Search

Michael A. Lyons

Examiner (ID: 3948, Phone: (571)272-2420 , Office: P/2877 )

Most Active Art Unit
2877
Art Unit(s)
2877
Total Applications
1696
Issued Applications
1407
Pending Applications
125
Abandoned Applications
181

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6850737 [patent_doc_number] => 20030142940 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-31 [patent_title] => 'Higher order mode stripping optical fiber and modules and systems utilizing same' [patent_app_type] => new [patent_app_number] => 10/061549 [patent_app_country] => US [patent_app_date] => 2002-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4036 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0142/20030142940.pdf [firstpage_image] =>[orig_patent_app_number] => 10061549 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/061549
Higher order mode stripping optical fiber and modules and systems utilizing the same Jan 30, 2002 Issued
Array ( [id] => 6743740 [patent_doc_number] => 20030020923 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-30 [patent_title] => 'Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications' [patent_app_type] => new [patent_app_number] => 10/060983 [patent_app_country] => US [patent_app_date] => 2002-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 11273 [patent_no_of_claims] => 78 [patent_no_of_ind_claims] => 16 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20030020923.pdf [firstpage_image] =>[orig_patent_app_number] => 10060983 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/060983
Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications Jan 29, 2002 Issued
Array ( [id] => 1134991 [patent_doc_number] => 06788419 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-09-07 [patent_title] => 'Determination of properties of an optical device' [patent_app_type] => B2 [patent_app_number] => 10/059703 [patent_app_country] => US [patent_app_date] => 2002-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4977 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/788/06788419.pdf [firstpage_image] =>[orig_patent_app_number] => 10059703 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/059703
Determination of properties of an optical device Jan 28, 2002 Issued
Array ( [id] => 1134994 [patent_doc_number] => 06788420 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-07 [patent_title] => 'Heterodyne interferometer with a phase modulated source' [patent_app_type] => B1 [patent_app_number] => 10/061067 [patent_app_country] => US [patent_app_date] => 2002-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2578 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/788/06788420.pdf [firstpage_image] =>[orig_patent_app_number] => 10061067 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/061067
Heterodyne interferometer with a phase modulated source Jan 28, 2002 Issued
Array ( [id] => 6850692 [patent_doc_number] => 20030142895 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-31 [patent_title] => 'Method of fabricating a monolithic expanded beam mode electroabsorption modulator' [patent_app_type] => new [patent_app_number] => 10/056929 [patent_app_country] => US [patent_app_date] => 2002-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 6905 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0142/20030142895.pdf [firstpage_image] =>[orig_patent_app_number] => 10056929 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/056929
Monolithic expanded beam mode electroabsorption modulator Jan 24, 2002 Issued
Array ( [id] => 1174914 [patent_doc_number] => 06760510 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-07-06 [patent_title] => 'Wavelength multiplex optical communication module' [patent_app_type] => B2 [patent_app_number] => 10/052346 [patent_app_country] => US [patent_app_date] => 2002-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 9672 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/760/06760510.pdf [firstpage_image] =>[orig_patent_app_number] => 10052346 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/052346
Wavelength multiplex optical communication module Jan 22, 2002 Issued
Array ( [id] => 1114545 [patent_doc_number] => 06804011 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-10-12 [patent_title] => 'Apparatus and method(s) for reducing the effects of coherent artifacts in an interferometer' [patent_app_type] => B2 [patent_app_number] => 10/053741 [patent_app_country] => US [patent_app_date] => 2002-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 30 [patent_no_of_words] => 11253 [patent_no_of_claims] => 88 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/804/06804011.pdf [firstpage_image] =>[orig_patent_app_number] => 10053741 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/053741
Apparatus and method(s) for reducing the effects of coherent artifacts in an interferometer Jan 21, 2002 Issued
Array ( [id] => 6516094 [patent_doc_number] => 20020135777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-26 [patent_title] => 'Phase shift fringe analysis method and apparatus using the same' [patent_app_type] => new [patent_app_number] => 10/051169 [patent_app_country] => US [patent_app_date] => 2002-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6752 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0135/20020135777.pdf [firstpage_image] =>[orig_patent_app_number] => 10051169 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/051169
Phase shift fringe analysis method and apparatus using the same Jan 21, 2002 Issued
Array ( [id] => 5903010 [patent_doc_number] => 20020140947 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-03 [patent_title] => 'Wavelength stabilised optical source' [patent_app_type] => new [patent_app_number] => 10/053307 [patent_app_country] => US [patent_app_date] => 2002-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2632 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20020140947.pdf [firstpage_image] =>[orig_patent_app_number] => 10053307 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/053307
Wavelength stabilised optical source Jan 17, 2002 Abandoned
Array ( [id] => 6687093 [patent_doc_number] => 20030030816 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-13 [patent_title] => 'Nonlinearity error correcting method and phase angle measuring method for displacement measurement in two-freqency laser interferometer and displacement measurement system using the same' [patent_app_type] => new [patent_app_number] => 10/051375 [patent_app_country] => US [patent_app_date] => 2002-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7407 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20030030816.pdf [firstpage_image] =>[orig_patent_app_number] => 10051375 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/051375
Nonlinearity error correcting method and phase angle measuring method for displacement measurement in two-freqency laser interferometer and displacement measurement system using the same Jan 16, 2002 Abandoned
Array ( [id] => 931787 [patent_doc_number] => 06980297 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-12-27 [patent_title] => 'Wavelength monitor' [patent_app_type] => utility [patent_app_number] => 10/051507 [patent_app_country] => US [patent_app_date] => 2002-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6989 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 267 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/980/06980297.pdf [firstpage_image] =>[orig_patent_app_number] => 10051507 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/051507
Wavelength monitor Jan 16, 2002 Issued
Array ( [id] => 1130180 [patent_doc_number] => 06791694 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-09-14 [patent_title] => 'Tunable optical device using a scanning MEMS mirror' [patent_app_type] => B2 [patent_app_number] => 10/051391 [patent_app_country] => US [patent_app_date] => 2002-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 3827 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/791/06791694.pdf [firstpage_image] =>[orig_patent_app_number] => 10051391 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/051391
Tunable optical device using a scanning MEMS mirror Jan 15, 2002 Issued
Array ( [id] => 7623151 [patent_doc_number] => 06687014 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-02-03 [patent_title] => 'Method for monitoring the rate of etching of a semiconductor' [patent_app_type] => B2 [patent_app_number] => 10/050737 [patent_app_country] => US [patent_app_date] => 2002-01-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2507 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 15 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/687/06687014.pdf [firstpage_image] =>[orig_patent_app_number] => 10050737 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/050737
Method for monitoring the rate of etching of a semiconductor Jan 15, 2002 Issued
Array ( [id] => 6657023 [patent_doc_number] => 20030133122 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-17 [patent_title] => 'Time difference synchronisation for determination of a property of an optical device' [patent_app_type] => new [patent_app_number] => 10/046521 [patent_app_country] => US [patent_app_date] => 2002-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2603 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0133/20030133122.pdf [firstpage_image] =>[orig_patent_app_number] => 10046521 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/046521
Time difference synchronization for determination of a property of an optical device Jan 13, 2002 Issued
Array ( [id] => 1162367 [patent_doc_number] => 06765682 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-07-20 [patent_title] => 'Method and apparatus for wavelength and power measurement for tunable laser control' [patent_app_type] => B1 [patent_app_number] => 10/044250 [patent_app_country] => US [patent_app_date] => 2002-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2024 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/765/06765682.pdf [firstpage_image] =>[orig_patent_app_number] => 10044250 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/044250
Method and apparatus for wavelength and power measurement for tunable laser control Jan 10, 2002 Issued
Array ( [id] => 1231323 [patent_doc_number] => 06697161 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-02-24 [patent_title] => 'Optical characterization of retarding devices' [patent_app_type] => B2 [patent_app_number] => 10/040425 [patent_app_country] => US [patent_app_date] => 2002-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 12 [patent_no_of_words] => 5570 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 215 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/697/06697161.pdf [firstpage_image] =>[orig_patent_app_number] => 10040425 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/040425
Optical characterization of retarding devices Jan 9, 2002 Issued
Array ( [id] => 7633890 [patent_doc_number] => 06657730 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-12-02 [patent_title] => 'Interferometer with angled beam entry' [patent_app_type] => B2 [patent_app_number] => 10/038736 [patent_app_country] => US [patent_app_date] => 2002-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 7540 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 4 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/657/06657730.pdf [firstpage_image] =>[orig_patent_app_number] => 10038736 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/038736
Interferometer with angled beam entry Jan 2, 2002 Issued
Array ( [id] => 5919420 [patent_doc_number] => 20020113971 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-22 [patent_title] => 'Method for measuring characteristics, especially the temperature of a multi-layer material while the layers are being built up' [patent_app_type] => new [patent_app_number] => 09/998446 [patent_app_country] => US [patent_app_date] => 2001-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3710 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0113/20020113971.pdf [firstpage_image] =>[orig_patent_app_number] => 09998446 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/998446
Method for measuring characteristics, especially the temperature of a multi-layer material while the layers are being built up Nov 29, 2001 Abandoned
Array ( [id] => 6515785 [patent_doc_number] => 20020135751 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-26 [patent_title] => 'Process and apparatus for recording the deformation of objects' [patent_app_type] => new [patent_app_number] => 09/996239 [patent_app_country] => US [patent_app_date] => 2001-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3149 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 16 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0135/20020135751.pdf [firstpage_image] =>[orig_patent_app_number] => 09996239 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/996239
Process and apparatus for recording the deformation of objects Nov 27, 2001 Issued
Array ( [id] => 1247464 [patent_doc_number] => 06678055 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-01-13 [patent_title] => 'Method and apparatus for measuring stress in semiconductor wafers' [patent_app_type] => B2 [patent_app_number] => 09/991709 [patent_app_country] => US [patent_app_date] => 2001-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 16 [patent_no_of_words] => 6322 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 31 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/678/06678055.pdf [firstpage_image] =>[orig_patent_app_number] => 09991709 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/991709
Method and apparatus for measuring stress in semiconductor wafers Nov 25, 2001 Issued
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