Search

Michael A. Brown

Examiner (ID: 3958)

Most Active Art Unit
3772
Art Unit(s)
3733, 3301, 3772, 3709, 2899, 3764
Total Applications
3915
Issued Applications
3110
Pending Applications
248
Abandoned Applications
556

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19369088 [patent_doc_number] => 12061167 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-13 [patent_title] => Desorber for a spectrometer [patent_app_type] => utility [patent_app_number] => 18/153031 [patent_app_country] => US [patent_app_date] => 2023-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 16 [patent_no_of_words] => 15525 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18153031 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/153031
Desorber for a spectrometer Jan 10, 2023 Issued
Array ( [id] => 18857187 [patent_doc_number] => 11854778 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-26 [patent_title] => Mass spectrometry imaging with substance identification using ion mobility [patent_app_type] => utility [patent_app_number] => 18/149189 [patent_app_country] => US [patent_app_date] => 2023-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 5645 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18149189 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/149189
Mass spectrometry imaging with substance identification using ion mobility Jan 2, 2023 Issued
Array ( [id] => 18361446 [patent_doc_number] => 20230143037 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-11 [patent_title] => SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES [patent_app_type] => utility [patent_app_number] => 18/148647 [patent_app_country] => US [patent_app_date] => 2022-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7811 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18148647 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/148647
SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES Dec 29, 2022 Abandoned
Array ( [id] => 18472965 [patent_doc_number] => 20230207253 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => ELECTRON-OPTICAL DEVICE, METHOD OF COMPENSATING FOR VARIATIONS IN A PROPERTY OF SUB-BEAMS [patent_app_type] => utility [patent_app_number] => 18/088497 [patent_app_country] => US [patent_app_date] => 2022-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 27000 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18088497 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/088497
ELECTRON-OPTICAL DEVICE, METHOD OF COMPENSATING FOR VARIATIONS IN A PROPERTY OF SUB-BEAMS Dec 22, 2022 Pending
Array ( [id] => 19200515 [patent_doc_number] => 11997778 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-28 [patent_title] => Replacement and refill method for droplet generator [patent_app_type] => utility [patent_app_number] => 18/064156 [patent_app_country] => US [patent_app_date] => 2022-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 13953 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18064156 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/064156
Replacement and refill method for droplet generator Dec 8, 2022 Issued
Array ( [id] => 20244077 [patent_doc_number] => 12424407 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-23 [patent_title] => Inspection device and inspection method [patent_app_type] => utility [patent_app_number] => 18/077635 [patent_app_country] => US [patent_app_date] => 2022-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 17 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 227 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18077635 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/077635
Inspection device and inspection method Dec 7, 2022 Issued
Array ( [id] => 19779516 [patent_doc_number] => 12228546 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-02-18 [patent_title] => Mobility based filtering of ions [patent_app_type] => utility [patent_app_number] => 18/074630 [patent_app_country] => US [patent_app_date] => 2022-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8994 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18074630 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/074630
Mobility based filtering of ions Dec 4, 2022 Issued
Array ( [id] => 18406923 [patent_doc_number] => 20230168274 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM [patent_app_type] => utility [patent_app_number] => 18/070659 [patent_app_country] => US [patent_app_date] => 2022-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 17389 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -32 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18070659 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/070659
Probe tip X-Y location identification using a charged particle beam Nov 28, 2022 Issued
Array ( [id] => 20216073 [patent_doc_number] => 12412727 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-09 [patent_title] => Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof [patent_app_type] => utility [patent_app_number] => 17/991168 [patent_app_country] => US [patent_app_date] => 2022-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3690 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17991168 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/991168
Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof Nov 20, 2022 Issued
Array ( [id] => 18394724 [patent_doc_number] => 20230162945 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-25 [patent_title] => Method Of Imaging And Milling A Sample [patent_app_type] => utility [patent_app_number] => 17/989550 [patent_app_country] => US [patent_app_date] => 2022-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9568 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17989550 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/989550
Method Of Imaging And Milling A Sample Nov 16, 2022 Pending
Array ( [id] => 19158962 [patent_doc_number] => 20240151669 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-09 [patent_title] => ELECTRICAL IMPEDANCE MEASUREMENT USING AN ELECTRON BEAM [patent_app_type] => utility [patent_app_number] => 17/984041 [patent_app_country] => US [patent_app_date] => 2022-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6212 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17984041 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/984041
Electrical impedance measurement using an electron beam Nov 8, 2022 Issued
Array ( [id] => 19161031 [patent_doc_number] => 20240153738 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-09 [patent_title] => PRECISION IN STEREOSCOPIC MEASUREMENTS USING A PRE-DEPOSITION LAYER [patent_app_type] => utility [patent_app_number] => 17/983225 [patent_app_country] => US [patent_app_date] => 2022-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7384 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17983225 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/983225
PRECISION IN STEREOSCOPIC MEASUREMENTS USING A PRE-DEPOSITION LAYER Nov 7, 2022 Pending
Array ( [id] => 19161030 [patent_doc_number] => 20240153737 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-09 [patent_title] => TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD [patent_app_type] => utility [patent_app_number] => 17/981141 [patent_app_country] => US [patent_app_date] => 2022-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11239 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -27 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17981141 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/981141
Tilt-column multi-beam electron microscopy system and method Nov 3, 2022 Issued
Array ( [id] => 18347491 [patent_doc_number] => 20230135601 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-04 [patent_title] => Phase Analyzer, Sample Analyzer, and Analysis Method [patent_app_type] => utility [patent_app_number] => 17/978518 [patent_app_country] => US [patent_app_date] => 2022-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9429 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17978518 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/978518
Phase analyzer, sample analyzer, and analysis method Oct 31, 2022 Issued
Array ( [id] => 18267709 [patent_doc_number] => 20230088951 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-23 [patent_title] => PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/051196 [patent_app_country] => US [patent_app_date] => 2022-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11071 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18051196 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/051196
Pattern inspection apparatus and pattern inspection method Oct 30, 2022 Issued
Array ( [id] => 19084080 [patent_doc_number] => 20240110881 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-04 [patent_title] => Systems And Methods For Detecting Beam Displacement [patent_app_type] => utility [patent_app_number] => 18/051170 [patent_app_country] => US [patent_app_date] => 2022-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9311 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18051170 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/051170
Systems and methods for detecting beam displacement Oct 30, 2022 Issued
Array ( [id] => 18570407 [patent_doc_number] => 20230260744 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-17 [patent_title] => METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUCT, AND MATERIAL PROCESSING DEVICE FOR CARRYING OUT THE METHOD [patent_app_type] => utility [patent_app_number] => 17/974702 [patent_app_country] => US [patent_app_date] => 2022-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 22457 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 250 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17974702 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/974702
METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUCT, AND MATERIAL PROCESSING DEVICE FOR CARRYING OUT THE METHOD Oct 26, 2022 Pending
Array ( [id] => 20455884 [patent_doc_number] => 12518944 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-06 [patent_title] => Electron microscope and image acquisition method [patent_app_type] => utility [patent_app_number] => 17/973993 [patent_app_country] => US [patent_app_date] => 2022-10-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 2387 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17973993 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/973993
Electron microscope and image acquisition method Oct 25, 2022 Issued
Array ( [id] => 18857172 [patent_doc_number] => 11854763 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-12-26 [patent_title] => Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof [patent_app_type] => utility [patent_app_number] => 18/046508 [patent_app_country] => US [patent_app_date] => 2022-10-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 6568 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18046508 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/046508
Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof Oct 13, 2022 Issued
Array ( [id] => 20189703 [patent_doc_number] => 12400826 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-26 [patent_title] => Charged particle beam device [patent_app_type] => utility [patent_app_number] => 17/964328 [patent_app_country] => US [patent_app_date] => 2022-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 1260 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 258 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17964328 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/964328
Charged particle beam device Oct 11, 2022 Issued
Menu