Search

Michael A. Lyons

Examiner (ID: 3948, Phone: (571)272-2420 , Office: P/2877 )

Most Active Art Unit
2877
Art Unit(s)
2877
Total Applications
1696
Issued Applications
1407
Pending Applications
125
Abandoned Applications
181

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 11964810 [patent_doc_number] => 20170268963 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-09-21 [patent_title] => 'STRUCTURED LIGHT MEASURING APPARATUS AND METHODS' [patent_app_type] => utility [patent_app_number] => 15/072560 [patent_app_country] => US [patent_app_date] => 2016-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3373 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15072560 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/072560
Structured light measuring apparatus and methods Mar 16, 2016 Issued
Array ( [id] => 12220672 [patent_doc_number] => 20180059032 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-03-01 [patent_title] => 'DEVICE AND METHOD FOR DETECTING DEFECTS IN BONDING ZONES BETWEEN SAMPLES SUCH AS WAFERS' [patent_app_type] => utility [patent_app_number] => 15/556988 [patent_app_country] => US [patent_app_date] => 2016-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6209 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15556988 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/556988
DEVICE AND METHOD FOR DETECTING DEFECTS IN BONDING ZONES BETWEEN SAMPLES SUCH AS WAFERS Mar 9, 2016 Abandoned
Array ( [id] => 11402934 [patent_doc_number] => 20170023472 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-01-26 [patent_title] => 'APPARATUS AND METHOD FOR QUANTITIVE PHASE TOMOGRAPHY THROUGH LINEAR SCANNING WITH COHERENT AND NON-COHERENT DETECTION' [patent_app_type] => utility [patent_app_number] => 15/062092 [patent_app_country] => US [patent_app_date] => 2016-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9530 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15062092 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/062092
Apparatus and method for quantitive phase tomography through linear scanning with coherent and non-coherent detection Mar 4, 2016 Issued
Array ( [id] => 12390600 [patent_doc_number] => 09964442 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-05-08 [patent_title] => Terahertz spectroscopy system and method [patent_app_type] => utility [patent_app_number] => 15/056245 [patent_app_country] => US [patent_app_date] => 2016-02-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 17 [patent_no_of_words] => 11350 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15056245 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/056245
Terahertz spectroscopy system and method Feb 28, 2016 Issued
Array ( [id] => 13843419 [patent_doc_number] => 20190025194 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-01-24 [patent_title] => METROLOGY DEVICE AND METROLOGY METHOD [patent_app_type] => utility [patent_app_number] => 16/068386 [patent_app_country] => US [patent_app_date] => 2016-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8632 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16068386 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/068386
Metrology device and metrology method Feb 16, 2016 Issued
Array ( [id] => 11068935 [patent_doc_number] => 20160265899 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-09-15 [patent_title] => 'OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD' [patent_app_type] => utility [patent_app_number] => 14/991022 [patent_app_country] => US [patent_app_date] => 2016-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 11152 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14991022 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/991022
Optical measurement apparatus and optical measurement method Jan 7, 2016 Issued
Array ( [id] => 12017897 [patent_doc_number] => 09810594 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2017-11-07 [patent_title] => 'Thermally stable high temperature pressure and acceleration optical interferometric sensors' [patent_app_type] => utility [patent_app_number] => 14/989901 [patent_app_country] => US [patent_app_date] => 2016-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 9973 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14989901 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/989901
Thermally stable high temperature pressure and acceleration optical interferometric sensors Jan 6, 2016 Issued
Array ( [id] => 12349971 [patent_doc_number] => 09952161 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-04-24 [patent_title] => Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials [patent_app_type] => utility [patent_app_number] => 14/984362 [patent_app_country] => US [patent_app_date] => 2015-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4907 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14984362 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/984362
Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials Dec 29, 2015 Issued
Array ( [id] => 10981410 [patent_doc_number] => 20160178354 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-06-23 [patent_title] => 'Method and device for superresolution optical measurement using singular optics' [patent_app_type] => utility [patent_app_number] => 14/998051 [patent_app_country] => US [patent_app_date] => 2015-12-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 20646 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14998051 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/998051
Method and device for superresolution optical measurement using singular optics Dec 23, 2015 Issued
Array ( [id] => 12139287 [patent_doc_number] => 20180017370 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-01-18 [patent_title] => 'INTERFERENCE OPTICAL DEVICE, INTERFERENCE OBSERVATION DEVICE, AND INTERFERENCE OBSERVATION METHOD' [patent_app_type] => utility [patent_app_number] => 15/546126 [patent_app_country] => US [patent_app_date] => 2015-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 12407 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15546126 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/546126
Interference optical device, interference observation device, and interference observation method Dec 13, 2015 Issued
Array ( [id] => 10981570 [patent_doc_number] => 20160178514 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-06-23 [patent_title] => 'LINE SCAN KNIFE EDGE HEIGHT SENSOR FOR SEMICONDUCTOR INSPECTION AND METROLOGY' [patent_app_type] => utility [patent_app_number] => 14/967432 [patent_app_country] => US [patent_app_date] => 2015-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 7059 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14967432 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/967432
Line scan knife edge height sensor for semiconductor inspection and metrology Dec 13, 2015 Issued
Array ( [id] => 11745022 [patent_doc_number] => 20170199093 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-07-13 [patent_title] => 'Multi-parameter Sensing based on Few-mode Fiber Bragg Gratings using Femtosecond IR Laser' [patent_app_type] => utility [patent_app_number] => 14/957592 [patent_app_country] => US [patent_app_date] => 2015-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2211 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14957592 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/957592
Multi-parameter sensing based on few-mode fiber Bragg gratings using femtosecond IR laser Dec 1, 2015 Issued
Array ( [id] => 14915713 [patent_doc_number] => 10429170 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-10-01 [patent_title] => High-sensitive swept-source optical coherence tomography system and methods of use thereof [patent_app_type] => utility [patent_app_number] => 15/531230 [patent_app_country] => US [patent_app_date] => 2015-11-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 31 [patent_no_of_words] => 10957 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15531230 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/531230
High-sensitive swept-source optical coherence tomography system and methods of use thereof Nov 24, 2015 Issued
Array ( [id] => 12093667 [patent_doc_number] => 20170350760 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-12-07 [patent_title] => 'Optical measurement system' [patent_app_type] => utility [patent_app_number] => 15/524628 [patent_app_country] => US [patent_app_date] => 2015-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6218 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15524628 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/524628
Optical measurement system Nov 4, 2015 Abandoned
Array ( [id] => 12031985 [patent_doc_number] => 20170322085 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-11-09 [patent_title] => 'Optical measurement method and system' [patent_app_type] => utility [patent_app_number] => 15/524630 [patent_app_country] => US [patent_app_date] => 2015-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7194 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15524630 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/524630
Optical measurement method and system Nov 3, 2015 Abandoned
Array ( [id] => 12107279 [patent_doc_number] => 09863756 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2018-01-09 [patent_title] => 'Line scan spectroscopic white light interferometry for semiconductor inspection and metrology' [patent_app_type] => utility [patent_app_number] => 14/877882 [patent_app_country] => US [patent_app_date] => 2015-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2977 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14877882 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/877882
Line scan spectroscopic white light interferometry for semiconductor inspection and metrology Oct 6, 2015 Issued
Array ( [id] => 12003359 [patent_doc_number] => 20170307515 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-10-26 [patent_title] => 'OPTICAL RESPONSE MEASURING DEVICE AND OPTICAL RESPONSE MEASURING METHOD' [patent_app_type] => utility [patent_app_number] => 15/517925 [patent_app_country] => US [patent_app_date] => 2015-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 13128 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15517925 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/517925
Optical response measuring device and optical response measuring method Oct 4, 2015 Issued
Array ( [id] => 10745221 [patent_doc_number] => 20160091372 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-03-31 [patent_title] => 'METHOD FOR DETECTING FOCAL PLANE BASED ON GRATING TALBOT EFFECT' [patent_app_type] => utility [patent_app_number] => 14/865081 [patent_app_country] => US [patent_app_date] => 2015-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2811 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14865081 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/865081
Method for detecting focal plane based on grating talbot effect Sep 24, 2015 Issued
Array ( [id] => 12493101 [patent_doc_number] => 09995648 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-06-12 [patent_title] => Optical measurement system and method for measuring critical dimension of nanostructure [patent_app_type] => utility [patent_app_number] => 14/850425 [patent_app_country] => US [patent_app_date] => 2015-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6323 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14850425 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/850425
Optical measurement system and method for measuring critical dimension of nanostructure Sep 9, 2015 Issued
Array ( [id] => 13744327 [patent_doc_number] => 20180376634 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-12-27 [patent_title] => COMPONENT MOUNTER, NOZZLE IMAGING METHOD [patent_app_type] => utility [patent_app_number] => 15/747063 [patent_app_country] => US [patent_app_date] => 2015-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8276 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15747063 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/747063
Component mounter, nozzle imaging method Aug 30, 2015 Issued
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