Search

Natalia Harkaway

Examiner (ID: 8237)

Most Active Art Unit
1201
Art Unit(s)
1201
Total Applications
161
Issued Applications
154
Pending Applications
0
Abandoned Applications
7

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19121948 [patent_doc_number] => 11965923 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-23 [patent_title] => Self-test for electrostatic charge variation sensors [patent_app_type] => utility [patent_app_number] => 17/581553 [patent_app_country] => US [patent_app_date] => 2022-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 8548 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17581553 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/581553
Self-test for electrostatic charge variation sensors Jan 20, 2022 Issued
Array ( [id] => 17750900 [patent_doc_number] => 20220229105 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-21 [patent_title] => INSPECTION APPARATUS, CONTROL METHOD, AND STORAGE MEDIUM [patent_app_type] => utility [patent_app_number] => 17/573680 [patent_app_country] => US [patent_app_date] => 2022-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6233 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17573680 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/573680
Inspection apparatus, control method, and storage medium Jan 11, 2022 Issued
Array ( [id] => 18284333 [patent_doc_number] => 20230099805 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-30 [patent_title] => LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT CHIPS [patent_app_type] => utility [patent_app_number] => 17/571271 [patent_app_country] => US [patent_app_date] => 2022-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8317 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17571271 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/571271
LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT CHIPS Jan 6, 2022 Abandoned
Array ( [id] => 18316072 [patent_doc_number] => 11630147 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-18 [patent_title] => Low-thermal resistance pressing device for a socket [patent_app_type] => utility [patent_app_number] => 17/551246 [patent_app_country] => US [patent_app_date] => 2021-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 5296 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17551246 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/551246
Low-thermal resistance pressing device for a socket Dec 14, 2021 Issued
Array ( [id] => 17521512 [patent_doc_number] => 20220107361 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-07 [patent_title] => Two-Port On-Wafer Calibration Piece Circuit Model and Method for Determining Parameters [patent_app_type] => utility [patent_app_number] => 17/550930 [patent_app_country] => US [patent_app_date] => 2021-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6294 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17550930 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/550930
Two-port on-wafer calibration piece circuit model and method for determining parameters Dec 13, 2021 Issued
Array ( [id] => 18749503 [patent_doc_number] => 11808808 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-11-07 [patent_title] => Testing a single chip in a wafer probing system [patent_app_type] => utility [patent_app_number] => 17/643216 [patent_app_country] => US [patent_app_date] => 2021-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 11095 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 331 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17643216 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/643216
Testing a single chip in a wafer probing system Dec 7, 2021 Issued
Array ( [id] => 18702562 [patent_doc_number] => 11789069 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-10-17 [patent_title] => Mixed high-resolution and low-resolution inspection for tamper detection [patent_app_type] => utility [patent_app_number] => 17/541708 [patent_app_country] => US [patent_app_date] => 2021-12-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8394 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17541708 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/541708
Mixed high-resolution and low-resolution inspection for tamper detection Dec 2, 2021 Issued
Array ( [id] => 18826024 [patent_doc_number] => 11841296 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-12 [patent_title] => Semiconductor substrates for electrical resistivity measurements [patent_app_type] => utility [patent_app_number] => 17/457426 [patent_app_country] => US [patent_app_date] => 2021-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4423 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17457426 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/457426
Semiconductor substrates for electrical resistivity measurements Dec 1, 2021 Issued
Array ( [id] => 18644172 [patent_doc_number] => 11768236 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-09-26 [patent_title] => Test device control method and test device [patent_app_type] => utility [patent_app_number] => 17/539951 [patent_app_country] => US [patent_app_date] => 2021-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 3742 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17539951 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/539951
Test device control method and test device Nov 30, 2021 Issued
Array ( [id] => 18479305 [patent_doc_number] => 11693039 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-04 [patent_title] => Electrostatic charge sensor with high impedance contact pads [patent_app_type] => utility [patent_app_number] => 17/537069 [patent_app_country] => US [patent_app_date] => 2021-11-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 4451 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17537069 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/537069
Electrostatic charge sensor with high impedance contact pads Nov 28, 2021 Issued
Array ( [id] => 17613085 [patent_doc_number] => 20220155365 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-19 [patent_title] => SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD [patent_app_type] => utility [patent_app_number] => 17/524788 [patent_app_country] => US [patent_app_date] => 2021-11-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3450 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17524788 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/524788
Semiconductor inspecting method for ensuring scrubbing length on pad Nov 11, 2021 Issued
Array ( [id] => 19035687 [patent_doc_number] => 20240085502 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-14 [patent_title] => LOW-COST MODULAR LIQUID NITROGEN LOW-TEMPERATURE MULTI-NUCLEAR MAGNETIC RESONANCE PROBE [patent_app_type] => utility [patent_app_number] => 18/284549 [patent_app_country] => US [patent_app_date] => 2021-11-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3862 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284549 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/284549
Low-cost modular liquid nitrogen low-temperature multi-nuclear magnetic resonance probe Nov 9, 2021 Issued
Array ( [id] => 17596990 [patent_doc_number] => 20220146564 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-12 [patent_title] => SEMICONDUCTOR WAFER EVALUATION APPARATUS AND SEMICONDUCTOR WAFER MANUFACTURING METHOD [patent_app_type] => utility [patent_app_number] => 17/519679 [patent_app_country] => US [patent_app_date] => 2021-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5902 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17519679 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/519679
Semiconductor wafer evaluation apparatus and semiconductor wafer manufacturing method Nov 4, 2021 Issued
Array ( [id] => 18857320 [patent_doc_number] => 11854915 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-26 [patent_title] => Electrical test structure, semiconductor structure and electrical test method [patent_app_type] => utility [patent_app_number] => 17/453205 [patent_app_country] => US [patent_app_date] => 2021-11-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 7764 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 314 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17453205 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/453205
Electrical test structure, semiconductor structure and electrical test method Nov 1, 2021 Issued
Array ( [id] => 19046677 [patent_doc_number] => 11935797 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-03-19 [patent_title] => Test method, adjustment method, test system, and storage medium for alignment error [patent_app_type] => utility [patent_app_number] => 17/452570 [patent_app_country] => US [patent_app_date] => 2021-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 4788 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17452570 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/452570
Test method, adjustment method, test system, and storage medium for alignment error Oct 26, 2021 Issued
Array ( [id] => 17750898 [patent_doc_number] => 20220229103 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-21 [patent_title] => ELECTRICAL CHARACTERISTIC INSPECTION DEVICE FOR SEMICONDUCTOR DEVICE AND ELECTRICAL CHARACTERISTIC INSPECTION METHOD FOR SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 17/499607 [patent_app_country] => US [patent_app_date] => 2021-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3768 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17499607 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/499607
Electrical characteristic inspection device for semiconductor device and electrical characteristic inspection method for semiconductor device Oct 11, 2021 Issued
Array ( [id] => 17983921 [patent_doc_number] => 20220349957 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-03 [patent_title] => SYSTEM FOR PERCEIVING OPERATING STATE OF LARGE POWER TRANSFORMER BASED ON VIBRO-ACOUSTIC INTEGRATION [patent_app_type] => utility [patent_app_number] => 17/616310 [patent_app_country] => US [patent_app_date] => 2021-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3482 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17616310 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/616310
System for perceiving operating state of large power transformer based on vibro-acoustic integration Oct 7, 2021 Issued
Array ( [id] => 17371430 [patent_doc_number] => 20220026482 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-27 [patent_title] => TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 17/495399 [patent_app_country] => US [patent_app_date] => 2021-10-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11347 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 104 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17495399 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/495399
Test system Oct 5, 2021 Issued
Array ( [id] => 18621611 [patent_doc_number] => 11754641 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-09-12 [patent_title] => Transformer test system and method [patent_app_type] => utility [patent_app_number] => 17/494586 [patent_app_country] => US [patent_app_date] => 2021-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8851 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17494586 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/494586
Transformer test system and method Oct 4, 2021 Issued
Array ( [id] => 17416719 [patent_doc_number] => 20220051623 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-17 [patent_title] => CHARGE-BASED COMPENSATION AND PARAMETER EXTRACTION IN AMOLED DISPLAYS [patent_app_type] => utility [patent_app_number] => 17/487112 [patent_app_country] => US [patent_app_date] => 2021-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 17794 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17487112 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/487112
Charge-based compensation and parameter extraction in AMOLED displays Sep 27, 2021 Issued
Menu