
Monica E. Millner
Examiner (ID: 18810)
| Most Active Art Unit | 3632 |
| Art Unit(s) | 3632, 3508, 3627 |
| Total Applications | 1502 |
| Issued Applications | 1157 |
| Pending Applications | 88 |
| Abandoned Applications | 284 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7037154
[patent_doc_number] => 20050156588
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-21
[patent_title] => 'Circuit arrangement and a method for compensating changes of a transfer factor of a magnetic field sensor arrangement'
[patent_app_type] => utility
[patent_app_number] => 10/999198
[patent_app_country] => US
[patent_app_date] => 2004-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4018
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0156/20050156588.pdf
[firstpage_image] =>[orig_patent_app_number] => 10999198
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/999198 | Circuit arrangement and a method for compensating changes of a transfer factor of a magnetic field sensor arrangement | Nov 28, 2004 | Issued |
Array
(
[id] => 7185024
[patent_doc_number] => 20050162176
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-28
[patent_title] => 'Test device for wafer testing digital semiconductor circuits'
[patent_app_type] => utility
[patent_app_number] => 10/995111
[patent_app_country] => US
[patent_app_date] => 2004-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2067
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0162/20050162176.pdf
[firstpage_image] =>[orig_patent_app_number] => 10995111
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/995111 | Test device for wafer testing digital semiconductor circuits | Nov 23, 2004 | Issued |
Array
(
[id] => 7234928
[patent_doc_number] => 20050139771
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-30
[patent_title] => 'Thin film transistor array inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/990415
[patent_app_country] => US
[patent_app_date] => 2004-11-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3284
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0139/20050139771.pdf
[firstpage_image] =>[orig_patent_app_number] => 10990415
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/990415 | Thin film transistor array inspection apparatus | Nov 17, 2004 | Issued |
Array
(
[id] => 717581
[patent_doc_number] => 07053638
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-05-30
[patent_title] => 'Surrounding structure for a probe card'
[patent_app_type] => utility
[patent_app_number] => 10/982919
[patent_app_country] => US
[patent_app_date] => 2004-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 2238
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/053/07053638.pdf
[firstpage_image] =>[orig_patent_app_number] => 10982919
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/982919 | Surrounding structure for a probe card | Nov 7, 2004 | Issued |
Array
(
[id] => 5774759
[patent_doc_number] => 20060103399
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-05-18
[patent_title] => 'Apparatus and method for testing conductive bumps'
[patent_app_type] => utility
[patent_app_number] => 10/979418
[patent_app_country] => US
[patent_app_date] => 2004-11-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 2533
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0103/20060103399.pdf
[firstpage_image] =>[orig_patent_app_number] => 10979418
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/979418 | Apparatus and method for testing conductive bumps | Nov 1, 2004 | Issued |
Array
(
[id] => 390760
[patent_doc_number] => 07301356
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-11-27
[patent_title] => 'Support for a receptacle block of a unit under test'
[patent_app_type] => utility
[patent_app_number] => 10/975728
[patent_app_country] => US
[patent_app_date] => 2004-10-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 4605
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/301/07301356.pdf
[firstpage_image] =>[orig_patent_app_number] => 10975728
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/975728 | Support for a receptacle block of a unit under test | Oct 27, 2004 | Issued |
Array
(
[id] => 394465
[patent_doc_number] => 07298166
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-11-20
[patent_title] => 'Loading device'
[patent_app_type] => utility
[patent_app_number] => 10/977296
[patent_app_country] => US
[patent_app_date] => 2004-10-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 12
[patent_no_of_words] => 7084
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 126
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/298/07298166.pdf
[firstpage_image] =>[orig_patent_app_number] => 10977296
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/977296 | Loading device | Oct 27, 2004 | Issued |
Array
(
[id] => 889575
[patent_doc_number] => 07348789
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-03-25
[patent_title] => 'Integrated circuit device with on-chip setup/hold measuring circuit'
[patent_app_type] => utility
[patent_app_number] => 10/972119
[patent_app_country] => US
[patent_app_date] => 2004-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 6070
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/348/07348789.pdf
[firstpage_image] =>[orig_patent_app_number] => 10972119
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/972119 | Integrated circuit device with on-chip setup/hold measuring circuit | Oct 20, 2004 | Issued |
Array
(
[id] => 5811246
[patent_doc_number] => 20060082355
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-20
[patent_title] => 'Test pulses for enabling revenue testable panel meters'
[patent_app_type] => utility
[patent_app_number] => 10/969713
[patent_app_country] => US
[patent_app_date] => 2004-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1113
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0082/20060082355.pdf
[firstpage_image] =>[orig_patent_app_number] => 10969713
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/969713 | Test pulses for enabling revenue testable panel meters | Oct 19, 2004 | Abandoned |
Array
(
[id] => 5811269
[patent_doc_number] => 20060082378
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-20
[patent_title] => 'Test system for device characterization'
[patent_app_type] => utility
[patent_app_number] => 10/969426
[patent_app_country] => US
[patent_app_date] => 2004-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4924
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0082/20060082378.pdf
[firstpage_image] =>[orig_patent_app_number] => 10969426
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/969426 | Test system for device characterization | Oct 19, 2004 | Issued |
Array
(
[id] => 5715739
[patent_doc_number] => 20060079102
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-13
[patent_title] => 'Cable terminal with flexible contacts'
[patent_app_type] => utility
[patent_app_number] => 10/965425
[patent_app_country] => US
[patent_app_date] => 2004-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2862
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0079/20060079102.pdf
[firstpage_image] =>[orig_patent_app_number] => 10965425
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/965425 | Cable terminal with flexible contacts | Oct 12, 2004 | Abandoned |
Array
(
[id] => 6910381
[patent_doc_number] => 20050174139
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-11
[patent_title] => 'Apparatus for high speed probing of flat panel displays'
[patent_app_type] => utility
[patent_app_number] => 10/964120
[patent_app_country] => US
[patent_app_date] => 2004-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1113
[patent_no_of_claims] => 2
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0174/20050174139.pdf
[firstpage_image] =>[orig_patent_app_number] => 10964120
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/964120 | Apparatus for high speed probing of flat panel displays | Oct 12, 2004 | Abandoned |
Array
(
[id] => 5713581
[patent_doc_number] => 20060076944
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-13
[patent_title] => 'Electrical-energy meter adaptable for optical communication with various external devices'
[patent_app_type] => utility
[patent_app_number] => 10/962925
[patent_app_country] => US
[patent_app_date] => 2004-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 5039
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0076/20060076944.pdf
[firstpage_image] =>[orig_patent_app_number] => 10962925
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/962925 | Electrical-energy meter adaptable for optical communication with various external devices | Oct 11, 2004 | Issued |
Array
(
[id] => 521090
[patent_doc_number] => 07193425
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-03-20
[patent_title] => 'Semiconductor test device'
[patent_app_type] => utility
[patent_app_number] => 10/935894
[patent_app_country] => US
[patent_app_date] => 2004-09-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3630
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 172
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/193/07193425.pdf
[firstpage_image] =>[orig_patent_app_number] => 10935894
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/935894 | Semiconductor test device | Sep 7, 2004 | Issued |
Array
(
[id] => 477098
[patent_doc_number] => 07227372
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-06-05
[patent_title] => 'Voltage monitoring apparatus in a semiconductor probe station'
[patent_app_type] => utility
[patent_app_number] => 10/933200
[patent_app_country] => US
[patent_app_date] => 2004-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2166
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 116
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/227/07227372.pdf
[firstpage_image] =>[orig_patent_app_number] => 10933200
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/933200 | Voltage monitoring apparatus in a semiconductor probe station | Sep 1, 2004 | Issued |
Array
(
[id] => 367102
[patent_doc_number] => 07479787
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-20
[patent_title] => 'Current regulator for loop powered time of flight and level measurement systems'
[patent_app_type] => utility
[patent_app_number] => 10/931897
[patent_app_country] => US
[patent_app_date] => 2004-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5193
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 194
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/479/07479787.pdf
[firstpage_image] =>[orig_patent_app_number] => 10931897
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/931897 | Current regulator for loop powered time of flight and level measurement systems | Aug 31, 2004 | Issued |
Array
(
[id] => 514006
[patent_doc_number] => 07196507
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-03-27
[patent_title] => 'Apparatus for testing substrates'
[patent_app_type] => utility
[patent_app_number] => 10/928975
[patent_app_country] => US
[patent_app_date] => 2004-08-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 2719
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/196/07196507.pdf
[firstpage_image] =>[orig_patent_app_number] => 10928975
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/928975 | Apparatus for testing substrates | Aug 26, 2004 | Issued |
Array
(
[id] => 660069
[patent_doc_number] => 07106084
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-12
[patent_title] => 'Method of screening semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 10/926305
[patent_app_country] => US
[patent_app_date] => 2004-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 2066
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/106/07106084.pdf
[firstpage_image] =>[orig_patent_app_number] => 10926305
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/926305 | Method of screening semiconductor device | Aug 25, 2004 | Issued |
Array
(
[id] => 5240143
[patent_doc_number] => 20070018634
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-25
[patent_title] => 'Method and device for measuring electric field distribution of semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 10/569796
[patent_app_country] => US
[patent_app_date] => 2004-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 5604
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0018/20070018634.pdf
[firstpage_image] =>[orig_patent_app_number] => 10569796
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/569796 | Electric-field distribution measurement method and apparatus for semiconductor device | Aug 24, 2004 | Issued |
Array
(
[id] => 7119198
[patent_doc_number] => 20050011027
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-01-20
[patent_title] => 'Contact actuator with contact force control'
[patent_app_type] => utility
[patent_app_number] => 10/919107
[patent_app_country] => US
[patent_app_date] => 2004-08-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3819
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0011/20050011027.pdf
[firstpage_image] =>[orig_patent_app_number] => 10919107
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/919107 | Contact actuator with contact force control | Aug 15, 2004 | Abandoned |