
Michael A. Brown
Examiner (ID: 3958)
| Most Active Art Unit | 3772 |
| Art Unit(s) | 3733, 3301, 3772, 3709, 2899, 3764 |
| Total Applications | 3915 |
| Issued Applications | 3110 |
| Pending Applications | 248 |
| Abandoned Applications | 556 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 19369088
[patent_doc_number] => 12061167
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-08-13
[patent_title] => Desorber for a spectrometer
[patent_app_type] => utility
[patent_app_number] => 18/153031
[patent_app_country] => US
[patent_app_date] => 2023-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 16
[patent_no_of_words] => 15525
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18153031
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/153031 | Desorber for a spectrometer | Jan 10, 2023 | Issued |
Array
(
[id] => 18857187
[patent_doc_number] => 11854778
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-12-26
[patent_title] => Mass spectrometry imaging with substance identification using ion mobility
[patent_app_type] => utility
[patent_app_number] => 18/149189
[patent_app_country] => US
[patent_app_date] => 2023-01-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 5645
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 215
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18149189
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/149189 | Mass spectrometry imaging with substance identification using ion mobility | Jan 2, 2023 | Issued |
Array
(
[id] => 18361446
[patent_doc_number] => 20230143037
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-05-11
[patent_title] => SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES
[patent_app_type] => utility
[patent_app_number] => 18/148647
[patent_app_country] => US
[patent_app_date] => 2022-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7811
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18148647
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/148647 | SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES | Dec 29, 2022 | Abandoned |
Array
(
[id] => 18472965
[patent_doc_number] => 20230207253
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-29
[patent_title] => ELECTRON-OPTICAL DEVICE, METHOD OF COMPENSATING FOR VARIATIONS IN A PROPERTY OF SUB-BEAMS
[patent_app_type] => utility
[patent_app_number] => 18/088497
[patent_app_country] => US
[patent_app_date] => 2022-12-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 27000
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 122
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18088497
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/088497 | ELECTRON-OPTICAL DEVICE, METHOD OF COMPENSATING FOR VARIATIONS IN A PROPERTY OF SUB-BEAMS | Dec 22, 2022 | Pending |
Array
(
[id] => 19200515
[patent_doc_number] => 11997778
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-05-28
[patent_title] => Replacement and refill method for droplet generator
[patent_app_type] => utility
[patent_app_number] => 18/064156
[patent_app_country] => US
[patent_app_date] => 2022-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 17
[patent_no_of_words] => 13953
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 66
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18064156
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/064156 | Replacement and refill method for droplet generator | Dec 8, 2022 | Issued |
Array
(
[id] => 20244077
[patent_doc_number] => 12424407
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-23
[patent_title] => Inspection device and inspection method
[patent_app_type] => utility
[patent_app_number] => 18/077635
[patent_app_country] => US
[patent_app_date] => 2022-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 17
[patent_no_of_words] => 0
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 227
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18077635
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/077635 | Inspection device and inspection method | Dec 7, 2022 | Issued |
Array
(
[id] => 19779516
[patent_doc_number] => 12228546
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-02-18
[patent_title] => Mobility based filtering of ions
[patent_app_type] => utility
[patent_app_number] => 18/074630
[patent_app_country] => US
[patent_app_date] => 2022-12-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 8994
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 207
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18074630
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/074630 | Mobility based filtering of ions | Dec 4, 2022 | Issued |
Array
(
[id] => 18406923
[patent_doc_number] => 20230168274
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-01
[patent_title] => PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM
[patent_app_type] => utility
[patent_app_number] => 18/070659
[patent_app_country] => US
[patent_app_date] => 2022-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 17389
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -32
[patent_words_short_claim] => 122
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18070659
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/070659 | Probe tip X-Y location identification using a charged particle beam | Nov 28, 2022 | Issued |
Array
(
[id] => 20216073
[patent_doc_number] => 12412727
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-09
[patent_title] => Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof
[patent_app_type] => utility
[patent_app_number] => 17/991168
[patent_app_country] => US
[patent_app_date] => 2022-11-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 3690
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 82
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17991168
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/991168 | Charged particle beam system, corrector for aberration correction of a charged particle beam, and method thereof | Nov 20, 2022 | Issued |
Array
(
[id] => 18394724
[patent_doc_number] => 20230162945
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-05-25
[patent_title] => Method Of Imaging And Milling A Sample
[patent_app_type] => utility
[patent_app_number] => 17/989550
[patent_app_country] => US
[patent_app_date] => 2022-11-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9568
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 96
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17989550
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/989550 | Method Of Imaging And Milling A Sample | Nov 16, 2022 | Pending |
Array
(
[id] => 19158962
[patent_doc_number] => 20240151669
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-09
[patent_title] => ELECTRICAL IMPEDANCE MEASUREMENT USING AN ELECTRON BEAM
[patent_app_type] => utility
[patent_app_number] => 17/984041
[patent_app_country] => US
[patent_app_date] => 2022-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6212
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 172
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17984041
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/984041 | Electrical impedance measurement using an electron beam | Nov 8, 2022 | Issued |
Array
(
[id] => 19161031
[patent_doc_number] => 20240153738
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-09
[patent_title] => PRECISION IN STEREOSCOPIC MEASUREMENTS USING A PRE-DEPOSITION LAYER
[patent_app_type] => utility
[patent_app_number] => 17/983225
[patent_app_country] => US
[patent_app_date] => 2022-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7384
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 157
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17983225
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/983225 | PRECISION IN STEREOSCOPIC MEASUREMENTS USING A PRE-DEPOSITION LAYER | Nov 7, 2022 | Pending |
Array
(
[id] => 19161030
[patent_doc_number] => 20240153737
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-09
[patent_title] => TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD
[patent_app_type] => utility
[patent_app_number] => 17/981141
[patent_app_country] => US
[patent_app_date] => 2022-11-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11239
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -27
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17981141
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/981141 | Tilt-column multi-beam electron microscopy system and method | Nov 3, 2022 | Issued |
Array
(
[id] => 18347491
[patent_doc_number] => 20230135601
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-05-04
[patent_title] => Phase Analyzer, Sample Analyzer, and Analysis Method
[patent_app_type] => utility
[patent_app_number] => 17/978518
[patent_app_country] => US
[patent_app_date] => 2022-11-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9429
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17978518
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/978518 | Phase analyzer, sample analyzer, and analysis method | Oct 31, 2022 | Issued |
Array
(
[id] => 18267709
[patent_doc_number] => 20230088951
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-23
[patent_title] => PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 18/051196
[patent_app_country] => US
[patent_app_date] => 2022-10-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 11071
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 212
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18051196
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/051196 | Pattern inspection apparatus and pattern inspection method | Oct 30, 2022 | Issued |
Array
(
[id] => 19084080
[patent_doc_number] => 20240110881
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-04
[patent_title] => Systems And Methods For Detecting Beam Displacement
[patent_app_type] => utility
[patent_app_number] => 18/051170
[patent_app_country] => US
[patent_app_date] => 2022-10-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9311
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 80
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18051170
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/051170 | Systems and methods for detecting beam displacement | Oct 30, 2022 | Issued |
Array
(
[id] => 18570407
[patent_doc_number] => 20230260744
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-08-17
[patent_title] => METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUCT, AND MATERIAL PROCESSING DEVICE FOR CARRYING OUT THE METHOD
[patent_app_type] => utility
[patent_app_number] => 17/974702
[patent_app_country] => US
[patent_app_date] => 2022-10-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 22457
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -19
[patent_words_short_claim] => 250
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17974702
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/974702 | METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUCT, AND MATERIAL PROCESSING DEVICE FOR CARRYING OUT THE METHOD | Oct 26, 2022 | Pending |
Array
(
[id] => 20455884
[patent_doc_number] => 12518944
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-01-06
[patent_title] => Electron microscope and image acquisition method
[patent_app_type] => utility
[patent_app_number] => 17/973993
[patent_app_country] => US
[patent_app_date] => 2022-10-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 2387
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 187
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17973993
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/973993 | Electron microscope and image acquisition method | Oct 25, 2022 | Issued |
Array
(
[id] => 18857172
[patent_doc_number] => 11854763
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2023-12-26
[patent_title] => Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof
[patent_app_type] => utility
[patent_app_number] => 18/046508
[patent_app_country] => US
[patent_app_date] => 2022-10-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 24
[patent_no_of_words] => 6568
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 70
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18046508
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/046508 | Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof | Oct 13, 2022 | Issued |
Array
(
[id] => 20189703
[patent_doc_number] => 12400826
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-08-26
[patent_title] => Charged particle beam device
[patent_app_type] => utility
[patent_app_number] => 17/964328
[patent_app_country] => US
[patent_app_date] => 2022-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 9
[patent_no_of_words] => 1260
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 258
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17964328
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/964328 | Charged particle beam device | Oct 11, 2022 | Issued |