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Nancy V. Le

Examiner (ID: 7907)

Most Active Art Unit
2108
Art Unit(s)
2853, 2861, 2858, 2108, 2107
Total Applications
431
Issued Applications
255
Pending Applications
24
Abandoned Applications
152

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19817831 [patent_doc_number] => 20250076038 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-06 [patent_title] => FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION [patent_app_type] => utility [patent_app_number] => 18/458929 [patent_app_country] => US [patent_app_date] => 2023-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8388 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18458929 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/458929
FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION Aug 29, 2023 Pending
Array ( [id] => 19539327 [patent_doc_number] => 12131883 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-29 [patent_title] => Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE) [patent_app_type] => utility [patent_app_number] => 18/456997 [patent_app_country] => US [patent_app_date] => 2023-08-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 6256 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18456997 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/456997
Method and apparatus for usable beam current and brightness in Schottky thermal field emission (TFE) Aug 27, 2023 Issued
Array ( [id] => 19803920 [patent_doc_number] => 20250069845 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-27 [patent_title] => TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELECTRON MICROSCOPE [patent_app_type] => utility [patent_app_number] => 18/456246 [patent_app_country] => US [patent_app_date] => 2023-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7249 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18456246 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/456246
Techniques for imaging low duty cycle signals using a scanning electron microscope Aug 24, 2023 Issued
Array ( [id] => 19252691 [patent_doc_number] => 20240203688 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-20 [patent_title] => APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN [patent_app_type] => utility [patent_app_number] => 18/366322 [patent_app_country] => US [patent_app_date] => 2023-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5852 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18366322 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/366322
APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN Aug 6, 2023 Pending
Array ( [id] => 19523929 [patent_doc_number] => 12125669 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-22 [patent_title] => Thermal-aided inspection by advanced charge controller module in a charged particle system [patent_app_type] => utility [patent_app_number] => 18/362757 [patent_app_country] => US [patent_app_date] => 2023-07-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 15070 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18362757 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/362757
Thermal-aided inspection by advanced charge controller module in a charged particle system Jul 30, 2023 Issued
Array ( [id] => 18812478 [patent_doc_number] => 20230386815 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-30 [patent_title] => COLLECTION PROBE AND METHODS FOR THE USE THEREOF [patent_app_type] => utility [patent_app_number] => 18/227417 [patent_app_country] => US [patent_app_date] => 2023-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15863 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18227417 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/227417
Collection probe and methods for the use thereof Jul 27, 2023 Issued
Array ( [id] => 19716500 [patent_doc_number] => 12202019 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-01-21 [patent_title] => Method and system for the removal and/or avoidance of contamination in charged particle beam systems [patent_app_type] => utility [patent_app_number] => 18/360731 [patent_app_country] => US [patent_app_date] => 2023-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 16 [patent_no_of_words] => 14957 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 175 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18360731 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/360731
Method and system for the removal and/or avoidance of contamination in charged particle beam systems Jul 26, 2023 Issued
Array ( [id] => 18943345 [patent_doc_number] => 20240038484 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-01 [patent_title] => Fastening an object to a manipulator and/or to an object holder in a particle beam apparatus [patent_app_type] => utility [patent_app_number] => 18/360197 [patent_app_country] => US [patent_app_date] => 2023-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 22780 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18360197 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/360197
Fastening an object to a manipulator and/or to an object holder in a particle beam apparatus Jul 26, 2023 Pending
Array ( [id] => 18941317 [patent_doc_number] => 20240036456 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-01 [patent_title] => METHOD FOR ELECTRON BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK [patent_app_type] => utility [patent_app_number] => 18/226901 [patent_app_country] => US [patent_app_date] => 2023-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12374 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18226901 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/226901
METHOD FOR ELECTRON BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK Jul 26, 2023 Pending
Array ( [id] => 19176027 [patent_doc_number] => 20240162001 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-16 [patent_title] => METHOD OF SAMPLE PREPARATON AND ANALYSIS [patent_app_type] => utility [patent_app_number] => 18/360232 [patent_app_country] => US [patent_app_date] => 2023-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3938 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18360232 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/360232
METHOD OF SAMPLE PREPARATON AND ANALYSIS Jul 26, 2023 Pending
Array ( [id] => 19007641 [patent_doc_number] => 20240071712 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-29 [patent_title] => ION BEAM DEPOSITION APPARATUS AND ION BEAM DEPOSITION METHOD USING THE SAME [patent_app_type] => utility [patent_app_number] => 18/226644 [patent_app_country] => US [patent_app_date] => 2023-07-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5862 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18226644 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/226644
ION BEAM DEPOSITION APPARATUS AND ION BEAM DEPOSITION METHOD USING THE SAME Jul 25, 2023 Pending
Array ( [id] => 20648296 [patent_doc_number] => 12603246 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-04-14 [patent_title] => Detector and method for obtaining Kikuchi images [patent_app_type] => utility [patent_app_number] => 18/357869 [patent_app_country] => US [patent_app_date] => 2023-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 1156 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 84 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18357869 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/357869
DETECTOR AND METHOD FOR OBTAINING KIKUCHI IMAGES Jul 23, 2023 Issued
Array ( [id] => 20636700 [patent_doc_number] => 12597583 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-04-07 [patent_title] => FIB and SEM resolution enhancement using asymmetric probe deconvolution [patent_app_type] => utility [patent_app_number] => 18/357056 [patent_app_country] => US [patent_app_date] => 2023-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 15 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18357056 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/357056
FIB and SEM resolution enhancement using asymmetric probe deconvolution Jul 20, 2023 Issued
Array ( [id] => 19712535 [patent_doc_number] => 20250022677 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => APPARATUS AND METHOD FOR MANIPULATING A MICROSCOPIC SAMPLE [patent_app_type] => utility [patent_app_number] => 18/352043 [patent_app_country] => US [patent_app_date] => 2023-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6916 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18352043 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/352043
APPARATUS AND METHOD FOR MANIPULATING A MICROSCOPIC SAMPLE Jul 12, 2023 Pending
Array ( [id] => 19712539 [patent_doc_number] => 20250022681 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-16 [patent_title] => SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS [patent_app_type] => utility [patent_app_number] => 18/220931 [patent_app_country] => US [patent_app_date] => 2023-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 23809 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18220931 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/220931
SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS Jul 11, 2023 Pending
Array ( [id] => 19007639 [patent_doc_number] => 20240071710 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-29 [patent_title] => METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING [patent_app_type] => utility [patent_app_number] => 18/350643 [patent_app_country] => US [patent_app_date] => 2023-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11944 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18350643 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/350643
METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING Jul 10, 2023 Pending
Array ( [id] => 20482727 [patent_doc_number] => 12531204 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-20 [patent_title] => Microscope aberration correction [patent_app_type] => utility [patent_app_number] => 18/345675 [patent_app_country] => US [patent_app_date] => 2023-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 19 [patent_no_of_words] => 6444 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18345675 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/345675
Microscope aberration correction Jun 29, 2023 Issued
Array ( [id] => 18956498 [patent_doc_number] => 20240044825 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-08 [patent_title] => XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION [patent_app_type] => utility [patent_app_number] => 18/337397 [patent_app_country] => US [patent_app_date] => 2023-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6705 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18337397 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/337397
XPS metrology for process control in selective deposition Jun 18, 2023 Issued
Array ( [id] => 19646397 [patent_doc_number] => 20240420917 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-19 [patent_title] => DISCHARGING A REGION OF A SAMPLE [patent_app_type] => utility [patent_app_number] => 18/210594 [patent_app_country] => US [patent_app_date] => 2023-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5748 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18210594 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/210594
DISCHARGING A REGION OF A SAMPLE Jun 14, 2023 Pending
Array ( [id] => 20161271 [patent_doc_number] => 12387904 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Examining, analyzing and/or processing an object using an object receiving container [patent_app_type] => utility [patent_app_number] => 18/333699 [patent_app_country] => US [patent_app_date] => 2023-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 28 [patent_no_of_words] => 19128 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 887 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18333699 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/333699
Examining, analyzing and/or processing an object using an object receiving container Jun 12, 2023 Issued
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