
Michael E. Barr
Supervisory Patent Examiner (ID: 15258, Phone: (571)272-1414 , Office: P/1711 )
| Most Active Art Unit | 1762 |
| Art Unit(s) | 1762, 1792, 1711, 1112 |
| Total Applications | 855 |
| Issued Applications | 630 |
| Pending Applications | 59 |
| Abandoned Applications | 171 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 11288270
[patent_doc_number] => 09504143
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-11-22
[patent_title] => 'Electrical circuit'
[patent_app_type] => utility
[patent_app_number] => 13/869570
[patent_app_country] => US
[patent_app_date] => 2013-04-24
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13869570
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/869570 | Electrical circuit | Apr 23, 2013 | Issued |
Array
(
[id] => 11192652
[patent_doc_number] => 09423462
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2016-08-23
[patent_title] => 'Relay testing device and methods for testing relays'
[patent_app_type] => utility
[patent_app_number] => 13/867105
[patent_app_country] => US
[patent_app_date] => 2013-04-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/867105 | Relay testing device and methods for testing relays | Apr 20, 2013 | Issued |
Array
(
[id] => 11238374
[patent_doc_number] => 09465011
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[patent_kind] => B2
[patent_issue_date] => 2016-10-11
[patent_title] => 'Flexible magnetostrictive probe having sensor elements without permanent magnets'
[patent_app_type] => utility
[patent_app_number] => 13/864696
[patent_app_country] => US
[patent_app_date] => 2013-04-17
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/864696 | Flexible magnetostrictive probe having sensor elements without permanent magnets | Apr 16, 2013 | Issued |
Array
(
[id] => 10238651
[patent_doc_number] => 20150123646
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-05-07
[patent_title] => 'Beam Detector with Control Circuit'
[patent_app_type] => utility
[patent_app_number] => 14/406231
[patent_app_country] => US
[patent_app_date] => 2013-04-15
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[rel_patent_id] =>[rel_patent_doc_number] =>) 14/406231 | Beam detector with control circuit | Apr 14, 2013 | Issued |
Array
(
[id] => 9091810
[patent_doc_number] => 20130271121
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[patent_issue_date] => 2013-10-17
[patent_title] => 'RESOLVER'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/856140 | RESOLVER | Apr 2, 2013 | Abandoned |
Array
(
[id] => 11332474
[patent_doc_number] => 09523715
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-12-20
[patent_title] => 'Wiring substrate with filled vias to accommodate custom terminals'
[patent_app_type] => utility
[patent_app_number] => 13/856091
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[patent_app_date] => 2013-04-03
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/856091 | Wiring substrate with filled vias to accommodate custom terminals | Apr 2, 2013 | Issued |
Array
(
[id] => 9105121
[patent_doc_number] => 20130278252
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-10-24
[patent_title] => 'ELECTRIC CURRENT MEASUREMENT METHOD'
[patent_app_type] => utility
[patent_app_number] => 13/851733
[patent_app_country] => US
[patent_app_date] => 2013-03-27
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/851733 | Electric current measurement method | Mar 26, 2013 | Issued |
Array
(
[id] => 11584104
[patent_doc_number] => 09638738
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2017-05-02
[patent_title] => 'Apparatus and method to detect a series arc fault of an electrical circuit'
[patent_app_type] => utility
[patent_app_number] => 13/798704
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[patent_app_date] => 2013-03-13
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/798704 | Apparatus and method to detect a series arc fault of an electrical circuit | Mar 12, 2013 | Issued |
Array
(
[id] => 9032107
[patent_doc_number] => 20130234745
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-09-12
[patent_title] => 'WAFER INSPECTION INTERFACE AND WAFER INSPECTION APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 13/787956
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/787956 | Wafer inspection interface and wafer inspection apparatus | Mar 6, 2013 | Issued |
Array
(
[id] => 9032109
[patent_doc_number] => 20130234747
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-09-12
[patent_title] => 'FINE PITCH PROBE ARRAY FROM BULK MATERIAL'
[patent_app_type] => utility
[patent_app_number] => 13/788241
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[patent_app_date] => 2013-03-07
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/788241 | FINE PITCH PROBE ARRAY FROM BULK MATERIAL | Mar 6, 2013 | Abandoned |
Array
(
[id] => 9038898
[patent_doc_number] => 20130241536
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-09-19
[patent_title] => 'Magnetic Logic Units Configured to Measure Magnetic Field Direction'
[patent_app_type] => utility
[patent_app_number] => 13/787585
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/787585 | Magnetic logic units configured to measure magnetic field direction | Mar 5, 2013 | Issued |
Array
(
[id] => 9032113
[patent_doc_number] => 20130234751
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-09-12
[patent_title] => 'DUAL POWER-SOURCE COMMUNICATION TESTING APPARATUS AND COMMUNICATION TESTING METHOD THEREOF'
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[patent_app_number] => 13/786719
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/786719 | Dual power-source communication testing apparatus and communication testing method thereof | Mar 5, 2013 | Issued |
Array
(
[id] => 9717431
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[patent_title] => 'Silicon Controlled Rectifier Control of Deep Towed Electromagnetic Source'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/787303 | Silicon controlled rectifier control of sub-sea towed electromagnetic source | Mar 5, 2013 | Issued |
Array
(
[id] => 9488853
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[patent_title] => 'TEST METHOD FOR INTERPOSER'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/784836 | Test method for interposer | Mar 4, 2013 | Issued |
Array
(
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Array
(
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[patent_title] => 'TSVs connected to ground and combined stimulus and testing leads'
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Array
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[patent_title] => 'Using test elements of an integrated circuit for integrated circuit testing'
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Array
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 13/782788 | Simplified resistance based belt inspection | Feb 28, 2013 | Issued |