Search

Mehran Kamran

Examiner (ID: 13733, Phone: (571)272-3401 , Office: P/2196 )

Most Active Art Unit
2196
Art Unit(s)
2196
Total Applications
612
Issued Applications
525
Pending Applications
49
Abandoned Applications
49

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5157890 [patent_doc_number] => 20070170934 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-26 [patent_title] => 'Method and Apparatus for Nondestructive Evaluation of Semiconductor Wafers' [patent_app_type] => utility [patent_app_number] => 11/307084 [patent_app_country] => US [patent_app_date] => 2006-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3443 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20070170934.pdf [firstpage_image] =>[orig_patent_app_number] => 11307084 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/307084
Method and Apparatus for Nondestructive Evaluation of Semiconductor Wafers Jan 22, 2006 Abandoned
Array ( [id] => 5186452 [patent_doc_number] => 20070164760 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-19 [patent_title] => 'Methods and apparatuses for improved stabilization in a probing system' [patent_app_type] => utility [patent_app_number] => 11/335081 [patent_app_country] => US [patent_app_date] => 2006-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4095 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20070164760.pdf [firstpage_image] =>[orig_patent_app_number] => 11335081 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/335081
Methods and apparatuses for improved stabilization in a probing system Jan 17, 2006 Issued
Array ( [id] => 5186456 [patent_doc_number] => 20070164764 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-19 [patent_title] => 'Method of kelvin current sense in a semiconductor package' [patent_app_type] => utility [patent_app_number] => 11/331783 [patent_app_country] => US [patent_app_date] => 2006-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4275 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20070164764.pdf [firstpage_image] =>[orig_patent_app_number] => 11331783 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/331783
Method of Kelvin current sense in a semiconductor package Jan 12, 2006 Issued
Array ( [id] => 5692095 [patent_doc_number] => 20060152240 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-13 [patent_title] => 'Probe device with micro-pin inserted in interface board' [patent_app_type] => utility [patent_app_number] => 11/332079 [patent_app_country] => US [patent_app_date] => 2006-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2483 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20060152240.pdf [firstpage_image] =>[orig_patent_app_number] => 11332079 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/332079
Probe device with micro-pin inserted in interface board Jan 12, 2006 Abandoned
Array ( [id] => 5746095 [patent_doc_number] => 20060109025 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-25 [patent_title] => 'Testing method for array substrate' [patent_app_type] => utility [patent_app_number] => 11/329124 [patent_app_country] => US [patent_app_date] => 2006-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 7368 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20060109025.pdf [firstpage_image] =>[orig_patent_app_number] => 11329124 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/329124
Testing method for array substrate Jan 10, 2006 Issued
Array ( [id] => 559941 [patent_doc_number] => 07468612 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-23 [patent_title] => 'Dermal phase meter with improved replaceable probe tips' [patent_app_type] => utility [patent_app_number] => 11/306686 [patent_app_country] => US [patent_app_date] => 2006-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 4270 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 288 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/468/07468612.pdf [firstpage_image] =>[orig_patent_app_number] => 11306686 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/306686
Dermal phase meter with improved replaceable probe tips Jan 5, 2006 Issued
Array ( [id] => 5681251 [patent_doc_number] => 20060197518 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-07 [patent_title] => 'PARAMETRIC MEASURING CIRCUIT FOR MINIMIZING OSCILLATION EFFECT' [patent_app_type] => utility [patent_app_number] => 11/306382 [patent_app_country] => US [patent_app_date] => 2005-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2680 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0197/20060197518.pdf [firstpage_image] =>[orig_patent_app_number] => 11306382 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/306382
PARAMETRIC MEASURING CIRCUIT FOR MINIMIZING OSCILLATION EFFECT Dec 26, 2005 Abandoned
Array ( [id] => 5117318 [patent_doc_number] => 20070139032 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-21 [patent_title] => 'Integrated current sensor' [patent_app_type] => utility [patent_app_number] => 11/311603 [patent_app_country] => US [patent_app_date] => 2005-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3585 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0139/20070139032.pdf [firstpage_image] =>[orig_patent_app_number] => 11311603 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/311603
Integrated current sensor Dec 18, 2005 Issued
Array ( [id] => 5146262 [patent_doc_number] => 20070046316 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-01 [patent_title] => 'Test circuit for flat panel display device' [patent_app_type] => utility [patent_app_number] => 11/301479 [patent_app_country] => US [patent_app_date] => 2005-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4427 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0046/20070046316.pdf [firstpage_image] =>[orig_patent_app_number] => 11301479 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/301479
Test circuit for flat panel display device Dec 11, 2005 Issued
Array ( [id] => 436355 [patent_doc_number] => 07262613 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-08-28 [patent_title] => 'Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object' [patent_app_type] => utility [patent_app_number] => 11/296482 [patent_app_country] => US [patent_app_date] => 2005-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 4669 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/262/07262613.pdf [firstpage_image] =>[orig_patent_app_number] => 11296482 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/296482
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Dec 7, 2005 Issued
Array ( [id] => 5837672 [patent_doc_number] => 20060118330 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-08 [patent_title] => 'Wired circuit board and connecting structure thereof' [patent_app_type] => utility [patent_app_number] => 11/295520 [patent_app_country] => US [patent_app_date] => 2005-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8801 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0118/20060118330.pdf [firstpage_image] =>[orig_patent_app_number] => 11295520 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/295520
Wired circuit board and connecting structure thereof Dec 6, 2005 Issued
Array ( [id] => 5617342 [patent_doc_number] => 20060186874 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-24 [patent_title] => 'System and method for mechanical testing of freestanding microscale to nanoscale thin films' [patent_app_type] => utility [patent_app_number] => 11/292958 [patent_app_country] => US [patent_app_date] => 2005-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 8356 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20060186874.pdf [firstpage_image] =>[orig_patent_app_number] => 11292958 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/292958
System and method for mechanical testing of freestanding microscale to nanoscale thin films Dec 1, 2005 Abandoned
Array ( [id] => 5276047 [patent_doc_number] => 20090128179 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-21 [patent_title] => 'Wiring Pattern Characteristic Evaluation Mounting Board' [patent_app_type] => utility [patent_app_number] => 12/084582 [patent_app_country] => US [patent_app_date] => 2006-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7009 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20090128179.pdf [firstpage_image] =>[orig_patent_app_number] => 12084582 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/084582
Wiring pattern characteristic evaluation mounting board Nov 29, 2005 Issued
Array ( [id] => 5646374 [patent_doc_number] => 20060132106 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-22 [patent_title] => 'System and method for regenerative burn-in' [patent_app_type] => utility [patent_app_number] => 11/287580 [patent_app_country] => US [patent_app_date] => 2005-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 3919 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20060132106.pdf [firstpage_image] =>[orig_patent_app_number] => 11287580 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/287580
System and method for regenerative burn-in Nov 22, 2005 Abandoned
Array ( [id] => 5519092 [patent_doc_number] => 20090027073 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-29 [patent_title] => 'DEVICE MOUNTED APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/093976 [patent_app_country] => US [patent_app_date] => 2005-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 6112 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0027/20090027073.pdf [firstpage_image] =>[orig_patent_app_number] => 12093976 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/093976
Device mounted apparatus, test head, and electronic device test system Nov 16, 2005 Issued
Array ( [id] => 334779 [patent_doc_number] => 07508191 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-24 [patent_title] => 'Pin electronics implemented system and method for reduced index time' [patent_app_type] => utility [patent_app_number] => 11/264949 [patent_app_country] => US [patent_app_date] => 2005-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 12051 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 410 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/508/07508191.pdf [firstpage_image] =>[orig_patent_app_number] => 11264949 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/264949
Pin electronics implemented system and method for reduced index time Oct 31, 2005 Issued
Array ( [id] => 5746094 [patent_doc_number] => 20060109024 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-25 [patent_title] => 'Method for measuring thin film transistor array of active matrix display panel' [patent_app_type] => utility [patent_app_number] => 11/264282 [patent_app_country] => US [patent_app_date] => 2005-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6720 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20060109024.pdf [firstpage_image] =>[orig_patent_app_number] => 11264282 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/264282
Method for measuring thin film transistor array of active matrix display panel Oct 31, 2005 Issued
Array ( [id] => 5774772 [patent_doc_number] => 20060103412 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-18 [patent_title] => 'Display device' [patent_app_type] => utility [patent_app_number] => 11/259178 [patent_app_country] => US [patent_app_date] => 2005-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 24057 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20060103412.pdf [firstpage_image] =>[orig_patent_app_number] => 11259178 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/259178
Display device Oct 26, 2005 Abandoned
Array ( [id] => 7604810 [patent_doc_number] => 07116121 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-10-03 [patent_title] => 'Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts' [patent_app_type] => utility [patent_app_number] => 11/261178 [patent_app_country] => US [patent_app_date] => 2005-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 4106 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/116/07116121.pdf [firstpage_image] =>[orig_patent_app_number] => 11261178 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/261178
Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts Oct 26, 2005 Issued
Array ( [id] => 592304 [patent_doc_number] => 07439729 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-21 [patent_title] => 'Integrated systems testing' [patent_app_type] => utility [patent_app_number] => 11/243660 [patent_app_country] => US [patent_app_date] => 2005-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 7809 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/439/07439729.pdf [firstpage_image] =>[orig_patent_app_number] => 11243660 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/243660
Integrated systems testing Oct 4, 2005 Issued
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