Search

Nancy V. Le

Examiner (ID: 7907)

Most Active Art Unit
2108
Art Unit(s)
2853, 2861, 2858, 2108, 2107
Total Applications
431
Issued Applications
255
Pending Applications
24
Abandoned Applications
152

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 20088819 [patent_doc_number] => 20250218755 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-03 [patent_title] => Micro-Channel Plate Mount Assembly for Ion Detector in Mass Spectrometry [patent_app_type] => utility [patent_app_number] => 18/698956 [patent_app_country] => US [patent_app_date] => 2022-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5042 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18698956 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/698956
Micro-Channel Plate Mount Assembly for Ion Detector in Mass Spectrometry Oct 4, 2022 Pending
Array ( [id] => 19604642 [patent_doc_number] => 20240395522 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => Systems and Methods for Background Ion Detection in Mass Spectrometry [patent_app_type] => utility [patent_app_number] => 18/693311 [patent_app_country] => US [patent_app_date] => 2022-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9325 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18693311 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/693311
Systems and Methods for Background Ion Detection in Mass Spectrometry Sep 18, 2022 Pending
Array ( [id] => 19294467 [patent_doc_number] => 12033830 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-07-09 [patent_title] => Multiple charged-particle beam apparatus with low crosstalk [patent_app_type] => utility [patent_app_number] => 17/944157 [patent_app_country] => US [patent_app_date] => 2022-09-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 12777 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17944157 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/944157
Multiple charged-particle beam apparatus with low crosstalk Sep 12, 2022 Issued
Array ( [id] => 19604647 [patent_doc_number] => 20240395527 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE [patent_app_type] => utility [patent_app_number] => 18/689467 [patent_app_country] => US [patent_app_date] => 2022-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6455 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18689467 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/689467
SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE Sep 8, 2022 Pending
Array ( [id] => 18911275 [patent_doc_number] => 11874251 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-01-16 [patent_title] => Ion mobility spectrometer and method of analyzing ions [patent_app_type] => utility [patent_app_number] => 17/940097 [patent_app_country] => US [patent_app_date] => 2022-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 24 [patent_no_of_words] => 11300 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 303 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17940097 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/940097
Ion mobility spectrometer and method of analyzing ions Sep 7, 2022 Issued
Array ( [id] => 18254805 [patent_doc_number] => 20230081844 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-16 [patent_title] => METHOD FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK [patent_app_type] => utility [patent_app_number] => 17/940688 [patent_app_country] => US [patent_app_date] => 2022-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12562 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17940688 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/940688
METHOD FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK Sep 7, 2022 Pending
Array ( [id] => 19951197 [patent_doc_number] => 12322568 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-06-03 [patent_title] => Auto-focus sensor implementation for multi-column microscopes [patent_app_type] => utility [patent_app_number] => 17/930332 [patent_app_country] => US [patent_app_date] => 2022-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 3733 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17930332 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/930332
Auto-focus sensor implementation for multi-column microscopes Sep 6, 2022 Issued
Array ( [id] => 18240680 [patent_doc_number] => 20230072991 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-09 [patent_title] => Charged Particle Beam Device and Image Generation Method [patent_app_type] => utility [patent_app_number] => 17/939309 [patent_app_country] => US [patent_app_date] => 2022-09-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4934 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17939309 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/939309
Charged particle beam device and image generation method Sep 6, 2022 Issued
Array ( [id] => 19626988 [patent_doc_number] => 12165837 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-12-10 [patent_title] => System and method for scanning a sample using multi-beam inspection apparatus [patent_app_type] => utility [patent_app_number] => 17/901767 [patent_app_country] => US [patent_app_date] => 2022-09-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 29 [patent_no_of_words] => 23887 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17901767 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/901767
System and method for scanning a sample using multi-beam inspection apparatus Aug 31, 2022 Issued
Array ( [id] => 19007646 [patent_doc_number] => 20240071717 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-29 [patent_title] => Application Management For Charged Particle Microscope Devices [patent_app_type] => utility [patent_app_number] => 17/823669 [patent_app_country] => US [patent_app_date] => 2022-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 19356 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17823669 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/823669
Application management for charged particle microscope devices Aug 30, 2022 Issued
Array ( [id] => 20305328 [patent_doc_number] => 12451325 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-21 [patent_title] => Charged particle beam axial calibration [patent_app_type] => utility [patent_app_number] => 17/897117 [patent_app_country] => US [patent_app_date] => 2022-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 5854 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17897117 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/897117
Charged particle beam axial calibration Aug 25, 2022 Issued
Array ( [id] => 19926168 [patent_doc_number] => 12300461 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-13 [patent_title] => Particle beam device, method for operating the particle beam device and computer program product [patent_app_type] => utility [patent_app_number] => 17/822530 [patent_app_country] => US [patent_app_date] => 2022-08-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3459 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 240 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17822530 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/822530
Particle beam device, method for operating the particle beam device and computer program product Aug 25, 2022 Issued
Array ( [id] => 19934996 [patent_doc_number] => 12308204 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-20 [patent_title] => Optical auto-focus unit and a method for auto-focus [patent_app_type] => utility [patent_app_number] => 17/893836 [patent_app_country] => US [patent_app_date] => 2022-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 0 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17893836 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/893836
Optical auto-focus unit and a method for auto-focus Aug 22, 2022 Issued
Array ( [id] => 18061656 [patent_doc_number] => 20220392743 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/891983 [patent_app_country] => US [patent_app_date] => 2022-08-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7445 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17891983 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/891983
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD Aug 18, 2022 Issued
Array ( [id] => 19515645 [patent_doc_number] => 20240347331 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY [patent_app_type] => utility [patent_app_number] => 18/682218 [patent_app_country] => US [patent_app_date] => 2022-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5411 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18682218 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/682218
INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY Aug 9, 2022 Pending
Array ( [id] => 18402039 [patent_doc_number] => 11664186 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-05-30 [patent_title] => Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction [patent_app_type] => utility [patent_app_number] => 17/817989 [patent_app_country] => US [patent_app_date] => 2022-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 7287 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17817989 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/817989
Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction Aug 6, 2022 Issued
Array ( [id] => 19934994 [patent_doc_number] => 12308202 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-20 [patent_title] => Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method [patent_app_type] => utility [patent_app_number] => 17/817474 [patent_app_country] => US [patent_app_date] => 2022-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 20 [patent_no_of_words] => 5844 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17817474 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/817474
Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method Aug 3, 2022 Issued
Array ( [id] => 18061649 [patent_doc_number] => 20220392736 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-08 [patent_title] => REDUCTION OF THERMAL MAGNETIC FIELD NOISE IN TEM CORRECTOR SYSTEMS [patent_app_type] => utility [patent_app_number] => 17/880624 [patent_app_country] => US [patent_app_date] => 2022-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5467 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17880624 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/880624
Reduction of thermal magnetic field noise in TEM corrector systems Aug 2, 2022 Issued
Array ( [id] => 20132221 [patent_doc_number] => 12374539 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-29 [patent_title] => Interposer with load hole for ion trap [patent_app_type] => utility [patent_app_number] => 17/877261 [patent_app_country] => US [patent_app_date] => 2022-07-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1224 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17877261 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/877261
Interposer with load hole for ion trap Jul 28, 2022 Issued
Array ( [id] => 18008395 [patent_doc_number] => 20220367162 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-17 [patent_title] => SEPARATING IONS IN AN ION TRAP [patent_app_type] => utility [patent_app_number] => 17/869016 [patent_app_country] => US [patent_app_date] => 2022-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 21099 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -36 [patent_words_short_claim] => 22 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17869016 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/869016
Separating ions in an ion trap Jul 19, 2022 Issued
Menu