Search

Michael James Carey

Examiner (ID: 18424, Phone: (571)270-7235 , Office: P/3766 )

Most Active Art Unit
3766
Art Unit(s)
3795, 3766, 3792, 3762, 4187
Total Applications
662
Issued Applications
554
Pending Applications
22
Abandoned Applications
95

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 16637888 [patent_doc_number] => 10916403 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-02-09 [patent_title] => Ion beam apparatus including slit structure for extracting ion beam [patent_app_type] => utility [patent_app_number] => 16/380012 [patent_app_country] => US [patent_app_date] => 2019-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 22 [patent_no_of_words] => 10278 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16380012 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/380012
Ion beam apparatus including slit structure for extracting ion beam Apr 9, 2019 Issued
Array ( [id] => 14587603 [patent_doc_number] => 20190221410 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-07-18 [patent_title] => Parallel Mass Analysis [patent_app_type] => utility [patent_app_number] => 16/365623 [patent_app_country] => US [patent_app_date] => 2019-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6014 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16365623 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/365623
Parallel mass analysis Mar 25, 2019 Issued
Array ( [id] => 16558459 [patent_doc_number] => 20210003608 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-01-07 [patent_title] => METHOD AND SYSTEM FOR AT LEAST SUBSURFACE CHARACTERIZATION OF A SAMPLE [patent_app_type] => utility [patent_app_number] => 16/981983 [patent_app_country] => US [patent_app_date] => 2019-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10957 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 263 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16981983 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/981983
METHOD AND SYSTEM FOR AT LEAST SUBSURFACE CHARACTERIZATION OF A SAMPLE Mar 20, 2019 Abandoned
Array ( [id] => 14926783 [patent_doc_number] => 20190299029 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-10-03 [patent_title] => CHARGED PARTICLE BEAM TREATMENT APPARATUS [patent_app_type] => utility [patent_app_number] => 16/360844 [patent_app_country] => US [patent_app_date] => 2019-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8221 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -2 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16360844 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/360844
CHARGED PARTICLE BEAM TREATMENT APPARATUS Mar 20, 2019 Abandoned
Array ( [id] => 14938251 [patent_doc_number] => 20190304764 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-10-03 [patent_title] => METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETECTOR OF A MASS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 16/359491 [patent_app_country] => US [patent_app_date] => 2019-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5117 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16359491 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/359491
Method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer Mar 19, 2019 Issued
Array ( [id] => 16332190 [patent_doc_number] => 20200303156 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-09-24 [patent_title] => BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE [patent_app_type] => utility [patent_app_number] => 16/359831 [patent_app_country] => US [patent_app_date] => 2019-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6230 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16359831 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/359831
BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE Mar 19, 2019 Abandoned
Array ( [id] => 16386373 [patent_doc_number] => 10811216 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-10-20 [patent_title] => Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping [patent_app_type] => utility [patent_app_number] => 16/359231 [patent_app_country] => US [patent_app_date] => 2019-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 7825 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16359231 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/359231
Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping Mar 19, 2019 Issued
Array ( [id] => 15213625 [patent_doc_number] => 20190369499 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-05 [patent_title] => MULTI-SUBSTRATE PROCESSING ON DIGITAL LITHOGRAPHY SYSTEMS [patent_app_type] => utility [patent_app_number] => 16/358323 [patent_app_country] => US [patent_app_date] => 2019-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4620 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16358323 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/358323
Multi-substrate processing on digital lithography systems Mar 18, 2019 Issued
Array ( [id] => 16327057 [patent_doc_number] => 20200298022 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-09-24 [patent_title] => Pencil Beam Therapy with Fast Deflection Magnet [patent_app_type] => utility [patent_app_number] => 16/358044 [patent_app_country] => US [patent_app_date] => 2019-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11758 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16358044 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/358044
Pencil Beam Therapy with Fast Deflection Magnet Mar 18, 2019 Abandoned
Array ( [id] => 14875081 [patent_doc_number] => 20190287782 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-09-19 [patent_title] => System and Method for Loading an Ion Trap [patent_app_type] => utility [patent_app_number] => 16/357488 [patent_app_country] => US [patent_app_date] => 2019-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7300 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16357488 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/357488
System and method for loading an ion trap Mar 18, 2019 Issued
Array ( [id] => 16609180 [patent_doc_number] => 10910193 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-02-02 [patent_title] => Particle detection assembly, system and method [patent_app_type] => utility [patent_app_number] => 16/356539 [patent_app_country] => US [patent_app_date] => 2019-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 31 [patent_no_of_words] => 7107 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16356539 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/356539
Particle detection assembly, system and method Mar 17, 2019 Issued
Array ( [id] => 16280033 [patent_doc_number] => 10763072 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-09-01 [patent_title] => Apparatus, system and techniques for mass analyzed ion beam [patent_app_type] => utility [patent_app_number] => 16/354638 [patent_app_country] => US [patent_app_date] => 2019-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 14 [patent_no_of_words] => 5330 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16354638 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/354638
Apparatus, system and techniques for mass analyzed ion beam Mar 14, 2019 Issued
Array ( [id] => 17758066 [patent_doc_number] => 11398365 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-07-26 [patent_title] => Positioning samples for microscopy, inspection, or analysis [patent_app_type] => utility [patent_app_number] => 16/355704 [patent_app_country] => US [patent_app_date] => 2019-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 15216 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16355704 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/355704
Positioning samples for microscopy, inspection, or analysis Mar 14, 2019 Issued
Array ( [id] => 15296083 [patent_doc_number] => 20190391177 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-26 [patent_title] => Method and Apparatus for Resolution and Sensitivity Enhanced Atomic Force Microscope Based Infrared Spectroscopy [patent_app_type] => utility [patent_app_number] => 16/351223 [patent_app_country] => US [patent_app_date] => 2019-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14417 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16351223 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/351223
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy Mar 11, 2019 Issued
Array ( [id] => 17803185 [patent_doc_number] => 11417496 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Stage device, charged particle beam apparatus, and vacuum apparatus [patent_app_type] => utility [patent_app_number] => 17/043950 [patent_app_country] => US [patent_app_date] => 2019-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 7041 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17043950 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/043950
Stage device, charged particle beam apparatus, and vacuum apparatus Feb 28, 2019 Issued
Array ( [id] => 17521431 [patent_doc_number] => 20220107280 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-07 [patent_title] => Defect Inspection Device and Defect Inspection Method [patent_app_type] => utility [patent_app_number] => 17/296828 [patent_app_country] => US [patent_app_date] => 2019-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7137 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17296828 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/296828
Defect Inspection Device and Defect Inspection Method Feb 14, 2019 Abandoned
Array ( [id] => 16241480 [patent_doc_number] => 20200258714 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-08-13 [patent_title] => DEVICE AND METHOD FOR OPERATING A CHARGED PARTICLE DEVICE WITH MULTIPLE BEAMLETS [patent_app_type] => utility [patent_app_number] => 16/273961 [patent_app_country] => US [patent_app_date] => 2019-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9088 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16273961 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/273961
Device and method for operating a charged particle device with multiple beamlets Feb 11, 2019 Issued
Array ( [id] => 14718211 [patent_doc_number] => 20190250169 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-08-15 [patent_title] => METHOD FOR ANALYZING MICROORGANISMS [patent_app_type] => utility [patent_app_number] => 16/274058 [patent_app_country] => US [patent_app_date] => 2019-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9440 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16274058 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/274058
Method for analyzing microorganisms Feb 11, 2019 Issued
Array ( [id] => 16593786 [patent_doc_number] => 10903063 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-01-26 [patent_title] => Methods for confirming charged-particle generation in an instrument, and related instruments [patent_app_type] => utility [patent_app_number] => 16/272621 [patent_app_country] => US [patent_app_date] => 2019-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 23 [patent_no_of_words] => 10496 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16272621 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/272621
Methods for confirming charged-particle generation in an instrument, and related instruments Feb 10, 2019 Issued
Array ( [id] => 14722213 [patent_doc_number] => 20190252170 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-08-15 [patent_title] => SAMPLE IONISATION USING A PULSED LASER SOURCE [patent_app_type] => utility [patent_app_number] => 16/272693 [patent_app_country] => US [patent_app_date] => 2019-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10252 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16272693 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/272693
Sample ionisation using a pulsed laser source Feb 10, 2019 Issued
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