
Monica E. Millner
Examiner (ID: 18810)
| Most Active Art Unit | 3632 |
| Art Unit(s) | 3632, 3508, 3627 |
| Total Applications | 1502 |
| Issued Applications | 1157 |
| Pending Applications | 88 |
| Abandoned Applications | 284 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5192222
[patent_doc_number] => 20070080704
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-04-12
[patent_title] => 'Semi-conductor chip package capable of detecting open and short'
[patent_app_type] => utility
[patent_app_number] => 11/546594
[patent_app_country] => US
[patent_app_date] => 2006-10-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5164
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0080/20070080704.pdf
[firstpage_image] =>[orig_patent_app_number] => 11546594
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/546594 | Semi-conductor chip package capable of detecting open and short | Oct 10, 2006 | Issued |
Array
(
[id] => 592513
[patent_doc_number] => 07439751
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-10-21
[patent_title] => 'Apparatus and method for testing conductive bumps'
[patent_app_type] => utility
[patent_app_number] => 11/527696
[patent_app_country] => US
[patent_app_date] => 2006-09-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2795
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 128
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/439/07439751.pdf
[firstpage_image] =>[orig_patent_app_number] => 11527696
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/527696 | Apparatus and method for testing conductive bumps | Sep 26, 2006 | Issued |
Array
(
[id] => 5104846
[patent_doc_number] => 20070063721
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-22
[patent_title] => 'Apparatus And Method Of Testing Singulated Dies'
[patent_app_type] => utility
[patent_app_number] => 11/532494
[patent_app_country] => US
[patent_app_date] => 2006-09-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
[patent_figures_cnt] => 23
[patent_no_of_words] => 16800
[patent_no_of_claims] => 53
[patent_no_of_ind_claims] => 8
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0063/20070063721.pdf
[firstpage_image] =>[orig_patent_app_number] => 11532494
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/532494 | Apparatus and method of testing singulated dies | Sep 14, 2006 | Issued |
Array
(
[id] => 5104843
[patent_doc_number] => 20070063718
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-22
[patent_title] => 'Contact assembly and LSI chip inspecting device using the same'
[patent_app_type] => utility
[patent_app_number] => 11/521195
[patent_app_country] => US
[patent_app_date] => 2006-09-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 30
[patent_figures_cnt] => 30
[patent_no_of_words] => 11433
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 0
[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0063/20070063718.pdf
[firstpage_image] =>[orig_patent_app_number] => 11521195
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/521195 | Contact assembly and LSI chip inspecting device using the same | Sep 13, 2006 | Issued |
Array
(
[id] => 5197084
[patent_doc_number] => 20070296402
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-27
[patent_title] => 'ADAPTER FOR POSITIONING OF CONTACT TIPS'
[patent_app_type] => utility
[patent_app_number] => 11/531092
[patent_app_country] => US
[patent_app_date] => 2006-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4723
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0296/20070296402.pdf
[firstpage_image] =>[orig_patent_app_number] => 11531092
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/531092 | Adapter for positioning of contact tips | Sep 11, 2006 | Issued |
Array
(
[id] => 896565
[patent_doc_number] => 07342409
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-03-11
[patent_title] => 'System for testing semiconductor components'
[patent_app_type] => utility
[patent_app_number] => 11/516342
[patent_app_country] => US
[patent_app_date] => 2006-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 30
[patent_no_of_words] => 7282
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 87
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/342/07342409.pdf
[firstpage_image] =>[orig_patent_app_number] => 11516342
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/516342 | System for testing semiconductor components | Sep 5, 2006 | Issued |
Array
(
[id] => 5139484
[patent_doc_number] => 20070001700
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-04
[patent_title] => 'Interconnect for testing semiconductor components'
[patent_app_type] => utility
[patent_app_number] => 11/516328
[patent_app_country] => US
[patent_app_date] => 2006-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 7239
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0001/20070001700.pdf
[firstpage_image] =>[orig_patent_app_number] => 11516328
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/516328 | Interconnect for testing semiconductor components | Sep 5, 2006 | Issued |
Array
(
[id] => 5537237
[patent_doc_number] => 20090219042
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-03
[patent_title] => 'Probe card'
[patent_app_type] => utility
[patent_app_number] => 11/991296
[patent_app_country] => US
[patent_app_date] => 2006-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 8075
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0219/20090219042.pdf
[firstpage_image] =>[orig_patent_app_number] => 11991296
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/991296 | Probe card | Aug 29, 2006 | Issued |
Array
(
[id] => 5600019
[patent_doc_number] => 20060290364
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-28
[patent_title] => 'Cable terminal with flexible contacts'
[patent_app_type] => utility
[patent_app_number] => 11/512553
[patent_app_country] => US
[patent_app_date] => 2006-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2881
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0290/20060290364.pdf
[firstpage_image] =>[orig_patent_app_number] => 11512553
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/512553 | Cable terminal with flexible contacts | Aug 28, 2006 | Abandoned |
Array
(
[id] => 5202822
[patent_doc_number] => 20070024301
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-01
[patent_title] => 'Electrical feedback detection system for multi-point probes'
[patent_app_type] => utility
[patent_app_number] => 11/509208
[patent_app_country] => US
[patent_app_date] => 2006-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 2747
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0024/20070024301.pdf
[firstpage_image] =>[orig_patent_app_number] => 11509208
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/509208 | Electrical feedback detection system for multi-point probes | Aug 23, 2006 | Issued |
Array
(
[id] => 5150110
[patent_doc_number] => 20070050170
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-01
[patent_title] => 'Device characteristics measuring system'
[patent_app_type] => utility
[patent_app_number] => 11/509297
[patent_app_country] => US
[patent_app_date] => 2006-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 5618
[patent_no_of_claims] => 16
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0050/20070050170.pdf
[firstpage_image] =>[orig_patent_app_number] => 11509297
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/509297 | Device characteristics measuring system | Aug 23, 2006 | Abandoned |
Array
(
[id] => 4731726
[patent_doc_number] => 20080048704
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-28
[patent_title] => 'Apparatus and methods for testing microelectronic devices'
[patent_app_type] => utility
[patent_app_number] => 11/509292
[patent_app_country] => US
[patent_app_date] => 2006-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 4868
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[pdf_file] => publications/A1/0048/20080048704.pdf
[firstpage_image] =>[orig_patent_app_number] => 11509292
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/509292 | Apparatus and methods for testing microelectronic devices | Aug 22, 2006 | Issued |
Array
(
[id] => 4458057
[patent_doc_number] => 07893703
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-02-22
[patent_title] => 'Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer'
[patent_app_type] => utility
[patent_app_number] => 11/465893
[patent_app_country] => US
[patent_app_date] => 2006-08-21
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/893/07893703.pdf
[firstpage_image] =>[orig_patent_app_number] => 11465893
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/465893 | Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer | Aug 20, 2006 | Issued |
Array
(
[id] => 865843
[patent_doc_number] => 07368930
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-05-06
[patent_title] => 'Adjustment mechanism'
[patent_app_type] => utility
[patent_app_number] => 11/464593
[patent_app_country] => US
[patent_app_date] => 2006-08-15
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 11133
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/368/07368930.pdf
[firstpage_image] =>[orig_patent_app_number] => 11464593
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/464593 | Adjustment mechanism | Aug 14, 2006 | Issued |
Array
(
[id] => 5640865
[patent_doc_number] => 20060279320
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-14
[patent_title] => 'Non-Abrasive Electrical Test Contact'
[patent_app_type] => utility
[patent_app_number] => 11/460632
[patent_app_country] => US
[patent_app_date] => 2006-07-28
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0279/20060279320.pdf
[firstpage_image] =>[orig_patent_app_number] => 11460632
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/460632 | Non-abrasive electrical test contact | Jul 27, 2006 | Issued |
Array
(
[id] => 5049474
[patent_doc_number] => 20070030018
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-08
[patent_title] => 'Docking device actuated by pressure means'
[patent_app_type] => utility
[patent_app_number] => 11/492198
[patent_app_country] => US
[patent_app_date] => 2006-07-25
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0030/20070030018.pdf
[firstpage_image] =>[orig_patent_app_number] => 11492198
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/492198 | Docking device actuated by pressure means | Jul 24, 2006 | Issued |
Array
(
[id] => 918576
[patent_doc_number] => 07323859
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-01-29
[patent_title] => 'Auto-measuring universal meter'
[patent_app_type] => utility
[patent_app_number] => 11/488697
[patent_app_country] => US
[patent_app_date] => 2006-07-19
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/323/07323859.pdf
[firstpage_image] =>[orig_patent_app_number] => 11488697
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/488697 | Auto-measuring universal meter | Jul 18, 2006 | Issued |
Array
(
[id] => 93480
[patent_doc_number] => 07737713
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-15
[patent_title] => 'Apparatus for hot-probing integrated semiconductor circuits on wafers'
[patent_app_type] => utility
[patent_app_number] => 11/482894
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[pdf_file] => patents/07/737/07737713.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/482894 | Apparatus for hot-probing integrated semiconductor circuits on wafers | Jul 9, 2006 | Issued |
Array
(
[id] => 5499784
[patent_doc_number] => 20090160472
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-06-25
[patent_title] => 'WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/064093
[patent_app_country] => US
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[pdf_file] => publications/A1/0160/20090160472.pdf
[firstpage_image] =>[orig_patent_app_number] => 12064093
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/064093 | WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS | Jun 25, 2006 | Abandoned |
Array
(
[id] => 5228595
[patent_doc_number] => 20070290702
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[patent_kind] => A1
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[patent_title] => 'System and method for thermal management and gradient reduction'
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0290/20070290702.pdf
[firstpage_image] =>[orig_patent_app_number] => 11455996
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/455996 | System and method for thermal management and gradient reduction | Jun 18, 2006 | Abandoned |