
Mehran Kamran
Examiner (ID: 13733, Phone: (571)272-3401 , Office: P/2196 )
| Most Active Art Unit | 2196 |
| Art Unit(s) | 2196 |
| Total Applications | 612 |
| Issued Applications | 525 |
| Pending Applications | 49 |
| Abandoned Applications | 49 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5635355
[patent_doc_number] => 20060066328
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-30
[patent_title] => 'Buckling beam probe test assembly'
[patent_app_type] => utility
[patent_app_number] => 10/955107
[patent_app_country] => US
[patent_app_date] => 2004-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 6329
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0066/20060066328.pdf
[firstpage_image] =>[orig_patent_app_number] => 10955107
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/955107 | Buckling beam probe test assembly | Sep 29, 2004 | Abandoned |
Array
(
[id] => 6916006
[patent_doc_number] => 20050093567
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-05-05
[patent_title] => 'Inspection method and inspection device for display device and active matrix substrate used for display device'
[patent_app_type] => utility
[patent_app_number] => 10/944682
[patent_app_country] => US
[patent_app_date] => 2004-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 10200
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0093/20050093567.pdf
[firstpage_image] =>[orig_patent_app_number] => 10944682
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/944682 | Inspection method and inspection device for display device and active matrix substrate used for display device | Sep 16, 2004 | Issued |
Array
(
[id] => 541740
[patent_doc_number] => 07176703
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-02-13
[patent_title] => 'Test probe with thermally activated grip and release'
[patent_app_type] => utility
[patent_app_number] => 10/930183
[patent_app_country] => US
[patent_app_date] => 2004-08-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 32
[patent_no_of_words] => 3165
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/176/07176703.pdf
[firstpage_image] =>[orig_patent_app_number] => 10930183
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/930183 | Test probe with thermally activated grip and release | Aug 30, 2004 | Issued |
Array
(
[id] => 5589125
[patent_doc_number] => 20060038576
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-23
[patent_title] => 'Sort interface unit having probe capacitors'
[patent_app_type] => utility
[patent_app_number] => 10/922323
[patent_app_country] => US
[patent_app_date] => 2004-08-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3313
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0038/20060038576.pdf
[firstpage_image] =>[orig_patent_app_number] => 10922323
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/922323 | Sort interface unit having probe capacitors | Aug 18, 2004 | Abandoned |
Array
(
[id] => 651404
[patent_doc_number] => 07112982
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-26
[patent_title] => 'Method for evaluating semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 10/900109
[patent_app_country] => US
[patent_app_date] => 2004-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 23
[patent_no_of_words] => 6432
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 95
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/112/07112982.pdf
[firstpage_image] =>[orig_patent_app_number] => 10900109
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/900109 | Method for evaluating semiconductor device | Jul 27, 2004 | Issued |
Array
(
[id] => 5818358
[patent_doc_number] => 20060022671
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-02
[patent_title] => 'AN APPARATUS AND METHOD FOR TRANSMISSION AND REMOTE SENSING OF SIGNALS FROM INTEGRATED CIRCUIT DEVICES'
[patent_app_type] => utility
[patent_app_number] => 10/710683
[patent_app_country] => US
[patent_app_date] => 2004-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3365
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0022/20060022671.pdf
[firstpage_image] =>[orig_patent_app_number] => 10710683
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/710683 | Apparatus and method for transmission and remote sensing of signals from integrated circuit devices | Jul 27, 2004 | Issued |
Array
(
[id] => 730803
[patent_doc_number] => 07042239
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-05-09
[patent_title] => 'Arrangement for manual disengagement of a device interface board from a personal tester'
[patent_app_type] => utility
[patent_app_number] => 10/877479
[patent_app_country] => US
[patent_app_date] => 2004-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 1706
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 234
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/042/07042239.pdf
[firstpage_image] =>[orig_patent_app_number] => 10877479
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/877479 | Arrangement for manual disengagement of a device interface board from a personal tester | Jun 24, 2004 | Issued |
Array
(
[id] => 717520
[patent_doc_number] => 07053600
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-05-30
[patent_title] => 'Current sensor'
[patent_app_type] => utility
[patent_app_number] => 10/874314
[patent_app_country] => US
[patent_app_date] => 2004-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 6
[patent_no_of_words] => 3261
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 27
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/053/07053600.pdf
[firstpage_image] =>[orig_patent_app_number] => 10874314
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/874314 | Current sensor | Jun 23, 2004 | Issued |
Array
(
[id] => 6975897
[patent_doc_number] => 20050285612
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-29
[patent_title] => 'Apparatus for measuring DC parameters in a wafer burn-in system'
[patent_app_type] => utility
[patent_app_number] => 10/875121
[patent_app_country] => US
[patent_app_date] => 2004-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2564
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0285/20050285612.pdf
[firstpage_image] =>[orig_patent_app_number] => 10875121
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/875121 | Apparatus for measuring DC parameters in a wafer burn-in system | Jun 22, 2004 | Abandoned |
Array
(
[id] => 7148955
[patent_doc_number] => 20050024078
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-03
[patent_title] => 'Device for making pass/fail judgement of semiconductor integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 10/873622
[patent_app_country] => US
[patent_app_date] => 2004-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3003
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0024/20050024078.pdf
[firstpage_image] =>[orig_patent_app_number] => 10873622
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/873622 | Device for making pass/fail judgement of semiconductor integrated circuit | Jun 22, 2004 | Abandoned |
Array
(
[id] => 7315791
[patent_doc_number] => 20040223358
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-11-11
[patent_title] => 'Semiconductor test apparatus'
[patent_app_type] => new
[patent_app_number] => 10/871113
[patent_app_country] => US
[patent_app_date] => 2004-06-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 8347
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0223/20040223358.pdf
[firstpage_image] =>[orig_patent_app_number] => 10871113
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/871113 | Semiconductor test apparatus | Jun 17, 2004 | Issued |
Array
(
[id] => 5600024
[patent_doc_number] => 20060290369
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-28
[patent_title] => 'Electronic part test device'
[patent_app_type] => utility
[patent_app_number] => 10/558833
[patent_app_country] => US
[patent_app_date] => 2004-05-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 22
[patent_figures_cnt] => 22
[patent_no_of_words] => 16487
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0290/20060290369.pdf
[firstpage_image] =>[orig_patent_app_number] => 10558833
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/558833 | Electronic part test device | May 27, 2004 | Abandoned |
Array
(
[id] => 762535
[patent_doc_number] => 07012444
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-03-14
[patent_title] => 'Semiconductor tester'
[patent_app_type] => utility
[patent_app_number] => 10/848823
[patent_app_country] => US
[patent_app_date] => 2004-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5596
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 164
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/012/07012444.pdf
[firstpage_image] =>[orig_patent_app_number] => 10848823
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/848823 | Semiconductor tester | May 18, 2004 | Issued |
Array
(
[id] => 225412
[patent_doc_number] => 07605598
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-10-20
[patent_title] => 'Undercurrent sense arrangement and method'
[patent_app_type] => utility
[patent_app_number] => 10/561783
[patent_app_country] => US
[patent_app_date] => 2004-05-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2720
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 203
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/605/07605598.pdf
[firstpage_image] =>[orig_patent_app_number] => 10561783
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/561783 | Undercurrent sense arrangement and method | May 13, 2004 | Issued |
Array
(
[id] => 5612195
[patent_doc_number] => 20060114122
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-01
[patent_title] => 'Power line inspection vehicle'
[patent_app_type] => utility
[patent_app_number] => 10/554483
[patent_app_country] => US
[patent_app_date] => 2004-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5678
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0114/20060114122.pdf
[firstpage_image] =>[orig_patent_app_number] => 10554483
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/554483 | Power line inspection vehicle | Apr 29, 2004 | Abandoned |
Array
(
[id] => 7292330
[patent_doc_number] => 20040212381
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-10-28
[patent_title] => 'Inspection coaxial probe and inspection unit incorporating the same'
[patent_app_type] => new
[patent_app_number] => 10/830220
[patent_app_country] => US
[patent_app_date] => 2004-04-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 7351
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0212/20040212381.pdf
[firstpage_image] =>[orig_patent_app_number] => 10830220
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/830220 | Inspection coaxial probe and inspection unit incorporating the same | Apr 22, 2004 | Issued |
Array
(
[id] => 289465
[patent_doc_number] => 07548082
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-16
[patent_title] => 'Inspection probe'
[patent_app_type] => utility
[patent_app_number] => 10/553580
[patent_app_country] => US
[patent_app_date] => 2004-04-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 8624
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 216
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/548/07548082.pdf
[firstpage_image] =>[orig_patent_app_number] => 10553580
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/553580 | Inspection probe | Apr 14, 2004 | Issued |
Array
(
[id] => 7175709
[patent_doc_number] => 20040201372
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-10-14
[patent_title] => 'Method and apparatus for testing driver circuits of AMOLED'
[patent_app_type] => new
[patent_app_number] => 10/822750
[patent_app_country] => US
[patent_app_date] => 2004-04-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2610
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 70
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0201/20040201372.pdf
[firstpage_image] =>[orig_patent_app_number] => 10822750
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/822750 | Method and apparatus for testing driver circuits of AMOLED | Apr 12, 2004 | Issued |
Array
(
[id] => 541563
[patent_doc_number] => 07184626
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-02-27
[patent_title] => 'Wafer-level testing of optical and optoelectronic chips'
[patent_app_type] => utility
[patent_app_number] => 10/820631
[patent_app_country] => US
[patent_app_date] => 2004-04-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 33
[patent_no_of_words] => 12986
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/184/07184626.pdf
[firstpage_image] =>[orig_patent_app_number] => 10820631
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/820631 | Wafer-level testing of optical and optoelectronic chips | Apr 6, 2004 | Issued |
Array
(
[id] => 6994477
[patent_doc_number] => 20050134253
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-23
[patent_title] => 'Current sensor'
[patent_app_type] => utility
[patent_app_number] => 10/813979
[patent_app_country] => US
[patent_app_date] => 2004-03-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1901
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0134/20050134253.pdf
[firstpage_image] =>[orig_patent_app_number] => 10813979
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/813979 | Current sensor | Mar 28, 2004 | Abandoned |