Search

Monica E. Millner

Examiner (ID: 18810)

Most Active Art Unit
3632
Art Unit(s)
3632, 3508, 3627
Total Applications
1502
Issued Applications
1157
Pending Applications
88
Abandoned Applications
284

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8726255 [patent_doc_number] => 08405381 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-26 [patent_title] => 'Power sensor for a current carrying conductor' [patent_app_type] => utility [patent_app_number] => 12/675178 [patent_app_country] => US [patent_app_date] => 2007-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 1046 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12675178 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/675178
Power sensor for a current carrying conductor Aug 26, 2007 Issued
Array ( [id] => 4763126 [patent_doc_number] => 20080174336 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-24 [patent_title] => 'Circuit and method for detecting skew of transistor in semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/892584 [patent_app_country] => US [patent_app_date] => 2007-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2076 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20080174336.pdf [firstpage_image] =>[orig_patent_app_number] => 11892584 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/892584
Circuit and method for detecting skew of transistors in a semiconductor device Aug 23, 2007 Issued
Array ( [id] => 4769267 [patent_doc_number] => 20080054925 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'TEST CHIP SOCKET' [patent_app_type] => utility [patent_app_number] => 11/841396 [patent_app_country] => US [patent_app_date] => 2007-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4761 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054925.pdf [firstpage_image] =>[orig_patent_app_number] => 11841396 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/841396
Test chip socket and method for testing a chip Aug 19, 2007 Issued
Array ( [id] => 4667619 [patent_doc_number] => 20080042679 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC COMPONENTS' [patent_app_type] => utility [patent_app_number] => 11/839899 [patent_app_country] => US [patent_app_date] => 2007-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5068 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042679.pdf [firstpage_image] =>[orig_patent_app_number] => 11839899 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/839899
Method and apparatus for controlling the temperature of electronic components Aug 15, 2007 Issued
Array ( [id] => 4789910 [patent_doc_number] => 20080290883 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-11-27 [patent_title] => 'Testboard with ZIF connectors, method of assembling, integrated circuit test system and test method introduced by the same' [patent_app_type] => utility [patent_app_number] => 11/889397 [patent_app_country] => US [patent_app_date] => 2007-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4845 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20080290883.pdf [firstpage_image] =>[orig_patent_app_number] => 11889397 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/889397
Testboard with ZIF connectors, method of assembling, integrated circuit test system and test method introduced by the same Aug 12, 2007 Abandoned
Array ( [id] => 197836 [patent_doc_number] => 07639028 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-12-29 [patent_title] => 'Probe card assembly with ZIF connectors' [patent_app_type] => utility [patent_app_number] => 11/889398 [patent_app_country] => US [patent_app_date] => 2007-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 5442 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/639/07639028.pdf [firstpage_image] =>[orig_patent_app_number] => 11889398 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/889398
Probe card assembly with ZIF connectors Aug 12, 2007 Issued
Array ( [id] => 803740 [patent_doc_number] => 07423447 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-09-09 [patent_title] => 'Method for testing liquid crystal display panels' [patent_app_type] => utility [patent_app_number] => 11/837098 [patent_app_country] => US [patent_app_date] => 2007-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3512 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/423/07423447.pdf [firstpage_image] =>[orig_patent_app_number] => 11837098 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/837098
Method for testing liquid crystal display panels Aug 9, 2007 Issued
Array ( [id] => 4794841 [patent_doc_number] => 20080006427 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-10 [patent_title] => 'Method and System for Testing or Measuring Electrical Elements, Using Two Offset Pulses' [patent_app_type] => utility [patent_app_number] => 11/833392 [patent_app_country] => US [patent_app_date] => 2007-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 9572 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20080006427.pdf [firstpage_image] =>[orig_patent_app_number] => 11833392 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/833392
Method and System for Testing or Measuring Electrical Elements, Using Two Offset Pulses Aug 2, 2007 Abandoned
Array ( [id] => 4907583 [patent_doc_number] => 20080018349 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-24 [patent_title] => 'METHOD FOR TESTING ELECTRICAL ELEMENTS USING AN INDIRECT PHOTOELECTRIC EFFECT' [patent_app_type] => utility [patent_app_number] => 11/833394 [patent_app_country] => US [patent_app_date] => 2007-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 10521 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20080018349.pdf [firstpage_image] =>[orig_patent_app_number] => 11833394 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/833394
METHOD FOR TESTING ELECTRICAL ELEMENTS USING AN INDIRECT PHOTOELECTRIC EFFECT Aug 2, 2007 Abandoned
Array ( [id] => 292866 [patent_doc_number] => 07545161 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-09 [patent_title] => 'Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes' [patent_app_type] => utility [patent_app_number] => 11/832796 [patent_app_country] => US [patent_app_date] => 2007-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 4167 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/545/07545161.pdf [firstpage_image] =>[orig_patent_app_number] => 11832796 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/832796
Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes Aug 1, 2007 Issued
Array ( [id] => 4686029 [patent_doc_number] => 20080030210 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'Test socket' [patent_app_type] => utility [patent_app_number] => 11/888792 [patent_app_country] => US [patent_app_date] => 2007-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 964 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20080030210.pdf [firstpage_image] =>[orig_patent_app_number] => 11888792 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/888792
Test socket Aug 1, 2007 Abandoned
Array ( [id] => 4444110 [patent_doc_number] => 07928721 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Method and apparatus for amplifying a signal and test device using same' [patent_app_type] => utility [patent_app_number] => 11/881699 [patent_app_country] => US [patent_app_date] => 2007-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2555 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 329 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928721.pdf [firstpage_image] =>[orig_patent_app_number] => 11881699 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/881699
Method and apparatus for amplifying a signal and test device using same Jul 25, 2007 Issued
Array ( [id] => 7492884 [patent_doc_number] => 08030958 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-10-04 [patent_title] => 'System for providing a reference voltage to a semiconductor integrated circuit' [patent_app_type] => utility [patent_app_number] => 11/878498 [patent_app_country] => US [patent_app_date] => 2007-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2520 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/030/08030958.pdf [firstpage_image] =>[orig_patent_app_number] => 11878498 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/878498
System for providing a reference voltage to a semiconductor integrated circuit Jul 24, 2007 Issued
Array ( [id] => 6312757 [patent_doc_number] => 20100194420 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-05 [patent_title] => 'CONTACTOR, PROBE CARD, AND METHOD OF MOUNTING CONTACTOR' [patent_app_type] => utility [patent_app_number] => 12/670247 [patent_app_country] => US [patent_app_date] => 2007-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 4831 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0194/20100194420.pdf [firstpage_image] =>[orig_patent_app_number] => 12670247 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/670247
Contactor, probe card, and method of mounting contactor Jul 23, 2007 Issued
Array ( [id] => 4655298 [patent_doc_number] => 20080024159 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-31 [patent_title] => 'COMPENSATION FOR VOLTAGE DROP IN AUTOMATIC TEST EQUI0PMENT' [patent_app_type] => utility [patent_app_number] => 11/780395 [patent_app_country] => US [patent_app_date] => 2007-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3410 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20080024159.pdf [firstpage_image] =>[orig_patent_app_number] => 11780395 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/780395
Compensation for voltage drop in automatic test equipment Jul 18, 2007 Issued
Array ( [id] => 345610 [patent_doc_number] => 07498800 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-03-03 [patent_title] => 'Methods and apparatus for rotationally accessed tester interface' [patent_app_type] => utility [patent_app_number] => 11/880093 [patent_app_country] => US [patent_app_date] => 2007-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2661 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/498/07498800.pdf [firstpage_image] =>[orig_patent_app_number] => 11880093 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/880093
Methods and apparatus for rotationally accessed tester interface Jul 17, 2007 Issued
Array ( [id] => 5307997 [patent_doc_number] => 20090015278 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-15 [patent_title] => 'APPARATUS TO MONITOR SUBSTRATE VIABILITY' [patent_app_type] => utility [patent_app_number] => 11/776996 [patent_app_country] => US [patent_app_date] => 2007-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5109 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0015/20090015278.pdf [firstpage_image] =>[orig_patent_app_number] => 11776996 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/776996
APPARATUS TO MONITOR SUBSTRATE VIABILITY Jul 11, 2007 Abandoned
Array ( [id] => 4661419 [patent_doc_number] => 20080252326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-16 [patent_title] => 'Probe' [patent_app_type] => utility [patent_app_number] => 11/824998 [patent_app_country] => US [patent_app_date] => 2007-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4847 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20080252326.pdf [firstpage_image] =>[orig_patent_app_number] => 11824998 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/824998
Spring loaded probe pin Jul 1, 2007 Issued
Array ( [id] => 5294271 [patent_doc_number] => 20090009197 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'PROBE FOR ELECTRICAL TEST' [patent_app_type] => utility [patent_app_number] => 11/772796 [patent_app_country] => US [patent_app_date] => 2007-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3117 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0009/20090009197.pdf [firstpage_image] =>[orig_patent_app_number] => 11772796 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/772796
PROBE FOR ELECTRICAL TEST Jul 1, 2007 Abandoned
Array ( [id] => 282347 [patent_doc_number] => 07554348 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-06-30 [patent_title] => 'Multi-offset die head' [patent_app_type] => utility [patent_app_number] => 11/770896 [patent_app_country] => US [patent_app_date] => 2007-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3019 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 217 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/554/07554348.pdf [firstpage_image] =>[orig_patent_app_number] => 11770896 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/770896
Multi-offset die head Jun 28, 2007 Issued
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