
Monica E. Millner
Examiner (ID: 18810)
| Most Active Art Unit | 3632 |
| Art Unit(s) | 3632, 3508, 3627 |
| Total Applications | 1502 |
| Issued Applications | 1157 |
| Pending Applications | 88 |
| Abandoned Applications | 284 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5681276
[patent_doc_number] => 20060197543
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-09-07
[patent_title] => 'Electronic appliance including a circuit board'
[patent_app_type] => utility
[patent_app_number] => 11/352999
[patent_app_country] => US
[patent_app_date] => 2006-02-14
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[pdf_file] => publications/A1/0197/20060197543.pdf
[firstpage_image] =>[orig_patent_app_number] => 11352999
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/352999 | Electronic appliance including a circuit board | Feb 13, 2006 | Abandoned |
Array
(
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[patent_doc_number] => 07449910
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-11-11
[patent_title] => 'Test system for semiconductor components having conductive spring contacts'
[patent_app_type] => utility
[patent_app_number] => 11/348094
[patent_app_country] => US
[patent_app_date] => 2006-02-06
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/348094 | Test system for semiconductor components having conductive spring contacts | Feb 5, 2006 | Issued |
Array
(
[id] => 5675945
[patent_doc_number] => 20060181300
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-17
[patent_title] => 'Method for testing a circuit unit and test apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/346518
[patent_app_country] => US
[patent_app_date] => 2006-02-02
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Array
(
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[patent_doc_number] => 07368934
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[patent_kind] => B2
[patent_issue_date] => 2008-05-06
[patent_title] => 'Avalanche testing at final test of top and bottom FETs of a buck converter'
[patent_app_type] => utility
[patent_app_number] => 11/342893
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/342893 | Avalanche testing at final test of top and bottom FETs of a buck converter | Jan 29, 2006 | Issued |
Array
(
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[patent_title] => 'Probe card'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/341195 | Probe card | Jan 26, 2006 | Issued |
Array
(
[id] => 5157900
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[patent_issue_date] => 2007-07-26
[patent_title] => 'Boundary-scan system architecture for remote environmental testing'
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/337895 | Socket and test apparatus | Jan 22, 2006 | Issued |
Array
(
[id] => 877900
[patent_doc_number] => 07358714
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[patent_issue_date] => 2008-04-15
[patent_title] => 'Testing method and testing apparatus'
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[pdf_file] => patents/07/358/07358714.pdf
[firstpage_image] =>[orig_patent_app_number] => 11334399
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/334399 | Testing method and testing apparatus | Jan 18, 2006 | Issued |
Array
(
[id] => 5686332
[patent_doc_number] => 20060284647
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[patent_issue_date] => 2006-12-21
[patent_title] => 'Sensor apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/335397 | Sensor apparatus | Jan 18, 2006 | Abandoned |
Array
(
[id] => 5641455
[patent_doc_number] => 20060279910
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[patent_issue_date] => 2006-12-14
[patent_title] => 'Current sensor assembly'
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Array
(
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[patent_issue_date] => 2006-08-03
[patent_title] => 'Probe card for testing a plurality of semiconductor chips and method thereof'
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Array
(
[id] => 394454
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Array
(
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/303393 | Organic electronic device display defect detection | Dec 15, 2005 | Issued |
Array
(
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Array
(
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Array
(
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Array
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