Search

Mohammad Sajid Adhami

Examiner (ID: 4101, Phone: (571)272-8615 , Office: P/2471 )

Most Active Art Unit
2471
Art Unit(s)
2616, 2416, 2662, 2471
Total Applications
876
Issued Applications
593
Pending Applications
74
Abandoned Applications
231

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19513446 [patent_doc_number] => 20240345132 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING [patent_app_type] => utility [patent_app_number] => 18/748876 [patent_app_country] => US [patent_app_date] => 2024-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6792 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18748876 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/748876
HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING Jun 19, 2024 Pending
Array ( [id] => 19433911 [patent_doc_number] => 20240302409 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-12 [patent_title] => MEASUREMENT UNIT [patent_app_type] => utility [patent_app_number] => 18/666102 [patent_app_country] => US [patent_app_date] => 2024-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5650 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 233 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18666102 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/666102
MEASUREMENT UNIT May 15, 2024 Pending
Array ( [id] => 20350877 [patent_doc_number] => 20250347729 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-11-13 [patent_title] => ANALYZING BUNDLES OF WIRES [patent_app_type] => utility [patent_app_number] => 18/657422 [patent_app_country] => US [patent_app_date] => 2024-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7102 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -25 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18657422 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/657422
ANALYZING BUNDLES OF WIRES May 6, 2024 Pending
Array ( [id] => 19941550 [patent_doc_number] => 12313676 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2025-05-27 [patent_title] => Planarity control for load pull tuner on wafer [patent_app_type] => utility [patent_app_number] => 18/646174 [patent_app_country] => US [patent_app_date] => 2024-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 0 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 265 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18646174 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/646174
Planarity control for load pull tuner on wafer Apr 24, 2024 Issued
Array ( [id] => 19544367 [patent_doc_number] => 20240361403 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-31 [patent_title] => MAGNETIC SENSOR [patent_app_type] => utility [patent_app_number] => 18/642084 [patent_app_country] => US [patent_app_date] => 2024-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14476 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18642084 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/642084
MAGNETIC SENSOR Apr 21, 2024 Pending
Array ( [id] => 19573144 [patent_doc_number] => 20240377436 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF [patent_app_type] => utility [patent_app_number] => 18/632322 [patent_app_country] => US [patent_app_date] => 2024-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4536 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 257 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18632322 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/632322
PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF Apr 10, 2024 Pending
Array ( [id] => 19573145 [patent_doc_number] => 20240377437 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF [patent_app_type] => utility [patent_app_number] => 18/632321 [patent_app_country] => US [patent_app_date] => 2024-04-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4647 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18632321 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/632321
VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF Apr 10, 2024 Pending
Array ( [id] => 19985101 [patent_doc_number] => 20250123323 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-17 [patent_title] => SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME [patent_app_type] => utility [patent_app_number] => 18/628896 [patent_app_country] => US [patent_app_date] => 2024-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18628896 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/628896
SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME Apr 7, 2024 Pending
Array ( [id] => 19497047 [patent_doc_number] => 20240336065 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-10 [patent_title] => FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSPECTING FLEXIBLE ELECTRIC WIRING SUBSTRATE [patent_app_type] => utility [patent_app_number] => 18/602732 [patent_app_country] => US [patent_app_date] => 2024-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9341 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18602732 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/602732
FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSPECTING FLEXIBLE ELECTRIC WIRING SUBSTRATE Mar 11, 2024 Pending
Array ( [id] => 19235058 [patent_doc_number] => 20240192252 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-13 [patent_title] => CHIP SOCKET, TESTING FIXTURE AND CHIP TESTING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/585507 [patent_app_country] => US [patent_app_date] => 2024-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4961 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18585507 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/585507
Chip socket, testing fixture and chip testing method thereof Feb 22, 2024 Issued
Array ( [id] => 19450303 [patent_doc_number] => 20240310433 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-19 [patent_title] => PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVEL RELIABILITY TEST [patent_app_type] => utility [patent_app_number] => 18/427076 [patent_app_country] => US [patent_app_date] => 2024-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4252 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18427076 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/427076
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVEL RELIABILITY TEST Jan 29, 2024 Pending
Array ( [id] => 19362166 [patent_doc_number] => 20240264200 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-08 [patent_title] => CONTACT PROBE AND PROBE UNIT [patent_app_type] => utility [patent_app_number] => 18/424927 [patent_app_country] => US [patent_app_date] => 2024-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8131 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18424927 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/424927
CONTACT PROBE AND PROBE UNIT Jan 28, 2024 Pending
Array ( [id] => 19143671 [patent_doc_number] => 20240142548 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-02 [patent_title] => MAGNETIC SENSOR AND MAGNETIC SENSOR SYSTEM [patent_app_type] => utility [patent_app_number] => 18/408835 [patent_app_country] => US [patent_app_date] => 2024-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 17976 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18408835 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/408835
Magnetic sensor and magnetic sensor system Jan 9, 2024 Issued
Array ( [id] => 19282955 [patent_doc_number] => 20240219431 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-04 [patent_title] => ELECTRICAL VOLTAGE MEASURING DEVICE USING AN MICROELECTROMECHANICAL SYSTEM AND OPTICAL INTERFEROMETER INTERACTION [patent_app_type] => utility [patent_app_number] => 18/396946 [patent_app_country] => US [patent_app_date] => 2023-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5100 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18396946 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/396946
ELECTRICAL VOLTAGE MEASURING DEVICE USING AN MICROELECTROMECHANICAL SYSTEM AND OPTICAL INTERFEROMETER INTERACTION Dec 26, 2023 Pending
Array ( [id] => 19114073 [patent_doc_number] => 20240125823 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-18 [patent_title] => CURRENT SENSOR [patent_app_type] => utility [patent_app_number] => 18/397828 [patent_app_country] => US [patent_app_date] => 2023-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7447 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18397828 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/397828
CURRENT SENSOR Dec 26, 2023 Pending
Array ( [id] => 20454098 [patent_doc_number] => 12517150 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-06 [patent_title] => Test tool with profiling connector and battery testing method [patent_app_type] => utility [patent_app_number] => 18/532886 [patent_app_country] => US [patent_app_date] => 2023-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 2469 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18532886 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/532886
Test tool with profiling connector and battery testing method Dec 6, 2023 Issued
Array ( [id] => 20051335 [patent_doc_number] => 20250189557 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-06-12 [patent_title] => SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE [patent_app_type] => utility [patent_app_number] => 18/532867 [patent_app_country] => US [patent_app_date] => 2023-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2318 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18532867 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/532867
SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE Dec 6, 2023 Pending
Array ( [id] => 19052285 [patent_doc_number] => 20240094254 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER [patent_app_type] => utility [patent_app_number] => 18/527013 [patent_app_country] => US [patent_app_date] => 2023-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10559 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 210 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18527013 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/527013
Prober controlling device, prober controlling method, and prober Nov 30, 2023 Issued
Array ( [id] => 19035642 [patent_doc_number] => 20240085457 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => Probes with Multiple Springs, Methods for Making, and Methods for Using [patent_app_type] => utility [patent_app_number] => 18/518116 [patent_app_country] => US [patent_app_date] => 2023-11-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 37764 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -37 [patent_words_short_claim] => 330 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18518116 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/518116
Probes with Multiple Springs, Methods for Making, and Methods for Using Nov 21, 2023 Abandoned
Array ( [id] => 20330853 [patent_doc_number] => 12461125 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-04 [patent_title] => Contact probe [patent_app_type] => utility [patent_app_number] => 18/516587 [patent_app_country] => US [patent_app_date] => 2023-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 0 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18516587 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/516587
Contact probe Nov 20, 2023 Issued
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