
Monica E. Millner
Examiner (ID: 18810)
| Most Active Art Unit | 3632 |
| Art Unit(s) | 3632, 3508, 3627 |
| Total Applications | 1502 |
| Issued Applications | 1157 |
| Pending Applications | 88 |
| Abandoned Applications | 284 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4710420
[patent_doc_number] => 20080298946
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-12-04
[patent_title] => 'Test Handler'
[patent_app_type] => utility
[patent_app_number] => 12/097398
[patent_app_country] => US
[patent_app_date] => 2007-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5292
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0298/20080298946.pdf
[firstpage_image] =>[orig_patent_app_number] => 12097398
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/097398 | Test handler and method for operating the same for testing semiconductor devices | Feb 8, 2007 | Issued |
Array
(
[id] => 4801008
[patent_doc_number] => 20080012595
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-17
[patent_title] => 'Wafer test card using electric conductive spring as wafer test interface'
[patent_app_type] => utility
[patent_app_number] => 11/702193
[patent_app_country] => US
[patent_app_date] => 2007-02-05
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11702193
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/702193 | Wafer test card using electric conductive spring as wafer test interface | Feb 4, 2007 | Abandoned |
Array
(
[id] => 5099182
[patent_doc_number] => 20070182442
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[patent_kind] => A1
[patent_issue_date] => 2007-08-09
[patent_title] => 'DISPLAY DEVICE AND ELECTRONIC APPARATUS HAVING THE DISPLAY DEVICE'
[patent_app_type] => utility
[patent_app_number] => 11/669399
[patent_app_country] => US
[patent_app_date] => 2007-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 26
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[patent_no_of_words] => 20149
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[pdf_file] => publications/A1/0182/20070182442.pdf
[firstpage_image] =>[orig_patent_app_number] => 11669399
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/669399 | Display device including test circuit and electronic apparatus having the display device | Jan 30, 2007 | Issued |
Array
(
[id] => 425628
[patent_doc_number] => 07271611
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-18
[patent_title] => 'Method for testing semiconductor components using bonded electrical connections'
[patent_app_type] => utility
[patent_app_number] => 11/698678
[patent_app_country] => US
[patent_app_date] => 2007-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 7263
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[pdf_file] => patents/07/271/07271611.pdf
[firstpage_image] =>[orig_patent_app_number] => 11698678
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/698678 | Method for testing semiconductor components using bonded electrical connections | Jan 25, 2007 | Issued |
Array
(
[id] => 5294230
[patent_doc_number] => 20090009156
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[patent_kind] => A1
[patent_issue_date] => 2009-01-08
[patent_title] => 'Magnetic Sensor Device With Reference Unit'
[patent_app_type] => utility
[patent_app_number] => 12/162678
[patent_app_country] => US
[patent_app_date] => 2007-01-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/162678 | Magnetic Sensor Device With Reference Unit | Jan 24, 2007 | Abandoned |
Array
(
[id] => 5157894
[patent_doc_number] => 20070170938
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-26
[patent_title] => 'TEST FIXTURE AND METHOD FOR TESTING A SEMI-FINISHED CHIP PACKAGE'
[patent_app_type] => utility
[patent_app_number] => 11/625194
[patent_app_country] => US
[patent_app_date] => 2007-01-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[pdf_file] => publications/A1/0170/20070170938.pdf
[firstpage_image] =>[orig_patent_app_number] => 11625194
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/625194 | Test fixture and method for testing a semi-finished chip package | Jan 18, 2007 | Issued |
Array
(
[id] => 342051
[patent_doc_number] => 07501809
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[patent_kind] => B2
[patent_issue_date] => 2009-03-10
[patent_title] => 'Electronic component handling and testing apparatus and method for electronic component handling and testing'
[patent_app_type] => utility
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[patent_app_country] => US
[patent_app_date] => 2007-01-12
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[pdf_file] => patents/07/501/07501809.pdf
[firstpage_image] =>[orig_patent_app_number] => 11652695
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/652695 | Electronic component handling and testing apparatus and method for electronic component handling and testing | Jan 11, 2007 | Issued |
Array
(
[id] => 4488652
[patent_doc_number] => 07902849
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-03-08
[patent_title] => 'Apparatus and method for test structure inspection'
[patent_app_type] => utility
[patent_app_number] => 11/619496
[patent_app_country] => US
[patent_app_date] => 2007-01-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 2070
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[pdf_file] => patents/07/902/07902849.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/619496 | Apparatus and method for test structure inspection | Jan 2, 2007 | Issued |
Array
(
[id] => 5450324
[patent_doc_number] => 20090066360
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-03-12
[patent_title] => 'METHOD FOR DETERMINING AN INDUCTANCE OF A MOTOR'
[patent_app_type] => utility
[patent_app_number] => 12/279793
[patent_app_country] => US
[patent_app_date] => 2006-12-28
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[patent_drawing_sheets_cnt] => 3
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/279793 | METHOD FOR DETERMINING AN INDUCTANCE OF A MOTOR | Dec 27, 2006 | Abandoned |
Array
(
[id] => 4913485
[patent_doc_number] => 20080094084
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-24
[patent_title] => 'MULTI-LAYER ELECTRIC PROBE AND FABRICATING METHOD THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/616892
[patent_app_country] => US
[patent_app_date] => 2006-12-28
[patent_effective_date] => 0000-00-00
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Array
(
[id] => 5414019
[patent_doc_number] => 20090039906
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-12
[patent_title] => 'CIRCUIT BOARD APPARATUS FOR WAFER INSPECTION, PROBE CARD, AND WAFER INSPECTION APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/158499
[patent_app_country] => US
[patent_app_date] => 2006-12-20
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[patent_drawing_sheets_cnt] => 15
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/158499 | Circuit board apparatus for wafer inspection, probe card, and wafer inspection apparatus | Dec 19, 2006 | Issued |
Array
(
[id] => 5251019
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[patent_title] => 'Semiconductor device test method and device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/605558 | Semiconductor device test method and device | Nov 28, 2006 | Abandoned |
Array
(
[id] => 4821416
[patent_doc_number] => 20080122469
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[patent_issue_date] => 2008-05-29
[patent_title] => 'Probe card for testing image-sensing chips'
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Array
(
[id] => 4897247
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[patent_title] => 'Burn-in system power stage'
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Array
(
[id] => 4850121
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[patent_title] => 'Apparatus For the Measurement of a Streaming Potential of a Liquid Containing Solid Matter'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/093828 | Apparatus For the Measurement of a Streaming Potential of a Liquid Containing Solid Matter | Nov 13, 2006 | Abandoned |
Array
(
[id] => 5003022
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[patent_title] => 'TEST APPARATUS AND TEST METHOD FOR LIQUID CRYSTAL DISPLAY DEVICE'
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Array
(
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[patent_title] => 'Apparatus and method for universal connectivity in test applications'
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Array
(
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Array
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Array
(
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