
Mohammad Sajid Adhami
Examiner (ID: 4101, Phone: (571)272-8615 , Office: P/2471 )
| Most Active Art Unit | 2471 |
| Art Unit(s) | 2616, 2416, 2662, 2471 |
| Total Applications | 876 |
| Issued Applications | 593 |
| Pending Applications | 74 |
| Abandoned Applications | 231 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 19513446
[patent_doc_number] => 20240345132
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-17
[patent_title] => HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING
[patent_app_type] => utility
[patent_app_number] => 18/748876
[patent_app_country] => US
[patent_app_date] => 2024-06-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6792
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 305
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18748876
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/748876 | HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING | Jun 19, 2024 | Pending |
Array
(
[id] => 19433911
[patent_doc_number] => 20240302409
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-12
[patent_title] => MEASUREMENT UNIT
[patent_app_type] => utility
[patent_app_number] => 18/666102
[patent_app_country] => US
[patent_app_date] => 2024-05-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5650
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 233
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18666102
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/666102 | MEASUREMENT UNIT | May 15, 2024 | Pending |
Array
(
[id] => 20350877
[patent_doc_number] => 20250347729
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-11-13
[patent_title] => ANALYZING BUNDLES OF WIRES
[patent_app_type] => utility
[patent_app_number] => 18/657422
[patent_app_country] => US
[patent_app_date] => 2024-05-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7102
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -25
[patent_words_short_claim] => 71
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18657422
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/657422 | ANALYZING BUNDLES OF WIRES | May 6, 2024 | Pending |
Array
(
[id] => 19941550
[patent_doc_number] => 12313676
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2025-05-27
[patent_title] => Planarity control for load pull tuner on wafer
[patent_app_type] => utility
[patent_app_number] => 18/646174
[patent_app_country] => US
[patent_app_date] => 2024-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 12
[patent_no_of_words] => 0
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 265
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18646174
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/646174 | Planarity control for load pull tuner on wafer | Apr 24, 2024 | Issued |
Array
(
[id] => 19544367
[patent_doc_number] => 20240361403
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-31
[patent_title] => MAGNETIC SENSOR
[patent_app_type] => utility
[patent_app_number] => 18/642084
[patent_app_country] => US
[patent_app_date] => 2024-04-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 14476
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 196
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18642084
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/642084 | MAGNETIC SENSOR | Apr 21, 2024 | Pending |
Array
(
[id] => 19573144
[patent_doc_number] => 20240377436
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-14
[patent_title] => PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/632322
[patent_app_country] => US
[patent_app_date] => 2024-04-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4536
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 257
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18632322
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/632322 | PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF | Apr 10, 2024 | Pending |
Array
(
[id] => 19573145
[patent_doc_number] => 20240377437
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-14
[patent_title] => VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/632321
[patent_app_country] => US
[patent_app_date] => 2024-04-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4647
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 176
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18632321
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/632321 | VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF | Apr 10, 2024 | Pending |
Array
(
[id] => 19985101
[patent_doc_number] => 20250123323
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-04-17
[patent_title] => SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/628896
[patent_app_country] => US
[patent_app_date] => 2024-04-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18628896
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/628896 | SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME | Apr 7, 2024 | Pending |
Array
(
[id] => 19497047
[patent_doc_number] => 20240336065
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-10
[patent_title] => FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSPECTING FLEXIBLE ELECTRIC WIRING SUBSTRATE
[patent_app_type] => utility
[patent_app_number] => 18/602732
[patent_app_country] => US
[patent_app_date] => 2024-03-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 9341
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18602732
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/602732 | FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSPECTING FLEXIBLE ELECTRIC WIRING SUBSTRATE | Mar 11, 2024 | Pending |
Array
(
[id] => 19235058
[patent_doc_number] => 20240192252
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-13
[patent_title] => CHIP SOCKET, TESTING FIXTURE AND CHIP TESTING METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/585507
[patent_app_country] => US
[patent_app_date] => 2024-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4961
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 101
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18585507
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/585507 | Chip socket, testing fixture and chip testing method thereof | Feb 22, 2024 | Issued |
Array
(
[id] => 19450303
[patent_doc_number] => 20240310433
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-09-19
[patent_title] => PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVEL RELIABILITY TEST
[patent_app_type] => utility
[patent_app_number] => 18/427076
[patent_app_country] => US
[patent_app_date] => 2024-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4252
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 152
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18427076
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/427076 | PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVEL RELIABILITY TEST | Jan 29, 2024 | Pending |
Array
(
[id] => 19362166
[patent_doc_number] => 20240264200
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-08
[patent_title] => CONTACT PROBE AND PROBE UNIT
[patent_app_type] => utility
[patent_app_number] => 18/424927
[patent_app_country] => US
[patent_app_date] => 2024-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8131
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 167
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18424927
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/424927 | CONTACT PROBE AND PROBE UNIT | Jan 28, 2024 | Pending |
Array
(
[id] => 19143671
[patent_doc_number] => 20240142548
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-02
[patent_title] => MAGNETIC SENSOR AND MAGNETIC SENSOR SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/408835
[patent_app_country] => US
[patent_app_date] => 2024-01-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 17976
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 232
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18408835
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/408835 | Magnetic sensor and magnetic sensor system | Jan 9, 2024 | Issued |
Array
(
[id] => 19282955
[patent_doc_number] => 20240219431
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-07-04
[patent_title] => ELECTRICAL VOLTAGE MEASURING DEVICE USING AN MICROELECTROMECHANICAL SYSTEM AND OPTICAL INTERFEROMETER INTERACTION
[patent_app_type] => utility
[patent_app_number] => 18/396946
[patent_app_country] => US
[patent_app_date] => 2023-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5100
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 197
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18396946
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/396946 | ELECTRICAL VOLTAGE MEASURING DEVICE USING AN MICROELECTROMECHANICAL SYSTEM AND OPTICAL INTERFEROMETER INTERACTION | Dec 26, 2023 | Pending |
Array
(
[id] => 19114073
[patent_doc_number] => 20240125823
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-18
[patent_title] => CURRENT SENSOR
[patent_app_type] => utility
[patent_app_number] => 18/397828
[patent_app_country] => US
[patent_app_date] => 2023-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7447
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -5
[patent_words_short_claim] => 95
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18397828
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/397828 | CURRENT SENSOR | Dec 26, 2023 | Pending |
Array
(
[id] => 20454098
[patent_doc_number] => 12517150
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2026-01-06
[patent_title] => Test tool with profiling connector and battery testing method
[patent_app_type] => utility
[patent_app_number] => 18/532886
[patent_app_country] => US
[patent_app_date] => 2023-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 2469
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 251
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18532886
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/532886 | Test tool with profiling connector and battery testing method | Dec 6, 2023 | Issued |
Array
(
[id] => 20051335
[patent_doc_number] => 20250189557
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-06-12
[patent_title] => SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE
[patent_app_type] => utility
[patent_app_number] => 18/532867
[patent_app_country] => US
[patent_app_date] => 2023-12-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2318
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 90
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18532867
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/532867 | SOCKET APPARATUS FOR SECURE PLACEMENT OF CHIP PACKAGE | Dec 6, 2023 | Pending |
Array
(
[id] => 19052285
[patent_doc_number] => 20240094254
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-03-21
[patent_title] => PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER
[patent_app_type] => utility
[patent_app_number] => 18/527013
[patent_app_country] => US
[patent_app_date] => 2023-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10559
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 210
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18527013
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/527013 | Prober controlling device, prober controlling method, and prober | Nov 30, 2023 | Issued |
Array
(
[id] => 19035642
[patent_doc_number] => 20240085457
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-03-14
[patent_title] => Probes with Multiple Springs, Methods for Making, and Methods for Using
[patent_app_type] => utility
[patent_app_number] => 18/518116
[patent_app_country] => US
[patent_app_date] => 2023-11-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 37764
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -37
[patent_words_short_claim] => 330
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18518116
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/518116 | Probes with Multiple Springs, Methods for Making, and Methods for Using | Nov 21, 2023 | Abandoned |
Array
(
[id] => 20330853
[patent_doc_number] => 12461125
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-11-04
[patent_title] => Contact probe
[patent_app_type] => utility
[patent_app_number] => 18/516587
[patent_app_country] => US
[patent_app_date] => 2023-11-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 14
[patent_no_of_words] => 0
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18516587
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/516587 | Contact probe | Nov 20, 2023 | Issued |