Search

Mehran Kamran

Examiner (ID: 13733, Phone: (571)272-3401 , Office: P/2196 )

Most Active Art Unit
2196
Art Unit(s)
2196
Total Applications
612
Issued Applications
525
Pending Applications
49
Abandoned Applications
49

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5635355 [patent_doc_number] => 20060066328 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-30 [patent_title] => 'Buckling beam probe test assembly' [patent_app_type] => utility [patent_app_number] => 10/955107 [patent_app_country] => US [patent_app_date] => 2004-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6329 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20060066328.pdf [firstpage_image] =>[orig_patent_app_number] => 10955107 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/955107
Buckling beam probe test assembly Sep 29, 2004 Abandoned
Array ( [id] => 6916006 [patent_doc_number] => 20050093567 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-05 [patent_title] => 'Inspection method and inspection device for display device and active matrix substrate used for display device' [patent_app_type] => utility [patent_app_number] => 10/944682 [patent_app_country] => US [patent_app_date] => 2004-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 10200 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0093/20050093567.pdf [firstpage_image] =>[orig_patent_app_number] => 10944682 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/944682
Inspection method and inspection device for display device and active matrix substrate used for display device Sep 16, 2004 Issued
Array ( [id] => 541740 [patent_doc_number] => 07176703 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-13 [patent_title] => 'Test probe with thermally activated grip and release' [patent_app_type] => utility [patent_app_number] => 10/930183 [patent_app_country] => US [patent_app_date] => 2004-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 32 [patent_no_of_words] => 3165 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/176/07176703.pdf [firstpage_image] =>[orig_patent_app_number] => 10930183 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/930183
Test probe with thermally activated grip and release Aug 30, 2004 Issued
Array ( [id] => 5589125 [patent_doc_number] => 20060038576 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-23 [patent_title] => 'Sort interface unit having probe capacitors' [patent_app_type] => utility [patent_app_number] => 10/922323 [patent_app_country] => US [patent_app_date] => 2004-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3313 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20060038576.pdf [firstpage_image] =>[orig_patent_app_number] => 10922323 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/922323
Sort interface unit having probe capacitors Aug 18, 2004 Abandoned
Array ( [id] => 651404 [patent_doc_number] => 07112982 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-26 [patent_title] => 'Method for evaluating semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/900109 [patent_app_country] => US [patent_app_date] => 2004-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 23 [patent_no_of_words] => 6432 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/112/07112982.pdf [firstpage_image] =>[orig_patent_app_number] => 10900109 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/900109
Method for evaluating semiconductor device Jul 27, 2004 Issued
Array ( [id] => 5818358 [patent_doc_number] => 20060022671 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-02 [patent_title] => 'AN APPARATUS AND METHOD FOR TRANSMISSION AND REMOTE SENSING OF SIGNALS FROM INTEGRATED CIRCUIT DEVICES' [patent_app_type] => utility [patent_app_number] => 10/710683 [patent_app_country] => US [patent_app_date] => 2004-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3365 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0022/20060022671.pdf [firstpage_image] =>[orig_patent_app_number] => 10710683 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/710683
Apparatus and method for transmission and remote sensing of signals from integrated circuit devices Jul 27, 2004 Issued
Array ( [id] => 730803 [patent_doc_number] => 07042239 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-05-09 [patent_title] => 'Arrangement for manual disengagement of a device interface board from a personal tester' [patent_app_type] => utility [patent_app_number] => 10/877479 [patent_app_country] => US [patent_app_date] => 2004-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 1706 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/042/07042239.pdf [firstpage_image] =>[orig_patent_app_number] => 10877479 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/877479
Arrangement for manual disengagement of a device interface board from a personal tester Jun 24, 2004 Issued
Array ( [id] => 717520 [patent_doc_number] => 07053600 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-30 [patent_title] => 'Current sensor' [patent_app_type] => utility [patent_app_number] => 10/874314 [patent_app_country] => US [patent_app_date] => 2004-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 3261 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/053/07053600.pdf [firstpage_image] =>[orig_patent_app_number] => 10874314 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/874314
Current sensor Jun 23, 2004 Issued
Array ( [id] => 6975897 [patent_doc_number] => 20050285612 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-29 [patent_title] => 'Apparatus for measuring DC parameters in a wafer burn-in system' [patent_app_type] => utility [patent_app_number] => 10/875121 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2564 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0285/20050285612.pdf [firstpage_image] =>[orig_patent_app_number] => 10875121 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/875121
Apparatus for measuring DC parameters in a wafer burn-in system Jun 22, 2004 Abandoned
Array ( [id] => 7148955 [patent_doc_number] => 20050024078 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-03 [patent_title] => 'Device for making pass/fail judgement of semiconductor integrated circuit' [patent_app_type] => utility [patent_app_number] => 10/873622 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3003 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20050024078.pdf [firstpage_image] =>[orig_patent_app_number] => 10873622 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/873622
Device for making pass/fail judgement of semiconductor integrated circuit Jun 22, 2004 Abandoned
Array ( [id] => 7315791 [patent_doc_number] => 20040223358 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-11-11 [patent_title] => 'Semiconductor test apparatus' [patent_app_type] => new [patent_app_number] => 10/871113 [patent_app_country] => US [patent_app_date] => 2004-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 8347 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0223/20040223358.pdf [firstpage_image] =>[orig_patent_app_number] => 10871113 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/871113
Semiconductor test apparatus Jun 17, 2004 Issued
Array ( [id] => 5600024 [patent_doc_number] => 20060290369 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Electronic part test device' [patent_app_type] => utility [patent_app_number] => 10/558833 [patent_app_country] => US [patent_app_date] => 2004-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 16487 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290369.pdf [firstpage_image] =>[orig_patent_app_number] => 10558833 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/558833
Electronic part test device May 27, 2004 Abandoned
Array ( [id] => 762535 [patent_doc_number] => 07012444 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-14 [patent_title] => 'Semiconductor tester' [patent_app_type] => utility [patent_app_number] => 10/848823 [patent_app_country] => US [patent_app_date] => 2004-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5596 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/012/07012444.pdf [firstpage_image] =>[orig_patent_app_number] => 10848823 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/848823
Semiconductor tester May 18, 2004 Issued
Array ( [id] => 225412 [patent_doc_number] => 07605598 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-20 [patent_title] => 'Undercurrent sense arrangement and method' [patent_app_type] => utility [patent_app_number] => 10/561783 [patent_app_country] => US [patent_app_date] => 2004-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2720 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 203 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/605/07605598.pdf [firstpage_image] =>[orig_patent_app_number] => 10561783 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/561783
Undercurrent sense arrangement and method May 13, 2004 Issued
Array ( [id] => 5612195 [patent_doc_number] => 20060114122 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-01 [patent_title] => 'Power line inspection vehicle' [patent_app_type] => utility [patent_app_number] => 10/554483 [patent_app_country] => US [patent_app_date] => 2004-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5678 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0114/20060114122.pdf [firstpage_image] =>[orig_patent_app_number] => 10554483 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/554483
Power line inspection vehicle Apr 29, 2004 Abandoned
Array ( [id] => 7292330 [patent_doc_number] => 20040212381 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-28 [patent_title] => 'Inspection coaxial probe and inspection unit incorporating the same' [patent_app_type] => new [patent_app_number] => 10/830220 [patent_app_country] => US [patent_app_date] => 2004-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7351 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20040212381.pdf [firstpage_image] =>[orig_patent_app_number] => 10830220 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/830220
Inspection coaxial probe and inspection unit incorporating the same Apr 22, 2004 Issued
Array ( [id] => 289465 [patent_doc_number] => 07548082 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-16 [patent_title] => 'Inspection probe' [patent_app_type] => utility [patent_app_number] => 10/553580 [patent_app_country] => US [patent_app_date] => 2004-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 8624 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 216 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/548/07548082.pdf [firstpage_image] =>[orig_patent_app_number] => 10553580 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/553580
Inspection probe Apr 14, 2004 Issued
Array ( [id] => 7175709 [patent_doc_number] => 20040201372 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-14 [patent_title] => 'Method and apparatus for testing driver circuits of AMOLED' [patent_app_type] => new [patent_app_number] => 10/822750 [patent_app_country] => US [patent_app_date] => 2004-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2610 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20040201372.pdf [firstpage_image] =>[orig_patent_app_number] => 10822750 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/822750
Method and apparatus for testing driver circuits of AMOLED Apr 12, 2004 Issued
Array ( [id] => 541563 [patent_doc_number] => 07184626 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-02-27 [patent_title] => 'Wafer-level testing of optical and optoelectronic chips' [patent_app_type] => utility [patent_app_number] => 10/820631 [patent_app_country] => US [patent_app_date] => 2004-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 33 [patent_no_of_words] => 12986 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/184/07184626.pdf [firstpage_image] =>[orig_patent_app_number] => 10820631 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/820631
Wafer-level testing of optical and optoelectronic chips Apr 6, 2004 Issued
Array ( [id] => 6994477 [patent_doc_number] => 20050134253 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-23 [patent_title] => 'Current sensor' [patent_app_type] => utility [patent_app_number] => 10/813979 [patent_app_country] => US [patent_app_date] => 2004-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1901 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20050134253.pdf [firstpage_image] =>[orig_patent_app_number] => 10813979 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/813979
Current sensor Mar 28, 2004 Abandoned
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