Search

Monica E. Millner

Examiner (ID: 18810)

Most Active Art Unit
3632
Art Unit(s)
3632, 3508, 3627
Total Applications
1502
Issued Applications
1157
Pending Applications
88
Abandoned Applications
284

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7037154 [patent_doc_number] => 20050156588 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-21 [patent_title] => 'Circuit arrangement and a method for compensating changes of a transfer factor of a magnetic field sensor arrangement' [patent_app_type] => utility [patent_app_number] => 10/999198 [patent_app_country] => US [patent_app_date] => 2004-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4018 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20050156588.pdf [firstpage_image] =>[orig_patent_app_number] => 10999198 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/999198
Circuit arrangement and a method for compensating changes of a transfer factor of a magnetic field sensor arrangement Nov 28, 2004 Issued
Array ( [id] => 7185024 [patent_doc_number] => 20050162176 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-28 [patent_title] => 'Test device for wafer testing digital semiconductor circuits' [patent_app_type] => utility [patent_app_number] => 10/995111 [patent_app_country] => US [patent_app_date] => 2004-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2067 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0162/20050162176.pdf [firstpage_image] =>[orig_patent_app_number] => 10995111 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/995111
Test device for wafer testing digital semiconductor circuits Nov 23, 2004 Issued
Array ( [id] => 7234928 [patent_doc_number] => 20050139771 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-06-30 [patent_title] => 'Thin film transistor array inspection apparatus' [patent_app_type] => utility [patent_app_number] => 10/990415 [patent_app_country] => US [patent_app_date] => 2004-11-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3284 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0139/20050139771.pdf [firstpage_image] =>[orig_patent_app_number] => 10990415 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/990415
Thin film transistor array inspection apparatus Nov 17, 2004 Issued
Array ( [id] => 717581 [patent_doc_number] => 07053638 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-30 [patent_title] => 'Surrounding structure for a probe card' [patent_app_type] => utility [patent_app_number] => 10/982919 [patent_app_country] => US [patent_app_date] => 2004-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 2238 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/053/07053638.pdf [firstpage_image] =>[orig_patent_app_number] => 10982919 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/982919
Surrounding structure for a probe card Nov 7, 2004 Issued
Array ( [id] => 5774759 [patent_doc_number] => 20060103399 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-18 [patent_title] => 'Apparatus and method for testing conductive bumps' [patent_app_type] => utility [patent_app_number] => 10/979418 [patent_app_country] => US [patent_app_date] => 2004-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 2533 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20060103399.pdf [firstpage_image] =>[orig_patent_app_number] => 10979418 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/979418
Apparatus and method for testing conductive bumps Nov 1, 2004 Issued
Array ( [id] => 390760 [patent_doc_number] => 07301356 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-27 [patent_title] => 'Support for a receptacle block of a unit under test' [patent_app_type] => utility [patent_app_number] => 10/975728 [patent_app_country] => US [patent_app_date] => 2004-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 4605 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/301/07301356.pdf [firstpage_image] =>[orig_patent_app_number] => 10975728 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/975728
Support for a receptacle block of a unit under test Oct 27, 2004 Issued
Array ( [id] => 394465 [patent_doc_number] => 07298166 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-20 [patent_title] => 'Loading device' [patent_app_type] => utility [patent_app_number] => 10/977296 [patent_app_country] => US [patent_app_date] => 2004-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 7084 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/298/07298166.pdf [firstpage_image] =>[orig_patent_app_number] => 10977296 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/977296
Loading device Oct 27, 2004 Issued
Array ( [id] => 889575 [patent_doc_number] => 07348789 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-25 [patent_title] => 'Integrated circuit device with on-chip setup/hold measuring circuit' [patent_app_type] => utility [patent_app_number] => 10/972119 [patent_app_country] => US [patent_app_date] => 2004-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 6070 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/348/07348789.pdf [firstpage_image] =>[orig_patent_app_number] => 10972119 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/972119
Integrated circuit device with on-chip setup/hold measuring circuit Oct 20, 2004 Issued
Array ( [id] => 5811246 [patent_doc_number] => 20060082355 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-20 [patent_title] => 'Test pulses for enabling revenue testable panel meters' [patent_app_type] => utility [patent_app_number] => 10/969713 [patent_app_country] => US [patent_app_date] => 2004-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1113 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0082/20060082355.pdf [firstpage_image] =>[orig_patent_app_number] => 10969713 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/969713
Test pulses for enabling revenue testable panel meters Oct 19, 2004 Abandoned
Array ( [id] => 5811269 [patent_doc_number] => 20060082378 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-20 [patent_title] => 'Test system for device characterization' [patent_app_type] => utility [patent_app_number] => 10/969426 [patent_app_country] => US [patent_app_date] => 2004-10-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4924 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0082/20060082378.pdf [firstpage_image] =>[orig_patent_app_number] => 10969426 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/969426
Test system for device characterization Oct 19, 2004 Issued
Array ( [id] => 5715739 [patent_doc_number] => 20060079102 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Cable terminal with flexible contacts' [patent_app_type] => utility [patent_app_number] => 10/965425 [patent_app_country] => US [patent_app_date] => 2004-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2862 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20060079102.pdf [firstpage_image] =>[orig_patent_app_number] => 10965425 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/965425
Cable terminal with flexible contacts Oct 12, 2004 Abandoned
Array ( [id] => 6910381 [patent_doc_number] => 20050174139 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-11 [patent_title] => 'Apparatus for high speed probing of flat panel displays' [patent_app_type] => utility [patent_app_number] => 10/964120 [patent_app_country] => US [patent_app_date] => 2004-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1113 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20050174139.pdf [firstpage_image] =>[orig_patent_app_number] => 10964120 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/964120
Apparatus for high speed probing of flat panel displays Oct 12, 2004 Abandoned
Array ( [id] => 5713581 [patent_doc_number] => 20060076944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Electrical-energy meter adaptable for optical communication with various external devices' [patent_app_type] => utility [patent_app_number] => 10/962925 [patent_app_country] => US [patent_app_date] => 2004-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 5039 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20060076944.pdf [firstpage_image] =>[orig_patent_app_number] => 10962925 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/962925
Electrical-energy meter adaptable for optical communication with various external devices Oct 11, 2004 Issued
Array ( [id] => 521090 [patent_doc_number] => 07193425 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-20 [patent_title] => 'Semiconductor test device' [patent_app_type] => utility [patent_app_number] => 10/935894 [patent_app_country] => US [patent_app_date] => 2004-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3630 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/193/07193425.pdf [firstpage_image] =>[orig_patent_app_number] => 10935894 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/935894
Semiconductor test device Sep 7, 2004 Issued
Array ( [id] => 477098 [patent_doc_number] => 07227372 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-05 [patent_title] => 'Voltage monitoring apparatus in a semiconductor probe station' [patent_app_type] => utility [patent_app_number] => 10/933200 [patent_app_country] => US [patent_app_date] => 2004-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2166 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/227/07227372.pdf [firstpage_image] =>[orig_patent_app_number] => 10933200 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/933200
Voltage monitoring apparatus in a semiconductor probe station Sep 1, 2004 Issued
Array ( [id] => 367102 [patent_doc_number] => 07479787 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-20 [patent_title] => 'Current regulator for loop powered time of flight and level measurement systems' [patent_app_type] => utility [patent_app_number] => 10/931897 [patent_app_country] => US [patent_app_date] => 2004-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5193 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/479/07479787.pdf [firstpage_image] =>[orig_patent_app_number] => 10931897 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/931897
Current regulator for loop powered time of flight and level measurement systems Aug 31, 2004 Issued
Array ( [id] => 514006 [patent_doc_number] => 07196507 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-03-27 [patent_title] => 'Apparatus for testing substrates' [patent_app_type] => utility [patent_app_number] => 10/928975 [patent_app_country] => US [patent_app_date] => 2004-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2719 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/196/07196507.pdf [firstpage_image] =>[orig_patent_app_number] => 10928975 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/928975
Apparatus for testing substrates Aug 26, 2004 Issued
Array ( [id] => 660069 [patent_doc_number] => 07106084 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-12 [patent_title] => 'Method of screening semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/926305 [patent_app_country] => US [patent_app_date] => 2004-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2066 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/106/07106084.pdf [firstpage_image] =>[orig_patent_app_number] => 10926305 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/926305
Method of screening semiconductor device Aug 25, 2004 Issued
Array ( [id] => 5240143 [patent_doc_number] => 20070018634 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-25 [patent_title] => 'Method and device for measuring electric field distribution of semiconductor device' [patent_app_type] => utility [patent_app_number] => 10/569796 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5604 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20070018634.pdf [firstpage_image] =>[orig_patent_app_number] => 10569796 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/569796
Electric-field distribution measurement method and apparatus for semiconductor device Aug 24, 2004 Issued
Array ( [id] => 7119198 [patent_doc_number] => 20050011027 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-20 [patent_title] => 'Contact actuator with contact force control' [patent_app_type] => utility [patent_app_number] => 10/919107 [patent_app_country] => US [patent_app_date] => 2004-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3819 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20050011027.pdf [firstpage_image] =>[orig_patent_app_number] => 10919107 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/919107
Contact actuator with contact force control Aug 15, 2004 Abandoned
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