
Michael A. Lyons
Examiner (ID: 9966, Phone: (571)272-2420 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 1651 |
| Issued Applications | 1383 |
| Pending Applications | 121 |
| Abandoned Applications | 177 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 506251
[patent_doc_number] => 07206077
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-04-17
[patent_title] => 'Flying height tester and flying height test method'
[patent_app_type] => utility
[patent_app_number] => 10/993669
[patent_app_country] => US
[patent_app_date] => 2004-11-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 7061
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 207
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/206/07206077.pdf
[firstpage_image] =>[orig_patent_app_number] => 10993669
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/993669 | Flying height tester and flying height test method | Nov 18, 2004 | Issued |
Array
(
[id] => 732088
[patent_doc_number] => 07042573
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-05-09
[patent_title] => 'Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects'
[patent_app_type] => utility
[patent_app_number] => 10/990966
[patent_app_country] => US
[patent_app_date] => 2004-11-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 20
[patent_no_of_words] => 10047
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 236
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/042/07042573.pdf
[firstpage_image] =>[orig_patent_app_number] => 10990966
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/990966 | Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects | Nov 17, 2004 | Issued |
Array
(
[id] => 7164606
[patent_doc_number] => 20050200940
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-09-15
[patent_title] => 'Device and method for wavefront measurement of an optical imaging system, and a microlithography projection exposure machine'
[patent_app_type] => utility
[patent_app_number] => 10/983593
[patent_app_country] => US
[patent_app_date] => 2004-11-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 6770
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0200/20050200940.pdf
[firstpage_image] =>[orig_patent_app_number] => 10983593
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/983593 | Device and method for wavefront measurement of an optical imaging system, and a microlithography projection exposure machine | Nov 8, 2004 | Issued |
Array
(
[id] => 506246
[patent_doc_number] => 07206076
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-04-17
[patent_title] => 'Thickness measurement of moving webs and seal integrity system using dual interferometer'
[patent_app_type] => utility
[patent_app_number] => 10/981177
[patent_app_country] => US
[patent_app_date] => 2004-11-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 7131
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 215
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/206/07206076.pdf
[firstpage_image] =>[orig_patent_app_number] => 10981177
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/981177 | Thickness measurement of moving webs and seal integrity system using dual interferometer | Nov 3, 2004 | Issued |
Array
(
[id] => 7009266
[patent_doc_number] => 20050062982
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-03-24
[patent_title] => 'Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed'
[patent_app_type] => utility
[patent_app_number] => 10/978412
[patent_app_country] => US
[patent_app_date] => 2004-11-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 10870
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0062/20050062982.pdf
[firstpage_image] =>[orig_patent_app_number] => 10978412
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/978412 | Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed | Nov 1, 2004 | Issued |
Array
(
[id] => 6989150
[patent_doc_number] => 20050088187
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-04-28
[patent_title] => 'Use of coefficient of a power curve to evaluate a semiconductor wafer'
[patent_app_type] => utility
[patent_app_number] => 10/976587
[patent_app_country] => US
[patent_app_date] => 2004-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 14547
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0088/20050088187.pdf
[firstpage_image] =>[orig_patent_app_number] => 10976587
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/976587 | Use of coefficient of a power curve to evaluate a semiconductor wafer | Oct 28, 2004 | Issued |
Array
(
[id] => 470969
[patent_doc_number] => 07233399
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-06-19
[patent_title] => 'Feedback control of an interferometer'
[patent_app_type] => utility
[patent_app_number] => 10/963270
[patent_app_country] => US
[patent_app_date] => 2004-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3322
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 118
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/233/07233399.pdf
[firstpage_image] =>[orig_patent_app_number] => 10963270
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/963270 | Feedback control of an interferometer | Oct 11, 2004 | Issued |
Array
(
[id] => 6989621
[patent_doc_number] => 20050088658
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-04-28
[patent_title] => 'Wavelength monitor'
[patent_app_type] => utility
[patent_app_number] => 10/961279
[patent_app_country] => US
[patent_app_date] => 2004-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5651
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0088/20050088658.pdf
[firstpage_image] =>[orig_patent_app_number] => 10961279
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/961279 | Wavelength monitor | Oct 7, 2004 | Issued |
Array
(
[id] => 682150
[patent_doc_number] => 07084987
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-08-01
[patent_title] => 'Method and system to interferometrically detect an alignment mark'
[patent_app_type] => utility
[patent_app_number] => 10/959511
[patent_app_country] => US
[patent_app_date] => 2004-10-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 26
[patent_no_of_words] => 7277
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 57
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/084/07084987.pdf
[firstpage_image] =>[orig_patent_app_number] => 10959511
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/959511 | Method and system to interferometrically detect an alignment mark | Oct 6, 2004 | Issued |
Array
(
[id] => 4998385
[patent_doc_number] => 20070041019
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-22
[patent_title] => 'Rugged fabry-perot pressure sensor'
[patent_app_type] => utility
[patent_app_number] => 10/574300
[patent_app_country] => US
[patent_app_date] => 2004-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5789
[patent_no_of_claims] => 33
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0041/20070041019.pdf
[firstpage_image] =>[orig_patent_app_number] => 10574300
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/574300 | Rugged fabry-perot pressure sensor | Sep 30, 2004 | Issued |
Array
(
[id] => 7081481
[patent_doc_number] => 20050046861
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-03-03
[patent_title] => 'Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it'
[patent_app_type] => utility
[patent_app_number] => 10/952934
[patent_app_country] => US
[patent_app_date] => 2004-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5501
[patent_no_of_claims] => 54
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0046/20050046861.pdf
[firstpage_image] =>[orig_patent_app_number] => 10952934
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/952934 | Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it | Sep 29, 2004 | Abandoned |
Array
(
[id] => 422528
[patent_doc_number] => 07274463
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-25
[patent_title] => 'Anodizing system with a coating thickness monitor and an anodized product'
[patent_app_type] => utility
[patent_app_number] => 10/953082
[patent_app_country] => US
[patent_app_date] => 2004-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 11
[patent_no_of_words] => 7588
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 198
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/274/07274463.pdf
[firstpage_image] =>[orig_patent_app_number] => 10953082
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/953082 | Anodizing system with a coating thickness monitor and an anodized product | Sep 28, 2004 | Issued |
Array
(
[id] => 6937446
[patent_doc_number] => 20050111007
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-05-26
[patent_title] => 'Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces'
[patent_app_type] => utility
[patent_app_number] => 10/948959
[patent_app_country] => US
[patent_app_date] => 2004-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 36
[patent_figures_cnt] => 36
[patent_no_of_words] => 26093
[patent_no_of_claims] => 49
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0111/20050111007.pdf
[firstpage_image] =>[orig_patent_app_number] => 10948959
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/948959 | Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces | Sep 23, 2004 | Abandoned |
Array
(
[id] => 429523
[patent_doc_number] => 07268860
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-09-11
[patent_title] => 'Color Moiré interferometry'
[patent_app_type] => utility
[patent_app_number] => 10/945417
[patent_app_country] => US
[patent_app_date] => 2004-09-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 17
[patent_no_of_words] => 3544
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 53
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/268/07268860.pdf
[firstpage_image] =>[orig_patent_app_number] => 10945417
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/945417 | Color Moiré interferometry | Sep 19, 2004 | Issued |
Array
(
[id] => 7009262
[patent_doc_number] => 20050062978
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-03-24
[patent_title] => 'Method and apparatus for directly measuring the phase change of an optical signal'
[patent_app_type] => utility
[patent_app_number] => 10/942787
[patent_app_country] => US
[patent_app_date] => 2004-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4704
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0062/20050062978.pdf
[firstpage_image] =>[orig_patent_app_number] => 10942787
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/942787 | Method and apparatus for directly measuring the phase change of an optical signal | Sep 16, 2004 | Issued |
Array
(
[id] => 7224857
[patent_doc_number] => 20050078318
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-04-14
[patent_title] => 'Methods and systems for interferometric analysis of surfaces and related applications'
[patent_app_type] => utility
[patent_app_number] => 10/941649
[patent_app_country] => US
[patent_app_date] => 2004-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 25
[patent_figures_cnt] => 25
[patent_no_of_words] => 20240
[patent_no_of_claims] => 43
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0078/20050078318.pdf
[firstpage_image] =>[orig_patent_app_number] => 10941649
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/941649 | Methods and systems for interferometric analysis of surfaces and related applications | Sep 14, 2004 | Issued |
Array
(
[id] => 94232
[patent_doc_number] => 07733497
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-08
[patent_title] => 'Method and apparatus for performing optical imaging using frequency-domain interferometry'
[patent_app_type] => utility
[patent_app_number] => 10/577562
[patent_app_country] => US
[patent_app_date] => 2004-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 31
[patent_no_of_words] => 18414
[patent_no_of_claims] => 95
[patent_no_of_ind_claims] => 9
[patent_words_short_claim] => 64
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/733/07733497.pdf
[firstpage_image] =>[orig_patent_app_number] => 10577562
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/577562 | Method and apparatus for performing optical imaging using frequency-domain interferometry | Sep 7, 2004 | Issued |
Array
(
[id] => 5099707
[patent_doc_number] => 20070182967
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-09
[patent_title] => 'Method and apparatus for precision measurement of phase shifts'
[patent_app_type] => utility
[patent_app_number] => 10/568657
[patent_app_country] => US
[patent_app_date] => 2004-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3113
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0182/20070182967.pdf
[firstpage_image] =>[orig_patent_app_number] => 10568657
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/568657 | Method and apparatus for precision measurement of phase shifts | Aug 26, 2004 | Abandoned |
Array
(
[id] => 919337
[patent_doc_number] => 07324206
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-01-29
[patent_title] => 'Method for determination/compensation of bias errors/random walk errors induced by the light source in fiber-optic Sagnac interferometers'
[patent_app_type] => utility
[patent_app_number] => 10/569659
[patent_app_country] => US
[patent_app_date] => 2004-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3381
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 222
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/324/07324206.pdf
[firstpage_image] =>[orig_patent_app_number] => 10569659
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/569659 | Method for determination/compensation of bias errors/random walk errors induced by the light source in fiber-optic Sagnac interferometers | Aug 24, 2004 | Issued |
Array
(
[id] => 481821
[patent_doc_number] => 07224467
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-05-29
[patent_title] => 'System for rotation measurement with laser interferometry'
[patent_app_type] => utility
[patent_app_number] => 10/711090
[patent_app_country] => US
[patent_app_date] => 2004-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 4268
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/224/07224467.pdf
[firstpage_image] =>[orig_patent_app_number] => 10711090
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/711090 | System for rotation measurement with laser interferometry | Aug 19, 2004 | Issued |