Search

Mohammad Sajid Adhami

Examiner (ID: 4101, Phone: (571)272-8615 , Office: P/2471 )

Most Active Art Unit
2471
Art Unit(s)
2616, 2416, 2662, 2471
Total Applications
876
Issued Applications
593
Pending Applications
74
Abandoned Applications
231

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 16187538 [patent_doc_number] => 10720883 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-07-21 [patent_title] => Apparatus and method for testing performance of multi-junction solar cells [patent_app_type] => utility [patent_app_number] => 15/495845 [patent_app_country] => US [patent_app_date] => 2017-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 8000 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15495845 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/495845
Apparatus and method for testing performance of multi-junction solar cells Apr 23, 2017 Issued
Array ( [id] => 13510591 [patent_doc_number] => 20180306838 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-10-25 [patent_title] => PROBE, MEASURING SYSTEM AS WELL AS TEST SETUP [patent_app_type] => utility [patent_app_number] => 15/494338 [patent_app_country] => US [patent_app_date] => 2017-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2455 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15494338 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/494338
Probe, measuring system as well as test setup Apr 20, 2017 Issued
Array ( [id] => 12983758 [patent_doc_number] => 20170343581 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-11-30 [patent_title] => DETECTION DATA STORAGE DEVICE FOR DETECTION PROBE [patent_app_type] => utility [patent_app_number] => 15/494049 [patent_app_country] => US [patent_app_date] => 2017-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2853 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 245 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15494049 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/494049
Detection data storage device for detection probe Apr 20, 2017 Issued
Array ( [id] => 11837922 [patent_doc_number] => 20170219641 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-03 [patent_title] => 'Charging Systems with Direct Charging Port Support and Extended Capabilities' [patent_app_type] => utility [patent_app_number] => 15/489467 [patent_app_country] => US [patent_app_date] => 2017-04-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7444 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15489467 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/489467
Charging systems with direct charging port support and extended capabilities Apr 16, 2017 Issued
Array ( [id] => 16384512 [patent_doc_number] => 10809340 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-10-20 [patent_title] => Magnetic resonance imaging apparatus and program [patent_app_type] => utility [patent_app_number] => 16/086766 [patent_app_country] => US [patent_app_date] => 2017-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 41 [patent_figures_cnt] => 41 [patent_no_of_words] => 8517 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16086766 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/086766
Magnetic resonance imaging apparatus and program Mar 30, 2017 Issued
Array ( [id] => 11950704 [patent_doc_number] => 20170254855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-09-07 [patent_title] => 'VOLTAGE MEASUREMENT METHOD FOR BATTERY' [patent_app_type] => utility [patent_app_number] => 15/447874 [patent_app_country] => US [patent_app_date] => 2017-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 11806 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447874 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/447874
Voltage measurement method for battery Mar 1, 2017 Issued
Array ( [id] => 12160403 [patent_doc_number] => 20180031668 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-01 [patent_title] => 'TEST APPARATUS WHICH TESTS SEMICONDUCTOR CHIPS' [patent_app_type] => utility [patent_app_number] => 15/448085 [patent_app_country] => US [patent_app_date] => 2017-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9626 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15448085 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/448085
Test apparatus which tests semiconductor chips Mar 1, 2017 Issued
Array ( [id] => 15980681 [patent_doc_number] => 10670662 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-06-02 [patent_title] => Method and apparatus for calibrating coulomb counting based state-of-charge estimation [patent_app_type] => utility [patent_app_number] => 15/447128 [patent_app_country] => US [patent_app_date] => 2017-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4629 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447128 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/447128
Method and apparatus for calibrating coulomb counting based state-of-charge estimation Mar 1, 2017 Issued
Array ( [id] => 16030863 [patent_doc_number] => 10677845 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-06-09 [patent_title] => Converged test platforms and processes for class and system testing of integrated circuits [patent_app_type] => utility [patent_app_number] => 15/447095 [patent_app_country] => US [patent_app_date] => 2017-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 7730 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447095 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/447095
Converged test platforms and processes for class and system testing of integrated circuits Feb 28, 2017 Issued
Array ( [id] => 12160341 [patent_doc_number] => 20180031607 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-02-01 [patent_title] => 'COMMON BOARD OF AN ADAPTOR FOR A TESTER, ADAPTOR FOR A TESTER, AND TESTER INCLUDING THE COMMON BOARD' [patent_app_type] => utility [patent_app_number] => 15/447084 [patent_app_country] => US [patent_app_date] => 2017-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7120 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15447084 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/447084
COMMON BOARD OF AN ADAPTOR FOR A TESTER, ADAPTOR FOR A TESTER, AND TESTER INCLUDING THE COMMON BOARD Feb 28, 2017 Abandoned
Array ( [id] => 15515263 [patent_doc_number] => 10564213 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-02-18 [patent_title] => Dielectric breakdown monitor [patent_app_type] => utility [patent_app_number] => 15/443688 [patent_app_country] => US [patent_app_date] => 2017-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 7564 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15443688 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/443688
Dielectric breakdown monitor Feb 26, 2017 Issued
Array ( [id] => 16322187 [patent_doc_number] => 10782145 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-09-22 [patent_title] => Devices and methods for determining a distance travelled [patent_app_type] => utility [patent_app_number] => 15/441829 [patent_app_country] => US [patent_app_date] => 2017-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 3809 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15441829 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/441829
Devices and methods for determining a distance travelled Feb 23, 2017 Issued
Array ( [id] => 16757804 [patent_doc_number] => 10976346 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-04-13 [patent_title] => Socket [patent_app_type] => utility [patent_app_number] => 15/441366 [patent_app_country] => US [patent_app_date] => 2017-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 7162 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15441366 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/441366
Socket Feb 23, 2017 Issued
Array ( [id] => 15823953 [patent_doc_number] => 10637179 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-04-28 [patent_title] => Hermetic RF connection for on-wafer operation [patent_app_type] => utility [patent_app_number] => 15/440734 [patent_app_country] => US [patent_app_date] => 2017-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 17 [patent_no_of_words] => 2734 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15440734 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/440734
Hermetic RF connection for on-wafer operation Feb 22, 2017 Issued
Array ( [id] => 11957394 [patent_doc_number] => 20170261547 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-09-14 [patent_title] => 'Temperature Forcing System and Method with Conductive Thermal Probes' [patent_app_type] => utility [patent_app_number] => 15/437861 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3495 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15437861 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/437861
Temperature Forcing System and Method with Conductive Thermal Probes Feb 20, 2017 Abandoned
Array ( [id] => 14425259 [patent_doc_number] => 10317429 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-06-11 [patent_title] => Bolt type probe [patent_app_type] => utility [patent_app_number] => 15/437464 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 3398 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 259 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15437464 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/437464
Bolt type probe Feb 20, 2017 Issued
Array ( [id] => 11937905 [patent_doc_number] => 20170242055 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-24 [patent_title] => 'KELVIN CONTACT ASSEMBLY AND METHOD OF INSTALLATION THEREOF' [patent_app_type] => utility [patent_app_number] => 15/438721 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 3133 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15438721 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/438721
Kelvin contact assembly and method of installation thereof Feb 20, 2017 Issued
Array ( [id] => 13374839 [patent_doc_number] => 20180238961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-08-23 [patent_title] => Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias [patent_app_type] => utility [patent_app_number] => 15/437713 [patent_app_country] => US [patent_app_date] => 2017-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5873 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15437713 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/437713
Terahertz plasmonics for testing very large-scale integrated circuits under bias Feb 20, 2017 Issued
Array ( [id] => 13816401 [patent_doc_number] => 10184966 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-01-22 [patent_title] => Signal inspection apparatus, signal inspection system, signal inspection method, and non-transitory computer-readable medium encoded with signal inspection program [patent_app_type] => utility [patent_app_number] => 15/436077 [patent_app_country] => US [patent_app_date] => 2017-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2904 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15436077 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/436077
Signal inspection apparatus, signal inspection system, signal inspection method, and non-transitory computer-readable medium encoded with signal inspection program Feb 16, 2017 Issued
Array ( [id] => 12817513 [patent_doc_number] => 20180164343 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-06-14 [patent_title] => UNIVERSAL TEST MECHANISM FOR SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 15/434099 [patent_app_country] => US [patent_app_date] => 2017-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6076 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15434099 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/434099
Universal test mechanism for semiconductor device Feb 15, 2017 Issued
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