Search

Monica E. Millner

Examiner (ID: 18810)

Most Active Art Unit
3632
Art Unit(s)
3632, 3508, 3627
Total Applications
1502
Issued Applications
1157
Pending Applications
88
Abandoned Applications
284

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4710420 [patent_doc_number] => 20080298946 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-04 [patent_title] => 'Test Handler' [patent_app_type] => utility [patent_app_number] => 12/097398 [patent_app_country] => US [patent_app_date] => 2007-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5292 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0298/20080298946.pdf [firstpage_image] =>[orig_patent_app_number] => 12097398 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/097398
Test handler and method for operating the same for testing semiconductor devices Feb 8, 2007 Issued
Array ( [id] => 4801008 [patent_doc_number] => 20080012595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-17 [patent_title] => 'Wafer test card using electric conductive spring as wafer test interface' [patent_app_type] => utility [patent_app_number] => 11/702193 [patent_app_country] => US [patent_app_date] => 2007-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1835 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20080012595.pdf [firstpage_image] =>[orig_patent_app_number] => 11702193 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/702193
Wafer test card using electric conductive spring as wafer test interface Feb 4, 2007 Abandoned
Array ( [id] => 5099182 [patent_doc_number] => 20070182442 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-09 [patent_title] => 'DISPLAY DEVICE AND ELECTRONIC APPARATUS HAVING THE DISPLAY DEVICE' [patent_app_type] => utility [patent_app_number] => 11/669399 [patent_app_country] => US [patent_app_date] => 2007-01-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 20149 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0182/20070182442.pdf [firstpage_image] =>[orig_patent_app_number] => 11669399 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/669399
Display device including test circuit and electronic apparatus having the display device Jan 30, 2007 Issued
Array ( [id] => 425628 [patent_doc_number] => 07271611 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-18 [patent_title] => 'Method for testing semiconductor components using bonded electrical connections' [patent_app_type] => utility [patent_app_number] => 11/698678 [patent_app_country] => US [patent_app_date] => 2007-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 30 [patent_no_of_words] => 7263 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/271/07271611.pdf [firstpage_image] =>[orig_patent_app_number] => 11698678 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/698678
Method for testing semiconductor components using bonded electrical connections Jan 25, 2007 Issued
Array ( [id] => 5294230 [patent_doc_number] => 20090009156 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-01-08 [patent_title] => 'Magnetic Sensor Device With Reference Unit' [patent_app_type] => utility [patent_app_number] => 12/162678 [patent_app_country] => US [patent_app_date] => 2007-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5683 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0009/20090009156.pdf [firstpage_image] =>[orig_patent_app_number] => 12162678 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/162678
Magnetic Sensor Device With Reference Unit Jan 24, 2007 Abandoned
Array ( [id] => 5157894 [patent_doc_number] => 20070170938 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-26 [patent_title] => 'TEST FIXTURE AND METHOD FOR TESTING A SEMI-FINISHED CHIP PACKAGE' [patent_app_type] => utility [patent_app_number] => 11/625194 [patent_app_country] => US [patent_app_date] => 2007-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2865 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20070170938.pdf [firstpage_image] =>[orig_patent_app_number] => 11625194 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/625194
Test fixture and method for testing a semi-finished chip package Jan 18, 2007 Issued
Array ( [id] => 342051 [patent_doc_number] => 07501809 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-10 [patent_title] => 'Electronic component handling and testing apparatus and method for electronic component handling and testing' [patent_app_type] => utility [patent_app_number] => 11/652695 [patent_app_country] => US [patent_app_date] => 2007-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 3826 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 283 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/501/07501809.pdf [firstpage_image] =>[orig_patent_app_number] => 11652695 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/652695
Electronic component handling and testing apparatus and method for electronic component handling and testing Jan 11, 2007 Issued
Array ( [id] => 4488652 [patent_doc_number] => 07902849 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-03-08 [patent_title] => 'Apparatus and method for test structure inspection' [patent_app_type] => utility [patent_app_number] => 11/619496 [patent_app_country] => US [patent_app_date] => 2007-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2070 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/902/07902849.pdf [firstpage_image] =>[orig_patent_app_number] => 11619496 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/619496
Apparatus and method for test structure inspection Jan 2, 2007 Issued
Array ( [id] => 5450324 [patent_doc_number] => 20090066360 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-03-12 [patent_title] => 'METHOD FOR DETERMINING AN INDUCTANCE OF A MOTOR' [patent_app_type] => utility [patent_app_number] => 12/279793 [patent_app_country] => US [patent_app_date] => 2006-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1321 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0066/20090066360.pdf [firstpage_image] =>[orig_patent_app_number] => 12279793 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/279793
METHOD FOR DETERMINING AN INDUCTANCE OF A MOTOR Dec 27, 2006 Abandoned
Array ( [id] => 4913485 [patent_doc_number] => 20080094084 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-24 [patent_title] => 'MULTI-LAYER ELECTRIC PROBE AND FABRICATING METHOD THEREOF' [patent_app_type] => utility [patent_app_number] => 11/616892 [patent_app_country] => US [patent_app_date] => 2006-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3311 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0094/20080094084.pdf [firstpage_image] =>[orig_patent_app_number] => 11616892 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/616892
MULTI-LAYER ELECTRIC PROBE AND FABRICATING METHOD THEREOF Dec 27, 2006 Abandoned
Array ( [id] => 5414019 [patent_doc_number] => 20090039906 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-12 [patent_title] => 'CIRCUIT BOARD APPARATUS FOR WAFER INSPECTION, PROBE CARD, AND WAFER INSPECTION APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/158499 [patent_app_country] => US [patent_app_date] => 2006-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 16360 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20090039906.pdf [firstpage_image] =>[orig_patent_app_number] => 12158499 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/158499
Circuit board apparatus for wafer inspection, probe card, and wafer inspection apparatus Dec 19, 2006 Issued
Array ( [id] => 5251019 [patent_doc_number] => 20070132475 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-14 [patent_title] => 'Semiconductor device test method and device' [patent_app_type] => utility [patent_app_number] => 11/605558 [patent_app_country] => US [patent_app_date] => 2006-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5492 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20070132475.pdf [firstpage_image] =>[orig_patent_app_number] => 11605558 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/605558
Semiconductor device test method and device Nov 28, 2006 Abandoned
Array ( [id] => 4821416 [patent_doc_number] => 20080122469 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-29 [patent_title] => 'Probe card for testing image-sensing chips' [patent_app_type] => utility [patent_app_number] => 11/604865 [patent_app_country] => US [patent_app_date] => 2006-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1532 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20080122469.pdf [firstpage_image] =>[orig_patent_app_number] => 11604865 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/604865
Probe card for testing image-sensing chips Nov 27, 2006 Abandoned
Array ( [id] => 4897247 [patent_doc_number] => 20080116860 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'Burn-in system power stage' [patent_app_type] => utility [patent_app_number] => 11/602093 [patent_app_country] => US [patent_app_date] => 2006-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5760 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116860.pdf [firstpage_image] =>[orig_patent_app_number] => 11602093 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/602093
Burn-in system power stage Nov 19, 2006 Issued
Array ( [id] => 4850121 [patent_doc_number] => 20080315863 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-12-25 [patent_title] => 'Apparatus For the Measurement of a Streaming Potential of a Liquid Containing Solid Matter' [patent_app_type] => utility [patent_app_number] => 12/093828 [patent_app_country] => US [patent_app_date] => 2006-11-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2402 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0315/20080315863.pdf [firstpage_image] =>[orig_patent_app_number] => 12093828 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/093828
Apparatus For the Measurement of a Streaming Potential of a Liquid Containing Solid Matter Nov 13, 2006 Abandoned
Array ( [id] => 5003022 [patent_doc_number] => 20070200589 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-08-30 [patent_title] => 'TEST APPARATUS AND TEST METHOD FOR LIQUID CRYSTAL DISPLAY DEVICE' [patent_app_type] => utility [patent_app_number] => 11/559496 [patent_app_country] => US [patent_app_date] => 2006-11-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4244 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0200/20070200589.pdf [firstpage_image] =>[orig_patent_app_number] => 11559496 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/559496
TEST APPARATUS AND TEST METHOD FOR LIQUID CRYSTAL DISPLAY DEVICE Nov 13, 2006 Abandoned
Array ( [id] => 4963474 [patent_doc_number] => 20080106294 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-08 [patent_title] => 'Apparatus and method for universal connectivity in test applications' [patent_app_type] => utility [patent_app_number] => 11/591399 [patent_app_country] => US [patent_app_date] => 2006-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 5370 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0106/20080106294.pdf [firstpage_image] =>[orig_patent_app_number] => 11591399 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/591399
Apparatus and method for universal connectivity in test applications Nov 1, 2006 Abandoned
Array ( [id] => 143024 [patent_doc_number] => 07688086 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'Fabrication method of semiconductor integrated circuit device and probe card' [patent_app_type] => utility [patent_app_number] => 11/555993 [patent_app_country] => US [patent_app_date] => 2006-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 49 [patent_no_of_words] => 15767 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 321 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/688/07688086.pdf [firstpage_image] =>[orig_patent_app_number] => 11555993 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/555993
Fabrication method of semiconductor integrated circuit device and probe card Nov 1, 2006 Issued
Array ( [id] => 5537242 [patent_doc_number] => 20090219047 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-03 [patent_title] => ' PROBE FOR TESTING ELECTRICAL PROPERTIES OF A TEST SAMPLE' [patent_app_type] => utility [patent_app_number] => 12/091927 [patent_app_country] => US [patent_app_date] => 2006-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4346 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20090219047.pdf [firstpage_image] =>[orig_patent_app_number] => 12091927 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/091927
Probe for testing electrical properties of a test sample Oct 30, 2006 Issued
Array ( [id] => 4661377 [patent_doc_number] => 20080252284 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-16 [patent_title] => 'Measuring a Current Supplied By a Rotating Electric Machine Such as an Alternator' [patent_app_type] => utility [patent_app_number] => 12/089793 [patent_app_country] => US [patent_app_date] => 2006-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4734 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20080252284.pdf [firstpage_image] =>[orig_patent_app_number] => 12089793 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/089793
Measuring a Current Supplied By a Rotating Electric Machine Such as an Alternator Oct 16, 2006 Abandoned
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