 3458355 [patent_doc_number] => 05451886 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-09-19 [patent_title] => 'Method of evaluating lifetime of semiconductor material and apparatus for the same' [patent_app_type] => 1 [patent_app_number] => 8/077062 [patent_app_country] => US [patent_app_date] => 1993-06-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 12 [patent_no_of_words] => 2940 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/451/05451886.pdf [firstpage_image] =>[orig_patent_app_number] => 077062 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/077062 		Method of evaluating lifetime of semiconductor material and apparatus for the same Jun 15, 1993 Issued
Array ( [id] => 3430809 [patent_doc_number] => 05416407 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-16 [patent_title] => 'Electric current sensor employing hall effect generator' [patent_app_type] => 1 [patent_app_number] => 8/075950 [patent_app_country] => US [patent_app_date] => 1993-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 2876 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/416/05416407.pdf [firstpage_image] =>[orig_patent_app_number] => 075950 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/075950 		Electric current sensor employing hall effect generator Jun 10, 1993 Issued
08/071841 ALTERNATOR TESTING DEVICE Jun 3, 1993 Pending
Array ( [id] => 3486685 [patent_doc_number] => 05406198 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-04-11 [patent_title] => 'Digital circuitry apparatus' [patent_app_type] => 1 [patent_app_number] => 8/070113 [patent_app_country] => US [patent_app_date] => 1993-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 8768 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/406/05406198.pdf [firstpage_image] =>[orig_patent_app_number] => 070113 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/070113 		Digital circuitry apparatus May 31, 1993 Issued
Array ( [id] => 3421614 [patent_doc_number] => 05394100 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-02-28 [patent_title] => 'Probe system with automatic control of contact pressure and probe alignment' [patent_app_type] => 1 [patent_app_number] => 8/058573 [patent_app_country] => US [patent_app_date] => 1993-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2278 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/394/05394100.pdf [firstpage_image] =>[orig_patent_app_number] => 058573 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/058573 		Probe system with automatic control of contact pressure and probe alignment May 5, 1993 Issued
Array ( [id] => 3450913 [patent_doc_number] => 05420503 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-05-30 [patent_title] => 'Phase sequence indicator' [patent_app_type] => 1 [patent_app_number] => 8/052583 [patent_app_country] => US [patent_app_date] => 1993-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4966 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/420/05420503.pdf [firstpage_image] =>[orig_patent_app_number] => 052583 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/052583 		Phase sequence indicator Apr 25, 1993 Issued
Array ( [id] => 3491641 [patent_doc_number] => 05426375 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-06-20 [patent_title] => 'Method and apparatus for optimizing high speed performance and hot carrier lifetime in a MOS integrated circuit' [patent_app_type] => 1 [patent_app_number] => 8/023074 [patent_app_country] => US [patent_app_date] => 1993-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5228 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/426/05426375.pdf [firstpage_image] =>[orig_patent_app_number] => 023074 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/023074 		Method and apparatus for optimizing high speed performance and hot carrier lifetime in a MOS integrated circuit Feb 25, 1993 Issued
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