Search

Michael A. Lyons

Examiner (ID: 9966, Phone: (571)272-2420 , Office: P/2877 )

Most Active Art Unit
2877
Art Unit(s)
2877
Total Applications
1651
Issued Applications
1383
Pending Applications
121
Abandoned Applications
177

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 506251 [patent_doc_number] => 07206077 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-17 [patent_title] => 'Flying height tester and flying height test method' [patent_app_type] => utility [patent_app_number] => 10/993669 [patent_app_country] => US [patent_app_date] => 2004-11-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 7061 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/206/07206077.pdf [firstpage_image] =>[orig_patent_app_number] => 10993669 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/993669
Flying height tester and flying height test method Nov 18, 2004 Issued
Array ( [id] => 732088 [patent_doc_number] => 07042573 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-09 [patent_title] => 'Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects' [patent_app_type] => utility [patent_app_number] => 10/990966 [patent_app_country] => US [patent_app_date] => 2004-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 20 [patent_no_of_words] => 10047 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/042/07042573.pdf [firstpage_image] =>[orig_patent_app_number] => 10990966 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/990966
Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects Nov 17, 2004 Issued
Array ( [id] => 7164606 [patent_doc_number] => 20050200940 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-15 [patent_title] => 'Device and method for wavefront measurement of an optical imaging system, and a microlithography projection exposure machine' [patent_app_type] => utility [patent_app_number] => 10/983593 [patent_app_country] => US [patent_app_date] => 2004-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6770 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0200/20050200940.pdf [firstpage_image] =>[orig_patent_app_number] => 10983593 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/983593
Device and method for wavefront measurement of an optical imaging system, and a microlithography projection exposure machine Nov 8, 2004 Issued
Array ( [id] => 506246 [patent_doc_number] => 07206076 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-04-17 [patent_title] => 'Thickness measurement of moving webs and seal integrity system using dual interferometer' [patent_app_type] => utility [patent_app_number] => 10/981177 [patent_app_country] => US [patent_app_date] => 2004-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 7131 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/206/07206076.pdf [firstpage_image] =>[orig_patent_app_number] => 10981177 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/981177
Thickness measurement of moving webs and seal integrity system using dual interferometer Nov 3, 2004 Issued
Array ( [id] => 7009266 [patent_doc_number] => 20050062982 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-24 [patent_title] => 'Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed' [patent_app_type] => utility [patent_app_number] => 10/978412 [patent_app_country] => US [patent_app_date] => 2004-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 10870 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20050062982.pdf [firstpage_image] =>[orig_patent_app_number] => 10978412 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/978412
Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed Nov 1, 2004 Issued
Array ( [id] => 6989150 [patent_doc_number] => 20050088187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-28 [patent_title] => 'Use of coefficient of a power curve to evaluate a semiconductor wafer' [patent_app_type] => utility [patent_app_number] => 10/976587 [patent_app_country] => US [patent_app_date] => 2004-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 14547 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20050088187.pdf [firstpage_image] =>[orig_patent_app_number] => 10976587 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/976587
Use of coefficient of a power curve to evaluate a semiconductor wafer Oct 28, 2004 Issued
Array ( [id] => 470969 [patent_doc_number] => 07233399 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-19 [patent_title] => 'Feedback control of an interferometer' [patent_app_type] => utility [patent_app_number] => 10/963270 [patent_app_country] => US [patent_app_date] => 2004-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3322 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 118 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/233/07233399.pdf [firstpage_image] =>[orig_patent_app_number] => 10963270 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/963270
Feedback control of an interferometer Oct 11, 2004 Issued
Array ( [id] => 6989621 [patent_doc_number] => 20050088658 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-28 [patent_title] => 'Wavelength monitor' [patent_app_type] => utility [patent_app_number] => 10/961279 [patent_app_country] => US [patent_app_date] => 2004-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5651 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20050088658.pdf [firstpage_image] =>[orig_patent_app_number] => 10961279 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/961279
Wavelength monitor Oct 7, 2004 Issued
Array ( [id] => 682150 [patent_doc_number] => 07084987 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-01 [patent_title] => 'Method and system to interferometrically detect an alignment mark' [patent_app_type] => utility [patent_app_number] => 10/959511 [patent_app_country] => US [patent_app_date] => 2004-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 26 [patent_no_of_words] => 7277 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/084/07084987.pdf [firstpage_image] =>[orig_patent_app_number] => 10959511 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/959511
Method and system to interferometrically detect an alignment mark Oct 6, 2004 Issued
Array ( [id] => 4998385 [patent_doc_number] => 20070041019 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-22 [patent_title] => 'Rugged fabry-perot pressure sensor' [patent_app_type] => utility [patent_app_number] => 10/574300 [patent_app_country] => US [patent_app_date] => 2004-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5789 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0041/20070041019.pdf [firstpage_image] =>[orig_patent_app_number] => 10574300 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/574300
Rugged fabry-perot pressure sensor Sep 30, 2004 Issued
Array ( [id] => 7081481 [patent_doc_number] => 20050046861 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-03 [patent_title] => 'Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it' [patent_app_type] => utility [patent_app_number] => 10/952934 [patent_app_country] => US [patent_app_date] => 2004-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5501 [patent_no_of_claims] => 54 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0046/20050046861.pdf [firstpage_image] =>[orig_patent_app_number] => 10952934 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/952934
Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it Sep 29, 2004 Abandoned
Array ( [id] => 422528 [patent_doc_number] => 07274463 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Anodizing system with a coating thickness monitor and an anodized product' [patent_app_type] => utility [patent_app_number] => 10/953082 [patent_app_country] => US [patent_app_date] => 2004-09-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 7588 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274463.pdf [firstpage_image] =>[orig_patent_app_number] => 10953082 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/953082
Anodizing system with a coating thickness monitor and an anodized product Sep 28, 2004 Issued
Array ( [id] => 6937446 [patent_doc_number] => 20050111007 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-26 [patent_title] => 'Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces' [patent_app_type] => utility [patent_app_number] => 10/948959 [patent_app_country] => US [patent_app_date] => 2004-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 36 [patent_figures_cnt] => 36 [patent_no_of_words] => 26093 [patent_no_of_claims] => 49 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0111/20050111007.pdf [firstpage_image] =>[orig_patent_app_number] => 10948959 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/948959
Catoptric and catadioptric imaging system with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces Sep 23, 2004 Abandoned
Array ( [id] => 429523 [patent_doc_number] => 07268860 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-09-11 [patent_title] => 'Color Moiré interferometry' [patent_app_type] => utility [patent_app_number] => 10/945417 [patent_app_country] => US [patent_app_date] => 2004-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 17 [patent_no_of_words] => 3544 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/268/07268860.pdf [firstpage_image] =>[orig_patent_app_number] => 10945417 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/945417
Color Moiré interferometry Sep 19, 2004 Issued
Array ( [id] => 7009262 [patent_doc_number] => 20050062978 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-24 [patent_title] => 'Method and apparatus for directly measuring the phase change of an optical signal' [patent_app_type] => utility [patent_app_number] => 10/942787 [patent_app_country] => US [patent_app_date] => 2004-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4704 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20050062978.pdf [firstpage_image] =>[orig_patent_app_number] => 10942787 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/942787
Method and apparatus for directly measuring the phase change of an optical signal Sep 16, 2004 Issued
Array ( [id] => 7224857 [patent_doc_number] => 20050078318 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-14 [patent_title] => 'Methods and systems for interferometric analysis of surfaces and related applications' [patent_app_type] => utility [patent_app_number] => 10/941649 [patent_app_country] => US [patent_app_date] => 2004-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 25 [patent_no_of_words] => 20240 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0078/20050078318.pdf [firstpage_image] =>[orig_patent_app_number] => 10941649 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/941649
Methods and systems for interferometric analysis of surfaces and related applications Sep 14, 2004 Issued
Array ( [id] => 94232 [patent_doc_number] => 07733497 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-08 [patent_title] => 'Method and apparatus for performing optical imaging using frequency-domain interferometry' [patent_app_type] => utility [patent_app_number] => 10/577562 [patent_app_country] => US [patent_app_date] => 2004-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 31 [patent_no_of_words] => 18414 [patent_no_of_claims] => 95 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/733/07733497.pdf [firstpage_image] =>[orig_patent_app_number] => 10577562 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/577562
Method and apparatus for performing optical imaging using frequency-domain interferometry Sep 7, 2004 Issued
Array ( [id] => 5099707 [patent_doc_number] => 20070182967 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-09 [patent_title] => 'Method and apparatus for precision measurement of phase shifts' [patent_app_type] => utility [patent_app_number] => 10/568657 [patent_app_country] => US [patent_app_date] => 2004-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3113 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0182/20070182967.pdf [firstpage_image] =>[orig_patent_app_number] => 10568657 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/568657
Method and apparatus for precision measurement of phase shifts Aug 26, 2004 Abandoned
Array ( [id] => 919337 [patent_doc_number] => 07324206 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-01-29 [patent_title] => 'Method for determination/compensation of bias errors/random walk errors induced by the light source in fiber-optic Sagnac interferometers' [patent_app_type] => utility [patent_app_number] => 10/569659 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3381 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/324/07324206.pdf [firstpage_image] =>[orig_patent_app_number] => 10569659 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/569659
Method for determination/compensation of bias errors/random walk errors induced by the light source in fiber-optic Sagnac interferometers Aug 24, 2004 Issued
Array ( [id] => 481821 [patent_doc_number] => 07224467 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-29 [patent_title] => 'System for rotation measurement with laser interferometry' [patent_app_type] => utility [patent_app_number] => 10/711090 [patent_app_country] => US [patent_app_date] => 2004-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 4268 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/224/07224467.pdf [firstpage_image] =>[orig_patent_app_number] => 10711090 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/711090
System for rotation measurement with laser interferometry Aug 19, 2004 Issued
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