Nalin B Pilapitiya

Array ( [id] => 3617676 [patent_doc_number] => 05534784 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-07-09 [patent_title] => 'Method for probing a semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 8/236847 [patent_app_country] => US [patent_app_date] => 1994-05-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 5609 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/534/05534784.pdf [firstpage_image] =>[orig_patent_app_number] => 236847 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3597431 [patent_doc_number] => 05521511 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-28 [patent_title] => 'Method and device for testing integrated power devices' [patent_app_type] => 1 [patent_app_number] => 8/233645 [patent_app_country] => US [patent_app_date] => 1994-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3030 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/521/05521511.pdf [firstpage_image] =>[orig_patent_app_number] => 233645 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3499502 [patent_doc_number] => 05508606 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-16 [patent_title] => 'Direct current sensor' [patent_app_type] => 1 [patent_app_number] => 8/232936 [patent_app_country] => US [patent_app_date] => 1994-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4753 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/508/05508606.pdf [firstpage_image] =>[orig_patent_app_number] => 232936 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3530566 [patent_doc_number] => 05504436 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-02 [patent_title] => 'Socket apparatus for member testing' [patent_app_type] => 1 [patent_app_number] => 8/229786 [patent_app_country] => US [patent_app_date] => 1994-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 3155 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 204 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/504/05504436.pdf [firstpage_image] =>[orig_patent_app_number] => 229786 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3597641 [patent_doc_number] => 05521525 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-05-28 [patent_title] => 'Method and apparatus for measuring the doping density profile of a semiconductor layer' [patent_app_type] => 1 [patent_app_number] => 8/228077 [patent_app_country] => US [patent_app_date] => 1994-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 7039 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/521/05521525.pdf [firstpage_image] =>[orig_patent_app_number] => 228077 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3518938 [patent_doc_number] => 05512839 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-04-30 [patent_title] => 'Test probe for electrical measuring instruments, particularly for voltmeters' [patent_app_type] => 1 [patent_app_number] => 8/225041 [patent_app_country] => US [patent_app_date] => 1994-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 708 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/512/05512839.pdf [firstpage_image] =>[orig_patent_app_number] => 225041 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3428352 [patent_doc_number] => 05459404 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-17 [patent_title] => 'Apparatus and method for detecting floating nodes' [patent_app_type] => 1 [patent_app_number] => 8/219682 [patent_app_country] => US [patent_app_date] => 1994-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 7 [patent_no_of_words] => 2652 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/459/05459404.pdf [firstpage_image] =>[orig_patent_app_number] => 219682 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3116946 [patent_doc_number] => 05465046 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-11-07 [patent_title] => 'Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits' [patent_app_type] => 1 [patent_app_number] => 8/215431 [patent_app_country] => US [patent_app_date] => 1994-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 7125 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/465/05465046.pdf [firstpage_image] =>[orig_patent_app_number] => 215431 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3571716 [patent_doc_number] => 05485079 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-01-16 [patent_title] => 'Magneto-optical element and optical magnetic field sensor' [patent_app_type] => 1 [patent_app_number] => 8/214462 [patent_app_country] => US [patent_app_date] => 1994-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 14 [patent_no_of_words] => 6581 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/485/05485079.pdf [firstpage_image] =>[orig_patent_app_number] => 214462 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3487961 [patent_doc_number] => 05446374 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-29 [patent_title] => 'Potentiometer multiplier circuit, and an electrical energy meter including such a circuit' [patent_app_type] => 1 [patent_app_number] => 8/208670 [patent_app_country] => US [patent_app_date] => 1994-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 2964 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 278 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/446/05446374.pdf [firstpage_image] =>[orig_patent_app_number] => 208670 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3414938 [patent_doc_number] => 05461307 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-24 [patent_title] => 'Electro-optical current sensing system and method for sensing and avoiding thermally induced measurement error therein' [patent_app_type] => 1 [patent_app_number] => 8/205220 [patent_app_country] => US [patent_app_date] => 1994-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2908 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/461/05461307.pdf [firstpage_image] =>[orig_patent_app_number] => 205220 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3453999 [patent_doc_number] => 05424634 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-06-13 [patent_title] => 'Non-destructive flex testing method and means' [patent_app_type] => 1 [patent_app_number] => 8/199042 [patent_app_country] => US [patent_app_date] => 1994-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5170 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/424/05424634.pdf [firstpage_image] =>[orig_patent_app_number] => 199042 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3491422 [patent_doc_number] => 05426360 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-06-20 [patent_title] => 'Secondary electrical power line parameter monitoring apparatus and system' [patent_app_type] => 1 [patent_app_number] => 8/198501 [patent_app_country] => US [patent_app_date] => 1994-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 13 [patent_no_of_words] => 7977 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/426/05426360.pdf [firstpage_image] =>[orig_patent_app_number] => 198501 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3418026 [patent_doc_number] => 05444390 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-22 [patent_title] => 'Means and method for sequentially testing electrical components' [patent_app_type] => 1 [patent_app_number] => 8/190312 [patent_app_country] => US [patent_app_date] => 1994-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4896 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/444/05444390.pdf [firstpage_image] =>[orig_patent_app_number] => 190312 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3414951 [patent_doc_number] => 05461308 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-10-24 [patent_title] => 'Magnetoresistive current sensor having high sensitivity' [patent_app_type] => 1 [patent_app_number] => 8/176366 [patent_app_country] => US [patent_app_date] => 1993-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 1948 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/461/05461308.pdf [firstpage_image] =>[orig_patent_app_number] => 176366 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3464914 [patent_doc_number] => 05442302 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1995-08-15 [patent_title] => 'Method and apparatus for measuring high-frequency C-V characteristics of MIS device' [patent_app_type] => 1 [patent_app_number] => 8/171406 [patent_app_country] => US [patent_app_date] => 1993-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3451 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/442/05442302.pdf [firstpage_image] =>[orig_patent_app_number] => 171406 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 3549547 [patent_doc_number] => 05554939 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 1996-09-10 [patent_title] => 'Non-destructive measuring sensor for semiconductor wafer and method of manufacturing the same' [patent_app_type] => 1 [patent_app_number] => 8/171026 [patent_app_country] => US [patent_app_date] => 1993-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 37 [patent_no_of_words] => 8376 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 256 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/05/554/05554939.pdf [firstpage_image] =>[orig_patent_app_number] => 171026 [rel_patent_id] =>[rel_patent_doc_number] =>)