
Michael A. Lyons
Examiner (ID: 3948, Phone: (571)272-2420 , Office: P/2877 )
| Most Active Art Unit | 2877 |
| Art Unit(s) | 2877 |
| Total Applications | 1696 |
| Issued Applications | 1407 |
| Pending Applications | 125 |
| Abandoned Applications | 181 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7032148
[patent_doc_number] => 20050030657
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-10
[patent_title] => 'Method and apparatus for multiwavelength imaging spectrometer'
[patent_app_type] => utility
[patent_app_number] => 10/893332
[patent_app_country] => US
[patent_app_date] => 2004-07-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 11112
[patent_no_of_claims] => 117
[patent_no_of_ind_claims] => 12
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0030/20050030657.pdf
[firstpage_image] =>[orig_patent_app_number] => 10893332
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/893332 | Method and apparatus for multiwavelength imaging spectrometer | Jul 18, 2004 | Issued |
Array
(
[id] => 545398
[patent_doc_number] => 07177029
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-02-13
[patent_title] => 'Stroboscopic interferometry with frequency domain analysis'
[patent_app_type] => utility
[patent_app_number] => 10/887409
[patent_app_country] => US
[patent_app_date] => 2004-07-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3528
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 74
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/177/07177029.pdf
[firstpage_image] =>[orig_patent_app_number] => 10887409
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/887409 | Stroboscopic interferometry with frequency domain analysis | Jul 7, 2004 | Issued |
Array
(
[id] => 6970439
[patent_doc_number] => 20050036149
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-17
[patent_title] => 'Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology'
[patent_app_type] => utility
[patent_app_number] => 10/886010
[patent_app_country] => US
[patent_app_date] => 2004-07-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 16510
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0036/20050036149.pdf
[firstpage_image] =>[orig_patent_app_number] => 10886010
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/886010 | Apparatus and method for high speed scan for detection and measurement of properties of sub-wavelength defects and artifacts in semiconductor and mask metrology | Jul 6, 2004 | Issued |
Array
(
[id] => 7073523
[patent_doc_number] => 20050146789
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-07
[patent_title] => 'Device for polarization-specific examination, an optical imaging system and a calibration method'
[patent_app_type] => utility
[patent_app_number] => 10/883739
[patent_app_country] => US
[patent_app_date] => 2004-07-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5614
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0146/20050146789.pdf
[firstpage_image] =>[orig_patent_app_number] => 10883739
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/883739 | Apparatus for polarization-specific examination, optical imaging system, and calibration method | Jul 5, 2004 | Issued |
Array
(
[id] => 7121106
[patent_doc_number] => 20050012935
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-20
[patent_title] => 'Characterizing unsteady pressures in pipes using optical measurement devices'
[patent_app_type] => utility
[patent_app_number] => 10/875860
[patent_app_country] => US
[patent_app_date] => 2004-06-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 9619
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0012/20050012935.pdf
[firstpage_image] =>[orig_patent_app_number] => 10875860
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/875860 | Characterizing unsteady pressures in pipes using optical measurement devices | Jun 23, 2004 | Issued |
Array
(
[id] => 7067943
[patent_doc_number] => 20050243326
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-11-03
[patent_title] => 'Imaginary polarizing measuring method for simultaneously measuring the optical crystal thickness and the optic axis direction'
[patent_app_type] => utility
[patent_app_number] => 10/862389
[patent_app_country] => US
[patent_app_date] => 2004-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4572
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0243/20050243326.pdf
[firstpage_image] =>[orig_patent_app_number] => 10862389
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/862389 | Imaginary polarizing measuring method for simultaneously measuring the optical crystal thickness and the optic axis direction | Jun 7, 2004 | Abandoned |
Array
(
[id] => 7324852
[patent_doc_number] => 20040252309
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-16
[patent_title] => 'Interferometer, a method of providing an interferometer, a light emitter, and a means for moving a mirror'
[patent_app_type] => new
[patent_app_number] => 10/857950
[patent_app_country] => US
[patent_app_date] => 2004-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5219
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 19
[patent_words_short_claim] => 16
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0252/20040252309.pdf
[firstpage_image] =>[orig_patent_app_number] => 10857950
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/857950 | Interferometer, a method of providing an interferometer, a light emitter, and a means for moving a mirror | Jun 1, 2004 | Abandoned |
Array
(
[id] => 422525
[patent_doc_number] => 07274460
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-25
[patent_title] => 'Stimulated rate optical power measurement in a fiber optic gyroscope'
[patent_app_type] => utility
[patent_app_number] => 10/859822
[patent_app_country] => US
[patent_app_date] => 2004-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 3
[patent_no_of_words] => 3825
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 54
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/274/07274460.pdf
[firstpage_image] =>[orig_patent_app_number] => 10859822
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/859822 | Stimulated rate optical power measurement in a fiber optic gyroscope | Jun 1, 2004 | Issued |
| 10/845259 | Method of processing an optical substrate | May 13, 2004 | Abandoned |
Array
(
[id] => 7219206
[patent_doc_number] => 20050254057
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-11-17
[patent_title] => 'Low coherence interferometry utilizing phase'
[patent_app_type] => utility
[patent_app_number] => 10/845849
[patent_app_country] => US
[patent_app_date] => 2004-05-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 19
[patent_no_of_words] => 15864
[patent_no_of_claims] => 58
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0254/20050254057.pdf
[firstpage_image] =>[orig_patent_app_number] => 10845849
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/845849 | Low coherence interferometry utilizing phase | May 13, 2004 | Issued |
Array
(
[id] => 7003435
[patent_doc_number] => 20050168748
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-04
[patent_title] => 'System and method for investigating photon or particle trajectory and interference pattern formation in double slit experiments'
[patent_app_type] => utility
[patent_app_number] => 10/844839
[patent_app_country] => US
[patent_app_date] => 2004-05-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2399
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0168/20050168748.pdf
[firstpage_image] =>[orig_patent_app_number] => 10844839
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/844839 | System and method for investigating photon or particle trajectory and interference pattern formation in double slit experiments | May 12, 2004 | Abandoned |
Array
(
[id] => 7150092
[patent_doc_number] => 20050024646
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-03
[patent_title] => 'Optical coherence tomography imaging'
[patent_app_type] => utility
[patent_app_number] => 10/840480
[patent_app_country] => US
[patent_app_date] => 2004-05-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5664
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0024/20050024646.pdf
[firstpage_image] =>[orig_patent_app_number] => 10840480
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/840480 | Optical coherence tomography imaging | May 4, 2004 | Issued |
Array
(
[id] => 7061281
[patent_doc_number] => 20050003642
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-06
[patent_title] => 'Method for determining the depth of a buried structure'
[patent_app_type] => utility
[patent_app_number] => 10/835259
[patent_app_country] => US
[patent_app_date] => 2004-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 6024
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0003/20050003642.pdf
[firstpage_image] =>[orig_patent_app_number] => 10835259
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/835259 | Method for determining the depth of a buried structure | Apr 29, 2004 | Issued |
Array
(
[id] => 530200
[patent_doc_number] => 07187453
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-03-06
[patent_title] => 'Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer'
[patent_app_type] => utility
[patent_app_number] => 10/829980
[patent_app_country] => US
[patent_app_date] => 2004-04-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 19
[patent_figures_cnt] => 21
[patent_no_of_words] => 11463
[patent_no_of_claims] => 92
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/187/07187453.pdf
[firstpage_image] =>[orig_patent_app_number] => 10829980
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/829980 | Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer | Apr 22, 2004 | Issued |
Array
(
[id] => 6924282
[patent_doc_number] => 20050237537
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-27
[patent_title] => 'Determination of thin film topograhpy'
[patent_app_type] => utility
[patent_app_number] => 10/829880
[patent_app_country] => US
[patent_app_date] => 2004-04-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 6613
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0237/20050237537.pdf
[firstpage_image] =>[orig_patent_app_number] => 10829880
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/829880 | Determination of thin film topography | Apr 21, 2004 | Issued |
Array
(
[id] => 7059680
[patent_doc_number] => 20050002040
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-06
[patent_title] => 'Lithographic apparatus, device manufacturing method, and computer program'
[patent_app_type] => utility
[patent_app_number] => 10/825221
[patent_app_country] => US
[patent_app_date] => 2004-04-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4604
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0002/20050002040.pdf
[firstpage_image] =>[orig_patent_app_number] => 10825221
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/825221 | Lithographic apparatus, device manufacturing method, and computer program | Apr 15, 2004 | Issued |
Array
(
[id] => 6964831
[patent_doc_number] => 20050231728
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-20
[patent_title] => 'Q-point stabilization for linear interferometric sensors using tunable diffraction grating'
[patent_app_type] => utility
[patent_app_number] => 10/824600
[patent_app_country] => US
[patent_app_date] => 2004-04-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5614
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0231/20050231728.pdf
[firstpage_image] =>[orig_patent_app_number] => 10824600
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/824600 | Q-point stabilization for linear interferometric sensors using tunable diffraction grating | Apr 14, 2004 | Abandoned |
Array
(
[id] => 849989
[patent_doc_number] => 07382467
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-06-03
[patent_title] => 'Interferometric measuring device'
[patent_app_type] => utility
[patent_app_number] => 10/559168
[patent_app_country] => US
[patent_app_date] => 2004-04-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 3
[patent_no_of_words] => 2478
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 194
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/382/07382467.pdf
[firstpage_image] =>[orig_patent_app_number] => 10559168
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/559168 | Interferometric measuring device | Apr 2, 2004 | Issued |
Array
(
[id] => 7606703
[patent_doc_number] => 07099014
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-08-29
[patent_title] => 'Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry'
[patent_app_type] => utility
[patent_app_number] => 10/816180
[patent_app_country] => US
[patent_app_date] => 2004-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 7
[patent_no_of_words] => 19623
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 166
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/099/07099014.pdf
[firstpage_image] =>[orig_patent_app_number] => 10816180
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/816180 | Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry | Mar 31, 2004 | Issued |
Array
(
[id] => 7263174
[patent_doc_number] => 20040150829
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-08-05
[patent_title] => 'Interferometric arrangement for determining the transit time of light in a sample'
[patent_app_type] => new
[patent_app_number] => 10/475040
[patent_app_country] => US
[patent_app_date] => 2004-03-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5089
[patent_no_of_claims] => 1
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 82
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0150/20040150829.pdf
[firstpage_image] =>[orig_patent_app_number] => 10475040
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/475040 | Interferometric arrangement for determining the transit time of light in a sample | Mar 30, 2004 | Abandoned |