
Monica E. Millner
Examiner (ID: 18810)
| Most Active Art Unit | 3632 |
| Art Unit(s) | 3632, 3508, 3627 |
| Total Applications | 1502 |
| Issued Applications | 1157 |
| Pending Applications | 88 |
| Abandoned Applications | 284 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 8726255
[patent_doc_number] => 08405381
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-03-26
[patent_title] => 'Power sensor for a current carrying conductor'
[patent_app_type] => utility
[patent_app_number] => 12/675178
[patent_app_country] => US
[patent_app_date] => 2007-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 1046
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[patent_words_short_claim] => 99
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12675178
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/675178 | Power sensor for a current carrying conductor | Aug 26, 2007 | Issued |
Array
(
[id] => 4763126
[patent_doc_number] => 20080174336
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-07-24
[patent_title] => 'Circuit and method for detecting skew of transistor in semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/892584
[patent_app_country] => US
[patent_app_date] => 2007-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => publications/A1/0174/20080174336.pdf
[firstpage_image] =>[orig_patent_app_number] => 11892584
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/892584 | Circuit and method for detecting skew of transistors in a semiconductor device | Aug 23, 2007 | Issued |
Array
(
[id] => 4769267
[patent_doc_number] => 20080054925
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-06
[patent_title] => 'TEST CHIP SOCKET'
[patent_app_type] => utility
[patent_app_number] => 11/841396
[patent_app_country] => US
[patent_app_date] => 2007-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
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[patent_no_of_words] => 4761
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[pdf_file] => publications/A1/0054/20080054925.pdf
[firstpage_image] =>[orig_patent_app_number] => 11841396
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/841396 | Test chip socket and method for testing a chip | Aug 19, 2007 | Issued |
Array
(
[id] => 4667619
[patent_doc_number] => 20080042679
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-21
[patent_title] => 'METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC COMPONENTS'
[patent_app_type] => utility
[patent_app_number] => 11/839899
[patent_app_country] => US
[patent_app_date] => 2007-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5068
[patent_no_of_claims] => 26
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0042/20080042679.pdf
[firstpage_image] =>[orig_patent_app_number] => 11839899
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/839899 | Method and apparatus for controlling the temperature of electronic components | Aug 15, 2007 | Issued |
Array
(
[id] => 4789910
[patent_doc_number] => 20080290883
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-11-27
[patent_title] => 'Testboard with ZIF connectors, method of assembling, integrated circuit test system and test method introduced by the same'
[patent_app_type] => utility
[patent_app_number] => 11/889397
[patent_app_country] => US
[patent_app_date] => 2007-08-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0290/20080290883.pdf
[firstpage_image] =>[orig_patent_app_number] => 11889397
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/889397 | Testboard with ZIF connectors, method of assembling, integrated circuit test system and test method introduced by the same | Aug 12, 2007 | Abandoned |
Array
(
[id] => 197836
[patent_doc_number] => 07639028
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-12-29
[patent_title] => 'Probe card assembly with ZIF connectors'
[patent_app_type] => utility
[patent_app_number] => 11/889398
[patent_app_country] => US
[patent_app_date] => 2007-08-13
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/639/07639028.pdf
[firstpage_image] =>[orig_patent_app_number] => 11889398
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/889398 | Probe card assembly with ZIF connectors | Aug 12, 2007 | Issued |
Array
(
[id] => 803740
[patent_doc_number] => 07423447
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-09-09
[patent_title] => 'Method for testing liquid crystal display panels'
[patent_app_type] => utility
[patent_app_number] => 11/837098
[patent_app_country] => US
[patent_app_date] => 2007-08-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 3512
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/423/07423447.pdf
[firstpage_image] =>[orig_patent_app_number] => 11837098
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/837098 | Method for testing liquid crystal display panels | Aug 9, 2007 | Issued |
Array
(
[id] => 4794841
[patent_doc_number] => 20080006427
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-10
[patent_title] => 'Method and System for Testing or Measuring Electrical Elements, Using Two Offset Pulses'
[patent_app_type] => utility
[patent_app_number] => 11/833392
[patent_app_country] => US
[patent_app_date] => 2007-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 9572
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 3
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0006/20080006427.pdf
[firstpage_image] =>[orig_patent_app_number] => 11833392
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/833392 | Method and System for Testing or Measuring Electrical Elements, Using Two Offset Pulses | Aug 2, 2007 | Abandoned |
Array
(
[id] => 4907583
[patent_doc_number] => 20080018349
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-24
[patent_title] => 'METHOD FOR TESTING ELECTRICAL ELEMENTS USING AN INDIRECT PHOTOELECTRIC EFFECT'
[patent_app_type] => utility
[patent_app_number] => 11/833394
[patent_app_country] => US
[patent_app_date] => 2007-08-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 10521
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[pdf_file] => publications/A1/0018/20080018349.pdf
[firstpage_image] =>[orig_patent_app_number] => 11833394
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/833394 | METHOD FOR TESTING ELECTRICAL ELEMENTS USING AN INDIRECT PHOTOELECTRIC EFFECT | Aug 2, 2007 | Abandoned |
Array
(
[id] => 292866
[patent_doc_number] => 07545161
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-09
[patent_title] => 'Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes'
[patent_app_type] => utility
[patent_app_number] => 11/832796
[patent_app_country] => US
[patent_app_date] => 2007-08-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 4167
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[pdf_file] => patents/07/545/07545161.pdf
[firstpage_image] =>[orig_patent_app_number] => 11832796
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/832796 | Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes | Aug 1, 2007 | Issued |
Array
(
[id] => 4686029
[patent_doc_number] => 20080030210
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'Test socket'
[patent_app_type] => utility
[patent_app_number] => 11/888792
[patent_app_country] => US
[patent_app_date] => 2007-08-02
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0030/20080030210.pdf
[firstpage_image] =>[orig_patent_app_number] => 11888792
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/888792 | Test socket | Aug 1, 2007 | Abandoned |
Array
(
[id] => 4444110
[patent_doc_number] => 07928721
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-04-19
[patent_title] => 'Method and apparatus for amplifying a signal and test device using same'
[patent_app_type] => utility
[patent_app_number] => 11/881699
[patent_app_country] => US
[patent_app_date] => 2007-07-26
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/928/07928721.pdf
[firstpage_image] =>[orig_patent_app_number] => 11881699
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/881699 | Method and apparatus for amplifying a signal and test device using same | Jul 25, 2007 | Issued |
Array
(
[id] => 7492884
[patent_doc_number] => 08030958
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-10-04
[patent_title] => 'System for providing a reference voltage to a semiconductor integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 11/878498
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[patent_app_date] => 2007-07-25
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[pdf_file] => patents/08/030/08030958.pdf
[firstpage_image] =>[orig_patent_app_number] => 11878498
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/878498 | System for providing a reference voltage to a semiconductor integrated circuit | Jul 24, 2007 | Issued |
Array
(
[id] => 6312757
[patent_doc_number] => 20100194420
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-05
[patent_title] => 'CONTACTOR, PROBE CARD, AND METHOD OF MOUNTING CONTACTOR'
[patent_app_type] => utility
[patent_app_number] => 12/670247
[patent_app_country] => US
[patent_app_date] => 2007-07-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
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[firstpage_image] =>[orig_patent_app_number] => 12670247
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/670247 | Contactor, probe card, and method of mounting contactor | Jul 23, 2007 | Issued |
Array
(
[id] => 4655298
[patent_doc_number] => 20080024159
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-31
[patent_title] => 'COMPENSATION FOR VOLTAGE DROP IN AUTOMATIC TEST EQUI0PMENT'
[patent_app_type] => utility
[patent_app_number] => 11/780395
[patent_app_country] => US
[patent_app_date] => 2007-07-19
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[pdf_file] => publications/A1/0024/20080024159.pdf
[firstpage_image] =>[orig_patent_app_number] => 11780395
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/780395 | Compensation for voltage drop in automatic test equipment | Jul 18, 2007 | Issued |
Array
(
[id] => 345610
[patent_doc_number] => 07498800
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-03-03
[patent_title] => 'Methods and apparatus for rotationally accessed tester interface'
[patent_app_type] => utility
[patent_app_number] => 11/880093
[patent_app_country] => US
[patent_app_date] => 2007-07-18
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[pdf_file] => patents/07/498/07498800.pdf
[firstpage_image] =>[orig_patent_app_number] => 11880093
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/880093 | Methods and apparatus for rotationally accessed tester interface | Jul 17, 2007 | Issued |
Array
(
[id] => 5307997
[patent_doc_number] => 20090015278
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-01-15
[patent_title] => 'APPARATUS TO MONITOR SUBSTRATE VIABILITY'
[patent_app_type] => utility
[patent_app_number] => 11/776996
[patent_app_country] => US
[patent_app_date] => 2007-07-12
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/776996 | APPARATUS TO MONITOR SUBSTRATE VIABILITY | Jul 11, 2007 | Abandoned |
Array
(
[id] => 4661419
[patent_doc_number] => 20080252326
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[patent_issue_date] => 2008-10-16
[patent_title] => 'Probe'
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[firstpage_image] =>[orig_patent_app_number] => 11824998
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/824998 | Spring loaded probe pin | Jul 1, 2007 | Issued |
Array
(
[id] => 5294271
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Array
(
[id] => 282347
[patent_doc_number] => 07554348
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[patent_issue_date] => 2009-06-30
[patent_title] => 'Multi-offset die head'
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/554/07554348.pdf
[firstpage_image] =>[orig_patent_app_number] => 11770896
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/770896 | Multi-offset die head | Jun 28, 2007 | Issued |