Search

Mark T. Le

Examiner (ID: 10293, Phone: (571)272-6682 , Office: P/3617 )

Most Active Art Unit
3617
Art Unit(s)
3617, 3104, 3102, 3613, 3103
Total Applications
3361
Issued Applications
2654
Pending Applications
119
Abandoned Applications
589

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 566451 [patent_doc_number] => 07161667 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-09 [patent_title] => 'Wafer edge inspection' [patent_app_type] => utility [patent_app_number] => 11/123913 [patent_app_country] => US [patent_app_date] => 2005-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3105 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/161/07161667.pdf [firstpage_image] =>[orig_patent_app_number] => 11123913 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/123913
Wafer edge inspection May 5, 2005 Issued
Array ( [id] => 5676342 [patent_doc_number] => 20060181697 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-17 [patent_title] => 'Circularly polarized light for optically inspecting workpieces' [patent_app_type] => utility [patent_app_number] => 11/112909 [patent_app_country] => US [patent_app_date] => 2005-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 21 [patent_no_of_words] => 10226 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0181/20060181697.pdf [firstpage_image] =>[orig_patent_app_number] => 11112909 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/112909
Circularly polarized light for optically inspecting workpieces Apr 21, 2005 Abandoned
Array ( [id] => 7049940 [patent_doc_number] => 20050185827 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-25 [patent_title] => 'Personal identification system' [patent_app_type] => utility [patent_app_number] => 11/104564 [patent_app_country] => US [patent_app_date] => 2005-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 5720 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0185/20050185827.pdf [firstpage_image] =>[orig_patent_app_number] => 11104564 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/104564
Personal identification system Apr 12, 2005 Issued
Array ( [id] => 5855885 [patent_doc_number] => 20060227327 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-10-12 [patent_title] => 'Absorption spectroscopy apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/101913 [patent_app_country] => US [patent_app_date] => 2005-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4932 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0227/20060227327.pdf [firstpage_image] =>[orig_patent_app_number] => 11101913 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/101913
Absorption spectroscopy apparatus and method Apr 7, 2005 Issued
Array ( [id] => 682110 [patent_doc_number] => 07084968 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-01 [patent_title] => 'Method for analyzing defect data and inspection apparatus and review system' [patent_app_type] => utility [patent_app_number] => 11/095614 [patent_app_country] => US [patent_app_date] => 2005-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 30 [patent_no_of_words] => 7996 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/084/07084968.pdf [firstpage_image] =>[orig_patent_app_number] => 11095614 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/095614
Method for analyzing defect data and inspection apparatus and review system Mar 31, 2005 Issued
Array ( [id] => 7187716 [patent_doc_number] => 20050162645 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-28 [patent_title] => 'Optical inspection of a specimen using multi-channel responses from the specimen' [patent_app_type] => utility [patent_app_number] => 11/087941 [patent_app_country] => US [patent_app_date] => 2005-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7378 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0162/20050162645.pdf [firstpage_image] =>[orig_patent_app_number] => 11087941 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/087941
Optical inspection of a specimen using multi-channel responses from the specimen Mar 22, 2005 Abandoned
Array ( [id] => 7187746 [patent_doc_number] => 20050162655 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-28 [patent_title] => 'Method and apparatus for monitoring trace constituents in a fluid' [patent_app_type] => utility [patent_app_number] => 11/081533 [patent_app_country] => US [patent_app_date] => 2005-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 6286 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0162/20050162655.pdf [firstpage_image] =>[orig_patent_app_number] => 11081533 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/081533
Method and apparatus for monitoring trace constituents in a fluid Mar 16, 2005 Abandoned
Array ( [id] => 7037863 [patent_doc_number] => 20050157297 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-21 [patent_title] => 'Periodic patterns and technique to control misalignment between two layers' [patent_app_type] => utility [patent_app_number] => 11/062255 [patent_app_country] => US [patent_app_date] => 2005-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 8288 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0157/20050157297.pdf [firstpage_image] =>[orig_patent_app_number] => 11062255 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/062255
Periodic patterns and technique to control misalignment between two layers Feb 17, 2005 Abandoned
Array ( [id] => 7049284 [patent_doc_number] => 20050185171 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-25 [patent_title] => 'Real-time monitoring apparatus for plasma process' [patent_app_type] => utility [patent_app_number] => 11/060501 [patent_app_country] => US [patent_app_date] => 2005-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3075 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0185/20050185171.pdf [firstpage_image] =>[orig_patent_app_number] => 11060501 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/060501
Real-time monitoring apparatus for plasma process Feb 17, 2005 Issued
Array ( [id] => 732062 [patent_doc_number] => 07042563 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-09 [patent_title] => 'Optical coupling for testing integrated circuits' [patent_app_type] => utility [patent_app_number] => 11/042288 [patent_app_country] => US [patent_app_date] => 2005-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 6303 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/042/07042563.pdf [firstpage_image] =>[orig_patent_app_number] => 11042288 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/042288
Optical coupling for testing integrated circuits Jan 23, 2005 Issued
Array ( [id] => 5653895 [patent_doc_number] => 20060139630 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-29 [patent_title] => 'Standard light source for single photo count apparatus' [patent_app_type] => utility [patent_app_number] => 11/040610 [patent_app_country] => US [patent_app_date] => 2005-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1137 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0139/20060139630.pdf [firstpage_image] =>[orig_patent_app_number] => 11040610 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/040610
Standard light source for single photo count apparatus Jan 18, 2005 Abandoned
Array ( [id] => 6998647 [patent_doc_number] => 20050137809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-23 [patent_title] => 'CD metrology analysis using green\'s function' [patent_app_type] => utility [patent_app_number] => 11/030735 [patent_app_country] => US [patent_app_date] => 2005-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 17672 [patent_no_of_claims] => 50 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0137/20050137809.pdf [firstpage_image] =>[orig_patent_app_number] => 11030735 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/030735
CD metrology analysis using green's function Jan 5, 2005 Issued
Array ( [id] => 448482 [patent_doc_number] => 07253909 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-08-07 [patent_title] => 'Phase shift measurement using transmittance spectra' [patent_app_type] => utility [patent_app_number] => 11/028894 [patent_app_country] => US [patent_app_date] => 2005-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 29 [patent_no_of_words] => 12854 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/253/07253909.pdf [firstpage_image] =>[orig_patent_app_number] => 11028894 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/028894
Phase shift measurement using transmittance spectra Jan 2, 2005 Issued
Array ( [id] => 7044173 [patent_doc_number] => 20050248768 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-10 [patent_title] => 'Passive optical sensor using carbon nanotubes' [patent_app_type] => utility [patent_app_number] => 11/024406 [patent_app_country] => US [patent_app_date] => 2004-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4963 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0248/20050248768.pdf [firstpage_image] =>[orig_patent_app_number] => 11024406 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/024406
Passive optical sensor using carbon nanotubes Dec 29, 2004 Issued
Array ( [id] => 6937426 [patent_doc_number] => 20050110987 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-26 [patent_title] => 'System for detection of wafer defects' [patent_app_type] => utility [patent_app_number] => 11/021393 [patent_app_country] => US [patent_app_date] => 2004-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 29 [patent_no_of_words] => 30459 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0110/20050110987.pdf [firstpage_image] =>[orig_patent_app_number] => 11021393 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/021393
System for detection of wafer defects Dec 22, 2004 Issued
Array ( [id] => 5653912 [patent_doc_number] => 20060139647 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-29 [patent_title] => 'System and method of condensation reduction in an electrical unit' [patent_app_type] => utility [patent_app_number] => 11/018625 [patent_app_country] => US [patent_app_date] => 2004-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4000 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0139/20060139647.pdf [firstpage_image] =>[orig_patent_app_number] => 11018625 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/018625
System and method of condensation reduction in an electrical unit Dec 20, 2004 Issued
Array ( [id] => 422536 [patent_doc_number] => 07274471 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Systems and methods for measuring distance of semiconductor patterns' [patent_app_type] => utility [patent_app_number] => 11/012005 [patent_app_country] => US [patent_app_date] => 2004-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 5803 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274471.pdf [firstpage_image] =>[orig_patent_app_number] => 11012005 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/012005
Systems and methods for measuring distance of semiconductor patterns Dec 12, 2004 Issued
Array ( [id] => 7102364 [patent_doc_number] => 20050105090 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-19 [patent_title] => 'Focused beam spectroscopic ellipsometry method and system' [patent_app_type] => utility [patent_app_number] => 11/007420 [patent_app_country] => US [patent_app_date] => 2004-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 12030 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0105/20050105090.pdf [firstpage_image] =>[orig_patent_app_number] => 11007420 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/007420
Focused beam spectroscopic ellipsometry method and system Dec 6, 2004 Abandoned
Array ( [id] => 6915338 [patent_doc_number] => 20050092899 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-05 [patent_title] => 'Apparatus and methods for optically inspecting a sample for anomalies' [patent_app_type] => utility [patent_app_number] => 10/993473 [patent_app_country] => US [patent_app_date] => 2004-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 15464 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0092/20050092899.pdf [firstpage_image] =>[orig_patent_app_number] => 10993473 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/993473
Apparatus and methods for optically inspecting a sample for anomalies Nov 17, 2004 Issued
Array ( [id] => 416047 [patent_doc_number] => 07280197 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-10-09 [patent_title] => 'Wafer edge inspection apparatus' [patent_app_type] => utility [patent_app_number] => 10/992419 [patent_app_country] => US [patent_app_date] => 2004-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2829 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 252 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/280/07280197.pdf [firstpage_image] =>[orig_patent_app_number] => 10992419 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/992419
Wafer edge inspection apparatus Nov 16, 2004 Issued
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