Search

Monica E. Millner

Examiner (ID: 18810)

Most Active Art Unit
3632
Art Unit(s)
3632, 3508, 3627
Total Applications
1502
Issued Applications
1157
Pending Applications
88
Abandoned Applications
284

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5192222 [patent_doc_number] => 20070080704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-12 [patent_title] => 'Semi-conductor chip package capable of detecting open and short' [patent_app_type] => utility [patent_app_number] => 11/546594 [patent_app_country] => US [patent_app_date] => 2006-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5164 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0080/20070080704.pdf [firstpage_image] =>[orig_patent_app_number] => 11546594 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/546594
Semi-conductor chip package capable of detecting open and short Oct 10, 2006 Issued
Array ( [id] => 592513 [patent_doc_number] => 07439751 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-21 [patent_title] => 'Apparatus and method for testing conductive bumps' [patent_app_type] => utility [patent_app_number] => 11/527696 [patent_app_country] => US [patent_app_date] => 2006-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2795 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/439/07439751.pdf [firstpage_image] =>[orig_patent_app_number] => 11527696 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/527696
Apparatus and method for testing conductive bumps Sep 26, 2006 Issued
Array ( [id] => 5104846 [patent_doc_number] => 20070063721 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-22 [patent_title] => 'Apparatus And Method Of Testing Singulated Dies' [patent_app_type] => utility [patent_app_number] => 11/532494 [patent_app_country] => US [patent_app_date] => 2006-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 16800 [patent_no_of_claims] => 53 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0063/20070063721.pdf [firstpage_image] =>[orig_patent_app_number] => 11532494 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/532494
Apparatus and method of testing singulated dies Sep 14, 2006 Issued
Array ( [id] => 5104843 [patent_doc_number] => 20070063718 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-22 [patent_title] => 'Contact assembly and LSI chip inspecting device using the same' [patent_app_type] => utility [patent_app_number] => 11/521195 [patent_app_country] => US [patent_app_date] => 2006-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 30 [patent_figures_cnt] => 30 [patent_no_of_words] => 11433 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0063/20070063718.pdf [firstpage_image] =>[orig_patent_app_number] => 11521195 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/521195
Contact assembly and LSI chip inspecting device using the same Sep 13, 2006 Issued
Array ( [id] => 5197084 [patent_doc_number] => 20070296402 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'ADAPTER FOR POSITIONING OF CONTACT TIPS' [patent_app_type] => utility [patent_app_number] => 11/531092 [patent_app_country] => US [patent_app_date] => 2006-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4723 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296402.pdf [firstpage_image] =>[orig_patent_app_number] => 11531092 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/531092
Adapter for positioning of contact tips Sep 11, 2006 Issued
Array ( [id] => 896565 [patent_doc_number] => 07342409 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-11 [patent_title] => 'System for testing semiconductor components' [patent_app_type] => utility [patent_app_number] => 11/516342 [patent_app_country] => US [patent_app_date] => 2006-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 30 [patent_no_of_words] => 7282 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/342/07342409.pdf [firstpage_image] =>[orig_patent_app_number] => 11516342 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/516342
System for testing semiconductor components Sep 5, 2006 Issued
Array ( [id] => 5139484 [patent_doc_number] => 20070001700 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-04 [patent_title] => 'Interconnect for testing semiconductor components' [patent_app_type] => utility [patent_app_number] => 11/516328 [patent_app_country] => US [patent_app_date] => 2006-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 7239 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20070001700.pdf [firstpage_image] =>[orig_patent_app_number] => 11516328 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/516328
Interconnect for testing semiconductor components Sep 5, 2006 Issued
Array ( [id] => 5537237 [patent_doc_number] => 20090219042 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-03 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/991296 [patent_app_country] => US [patent_app_date] => 2006-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8075 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20090219042.pdf [firstpage_image] =>[orig_patent_app_number] => 11991296 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/991296
Probe card Aug 29, 2006 Issued
Array ( [id] => 5600019 [patent_doc_number] => 20060290364 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Cable terminal with flexible contacts' [patent_app_type] => utility [patent_app_number] => 11/512553 [patent_app_country] => US [patent_app_date] => 2006-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2881 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290364.pdf [firstpage_image] =>[orig_patent_app_number] => 11512553 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/512553
Cable terminal with flexible contacts Aug 28, 2006 Abandoned
Array ( [id] => 5202822 [patent_doc_number] => 20070024301 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-01 [patent_title] => 'Electrical feedback detection system for multi-point probes' [patent_app_type] => utility [patent_app_number] => 11/509208 [patent_app_country] => US [patent_app_date] => 2006-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2747 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20070024301.pdf [firstpage_image] =>[orig_patent_app_number] => 11509208 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509208
Electrical feedback detection system for multi-point probes Aug 23, 2006 Issued
Array ( [id] => 5150110 [patent_doc_number] => 20070050170 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-01 [patent_title] => 'Device characteristics measuring system' [patent_app_type] => utility [patent_app_number] => 11/509297 [patent_app_country] => US [patent_app_date] => 2006-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 5618 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20070050170.pdf [firstpage_image] =>[orig_patent_app_number] => 11509297 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509297
Device characteristics measuring system Aug 23, 2006 Abandoned
Array ( [id] => 4731726 [patent_doc_number] => 20080048704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Apparatus and methods for testing microelectronic devices' [patent_app_type] => utility [patent_app_number] => 11/509292 [patent_app_country] => US [patent_app_date] => 2006-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4868 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048704.pdf [firstpage_image] =>[orig_patent_app_number] => 11509292 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509292
Apparatus and methods for testing microelectronic devices Aug 22, 2006 Issued
Array ( [id] => 4458057 [patent_doc_number] => 07893703 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-22 [patent_title] => 'Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer' [patent_app_type] => utility [patent_app_number] => 11/465893 [patent_app_country] => US [patent_app_date] => 2006-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 62 [patent_no_of_words] => 54054 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/893/07893703.pdf [firstpage_image] =>[orig_patent_app_number] => 11465893 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/465893
Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer Aug 20, 2006 Issued
Array ( [id] => 865843 [patent_doc_number] => 07368930 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-05-06 [patent_title] => 'Adjustment mechanism' [patent_app_type] => utility [patent_app_number] => 11/464593 [patent_app_country] => US [patent_app_date] => 2006-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 24 [patent_no_of_words] => 11133 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/368/07368930.pdf [firstpage_image] =>[orig_patent_app_number] => 11464593 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/464593
Adjustment mechanism Aug 14, 2006 Issued
Array ( [id] => 5640865 [patent_doc_number] => 20060279320 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Non-Abrasive Electrical Test Contact' [patent_app_type] => utility [patent_app_number] => 11/460632 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2875 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279320.pdf [firstpage_image] =>[orig_patent_app_number] => 11460632 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/460632
Non-abrasive electrical test contact Jul 27, 2006 Issued
Array ( [id] => 5049474 [patent_doc_number] => 20070030018 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-08 [patent_title] => 'Docking device actuated by pressure means' [patent_app_type] => utility [patent_app_number] => 11/492198 [patent_app_country] => US [patent_app_date] => 2006-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4134 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20070030018.pdf [firstpage_image] =>[orig_patent_app_number] => 11492198 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/492198
Docking device actuated by pressure means Jul 24, 2006 Issued
Array ( [id] => 918576 [patent_doc_number] => 07323859 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-01-29 [patent_title] => 'Auto-measuring universal meter' [patent_app_type] => utility [patent_app_number] => 11/488697 [patent_app_country] => US [patent_app_date] => 2006-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4172 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 545 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/323/07323859.pdf [firstpage_image] =>[orig_patent_app_number] => 11488697 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/488697
Auto-measuring universal meter Jul 18, 2006 Issued
Array ( [id] => 93480 [patent_doc_number] => 07737713 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-15 [patent_title] => 'Apparatus for hot-probing integrated semiconductor circuits on wafers' [patent_app_type] => utility [patent_app_number] => 11/482894 [patent_app_country] => US [patent_app_date] => 2006-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3685 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/737/07737713.pdf [firstpage_image] =>[orig_patent_app_number] => 11482894 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/482894
Apparatus for hot-probing integrated semiconductor circuits on wafers Jul 9, 2006 Issued
Array ( [id] => 5499784 [patent_doc_number] => 20090160472 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-25 [patent_title] => 'WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/064093 [patent_app_country] => US [patent_app_date] => 2006-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7448 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0160/20090160472.pdf [firstpage_image] =>[orig_patent_app_number] => 12064093 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/064093
WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS Jun 25, 2006 Abandoned
Array ( [id] => 5228595 [patent_doc_number] => 20070290702 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-20 [patent_title] => 'System and method for thermal management and gradient reduction' [patent_app_type] => utility [patent_app_number] => 11/455996 [patent_app_country] => US [patent_app_date] => 2006-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5370 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20070290702.pdf [firstpage_image] =>[orig_patent_app_number] => 11455996 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/455996
System and method for thermal management and gradient reduction Jun 18, 2006 Abandoned
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