Search

Natalia Harkaway

Examiner (ID: 8237)

Most Active Art Unit
1201
Art Unit(s)
1201
Total Applications
161
Issued Applications
154
Pending Applications
0
Abandoned Applications
7

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18527132 [patent_doc_number] => 11714122 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-01 [patent_title] => Semiconductor device and method of testing the same [patent_app_type] => utility [patent_app_number] => 17/338868 [patent_app_country] => US [patent_app_date] => 2021-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5101 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17338868 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/338868
Semiconductor device and method of testing the same Jun 3, 2021 Issued
Array ( [id] => 17387104 [patent_doc_number] => 20220034956 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-03 [patent_title] => WAFER INSPECTION SYSTEM AND WAFER INSPECTION EQUIPMENT THEREOF [patent_app_type] => utility [patent_app_number] => 17/337954 [patent_app_country] => US [patent_app_date] => 2021-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4258 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17337954 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/337954
Wafer inspection system and wafer inspection equipment thereof Jun 2, 2021 Issued
Array ( [id] => 18997168 [patent_doc_number] => 11914004 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-27 [patent_title] => Current transformer with embedded voltage field detection and thermal sensing [patent_app_type] => utility [patent_app_number] => 17/334605 [patent_app_country] => US [patent_app_date] => 2021-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 5592 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17334605 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/334605
Current transformer with embedded voltage field detection and thermal sensing May 27, 2021 Issued
Array ( [id] => 18037600 [patent_doc_number] => 20220381816 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-01 [patent_title] => TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) HETEROSTRUCTURE ON INSULATING AND SEMI-INSULATING SUBSTRATES [patent_app_type] => utility [patent_app_number] => 17/332952 [patent_app_country] => US [patent_app_date] => 2021-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5778 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17332952 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/332952
Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates May 26, 2021 Issued
Array ( [id] => 17337472 [patent_doc_number] => 20220003803 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-01-06 [patent_title] => METHOD FOR MONITORING POLARIZATION QUALITY OF PIEZOELECTRIC FILM [patent_app_type] => utility [patent_app_number] => 17/329172 [patent_app_country] => US [patent_app_date] => 2021-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6142 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17329172 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/329172
Method for monitoring polarization quality of piezoelectric film May 24, 2021 Issued
Array ( [id] => 17229962 [patent_doc_number] => 20210356519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-11-18 [patent_title] => STRUCTURE AND METHOD FOR TESTING OF PIC WITH AN UPTURNED MIRROR [patent_app_type] => utility [patent_app_number] => 17/242701 [patent_app_country] => US [patent_app_date] => 2021-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 38381 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 179 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17242701 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/242701
Structure and method for testing of PIC with an upturned mirror Apr 27, 2021 Issued
Array ( [id] => 17853175 [patent_doc_number] => 20220283217 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-08 [patent_title] => EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 17/226460 [patent_app_country] => US [patent_app_date] => 2021-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3169 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226460 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/226460
EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF Apr 8, 2021 Abandoned
Array ( [id] => 18275538 [patent_doc_number] => 11614478 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-03-28 [patent_title] => Fault detection circuits and methods for drivers [patent_app_type] => utility [patent_app_number] => 17/226924 [patent_app_country] => US [patent_app_date] => 2021-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4826 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17226924 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/226924
Fault detection circuits and methods for drivers Apr 8, 2021 Issued
Array ( [id] => 18437532 [patent_doc_number] => 20230184827 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-15 [patent_title] => SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 17/926376 [patent_app_country] => US [patent_app_date] => 2021-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8869 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 205 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17926376 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/926376
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION APPARATUS Apr 4, 2021 Pending
Array ( [id] => 17808797 [patent_doc_number] => 20220260632 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-18 [patent_title] => SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR DIE PACKAGES [patent_app_type] => utility [patent_app_number] => 17/212877 [patent_app_country] => US [patent_app_date] => 2021-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10220 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -35 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17212877 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/212877
Systems and methods for evaluating the reliability of semiconductor die packages Mar 24, 2021 Issued
Array ( [id] => 18029973 [patent_doc_number] => 11513151 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-11-29 [patent_title] => Test handler and semiconductor device equipment including same [patent_app_type] => utility [patent_app_number] => 17/211385 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 19 [patent_no_of_words] => 8034 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17211385 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/211385
Test handler and semiconductor device equipment including same Mar 23, 2021 Issued
Array ( [id] => 17900799 [patent_doc_number] => 20220310461 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => IN-WAFER TESTING DEVICE [patent_app_type] => utility [patent_app_number] => 17/210550 [patent_app_country] => US [patent_app_date] => 2021-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3545 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210550 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/210550
IN-WAFER TESTING DEVICE Mar 23, 2021 Abandoned
Array ( [id] => 18045947 [patent_doc_number] => 11519896 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-12-06 [patent_title] => Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus [patent_app_type] => utility [patent_app_number] => 17/210396 [patent_app_country] => US [patent_app_date] => 2021-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 14 [patent_no_of_words] => 12644 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17210396 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/210396
Soil moisture monitoring systems and methods for measuring mutual inductance of area of influence using radio frequency stimulus Mar 22, 2021 Issued
Array ( [id] => 17564477 [patent_doc_number] => 20220128626 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-28 [patent_title] => CHIP TRAY KIT AND CHIP TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 17/195557 [patent_app_country] => US [patent_app_date] => 2021-03-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10014 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 455 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17195557 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/195557
Chip tray kit and chip testing apparatus Mar 7, 2021 Issued
Array ( [id] => 18359961 [patent_doc_number] => 20230141552 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-05-11 [patent_title] => SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 17/912880 [patent_app_country] => US [patent_app_date] => 2021-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11998 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17912880 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/912880
SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR TESTING METHOD, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE Feb 24, 2021 Pending
Array ( [id] => 18342482 [patent_doc_number] => 11639959 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-02 [patent_title] => Defect localization in embedded memory [patent_app_type] => utility [patent_app_number] => 17/179133 [patent_app_country] => US [patent_app_date] => 2021-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 4329 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17179133 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/179133
Defect localization in embedded memory Feb 17, 2021 Issued
Array ( [id] => 17860940 [patent_doc_number] => 11442096 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-09-13 [patent_title] => Testing apparatus [patent_app_type] => utility [patent_app_number] => 17/168422 [patent_app_country] => US [patent_app_date] => 2021-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7822 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 290 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17168422 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/168422
Testing apparatus Feb 4, 2021 Issued
Array ( [id] => 17628455 [patent_doc_number] => 20220163470 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-05-26 [patent_title] => METHOD FOR CALCULATING LIQUID-SOLID INTERFACE MORPHOLOGY DURING GROWTH OF INGOT [patent_app_type] => utility [patent_app_number] => 17/167417 [patent_app_country] => US [patent_app_date] => 2021-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4909 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17167417 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/167417
Method for calculating liquid-solid interface morphology during growth of ingot Feb 3, 2021 Issued
Array ( [id] => 16993309 [patent_doc_number] => 20210231729 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-29 [patent_title] => HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY [patent_app_type] => utility [patent_app_number] => 17/158994 [patent_app_country] => US [patent_app_date] => 2021-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6750 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17158994 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/158994
HIGH VOLTAGE INTEGRATED CIRCUIT TESTING INTERFACE ASSEMBLY Jan 25, 2021 Pending
Array ( [id] => 17618695 [patent_doc_number] => 11337718 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-24 [patent_title] => System and method for controlling an ultrasonic tool [patent_app_type] => utility [patent_app_number] => 17/154324 [patent_app_country] => US [patent_app_date] => 2021-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 8869 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 182 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17154324 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/154324
System and method for controlling an ultrasonic tool Jan 20, 2021 Issued
Menu