Search

Michael A. Lyons

Examiner (ID: 7672)

Most Active Art Unit
2877
Art Unit(s)
2877
Total Applications
1691
Issued Applications
1404
Pending Applications
124
Abandoned Applications
181

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 422532 [patent_doc_number] => 07274467 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element' [patent_app_type] => utility [patent_app_number] => 11/027989 [patent_app_country] => US [patent_app_date] => 2005-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6492 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274467.pdf [firstpage_image] =>[orig_patent_app_number] => 11027989 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/027989
Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element Jan 3, 2005 Issued
Array ( [id] => 732103 [patent_doc_number] => 07042578 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-09 [patent_title] => 'Method and apparatus for absolute figure metrology' [patent_app_type] => utility [patent_app_number] => 11/017210 [patent_app_country] => US [patent_app_date] => 2004-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 8290 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/042/07042578.pdf [firstpage_image] =>[orig_patent_app_number] => 11017210 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/017210
Method and apparatus for absolute figure metrology Dec 19, 2004 Issued
Array ( [id] => 422526 [patent_doc_number] => 07274461 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Optical lens system and position measurement system using the same' [patent_app_type] => utility [patent_app_number] => 11/013390 [patent_app_country] => US [patent_app_date] => 2004-12-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 39 [patent_no_of_words] => 13020 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274461.pdf [firstpage_image] =>[orig_patent_app_number] => 11013390 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/013390
Optical lens system and position measurement system using the same Dec 16, 2004 Issued
Array ( [id] => 6981907 [patent_doc_number] => 20050151976 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-14 [patent_title] => 'Method for monitoring of analytes in biological samples using low coherence interferometry' [patent_app_type] => utility [patent_app_number] => 11/014480 [patent_app_country] => US [patent_app_date] => 2004-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 10824 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0151/20050151976.pdf [firstpage_image] =>[orig_patent_app_number] => 11014480 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/014480
Method for monitoring of analytes in biological samples using low coherence interferometry Dec 15, 2004 Abandoned
Array ( [id] => 540750 [patent_doc_number] => 07180602 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-20 [patent_title] => 'Agile spectral interferometric microscopy' [patent_app_type] => utility [patent_app_number] => 11/009400 [patent_app_country] => US [patent_app_date] => 2004-12-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 5735 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/180/07180602.pdf [firstpage_image] =>[orig_patent_app_number] => 11009400 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/009400
Agile spectral interferometric microscopy Dec 9, 2004 Issued
Array ( [id] => 475173 [patent_doc_number] => 07230715 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-12 [patent_title] => 'Ultrafast laser pulse shape measurement method and system' [patent_app_type] => utility [patent_app_number] => 11/006109 [patent_app_country] => US [patent_app_date] => 2004-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5910 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 327 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/230/07230715.pdf [firstpage_image] =>[orig_patent_app_number] => 11006109 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/006109
Ultrafast laser pulse shape measurement method and system Dec 6, 2004 Issued
Array ( [id] => 7171437 [patent_doc_number] => 20050122526 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-09 [patent_title] => 'Measurement device' [patent_app_type] => utility [patent_app_number] => 11/002679 [patent_app_country] => US [patent_app_date] => 2004-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7732 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20050122526.pdf [firstpage_image] =>[orig_patent_app_number] => 11002679 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/002679
Measurement device for optical measurement of a property of a measurement object Dec 2, 2004 Issued
Array ( [id] => 617493 [patent_doc_number] => 07145659 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-12-05 [patent_title] => 'Light interference measurement method using computer-generated hologram, and interferometer using this method' [patent_app_type] => utility [patent_app_number] => 10/994270 [patent_app_country] => US [patent_app_date] => 2004-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 6142 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/145/07145659.pdf [firstpage_image] =>[orig_patent_app_number] => 10994270 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/994270
Light interference measurement method using computer-generated hologram, and interferometer using this method Nov 22, 2004 Issued
Array ( [id] => 506251 [patent_doc_number] => 07206077 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-17 [patent_title] => 'Flying height tester and flying height test method' [patent_app_type] => utility [patent_app_number] => 10/993669 [patent_app_country] => US [patent_app_date] => 2004-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 7061 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/206/07206077.pdf [firstpage_image] =>[orig_patent_app_number] => 10993669 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/993669
Flying height tester and flying height test method Nov 18, 2004 Issued
Array ( [id] => 732088 [patent_doc_number] => 07042573 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-09 [patent_title] => 'Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects' [patent_app_type] => utility [patent_app_number] => 10/990966 [patent_app_country] => US [patent_app_date] => 2004-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 20 [patent_no_of_words] => 10047 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/042/07042573.pdf [firstpage_image] =>[orig_patent_app_number] => 10990966 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/990966
Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects Nov 17, 2004 Issued
Array ( [id] => 7164606 [patent_doc_number] => 20050200940 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-15 [patent_title] => 'Device and method for wavefront measurement of an optical imaging system, and a microlithography projection exposure machine' [patent_app_type] => utility [patent_app_number] => 10/983593 [patent_app_country] => US [patent_app_date] => 2004-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6770 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0200/20050200940.pdf [firstpage_image] =>[orig_patent_app_number] => 10983593 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/983593
Device and method for wavefront measurement of an optical imaging system, and a microlithography projection exposure machine Nov 8, 2004 Issued
Array ( [id] => 506246 [patent_doc_number] => 07206076 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-17 [patent_title] => 'Thickness measurement of moving webs and seal integrity system using dual interferometer' [patent_app_type] => utility [patent_app_number] => 10/981177 [patent_app_country] => US [patent_app_date] => 2004-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 7131 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/206/07206076.pdf [firstpage_image] =>[orig_patent_app_number] => 10981177 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/981177
Thickness measurement of moving webs and seal integrity system using dual interferometer Nov 3, 2004 Issued
Array ( [id] => 7009266 [patent_doc_number] => 20050062982 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-24 [patent_title] => 'Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed' [patent_app_type] => utility [patent_app_number] => 10/978412 [patent_app_country] => US [patent_app_date] => 2004-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10870 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20050062982.pdf [firstpage_image] =>[orig_patent_app_number] => 10978412 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/978412
Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed Nov 1, 2004 Issued
Array ( [id] => 6989150 [patent_doc_number] => 20050088187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-28 [patent_title] => 'Use of coefficient of a power curve to evaluate a semiconductor wafer' [patent_app_type] => utility [patent_app_number] => 10/976587 [patent_app_country] => US [patent_app_date] => 2004-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 14547 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20050088187.pdf [firstpage_image] =>[orig_patent_app_number] => 10976587 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/976587
Use of coefficient of a power curve to evaluate a semiconductor wafer Oct 28, 2004 Issued
Array ( [id] => 470969 [patent_doc_number] => 07233399 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-19 [patent_title] => 'Feedback control of an interferometer' [patent_app_type] => utility [patent_app_number] => 10/963270 [patent_app_country] => US [patent_app_date] => 2004-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3322 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/233/07233399.pdf [firstpage_image] =>[orig_patent_app_number] => 10963270 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/963270
Feedback control of an interferometer Oct 11, 2004 Issued
Array ( [id] => 6989621 [patent_doc_number] => 20050088658 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-28 [patent_title] => 'Wavelength monitor' [patent_app_type] => utility [patent_app_number] => 10/961279 [patent_app_country] => US [patent_app_date] => 2004-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5651 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20050088658.pdf [firstpage_image] =>[orig_patent_app_number] => 10961279 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/961279
Wavelength monitor Oct 7, 2004 Issued
Array ( [id] => 682150 [patent_doc_number] => 07084987 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-01 [patent_title] => 'Method and system to interferometrically detect an alignment mark' [patent_app_type] => utility [patent_app_number] => 10/959511 [patent_app_country] => US [patent_app_date] => 2004-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 26 [patent_no_of_words] => 7277 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/084/07084987.pdf [firstpage_image] =>[orig_patent_app_number] => 10959511 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/959511
Method and system to interferometrically detect an alignment mark Oct 6, 2004 Issued
Array ( [id] => 4998385 [patent_doc_number] => 20070041019 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-22 [patent_title] => 'Rugged fabry-perot pressure sensor' [patent_app_type] => utility [patent_app_number] => 10/574300 [patent_app_country] => US [patent_app_date] => 2004-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5789 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0041/20070041019.pdf [firstpage_image] =>[orig_patent_app_number] => 10574300 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/574300
Rugged fabry-perot pressure sensor Sep 30, 2004 Issued
Array ( [id] => 7081481 [patent_doc_number] => 20050046861 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-03 [patent_title] => 'Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it' [patent_app_type] => utility [patent_app_number] => 10/952934 [patent_app_country] => US [patent_app_date] => 2004-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5501 [patent_no_of_claims] => 54 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0046/20050046861.pdf [firstpage_image] =>[orig_patent_app_number] => 10952934 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/952934
Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it Sep 29, 2004 Abandoned
Array ( [id] => 422528 [patent_doc_number] => 07274463 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Anodizing system with a coating thickness monitor and an anodized product' [patent_app_type] => utility [patent_app_number] => 10/953082 [patent_app_country] => US [patent_app_date] => 2004-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 7588 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274463.pdf [firstpage_image] =>[orig_patent_app_number] => 10953082 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/953082
Anodizing system with a coating thickness monitor and an anodized product Sep 28, 2004 Issued
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