Search

Mehran Kamran

Examiner (ID: 13733, Phone: (571)272-3401 , Office: P/2196 )

Most Active Art Unit
2196
Art Unit(s)
2196
Total Applications
612
Issued Applications
525
Pending Applications
49
Abandoned Applications
49

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4769223 [patent_doc_number] => 20080054881 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Dc Current Sensor' [patent_app_type] => utility [patent_app_number] => 11/571881 [patent_app_country] => US [patent_app_date] => 2005-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5760 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054881.pdf [firstpage_image] =>[orig_patent_app_number] => 11571881 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/571881
Dc Current Sensor Jul 6, 2005 Abandoned
Array ( [id] => 5139488 [patent_doc_number] => 20070001704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-04 [patent_title] => 'Method and apparatus for equalization of connection pads' [patent_app_type] => utility [patent_app_number] => 11/173836 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5215 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20070001704.pdf [firstpage_image] =>[orig_patent_app_number] => 11173836 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/173836
Method and apparatus for equalization of connection pads Jun 29, 2005 Abandoned
Array ( [id] => 6979697 [patent_doc_number] => 20050289415 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-29 [patent_title] => 'Intelligent probe chips/heads' [patent_app_type] => utility [patent_app_number] => 11/165679 [patent_app_country] => US [patent_app_date] => 2005-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2804 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0289/20050289415.pdf [firstpage_image] =>[orig_patent_app_number] => 11165679 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/165679
Intelligent probe chips/heads Jun 23, 2005 Abandoned
Array ( [id] => 664435 [patent_doc_number] => 07102377 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-09-05 [patent_title] => 'Packaging reliability superchips' [patent_app_type] => utility [patent_app_number] => 11/159913 [patent_app_country] => US [patent_app_date] => 2005-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 4365 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/102/07102377.pdf [firstpage_image] =>[orig_patent_app_number] => 11159913 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/159913
Packaging reliability superchips Jun 22, 2005 Issued
Array ( [id] => 5878657 [patent_doc_number] => 20060028231 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-09 [patent_title] => 'System for manufacturing display panel, method to be used in same, and testing apparatus therefor' [patent_app_type] => utility [patent_app_number] => 11/158992 [patent_app_country] => US [patent_app_date] => 2005-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5659 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20060028231.pdf [firstpage_image] =>[orig_patent_app_number] => 11158992 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/158992
System for manufacturing display panel, method to be used in same, and testing apparatus therefor Jun 21, 2005 Abandoned
Array ( [id] => 5763516 [patent_doc_number] => 20060017455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-01-26 [patent_title] => 'Defect diagnosis method and apparatus for semiconductor integrated circuit' [patent_app_type] => utility [patent_app_number] => 11/151263 [patent_app_country] => US [patent_app_date] => 2005-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3178 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0017/20060017455.pdf [firstpage_image] =>[orig_patent_app_number] => 11151263 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/151263
Defect diagnosis method and apparatus for semiconductor integrated circuit Jun 13, 2005 Abandoned
Array ( [id] => 5713602 [patent_doc_number] => 20060076965 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Contact-free test system for semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/147437 [patent_app_country] => US [patent_app_date] => 2005-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1469 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20060076965.pdf [firstpage_image] =>[orig_patent_app_number] => 11147437 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/147437
Contact-free test system for semiconductor device Jun 7, 2005 Abandoned
Array ( [id] => 4795693 [patent_doc_number] => 20080007279 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-10 [patent_title] => 'Probe Cards' [patent_app_type] => utility [patent_app_number] => 11/628681 [patent_app_country] => US [patent_app_date] => 2005-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1986 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20080007279.pdf [firstpage_image] =>[orig_patent_app_number] => 11628681 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/628681
Probe Cards Jun 7, 2005 Abandoned
Array ( [id] => 6929377 [patent_doc_number] => 20050280410 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-22 [patent_title] => 'Test apparatus and method for testing circuit units to be tested' [patent_app_type] => utility [patent_app_number] => 11/145610 [patent_app_country] => US [patent_app_date] => 2005-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4288 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0280/20050280410.pdf [firstpage_image] =>[orig_patent_app_number] => 11145610 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/145610
Test apparatus and method for testing circuit units to be tested Jun 5, 2005 Issued
Array ( [id] => 398191 [patent_doc_number] => 07295026 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-13 [patent_title] => 'Automated position control of a surface array relative to a liquid microjunction surface sampler' [patent_app_type] => utility [patent_app_number] => 11/144882 [patent_app_country] => US [patent_app_date] => 2005-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 15 [patent_no_of_words] => 7483 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 252 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/295/07295026.pdf [firstpage_image] =>[orig_patent_app_number] => 11144882 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/144882
Automated position control of a surface array relative to a liquid microjunction surface sampler Jun 2, 2005 Issued
Array ( [id] => 4768605 [patent_doc_number] => 20080054260 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Semiconductor Integrated Circuit Device, Method For Testing The Semiconductor Integrated Circuit Device, Semiconductor Wafer And Burn-In Test Apparatus' [patent_app_type] => utility [patent_app_number] => 11/661680 [patent_app_country] => US [patent_app_date] => 2005-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8943 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054260.pdf [firstpage_image] =>[orig_patent_app_number] => 11661680 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/661680
Semiconductor Integrated Circuit Device, Method For Testing The Semiconductor Integrated Circuit Device, Semiconductor Wafer And Burn-In Test Apparatus May 31, 2005 Abandoned
Array ( [id] => 7231376 [patent_doc_number] => 20050270049 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-08 [patent_title] => 'Semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/140963 [patent_app_country] => US [patent_app_date] => 2005-06-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5874 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0270/20050270049.pdf [firstpage_image] =>[orig_patent_app_number] => 11140963 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/140963
Semiconductor device May 31, 2005 Abandoned
Array ( [id] => 638733 [patent_doc_number] => 07126360 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-10-24 [patent_title] => 'Differential signal acquisition probe having retractable double cushioned probing tips with EOS/ESD protection capabilities' [patent_app_type] => utility [patent_app_number] => 11/139079 [patent_app_country] => US [patent_app_date] => 2005-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 11734 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 318 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/126/07126360.pdf [firstpage_image] =>[orig_patent_app_number] => 11139079 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/139079
Differential signal acquisition probe having retractable double cushioned probing tips with EOS/ESD protection capabilities May 26, 2005 Issued
Array ( [id] => 7208019 [patent_doc_number] => 20050258856 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-24 [patent_title] => 'High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method' [patent_app_type] => utility [patent_app_number] => 11/133290 [patent_app_country] => US [patent_app_date] => 2005-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 27007 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20050258856.pdf [firstpage_image] =>[orig_patent_app_number] => 11133290 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/133290
High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method May 19, 2005 Abandoned
Array ( [id] => 5623335 [patent_doc_number] => 20060261840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-23 [patent_title] => 'System and method for determining channel mobility' [patent_app_type] => utility [patent_app_number] => 11/131521 [patent_app_country] => US [patent_app_date] => 2005-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5558 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20060261840.pdf [firstpage_image] =>[orig_patent_app_number] => 11131521 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/131521
System and method for determining channel mobility May 17, 2005 Abandoned
Array ( [id] => 5898997 [patent_doc_number] => 20060044000 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-02 [patent_title] => 'Method and apparatus for evaluating semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/131391 [patent_app_country] => US [patent_app_date] => 2005-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6044 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0044/20060044000.pdf [firstpage_image] =>[orig_patent_app_number] => 11131391 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/131391
Method and apparatus for evaluating semiconductor device May 17, 2005 Issued
Array ( [id] => 562147 [patent_doc_number] => 07161364 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-01-09 [patent_title] => 'Dermal phase meter with replaceable probe tips' [patent_app_type] => utility [patent_app_number] => 10/908327 [patent_app_country] => US [patent_app_date] => 2005-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3078 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/161/07161364.pdf [firstpage_image] =>[orig_patent_app_number] => 10908327 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/908327
Dermal phase meter with replaceable probe tips May 5, 2005 Issued
Array ( [id] => 5909781 [patent_doc_number] => 20060125499 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-15 [patent_title] => 'Test apparatus' [patent_app_type] => utility [patent_app_number] => 11/119344 [patent_app_country] => US [patent_app_date] => 2005-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5934 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0125/20060125499.pdf [firstpage_image] =>[orig_patent_app_number] => 11119344 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/119344
Test apparatus Apr 28, 2005 Issued
Array ( [id] => 688000 [patent_doc_number] => 07078888 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-07-18 [patent_title] => 'Electric current measuring device, current sensor, electric trip unit and breaking device comprising such a measuring device' [patent_app_type] => utility [patent_app_number] => 11/117439 [patent_app_country] => US [patent_app_date] => 2005-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 12 [patent_no_of_words] => 3319 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/078/07078888.pdf [firstpage_image] =>[orig_patent_app_number] => 11117439 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/117439
Electric current measuring device, current sensor, electric trip unit and breaking device comprising such a measuring device Apr 28, 2005 Issued
Array ( [id] => 6910345 [patent_doc_number] => 20050174103 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-11 [patent_title] => 'Apparatus and method for determining a current through a power semiconductor component' [patent_app_type] => utility [patent_app_number] => 11/105272 [patent_app_country] => US [patent_app_date] => 2005-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 9132 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20050174103.pdf [firstpage_image] =>[orig_patent_app_number] => 11105272 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/105272
Apparatus and method for determining a current through a power semiconductor component Apr 12, 2005 Issued
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