
Michael A. Lyons
Examiner (ID: 9966, Phone: (571)272-2420 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 1651 |
| Issued Applications | 1383 |
| Pending Applications | 121 |
| Abandoned Applications | 177 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 441043
[patent_doc_number] => 07259864
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-08-21
[patent_title] => 'Optical underwater acoustic sensor'
[patent_app_type] => utility
[patent_app_number] => 11/070400
[patent_app_country] => US
[patent_app_date] => 2005-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2796
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 83
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/259/07259864.pdf
[firstpage_image] =>[orig_patent_app_number] => 11070400
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/070400 | Optical underwater acoustic sensor | Feb 24, 2005 | Issued |
Array
(
[id] => 5117943
[patent_doc_number] => 20070139657
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-06-21
[patent_title] => 'Three-dimensional geometric measurement and analysis system'
[patent_app_type] => utility
[patent_app_number] => 10/589750
[patent_app_country] => US
[patent_app_date] => 2005-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5179
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0139/20070139657.pdf
[firstpage_image] =>[orig_patent_app_number] => 10589750
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/589750 | Three-dimensional geometric measurement and analysis system | Feb 24, 2005 | Abandoned |
Array
(
[id] => 7037877
[patent_doc_number] => 20050157311
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-21
[patent_title] => 'Scanning interferometer for aspheric surfaces and wavefronts'
[patent_app_type] => utility
[patent_app_number] => 11/064731
[patent_app_country] => US
[patent_app_date] => 2005-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 15492
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0157/20050157311.pdf
[firstpage_image] =>[orig_patent_app_number] => 11064731
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/064731 | Scanning interferometer for aspheric surfaces and wavefronts | Feb 23, 2005 | Issued |
Array
(
[id] => 7049305
[patent_doc_number] => 20050185192
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-25
[patent_title] => 'Method of full-color optical coherence tomography'
[patent_app_type] => utility
[patent_app_number] => 11/063499
[patent_app_country] => US
[patent_app_date] => 2005-02-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 4304
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0185/20050185192.pdf
[firstpage_image] =>[orig_patent_app_number] => 11063499
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/063499 | Method of full-color optical coherence tomography | Feb 21, 2005 | Issued |
Array
(
[id] => 422530
[patent_doc_number] => 07274465
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-25
[patent_title] => 'Optical metrology of a structure formed on a semiconductor wafer using optical pulses'
[patent_app_type] => utility
[patent_app_number] => 11/061330
[patent_app_country] => US
[patent_app_date] => 2005-02-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 30
[patent_no_of_words] => 5607
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 117
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/274/07274465.pdf
[firstpage_image] =>[orig_patent_app_number] => 11061330
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/061330 | Optical metrology of a structure formed on a semiconductor wafer using optical pulses | Feb 16, 2005 | Issued |
Array
(
[id] => 744737
[patent_doc_number] => 07030971
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-04-18
[patent_title] => 'Natural fiber span reflectometer providing a virtual signal sensing array capability'
[patent_app_type] => utility
[patent_app_number] => 11/056630
[patent_app_country] => US
[patent_app_date] => 2005-02-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 17199
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 185
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/030/07030971.pdf
[firstpage_image] =>[orig_patent_app_number] => 11056630
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/056630 | Natural fiber span reflectometer providing a virtual signal sensing array capability | Feb 6, 2005 | Issued |
Array
(
[id] => 391048
[patent_doc_number] => 07301645
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-11-27
[patent_title] => 'In-situ critical dimension measurement'
[patent_app_type] => utility
[patent_app_number] => 11/053300
[patent_app_country] => US
[patent_app_date] => 2005-02-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 12
[patent_no_of_words] => 3404
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/301/07301645.pdf
[firstpage_image] =>[orig_patent_app_number] => 11053300
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/053300 | In-situ critical dimension measurement | Feb 6, 2005 | Issued |
Array
(
[id] => 364435
[patent_doc_number] => 07483155
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-27
[patent_title] => 'Structure inspection method, pattern formation method, process condition determination method and resist pattern evaluation apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/051617
[patent_app_country] => US
[patent_app_date] => 2005-01-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 36
[patent_no_of_words] => 16840
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 183
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/483/07483155.pdf
[firstpage_image] =>[orig_patent_app_number] => 11051617
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/051617 | Structure inspection method, pattern formation method, process condition determination method and resist pattern evaluation apparatus | Jan 26, 2005 | Issued |
Array
(
[id] => 7219246
[patent_doc_number] => 20050254061
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-11-17
[patent_title] => 'Low coherence interferometry for detecting and characterizing plaques'
[patent_app_type] => utility
[patent_app_number] => 11/041177
[patent_app_country] => US
[patent_app_date] => 2005-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 24
[patent_no_of_words] => 22126
[patent_no_of_claims] => 79
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0254/20050254061.pdf
[firstpage_image] =>[orig_patent_app_number] => 11041177
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/041177 | Low coherence interferometry for detecting and characterizing plaques | Jan 20, 2005 | Issued |
Array
(
[id] => 463092
[patent_doc_number] => 07242480
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-10
[patent_title] => 'Low coherence interferometry for detecting and characterizing plaques'
[patent_app_type] => utility
[patent_app_number] => 11/039987
[patent_app_country] => US
[patent_app_date] => 2005-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
[patent_figures_cnt] => 34
[patent_no_of_words] => 21905
[patent_no_of_claims] => 49
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 395
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/242/07242480.pdf
[firstpage_image] =>[orig_patent_app_number] => 11039987
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/039987 | Low coherence interferometry for detecting and characterizing plaques | Jan 20, 2005 | Issued |
Array
(
[id] => 7102373
[patent_doc_number] => 20050105099
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-05-19
[patent_title] => 'Coherent photothermal interferometric spectroscopy system and method for chemical sensing'
[patent_app_type] => utility
[patent_app_number] => 10/947640
[patent_app_country] => US
[patent_app_date] => 2005-01-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 4816
[patent_no_of_claims] => 74
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0105/20050105099.pdf
[firstpage_image] =>[orig_patent_app_number] => 10947640
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/947640 | Coherent photothermal interferometric spectroscopy system and method for chemical sensing | Jan 12, 2005 | Issued |
Array
(
[id] => 5229167
[patent_doc_number] => 20070291274
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-20
[patent_title] => 'Interferometric Measuring System'
[patent_app_type] => utility
[patent_app_number] => 10/591502
[patent_app_country] => US
[patent_app_date] => 2005-01-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1904
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0291/20070291274.pdf
[firstpage_image] =>[orig_patent_app_number] => 10591502
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/591502 | Interferometric Measuring System | Jan 6, 2005 | Abandoned |
Array
(
[id] => 422532
[patent_doc_number] => 07274467
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-25
[patent_title] => 'Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element'
[patent_app_type] => utility
[patent_app_number] => 11/027989
[patent_app_country] => US
[patent_app_date] => 2005-01-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6492
[patent_no_of_claims] => 38
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/274/07274467.pdf
[firstpage_image] =>[orig_patent_app_number] => 11027989
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/027989 | Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element | Jan 3, 2005 | Issued |
Array
(
[id] => 732103
[patent_doc_number] => 07042578
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-05-09
[patent_title] => 'Method and apparatus for absolute figure metrology'
[patent_app_type] => utility
[patent_app_number] => 11/017210
[patent_app_country] => US
[patent_app_date] => 2004-12-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 8290
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/042/07042578.pdf
[firstpage_image] =>[orig_patent_app_number] => 11017210
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/017210 | Method and apparatus for absolute figure metrology | Dec 19, 2004 | Issued |
Array
(
[id] => 422526
[patent_doc_number] => 07274461
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-25
[patent_title] => 'Optical lens system and position measurement system using the same'
[patent_app_type] => utility
[patent_app_number] => 11/013390
[patent_app_country] => US
[patent_app_date] => 2004-12-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 39
[patent_no_of_words] => 13020
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 47
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/274/07274461.pdf
[firstpage_image] =>[orig_patent_app_number] => 11013390
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/013390 | Optical lens system and position measurement system using the same | Dec 16, 2004 | Issued |
Array
(
[id] => 6981907
[patent_doc_number] => 20050151976
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-14
[patent_title] => 'Method for monitoring of analytes in biological samples using low coherence interferometry'
[patent_app_type] => utility
[patent_app_number] => 11/014480
[patent_app_country] => US
[patent_app_date] => 2004-12-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 10824
[patent_no_of_claims] => 47
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0151/20050151976.pdf
[firstpage_image] =>[orig_patent_app_number] => 11014480
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/014480 | Method for monitoring of analytes in biological samples using low coherence interferometry | Dec 15, 2004 | Abandoned |
Array
(
[id] => 540750
[patent_doc_number] => 07180602
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-02-20
[patent_title] => 'Agile spectral interferometric microscopy'
[patent_app_type] => utility
[patent_app_number] => 11/009400
[patent_app_country] => US
[patent_app_date] => 2004-12-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 13
[patent_no_of_words] => 5735
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/180/07180602.pdf
[firstpage_image] =>[orig_patent_app_number] => 11009400
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/009400 | Agile spectral interferometric microscopy | Dec 9, 2004 | Issued |
Array
(
[id] => 475173
[patent_doc_number] => 07230715
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-06-12
[patent_title] => 'Ultrafast laser pulse shape measurement method and system'
[patent_app_type] => utility
[patent_app_number] => 11/006109
[patent_app_country] => US
[patent_app_date] => 2004-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5910
[patent_no_of_claims] => 44
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 327
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/230/07230715.pdf
[firstpage_image] =>[orig_patent_app_number] => 11006109
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/006109 | Ultrafast laser pulse shape measurement method and system | Dec 6, 2004 | Issued |
Array
(
[id] => 7171437
[patent_doc_number] => 20050122526
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-09
[patent_title] => 'Measurement device'
[patent_app_type] => utility
[patent_app_number] => 11/002679
[patent_app_country] => US
[patent_app_date] => 2004-12-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 7732
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0122/20050122526.pdf
[firstpage_image] =>[orig_patent_app_number] => 11002679
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/002679 | Measurement device for optical measurement of a property of a measurement object | Dec 2, 2004 | Issued |
Array
(
[id] => 617493
[patent_doc_number] => 07145659
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-12-05
[patent_title] => 'Light interference measurement method using computer-generated hologram, and interferometer using this method'
[patent_app_type] => utility
[patent_app_number] => 10/994270
[patent_app_country] => US
[patent_app_date] => 2004-11-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 6142
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 205
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/145/07145659.pdf
[firstpage_image] =>[orig_patent_app_number] => 10994270
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/994270 | Light interference measurement method using computer-generated hologram, and interferometer using this method | Nov 22, 2004 | Issued |