Search

Nancy V. Le

Examiner (ID: 7907)

Most Active Art Unit
2108
Art Unit(s)
2853, 2861, 2858, 2108, 2107
Total Applications
431
Issued Applications
255
Pending Applications
24
Abandoned Applications
152

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 17838896 [patent_doc_number] => 20220276201 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-01 [patent_title] => ION MOBILITY SPECTROMETER WITH CENTER ROD [patent_app_type] => utility [patent_app_number] => 17/698048 [patent_app_country] => US [patent_app_date] => 2022-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10329 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -29 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17698048 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/698048
Ion mobility spectrometer with center rod Mar 17, 2022 Issued
Array ( [id] => 19487209 [patent_doc_number] => 12106933 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-01 [patent_title] => Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopes [patent_app_type] => utility [patent_app_number] => 17/694549 [patent_app_country] => US [patent_app_date] => 2022-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 9830 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17694549 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/694549
Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopes Mar 13, 2022 Issued
Array ( [id] => 18978553 [patent_doc_number] => 11903707 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-20 [patent_title] => Enclosed desorption electrospray ionization probes and method of use thereof [patent_app_type] => utility [patent_app_number] => 17/692613 [patent_app_country] => US [patent_app_date] => 2022-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 29 [patent_no_of_words] => 7387 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17692613 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/692613
Enclosed desorption electrospray ionization probes and method of use thereof Mar 10, 2022 Issued
Array ( [id] => 19918531 [patent_doc_number] => 12293907 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-06 [patent_title] => Physical-chemical property scoring for structure elucidation in ion spectrometry [patent_app_type] => utility [patent_app_number] => 17/688470 [patent_app_country] => US [patent_app_date] => 2022-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1149 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17688470 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/688470
Physical-chemical property scoring for structure elucidation in ion spectrometry Mar 6, 2022 Issued
Array ( [id] => 17949166 [patent_doc_number] => 20220336185 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-20 [patent_title] => ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY [patent_app_type] => utility [patent_app_number] => 17/688339 [patent_app_country] => US [patent_app_date] => 2022-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14502 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17688339 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/688339
Arbitrary electron dose waveforms for electron microscopy Mar 6, 2022 Issued
Array ( [id] => 19219102 [patent_doc_number] => 20240183806 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-06 [patent_title] => SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECTION IN A CHARGED PARTICLE SYSTEM [patent_app_type] => utility [patent_app_number] => 18/284824 [patent_app_country] => US [patent_app_date] => 2022-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13114 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284824 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/284824
System and method for determining local focus points during inspection in a charged particle system Mar 3, 2022 Issued
Array ( [id] => 19384557 [patent_doc_number] => 20240274427 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-15 [patent_title] => MASS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 18/290295 [patent_app_country] => US [patent_app_date] => 2022-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6137 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18290295 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/290295
MASS SPECTROMETER Mar 3, 2022 Pending
Array ( [id] => 19063066 [patent_doc_number] => 11942315 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-26 [patent_title] => Amplifier amplitude digital control for a mass spectrometer [patent_app_type] => utility [patent_app_number] => 17/685516 [patent_app_country] => US [patent_app_date] => 2022-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 8134 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17685516 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/685516
Amplifier amplitude digital control for a mass spectrometer Mar 2, 2022 Issued
Array ( [id] => 19183717 [patent_doc_number] => 11990315 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-21 [patent_title] => Measurement and correction of optical aberrations in charged particle beam microscopy [patent_app_type] => utility [patent_app_number] => 17/683076 [patent_app_country] => US [patent_app_date] => 2022-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 10268 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17683076 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/683076
Measurement and correction of optical aberrations in charged particle beam microscopy Feb 27, 2022 Issued
Array ( [id] => 19321377 [patent_doc_number] => 20240242924 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-18 [patent_title] => FOCUSED ION BEAM SYSTEM [patent_app_type] => utility [patent_app_number] => 18/560013 [patent_app_country] => US [patent_app_date] => 2022-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5393 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 223 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18560013 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/560013
FOCUSED ION BEAM SYSTEM Feb 24, 2022 Pending
Array ( [id] => 18061645 [patent_doc_number] => 20220392732 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => CARBON NANOTUBE DEVICE [patent_app_type] => utility [patent_app_number] => 17/679652 [patent_app_country] => US [patent_app_date] => 2022-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2518 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17679652 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/679652
Carbon nanotube device Feb 23, 2022 Issued
Array ( [id] => 18965218 [patent_doc_number] => 11898975 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-13 [patent_title] => Electron spectrometer [patent_app_type] => utility [patent_app_number] => 17/652237 [patent_app_country] => US [patent_app_date] => 2022-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9619 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17652237 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/652237
Electron spectrometer Feb 22, 2022 Issued
Array ( [id] => 19035558 [patent_doc_number] => 20240085373 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => DYNAMIC HEATING OF A DIFFERENTIAL MOBILITY SPECTROMETER CELL [patent_app_type] => utility [patent_app_number] => 18/262972 [patent_app_country] => US [patent_app_date] => 2022-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5954 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18262972 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/262972
DYNAMIC HEATING OF A DIFFERENTIAL MOBILITY SPECTROMETER CELL Feb 22, 2022 Pending
Array ( [id] => 19206062 [patent_doc_number] => 20240177961 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-30 [patent_title] => ELECTRON BEAM MODULATION DEVICE AND ELECTRON BEAM MODULATION METHOD [patent_app_type] => utility [patent_app_number] => 18/284532 [patent_app_country] => US [patent_app_date] => 2022-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13122 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284532 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/284532
ELECTRON BEAM MODULATION DEVICE AND ELECTRON BEAM MODULATION METHOD Feb 21, 2022 Pending
Array ( [id] => 19582417 [patent_doc_number] => 12148543 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-11-19 [patent_title] => Ion trap loading assembly [patent_app_type] => utility [patent_app_number] => 17/651840 [patent_app_country] => US [patent_app_date] => 2022-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 10872 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17651840 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/651840
Ion trap loading assembly Feb 20, 2022 Issued
Array ( [id] => 17917402 [patent_doc_number] => 20220319798 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-06 [patent_title] => ELECTRON BEAM APPLICATION APPARATUS [patent_app_type] => utility [patent_app_number] => 17/676386 [patent_app_country] => US [patent_app_date] => 2022-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5348 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17676386 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/676386
Electron beam application apparatus Feb 20, 2022 Issued
Array ( [id] => 17810760 [patent_doc_number] => 20220262595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-18 [patent_title] => Estimation Model Generation Method and Electron Microscope [patent_app_type] => utility [patent_app_number] => 17/671896 [patent_app_country] => US [patent_app_date] => 2022-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8053 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17671896 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/671896
Estimation model generation method and electron microscope Feb 14, 2022 Issued
Array ( [id] => 18804270 [patent_doc_number] => 11837433 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-05 [patent_title] => Method of measuring relative rotational angle and scanning transmission electron microscope [patent_app_type] => utility [patent_app_number] => 17/669503 [patent_app_country] => US [patent_app_date] => 2022-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 25 [patent_no_of_words] => 9814 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17669503 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/669503
Method of measuring relative rotational angle and scanning transmission electron microscope Feb 10, 2022 Issued
Array ( [id] => 19161025 [patent_doc_number] => 20240153732 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-09 [patent_title] => SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED PARTICLE SYSTEM [patent_app_type] => utility [patent_app_number] => 18/281272 [patent_app_country] => US [patent_app_date] => 2022-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18003 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18281272 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/281272
SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED PARTICLE SYSTEM Feb 8, 2022 Pending
Array ( [id] => 17954445 [patent_doc_number] => 11480545 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-10-25 [patent_title] => Ion mobility spectrometer and method of analyzing ions [patent_app_type] => utility [patent_app_number] => 17/667165 [patent_app_country] => US [patent_app_date] => 2022-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 18 [patent_no_of_words] => 6805 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17667165 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/667165
Ion mobility spectrometer and method of analyzing ions Feb 7, 2022 Issued
Menu