
Mehran Kamran
Examiner (ID: 13733, Phone: (571)272-3401 , Office: P/2196 )
| Most Active Art Unit | 2196 |
| Art Unit(s) | 2196 |
| Total Applications | 612 |
| Issued Applications | 525 |
| Pending Applications | 49 |
| Abandoned Applications | 49 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4769223
[patent_doc_number] => 20080054881
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-06
[patent_title] => 'Dc Current Sensor'
[patent_app_type] => utility
[patent_app_number] => 11/571881
[patent_app_country] => US
[patent_app_date] => 2005-07-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5760
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0054/20080054881.pdf
[firstpage_image] =>[orig_patent_app_number] => 11571881
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/571881 | Dc Current Sensor | Jul 6, 2005 | Abandoned |
Array
(
[id] => 5139488
[patent_doc_number] => 20070001704
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-04
[patent_title] => 'Method and apparatus for equalization of connection pads'
[patent_app_type] => utility
[patent_app_number] => 11/173836
[patent_app_country] => US
[patent_app_date] => 2005-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5215
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0001/20070001704.pdf
[firstpage_image] =>[orig_patent_app_number] => 11173836
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/173836 | Method and apparatus for equalization of connection pads | Jun 29, 2005 | Abandoned |
Array
(
[id] => 6979697
[patent_doc_number] => 20050289415
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-29
[patent_title] => 'Intelligent probe chips/heads'
[patent_app_type] => utility
[patent_app_number] => 11/165679
[patent_app_country] => US
[patent_app_date] => 2005-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2804
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0289/20050289415.pdf
[firstpage_image] =>[orig_patent_app_number] => 11165679
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/165679 | Intelligent probe chips/heads | Jun 23, 2005 | Abandoned |
Array
(
[id] => 664435
[patent_doc_number] => 07102377
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-09-05
[patent_title] => 'Packaging reliability superchips'
[patent_app_type] => utility
[patent_app_number] => 11/159913
[patent_app_country] => US
[patent_app_date] => 2005-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 9
[patent_no_of_words] => 4365
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 221
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/102/07102377.pdf
[firstpage_image] =>[orig_patent_app_number] => 11159913
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/159913 | Packaging reliability superchips | Jun 22, 2005 | Issued |
Array
(
[id] => 5878657
[patent_doc_number] => 20060028231
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-09
[patent_title] => 'System for manufacturing display panel, method to be used in same, and testing apparatus therefor'
[patent_app_type] => utility
[patent_app_number] => 11/158992
[patent_app_country] => US
[patent_app_date] => 2005-06-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5659
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0028/20060028231.pdf
[firstpage_image] =>[orig_patent_app_number] => 11158992
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/158992 | System for manufacturing display panel, method to be used in same, and testing apparatus therefor | Jun 21, 2005 | Abandoned |
Array
(
[id] => 5763516
[patent_doc_number] => 20060017455
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-01-26
[patent_title] => 'Defect diagnosis method and apparatus for semiconductor integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 11/151263
[patent_app_country] => US
[patent_app_date] => 2005-06-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 3178
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0017/20060017455.pdf
[firstpage_image] =>[orig_patent_app_number] => 11151263
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/151263 | Defect diagnosis method and apparatus for semiconductor integrated circuit | Jun 13, 2005 | Abandoned |
Array
(
[id] => 5713602
[patent_doc_number] => 20060076965
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-13
[patent_title] => 'Contact-free test system for semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/147437
[patent_app_country] => US
[patent_app_date] => 2005-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1469
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0076/20060076965.pdf
[firstpage_image] =>[orig_patent_app_number] => 11147437
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/147437 | Contact-free test system for semiconductor device | Jun 7, 2005 | Abandoned |
Array
(
[id] => 4795693
[patent_doc_number] => 20080007279
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-10
[patent_title] => 'Probe Cards'
[patent_app_type] => utility
[patent_app_number] => 11/628681
[patent_app_country] => US
[patent_app_date] => 2005-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 1986
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0007/20080007279.pdf
[firstpage_image] =>[orig_patent_app_number] => 11628681
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/628681 | Probe Cards | Jun 7, 2005 | Abandoned |
Array
(
[id] => 6929377
[patent_doc_number] => 20050280410
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-22
[patent_title] => 'Test apparatus and method for testing circuit units to be tested'
[patent_app_type] => utility
[patent_app_number] => 11/145610
[patent_app_country] => US
[patent_app_date] => 2005-06-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4288
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0280/20050280410.pdf
[firstpage_image] =>[orig_patent_app_number] => 11145610
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/145610 | Test apparatus and method for testing circuit units to be tested | Jun 5, 2005 | Issued |
Array
(
[id] => 398191
[patent_doc_number] => 07295026
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-11-13
[patent_title] => 'Automated position control of a surface array relative to a liquid microjunction surface sampler'
[patent_app_type] => utility
[patent_app_number] => 11/144882
[patent_app_country] => US
[patent_app_date] => 2005-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 15
[patent_no_of_words] => 7483
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 252
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/295/07295026.pdf
[firstpage_image] =>[orig_patent_app_number] => 11144882
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/144882 | Automated position control of a surface array relative to a liquid microjunction surface sampler | Jun 2, 2005 | Issued |
Array
(
[id] => 4768605
[patent_doc_number] => 20080054260
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-06
[patent_title] => 'Semiconductor Integrated Circuit Device, Method For Testing The Semiconductor Integrated Circuit Device, Semiconductor Wafer And Burn-In Test Apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/661680
[patent_app_country] => US
[patent_app_date] => 2005-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 8943
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0054/20080054260.pdf
[firstpage_image] =>[orig_patent_app_number] => 11661680
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/661680 | Semiconductor Integrated Circuit Device, Method For Testing The Semiconductor Integrated Circuit Device, Semiconductor Wafer And Burn-In Test Apparatus | May 31, 2005 | Abandoned |
Array
(
[id] => 7231376
[patent_doc_number] => 20050270049
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-08
[patent_title] => 'Semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/140963
[patent_app_country] => US
[patent_app_date] => 2005-06-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5874
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0270/20050270049.pdf
[firstpage_image] =>[orig_patent_app_number] => 11140963
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/140963 | Semiconductor device | May 31, 2005 | Abandoned |
Array
(
[id] => 638733
[patent_doc_number] => 07126360
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-10-24
[patent_title] => 'Differential signal acquisition probe having retractable double cushioned probing tips with EOS/ESD protection capabilities'
[patent_app_type] => utility
[patent_app_number] => 11/139079
[patent_app_country] => US
[patent_app_date] => 2005-05-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 17
[patent_no_of_words] => 11734
[patent_no_of_claims] => 37
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 318
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/126/07126360.pdf
[firstpage_image] =>[orig_patent_app_number] => 11139079
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/139079 | Differential signal acquisition probe having retractable double cushioned probing tips with EOS/ESD protection capabilities | May 26, 2005 | Issued |
Array
(
[id] => 7208019
[patent_doc_number] => 20050258856
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-11-24
[patent_title] => 'High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method'
[patent_app_type] => utility
[patent_app_number] => 11/133290
[patent_app_country] => US
[patent_app_date] => 2005-05-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 27007
[patent_no_of_claims] => 42
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0258/20050258856.pdf
[firstpage_image] =>[orig_patent_app_number] => 11133290
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/133290 | High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method | May 19, 2005 | Abandoned |
Array
(
[id] => 5623335
[patent_doc_number] => 20060261840
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-23
[patent_title] => 'System and method for determining channel mobility'
[patent_app_type] => utility
[patent_app_number] => 11/131521
[patent_app_country] => US
[patent_app_date] => 2005-05-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5558
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0261/20060261840.pdf
[firstpage_image] =>[orig_patent_app_number] => 11131521
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/131521 | System and method for determining channel mobility | May 17, 2005 | Abandoned |
Array
(
[id] => 5898997
[patent_doc_number] => 20060044000
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-02
[patent_title] => 'Method and apparatus for evaluating semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/131391
[patent_app_country] => US
[patent_app_date] => 2005-05-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 6044
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0044/20060044000.pdf
[firstpage_image] =>[orig_patent_app_number] => 11131391
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/131391 | Method and apparatus for evaluating semiconductor device | May 17, 2005 | Issued |
Array
(
[id] => 562147
[patent_doc_number] => 07161364
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-01-09
[patent_title] => 'Dermal phase meter with replaceable probe tips'
[patent_app_type] => utility
[patent_app_number] => 10/908327
[patent_app_country] => US
[patent_app_date] => 2005-05-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 3078
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 164
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/161/07161364.pdf
[firstpage_image] =>[orig_patent_app_number] => 10908327
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/908327 | Dermal phase meter with replaceable probe tips | May 5, 2005 | Issued |
Array
(
[id] => 5909781
[patent_doc_number] => 20060125499
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-15
[patent_title] => 'Test apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/119344
[patent_app_country] => US
[patent_app_date] => 2005-04-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5934
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0125/20060125499.pdf
[firstpage_image] =>[orig_patent_app_number] => 11119344
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/119344 | Test apparatus | Apr 28, 2005 | Issued |
Array
(
[id] => 688000
[patent_doc_number] => 07078888
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-07-18
[patent_title] => 'Electric current measuring device, current sensor, electric trip unit and breaking device comprising such a measuring device'
[patent_app_type] => utility
[patent_app_number] => 11/117439
[patent_app_country] => US
[patent_app_date] => 2005-04-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 12
[patent_no_of_words] => 3319
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 86
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/078/07078888.pdf
[firstpage_image] =>[orig_patent_app_number] => 11117439
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/117439 | Electric current measuring device, current sensor, electric trip unit and breaking device comprising such a measuring device | Apr 28, 2005 | Issued |
Array
(
[id] => 6910345
[patent_doc_number] => 20050174103
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-11
[patent_title] => 'Apparatus and method for determining a current through a power semiconductor component'
[patent_app_type] => utility
[patent_app_number] => 11/105272
[patent_app_country] => US
[patent_app_date] => 2005-04-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 9132
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0174/20050174103.pdf
[firstpage_image] =>[orig_patent_app_number] => 11105272
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/105272 | Apparatus and method for determining a current through a power semiconductor component | Apr 12, 2005 | Issued |