Search

Monica E. Millner

Examiner (ID: 18810)

Most Active Art Unit
3632
Art Unit(s)
3632, 3508, 3627
Total Applications
1502
Issued Applications
1157
Pending Applications
88
Abandoned Applications
284

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5681276 [patent_doc_number] => 20060197543 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-07 [patent_title] => 'Electronic appliance including a circuit board' [patent_app_type] => utility [patent_app_number] => 11/352999 [patent_app_country] => US [patent_app_date] => 2006-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 2760 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0197/20060197543.pdf [firstpage_image] =>[orig_patent_app_number] => 11352999 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/352999
Electronic appliance including a circuit board Feb 13, 2006 Abandoned
Array ( [id] => 587515 [patent_doc_number] => 07449910 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-11-11 [patent_title] => 'Test system for semiconductor components having conductive spring contacts' [patent_app_type] => utility [patent_app_number] => 11/348094 [patent_app_country] => US [patent_app_date] => 2006-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 42 [patent_no_of_words] => 8095 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/449/07449910.pdf [firstpage_image] =>[orig_patent_app_number] => 11348094 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/348094
Test system for semiconductor components having conductive spring contacts Feb 5, 2006 Issued
Array ( [id] => 5675945 [patent_doc_number] => 20060181300 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-17 [patent_title] => 'Method for testing a circuit unit and test apparatus' [patent_app_type] => utility [patent_app_number] => 11/346518 [patent_app_country] => US [patent_app_date] => 2006-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3086 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0181/20060181300.pdf [firstpage_image] =>[orig_patent_app_number] => 11346518 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/346518
Method for testing a circuit unit and test apparatus Feb 1, 2006 Abandoned
Array ( [id] => 865850 [patent_doc_number] => 07368934 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-05-06 [patent_title] => 'Avalanche testing at final test of top and bottom FETs of a buck converter' [patent_app_type] => utility [patent_app_number] => 11/342893 [patent_app_country] => US [patent_app_date] => 2006-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 15 [patent_no_of_words] => 1418 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/368/07368934.pdf [firstpage_image] =>[orig_patent_app_number] => 11342893 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/342893
Avalanche testing at final test of top and bottom FETs of a buck converter Jan 29, 2006 Issued
Array ( [id] => 624101 [patent_doc_number] => 07138812 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-11-21 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/341195 [patent_app_country] => US [patent_app_date] => 2006-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 17 [patent_no_of_words] => 4532 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/138/07138812.pdf [firstpage_image] =>[orig_patent_app_number] => 11341195 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/341195
Probe card Jan 26, 2006 Issued
Array ( [id] => 5157900 [patent_doc_number] => 20070170944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-26 [patent_title] => 'Boundary-scan system architecture for remote environmental testing' [patent_app_type] => utility [patent_app_number] => 11/340295 [patent_app_country] => US [patent_app_date] => 2006-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4386 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20070170944.pdf [firstpage_image] =>[orig_patent_app_number] => 11340295 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/340295
Boundary-scan system architecture for remote environmental testing Jan 25, 2006 Issued
Array ( [id] => 5843684 [patent_doc_number] => 20060121752 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-08 [patent_title] => 'Socket and test apparatus' [patent_app_type] => utility [patent_app_number] => 11/337895 [patent_app_country] => US [patent_app_date] => 2006-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7162 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20060121752.pdf [firstpage_image] =>[orig_patent_app_number] => 11337895 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/337895
Socket and test apparatus Jan 22, 2006 Issued
Array ( [id] => 877900 [patent_doc_number] => 07358714 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-15 [patent_title] => 'Testing method and testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/334399 [patent_app_country] => US [patent_app_date] => 2006-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 13 [patent_no_of_words] => 5064 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/358/07358714.pdf [firstpage_image] =>[orig_patent_app_number] => 11334399 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/334399
Testing method and testing apparatus Jan 18, 2006 Issued
Array ( [id] => 5686332 [patent_doc_number] => 20060284647 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'Sensor apparatus' [patent_app_type] => utility [patent_app_number] => 11/335397 [patent_app_country] => US [patent_app_date] => 2006-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 12433 [patent_no_of_claims] => 49 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284647.pdf [firstpage_image] =>[orig_patent_app_number] => 11335397 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/335397
Sensor apparatus Jan 18, 2006 Abandoned
Array ( [id] => 5641455 [patent_doc_number] => 20060279910 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Current sensor assembly' [patent_app_type] => utility [patent_app_number] => 11/335793 [patent_app_country] => US [patent_app_date] => 2006-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 12433 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279910.pdf [firstpage_image] =>[orig_patent_app_number] => 11335793 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/335793
Current sensor assembly Jan 18, 2006 Issued
Array ( [id] => 5665087 [patent_doc_number] => 20060170437 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-03 [patent_title] => 'Probe card for testing a plurality of semiconductor chips and method thereof' [patent_app_type] => utility [patent_app_number] => 11/330399 [patent_app_country] => US [patent_app_date] => 2006-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3471 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20060170437.pdf [firstpage_image] =>[orig_patent_app_number] => 11330399 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/330399
Probe card for testing a plurality of semiconductor chips and method thereof Jan 11, 2006 Abandoned
Array ( [id] => 394454 [patent_doc_number] => 07298155 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-20 [patent_title] => 'Probing apparatus' [patent_app_type] => utility [patent_app_number] => 11/330599 [patent_app_country] => US [patent_app_date] => 2006-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 6148 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/298/07298155.pdf [firstpage_image] =>[orig_patent_app_number] => 11330599 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/330599
Probing apparatus Jan 10, 2006 Issued
Array ( [id] => 602938 [patent_doc_number] => 07432702 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-07 [patent_title] => 'Circuit board damping assembly' [patent_app_type] => utility [patent_app_number] => 11/321297 [patent_app_country] => US [patent_app_date] => 2005-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2510 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/432/07432702.pdf [firstpage_image] =>[orig_patent_app_number] => 11321297 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/321297
Circuit board damping assembly Dec 21, 2005 Issued
Array ( [id] => 373810 [patent_doc_number] => 07474115 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-01-06 [patent_title] => 'Organic electronic device display defect detection' [patent_app_type] => utility [patent_app_number] => 11/303393 [patent_app_country] => US [patent_app_date] => 2005-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4489 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/474/07474115.pdf [firstpage_image] =>[orig_patent_app_number] => 11303393 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/303393
Organic electronic device display defect detection Dec 15, 2005 Issued
Array ( [id] => 5675526 [patent_doc_number] => 20060180881 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-17 [patent_title] => 'Probe head and method of fabricating the same' [patent_app_type] => utility [patent_app_number] => 11/285281 [patent_app_country] => US [patent_app_date] => 2005-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 3116 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0180/20060180881.pdf [firstpage_image] =>[orig_patent_app_number] => 11285281 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/285281
Probe head and method of fabricating the same Nov 22, 2005 Abandoned
Array ( [id] => 5719500 [patent_doc_number] => 20060072273 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-06 [patent_title] => 'Power supply device, test apparatus, and power supply voltage stabilizing device' [patent_app_type] => utility [patent_app_number] => 11/284224 [patent_app_country] => US [patent_app_date] => 2005-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 15566 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20060072273.pdf [firstpage_image] =>[orig_patent_app_number] => 11284224 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/284224
Power supply device, test apparatus, and power supply voltage stabilizing device Nov 20, 2005 Issued
Array ( [id] => 810743 [patent_doc_number] => 07417449 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-08-26 [patent_title] => 'Wafer stage storage structure speed testing' [patent_app_type] => utility [patent_app_number] => 11/274595 [patent_app_country] => US [patent_app_date] => 2005-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5212 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/417/07417449.pdf [firstpage_image] =>[orig_patent_app_number] => 11274595 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/274595
Wafer stage storage structure speed testing Nov 14, 2005 Issued
Array ( [id] => 4576541 [patent_doc_number] => 07859248 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus' [patent_app_type] => utility [patent_app_number] => 12/092496 [patent_app_country] => US [patent_app_date] => 2005-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8883 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859248.pdf [firstpage_image] =>[orig_patent_app_number] => 12092496 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/092496
Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus Nov 8, 2005 Issued
Array ( [id] => 398199 [patent_doc_number] => 07295030 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-13 [patent_title] => 'Thin film transistor tester and corresponding test method' [patent_app_type] => utility [patent_app_number] => 11/163996 [patent_app_country] => US [patent_app_date] => 2005-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 26 [patent_no_of_words] => 5926 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/295/07295030.pdf [firstpage_image] =>[orig_patent_app_number] => 11163996 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/163996
Thin film transistor tester and corresponding test method Nov 6, 2005 Issued
Array ( [id] => 5733070 [patent_doc_number] => 20060258187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-16 [patent_title] => 'Impedance controlled via structure' [patent_app_type] => utility [patent_app_number] => 11/266892 [patent_app_country] => US [patent_app_date] => 2005-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4189 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20060258187.pdf [firstpage_image] =>[orig_patent_app_number] => 11266892 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/266892
Impedance controlled via structure Nov 2, 2005 Issued
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