Search

Matthew O Savage

Examiner (ID: 13996, Phone: (571)272-1146 , Office: P/1773 )

Most Active Art Unit
1306
Art Unit(s)
1776, 1724, 1797, 1306, 1723, 1778, 1773
Total Applications
2718
Issued Applications
1844
Pending Applications
157
Abandoned Applications
717

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 3516119 [patent_doc_number] => 05563509 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-08 [patent_title] => 'Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations' [patent_app_type] => 1 [patent_app_number] => 8/574862 [patent_app_country] => US [patent_app_date] => 1995-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 18 [patent_no_of_words] => 5851 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 272 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/563/05563509.pdf [firstpage_image] =>[orig_patent_app_number] => 574862 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/574862
Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations Dec 18, 1995 Issued
Array ( [id] => 3556802 [patent_doc_number] => 05555422 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-10 [patent_title] => 'Prober for semiconductor integrated circuit element wafer' [patent_app_type] => 1 [patent_app_number] => 8/547383 [patent_app_country] => US [patent_app_date] => 1995-10-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 22 [patent_no_of_words] => 11695 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/555/05555422.pdf [firstpage_image] =>[orig_patent_app_number] => 547383 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/547383
Prober for semiconductor integrated circuit element wafer Oct 23, 1995 Issued
Array ( [id] => 3593312 [patent_doc_number] => 05550479 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-08-27 [patent_title] => 'Signal measuring apparatus and signal measuring method' [patent_app_type] => 1 [patent_app_number] => 8/498911 [patent_app_country] => US [patent_app_date] => 1995-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 23 [patent_no_of_words] => 11461 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/550/05550479.pdf [firstpage_image] =>[orig_patent_app_number] => 498911 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/498911
Signal measuring apparatus and signal measuring method Jul 5, 1995 Issued
Array ( [id] => 3619402 [patent_doc_number] => 05510705 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-23 [patent_title] => 'Electrical test arrangement and apparatus' [patent_app_type] => 1 [patent_app_number] => 8/495870 [patent_app_country] => US [patent_app_date] => 1995-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 2400 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/510/05510705.pdf [firstpage_image] =>[orig_patent_app_number] => 495870 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/495870
Electrical test arrangement and apparatus Jun 27, 1995 Issued
Array ( [id] => 3586760 [patent_doc_number] => 05498971 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-03-12 [patent_title] => 'Method and control circuit for measuring the temperature of an integrated circuit' [patent_app_type] => 1 [patent_app_number] => 8/470639 [patent_app_country] => US [patent_app_date] => 1995-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3223 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/498/05498971.pdf [firstpage_image] =>[orig_patent_app_number] => 470639 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/470639
Method and control circuit for measuring the temperature of an integrated circuit Jun 5, 1995 Issued
Array ( [id] => 3595859 [patent_doc_number] => 05568054 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-10-22 [patent_title] => 'Probe apparatus having burn-in test function' [patent_app_type] => 1 [patent_app_number] => 8/444888 [patent_app_country] => US [patent_app_date] => 1995-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 5470 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/568/05568054.pdf [firstpage_image] =>[orig_patent_app_number] => 444888 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/444888
Probe apparatus having burn-in test function May 18, 1995 Issued
Array ( [id] => 3552527 [patent_doc_number] => 05545975 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-08-13 [patent_title] => 'Storm monitor' [patent_app_type] => 1 [patent_app_number] => 8/404749 [patent_app_country] => US [patent_app_date] => 1995-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 12035 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/545/05545975.pdf [firstpage_image] =>[orig_patent_app_number] => 404749 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/404749
Storm monitor May 10, 1995 Issued
Array ( [id] => 3492640 [patent_doc_number] => 05475317 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-12-12 [patent_title] => 'Singulated bare die tester and method of performing forced temperature electrical tests and burn-in' [patent_app_type] => 1 [patent_app_number] => 8/427974 [patent_app_country] => US [patent_app_date] => 1995-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6623 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/475/05475317.pdf [firstpage_image] =>[orig_patent_app_number] => 427974 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/427974
Singulated bare die tester and method of performing forced temperature electrical tests and burn-in Apr 20, 1995 Issued
Array ( [id] => 3619458 [patent_doc_number] => 05510709 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-23 [patent_title] => 'Eddy current surface inspection probe for aircraft fastener inspection, and inspection method' [patent_app_type] => 1 [patent_app_number] => 8/423489 [patent_app_country] => US [patent_app_date] => 1995-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4426 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/510/05510709.pdf [firstpage_image] =>[orig_patent_app_number] => 423489 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/423489
Eddy current surface inspection probe for aircraft fastener inspection, and inspection method Apr 18, 1995 Issued
08/417441 TRANSLATOR FIXTURE WITH MODULE FOR EXPANDING TEST POINTS Apr 4, 1995 Abandoned
Array ( [id] => 3525551 [patent_doc_number] => 05530374 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-25 [patent_title] => 'Method of identifying probe position and probing method in prober' [patent_app_type] => 1 [patent_app_number] => 8/401231 [patent_app_country] => US [patent_app_date] => 1995-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 16 [patent_no_of_words] => 5996 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 330 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/530/05530374.pdf [firstpage_image] =>[orig_patent_app_number] => 401231 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/401231
Method of identifying probe position and probing method in prober Mar 8, 1995 Issued
Array ( [id] => 3531661 [patent_doc_number] => 05541502 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-30 [patent_title] => 'Level measuring set for low-frequency signals' [patent_app_type] => 1 [patent_app_number] => 8/381970 [patent_app_country] => US [patent_app_date] => 1995-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 770 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/541/05541502.pdf [firstpage_image] =>[orig_patent_app_number] => 381970 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/381970
Level measuring set for low-frequency signals Feb 12, 1995 Issued
Array ( [id] => 3521065 [patent_doc_number] => 05486758 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-23 [patent_title] => 'Integral variable reluctance speed sensor' [patent_app_type] => 1 [patent_app_number] => 8/374401 [patent_app_country] => US [patent_app_date] => 1995-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 5117 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/486/05486758.pdf [firstpage_image] =>[orig_patent_app_number] => 374401 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/374401
Integral variable reluctance speed sensor Jan 16, 1995 Issued
Array ( [id] => 3591946 [patent_doc_number] => 05552718 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-03 [patent_title] => 'Electrical test structure and method for space and line measurement' [patent_app_type] => 1 [patent_app_number] => 8/368181 [patent_app_country] => US [patent_app_date] => 1995-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 11 [patent_no_of_words] => 4959 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/552/05552718.pdf [firstpage_image] =>[orig_patent_app_number] => 368181 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/368181
Electrical test structure and method for space and line measurement Jan 3, 1995 Issued
Array ( [id] => 3617736 [patent_doc_number] => 05534788 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-09 [patent_title] => 'Integrated resistor for sensing electrical parameters' [patent_app_type] => 1 [patent_app_number] => 8/352481 [patent_app_country] => US [patent_app_date] => 1994-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4180 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/534/05534788.pdf [firstpage_image] =>[orig_patent_app_number] => 352481 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/352481
Integrated resistor for sensing electrical parameters Dec 8, 1994 Issued
Array ( [id] => 3595319 [patent_doc_number] => 05585736 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-12-17 [patent_title] => 'Contact probe utilizing conductive meltable probing material' [patent_app_type] => 1 [patent_app_number] => 8/346037 [patent_app_country] => US [patent_app_date] => 1994-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3833 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/585/05585736.pdf [firstpage_image] =>[orig_patent_app_number] => 346037 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/346037
Contact probe utilizing conductive meltable probing material Nov 28, 1994 Issued
Array ( [id] => 3593535 [patent_doc_number] => 05517105 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-14 [patent_title] => 'Dual linked zoom boxes for instrument display' [patent_app_type] => 1 [patent_app_number] => 8/328983 [patent_app_country] => US [patent_app_date] => 1994-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4209 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 317 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/517/05517105.pdf [firstpage_image] =>[orig_patent_app_number] => 328983 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/328983
Dual linked zoom boxes for instrument display Oct 24, 1994 Issued
Array ( [id] => 3494508 [patent_doc_number] => 05471135 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-28 [patent_title] => 'Tester and method for testing a rectifier-regulator' [patent_app_type] => 1 [patent_app_number] => 8/325970 [patent_app_country] => US [patent_app_date] => 1994-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4967 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 307 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/471/05471135.pdf [firstpage_image] =>[orig_patent_app_number] => 325970 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/325970
Tester and method for testing a rectifier-regulator Oct 19, 1994 Issued
Array ( [id] => 3580765 [patent_doc_number] => 05523677 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-04 [patent_title] => 'DC current sensor' [patent_app_type] => 1 [patent_app_number] => 8/321792 [patent_app_country] => US [patent_app_date] => 1994-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 11654 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/523/05523677.pdf [firstpage_image] =>[orig_patent_app_number] => 321792 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/321792
DC current sensor Oct 11, 1994 Issued
Array ( [id] => 3525016 [patent_doc_number] => 05530341 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-06-25 [patent_title] => 'External clock count based auto trigger for an oscilloscope' [patent_app_type] => 1 [patent_app_number] => 8/320722 [patent_app_country] => US [patent_app_date] => 1994-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1407 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/530/05530341.pdf [firstpage_image] =>[orig_patent_app_number] => 320722 [rel_patent_id] =>[rel_patent_doc_number] =>)
08/320722
External clock count based auto trigger for an oscilloscope Oct 10, 1994 Issued
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