Search

Michael Jasper Tsai

Examiner (ID: 4693, Phone: (571)270-5246 , Office: P/3771 )

Most Active Art Unit
3771
Art Unit(s)
3619, 3771, 3785, 3783
Total Applications
519
Issued Applications
310
Pending Applications
23
Abandoned Applications
189

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7811824 [patent_doc_number] => 08134356 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-13 [patent_title] => 'Operating an integrated circuit at a minimum supply voltage' [patent_app_type] => utility [patent_app_number] => 13/046103 [patent_app_country] => US [patent_app_date] => 2011-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 16 [patent_no_of_words] => 13118 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/134/08134356.pdf [firstpage_image] =>[orig_patent_app_number] => 13046103 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/046103
Operating an integrated circuit at a minimum supply voltage Mar 10, 2011 Issued
Array ( [id] => 8956741 [patent_doc_number] => 08502523 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-08-06 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 13/024264 [patent_app_country] => US [patent_app_date] => 2011-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8525 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13024264 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/024264
Test apparatus and test method Feb 8, 2011 Issued
Array ( [id] => 8233471 [patent_doc_number] => 08198909 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-06-12 [patent_title] => 'Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion' [patent_app_type] => utility [patent_app_number] => 13/022803 [patent_app_country] => US [patent_app_date] => 2011-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 15418 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/198/08198909.pdf [firstpage_image] =>[orig_patent_app_number] => 13022803 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/022803
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Feb 7, 2011 Issued
Array ( [id] => 6099684 [patent_doc_number] => 20110163763 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-07 [patent_title] => 'ELECTRICAL CAPACITANCE SENSOR' [patent_app_type] => utility [patent_app_number] => 13/023012 [patent_app_country] => US [patent_app_date] => 2011-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7846 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0163/20110163763.pdf [firstpage_image] =>[orig_patent_app_number] => 13023012 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/023012
Electrical capacitance sensor Feb 7, 2011 Issued
Array ( [id] => 5941353 [patent_doc_number] => 20110101973 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'SENSOR SYSTEM AND METHOD' [patent_app_type] => utility [patent_app_number] => 13/005158 [patent_app_country] => US [patent_app_date] => 2011-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2406 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0101/20110101973.pdf [firstpage_image] =>[orig_patent_app_number] => 13005158 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/005158
Sensor system and method Jan 11, 2011 Issued
Array ( [id] => 6036915 [patent_doc_number] => 20110089964 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-21 [patent_title] => 'METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE USING PROBE AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/980437 [patent_app_country] => US [patent_app_date] => 2010-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6422 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0089/20110089964.pdf [firstpage_image] =>[orig_patent_app_number] => 12980437 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/980437
METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE USING PROBE AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME Dec 28, 2010 Abandoned
Array ( [id] => 8446983 [patent_doc_number] => 08289040 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-16 [patent_title] => 'Test wafer unit and test system' [patent_app_type] => utility [patent_app_number] => 12/947721 [patent_app_country] => US [patent_app_date] => 2010-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8502 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12947721 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/947721
Test wafer unit and test system Nov 15, 2010 Issued
Array ( [id] => 7811846 [patent_doc_number] => 08134378 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-13 [patent_title] => 'Reconfigurable connections for stacked semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/900286 [patent_app_country] => US [patent_app_date] => 2010-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10893 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/134/08134378.pdf [firstpage_image] =>[orig_patent_app_number] => 12900286 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/900286
Reconfigurable connections for stacked semiconductor devices Oct 6, 2010 Issued
Array ( [id] => 6115708 [patent_doc_number] => 20110074456 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'PROBE APPARATUS AND TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/885403 [patent_app_country] => US [patent_app_date] => 2010-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5988 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074456.pdf [firstpage_image] =>[orig_patent_app_number] => 12885403 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/885403
Probe apparatus and test apparatus Sep 16, 2010 Issued
Array ( [id] => 8275499 [patent_doc_number] => 20120169365 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-07-05 [patent_title] => 'SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INSPECTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/395291 [patent_app_country] => US [patent_app_date] => 2010-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 29 [patent_no_of_words] => 12577 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13395291 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/395291
SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INSPECTING APPARATUS Sep 8, 2010 Abandoned
Array ( [id] => 4528186 [patent_doc_number] => 07952368 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-05-31 [patent_title] => 'Apparatus and method for measuring diode chip' [patent_app_type] => utility [patent_app_number] => 12/876218 [patent_app_country] => US [patent_app_date] => 2010-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4455 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/952/07952368.pdf [firstpage_image] =>[orig_patent_app_number] => 12876218 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/876218
Apparatus and method for measuring diode chip Sep 5, 2010 Issued
Array ( [id] => 4605175 [patent_doc_number] => 07986157 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-07-26 [patent_title] => 'High speed probing apparatus for semiconductor devices and probe stage for the same' [patent_app_type] => utility [patent_app_number] => 12/874563 [patent_app_country] => US [patent_app_date] => 2010-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3860 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/986/07986157.pdf [firstpage_image] =>[orig_patent_app_number] => 12874563 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/874563
High speed probing apparatus for semiconductor devices and probe stage for the same Sep 1, 2010 Issued
Array ( [id] => 8544222 [patent_doc_number] => 08319517 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-27 [patent_title] => 'Generator tester' [patent_app_type] => utility [patent_app_number] => 12/868011 [patent_app_country] => US [patent_app_date] => 2010-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2125 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12868011 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/868011
Generator tester Aug 24, 2010 Issued
Array ( [id] => 8528530 [patent_doc_number] => 08305106 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-06 [patent_title] => 'Electronic self-healing methods for radio-frequency receivers' [patent_app_type] => utility [patent_app_number] => 12/806906 [patent_app_country] => US [patent_app_date] => 2010-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 44 [patent_no_of_words] => 11755 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12806906 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/806906
Electronic self-healing methods for radio-frequency receivers Aug 23, 2010 Issued
Array ( [id] => 8871325 [patent_doc_number] => 08466703 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-18 [patent_title] => 'Probe card analysis system and method' [patent_app_type] => utility [patent_app_number] => 12/862375 [patent_app_country] => US [patent_app_date] => 2010-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 10533 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12862375 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/862375
Probe card analysis system and method Aug 23, 2010 Issued
Array ( [id] => 8773219 [patent_doc_number] => 08427182 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-23 [patent_title] => 'Test apparatus and power supply apparatus' [patent_app_type] => utility [patent_app_number] => 12/861695 [patent_app_country] => US [patent_app_date] => 2010-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6741 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 429 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12861695 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/861695
Test apparatus and power supply apparatus Aug 22, 2010 Issued
Array ( [id] => 8871327 [patent_doc_number] => 08466706 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-18 [patent_title] => 'Solar combiner with integrated string current monitoring' [patent_app_type] => utility [patent_app_number] => 12/857778 [patent_app_country] => US [patent_app_date] => 2010-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5637 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12857778 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/857778
Solar combiner with integrated string current monitoring Aug 16, 2010 Issued
Array ( [id] => 7782428 [patent_doc_number] => 20120043984 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-02-23 [patent_title] => 'Test Adapter and Method for Achieving Optical Alignment and Thermal Coupling Thereof With a Device Under Test' [patent_app_type] => utility [patent_app_number] => 12/858424 [patent_app_country] => US [patent_app_date] => 2010-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8192 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20120043984.pdf [firstpage_image] =>[orig_patent_app_number] => 12858424 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/858424
Test adapter and method for achieving optical alignment and thermal coupling thereof with a device under test Aug 16, 2010 Issued
Array ( [id] => 6178628 [patent_doc_number] => 20110121848 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-26 [patent_title] => 'PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/857483 [patent_app_country] => US [patent_app_date] => 2010-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7765 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20110121848.pdf [firstpage_image] =>[orig_patent_app_number] => 12857483 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/857483
Probe wafer, probe device, and testing system Aug 15, 2010 Issued
Array ( [id] => 6052970 [patent_doc_number] => 20110109337 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-12 [patent_title] => 'PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/857478 [patent_app_country] => US [patent_app_date] => 2010-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 8489 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20110109337.pdf [firstpage_image] =>[orig_patent_app_number] => 12857478 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/857478
Probe wafer, probe device, and testing system Aug 15, 2010 Issued
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