
Michael A. Lyons
Examiner (ID: 3948, Phone: (571)272-2420 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 1696 |
| Issued Applications | 1407 |
| Pending Applications | 125 |
| Abandoned Applications | 181 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
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[id] => 5025340
[patent_doc_number] => 20070266784
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[patent_issue_date] => 2007-11-22
[patent_title] => 'CHIP SCALE ATOMIC GYROSCOPE'
[patent_app_type] => utility
[patent_app_number] => 11/419052
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/419052 | Chip scale atomic gyroscope | May 17, 2006 | Issued |
Array
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[patent_doc_number] => 07450246
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[patent_issue_date] => 2008-11-11
[patent_title] => 'Measuring device and method for determining relative positions of a positioning stage configured to be moveable in at least one direction'
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[patent_title] => 'Method for tomographically displaying a cavity by optical coherence tomography (OCT) and an OCT device for carrying out the method'
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[patent_title] => 'Optical property measuring apparatus and optical property measuring method, exposure apparatus and exposure method , and device manufacturing method'
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[patent_title] => 'System and method for coherent anti-Stokes Raman scattering endoscopy'
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Array
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[patent_title] => 'PRESSURE SENSOR HAVING TWO MATERIALS WITH DIFFERENT COEFFICIENTS OF THERMAL EXPANSION CONFIGURED TO REDUCE TEMPERATURE DEPENDENCE'
[patent_app_type] => utility
[patent_app_number] => 11/278559
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/278559 | Pressure sensor having two materials with different coefficients of thermal expansion configured to reduce temperature dependence | Apr 3, 2006 | Issued |
Array
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[patent_title] => 'Determining Positional Error of an Optical Component Using Structured Light Patterns'
[patent_app_type] => utility
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Array
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[patent_title] => 'Method for optically testing semiconductor devices'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/278389 | Method for optically testing semiconductor devices | Mar 30, 2006 | Issued |
Array
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[patent_title] => 'Optical measuring apparatus'
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Array
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[patent_title] => 'Apparatus for measuring differential mode delay of multimode optical fiber'
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Array
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Array
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Array
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