Search

Michael A. Lyons

Examiner (ID: 3948, Phone: (571)272-2420 , Office: P/2877 )

Most Active Art Unit
2877
Art Unit(s)
2877
Total Applications
1696
Issued Applications
1407
Pending Applications
125
Abandoned Applications
181

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7032148 [patent_doc_number] => 20050030657 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-10 [patent_title] => 'Method and apparatus for multiwavelength imaging spectrometer' [patent_app_type] => utility [patent_app_number] => 10/893332 [patent_app_country] => US [patent_app_date] => 2004-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 11112 [patent_no_of_claims] => 117 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20050030657.pdf [firstpage_image] =>[orig_patent_app_number] => 10893332 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/893332
Method and apparatus for multiwavelength imaging spectrometer Jul 18, 2004 Issued
Array ( [id] => 545398 [patent_doc_number] => 07177029 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-13 [patent_title] => 'Stroboscopic interferometry with frequency domain analysis' [patent_app_type] => utility [patent_app_number] => 10/887409 [patent_app_country] => US [patent_app_date] => 2004-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3528 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/177/07177029.pdf [firstpage_image] =>[orig_patent_app_number] => 10887409 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/887409
Stroboscopic interferometry with frequency domain analysis Jul 7, 2004 Issued
Array ( [id] => 6970439 [patent_doc_number] => 20050036149 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-17 [patent_title] => 'Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology' [patent_app_type] => utility [patent_app_number] => 10/886010 [patent_app_country] => US [patent_app_date] => 2004-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 16510 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0036/20050036149.pdf [firstpage_image] =>[orig_patent_app_number] => 10886010 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/886010
Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology Jul 6, 2004 Issued
Array ( [id] => 7073523 [patent_doc_number] => 20050146789 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'Device for polarization-specific examination, an optical imaging system and a calibration method' [patent_app_type] => utility [patent_app_number] => 10/883739 [patent_app_country] => US [patent_app_date] => 2004-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5614 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20050146789.pdf [firstpage_image] =>[orig_patent_app_number] => 10883739 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/883739
Apparatus for polarization-specific examination, optical imaging system, and calibration method Jul 5, 2004 Issued
Array ( [id] => 7121106 [patent_doc_number] => 20050012935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-20 [patent_title] => 'Characterizing unsteady pressures in pipes using optical measurement devices' [patent_app_type] => utility [patent_app_number] => 10/875860 [patent_app_country] => US [patent_app_date] => 2004-06-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 9619 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20050012935.pdf [firstpage_image] =>[orig_patent_app_number] => 10875860 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/875860
Characterizing unsteady pressures in pipes using optical measurement devices Jun 23, 2004 Issued
Array ( [id] => 7067943 [patent_doc_number] => 20050243326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-03 [patent_title] => 'Imaginary polarizing measuring method for simultaneously measuring the optical crystal thickness and the optic axis direction' [patent_app_type] => utility [patent_app_number] => 10/862389 [patent_app_country] => US [patent_app_date] => 2004-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4572 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0243/20050243326.pdf [firstpage_image] =>[orig_patent_app_number] => 10862389 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/862389
Imaginary polarizing measuring method for simultaneously measuring the optical crystal thickness and the optic axis direction Jun 7, 2004 Abandoned
Array ( [id] => 7324852 [patent_doc_number] => 20040252309 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-16 [patent_title] => 'Interferometer, a method of providing an interferometer, a light emitter, and a means for moving a mirror' [patent_app_type] => new [patent_app_number] => 10/857950 [patent_app_country] => US [patent_app_date] => 2004-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5219 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 19 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20040252309.pdf [firstpage_image] =>[orig_patent_app_number] => 10857950 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/857950
Interferometer, a method of providing an interferometer, a light emitter, and a means for moving a mirror Jun 1, 2004 Abandoned
Array ( [id] => 422525 [patent_doc_number] => 07274460 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Stimulated rate optical power measurement in a fiber optic gyroscope' [patent_app_type] => utility [patent_app_number] => 10/859822 [patent_app_country] => US [patent_app_date] => 2004-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3825 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274460.pdf [firstpage_image] =>[orig_patent_app_number] => 10859822 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/859822
Stimulated rate optical power measurement in a fiber optic gyroscope Jun 1, 2004 Issued
10/845259 Method of processing an optical substrate May 13, 2004 Abandoned
Array ( [id] => 7219206 [patent_doc_number] => 20050254057 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-17 [patent_title] => 'Low coherence interferometry utilizing phase' [patent_app_type] => utility [patent_app_number] => 10/845849 [patent_app_country] => US [patent_app_date] => 2004-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 15864 [patent_no_of_claims] => 58 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0254/20050254057.pdf [firstpage_image] =>[orig_patent_app_number] => 10845849 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/845849
Low coherence interferometry utilizing phase May 13, 2004 Issued
Array ( [id] => 7003435 [patent_doc_number] => 20050168748 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-04 [patent_title] => 'System and method for investigating photon or particle trajectory and interference pattern formation in double slit experiments' [patent_app_type] => utility [patent_app_number] => 10/844839 [patent_app_country] => US [patent_app_date] => 2004-05-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2399 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0168/20050168748.pdf [firstpage_image] =>[orig_patent_app_number] => 10844839 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/844839
System and method for investigating photon or particle trajectory and interference pattern formation in double slit experiments May 12, 2004 Abandoned
Array ( [id] => 7150092 [patent_doc_number] => 20050024646 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-03 [patent_title] => 'Optical coherence tomography imaging' [patent_app_type] => utility [patent_app_number] => 10/840480 [patent_app_country] => US [patent_app_date] => 2004-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5664 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20050024646.pdf [firstpage_image] =>[orig_patent_app_number] => 10840480 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/840480
Optical coherence tomography imaging May 4, 2004 Issued
Array ( [id] => 7061281 [patent_doc_number] => 20050003642 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-06 [patent_title] => 'Method for determining the depth of a buried structure' [patent_app_type] => utility [patent_app_number] => 10/835259 [patent_app_country] => US [patent_app_date] => 2004-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6024 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0003/20050003642.pdf [firstpage_image] =>[orig_patent_app_number] => 10835259 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/835259
Method for determining the depth of a buried structure Apr 29, 2004 Issued
Array ( [id] => 530200 [patent_doc_number] => 07187453 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-06 [patent_title] => 'Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer' [patent_app_type] => utility [patent_app_number] => 10/829980 [patent_app_country] => US [patent_app_date] => 2004-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 21 [patent_no_of_words] => 11463 [patent_no_of_claims] => 92 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/187/07187453.pdf [firstpage_image] =>[orig_patent_app_number] => 10829980 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/829980
Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer Apr 22, 2004 Issued
Array ( [id] => 6924282 [patent_doc_number] => 20050237537 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-27 [patent_title] => 'Determination of thin film topograhpy' [patent_app_type] => utility [patent_app_number] => 10/829880 [patent_app_country] => US [patent_app_date] => 2004-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 6613 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20050237537.pdf [firstpage_image] =>[orig_patent_app_number] => 10829880 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/829880
Determination of thin film topography Apr 21, 2004 Issued
Array ( [id] => 7059680 [patent_doc_number] => 20050002040 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-06 [patent_title] => 'Lithographic apparatus, device manufacturing method, and computer program' [patent_app_type] => utility [patent_app_number] => 10/825221 [patent_app_country] => US [patent_app_date] => 2004-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4604 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0002/20050002040.pdf [firstpage_image] =>[orig_patent_app_number] => 10825221 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/825221
Lithographic apparatus, device manufacturing method, and computer program Apr 15, 2004 Issued
Array ( [id] => 6964831 [patent_doc_number] => 20050231728 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-20 [patent_title] => 'Q-point stabilization for linear interferometric sensors using tunable diffraction grating' [patent_app_type] => utility [patent_app_number] => 10/824600 [patent_app_country] => US [patent_app_date] => 2004-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5614 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20050231728.pdf [firstpage_image] =>[orig_patent_app_number] => 10824600 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/824600
Q-point stabilization for linear interferometric sensors using tunable diffraction grating Apr 14, 2004 Abandoned
Array ( [id] => 849989 [patent_doc_number] => 07382467 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-06-03 [patent_title] => 'Interferometric measuring device' [patent_app_type] => utility [patent_app_number] => 10/559168 [patent_app_country] => US [patent_app_date] => 2004-04-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 2478 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/382/07382467.pdf [firstpage_image] =>[orig_patent_app_number] => 10559168 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/559168
Interferometric measuring device Apr 2, 2004 Issued
Array ( [id] => 7606703 [patent_doc_number] => 07099014 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-29 [patent_title] => 'Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry' [patent_app_type] => utility [patent_app_number] => 10/816180 [patent_app_country] => US [patent_app_date] => 2004-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 19623 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/099/07099014.pdf [firstpage_image] =>[orig_patent_app_number] => 10816180 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/816180
Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry Mar 31, 2004 Issued
Array ( [id] => 7263174 [patent_doc_number] => 20040150829 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-05 [patent_title] => 'Interferometric arrangement for determining the transit time of light in a sample' [patent_app_type] => new [patent_app_number] => 10/475040 [patent_app_country] => US [patent_app_date] => 2004-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5089 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0150/20040150829.pdf [firstpage_image] =>[orig_patent_app_number] => 10475040 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/475040
Interferometric arrangement for determining the transit time of light in a sample Mar 30, 2004 Abandoned
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