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Natalia Harkaway

Examiner (ID: 8237)

Most Active Art Unit
1201
Art Unit(s)
1201
Total Applications
161
Issued Applications
154
Pending Applications
0
Abandoned Applications
7

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18222405 [patent_doc_number] => 20230061399 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-02 [patent_title] => SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSIS METHOD [patent_app_type] => utility [patent_app_number] => 17/799009 [patent_app_country] => US [patent_app_date] => 2021-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 24875 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17799009 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/799009
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSIS METHOD Jan 12, 2021 Pending
Array ( [id] => 18046009 [patent_doc_number] => 11519958 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-12-06 [patent_title] => Semiconductor module inspection device with robot [patent_app_type] => utility [patent_app_number] => 17/142438 [patent_app_country] => US [patent_app_date] => 2021-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 6529 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17142438 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/142438
Semiconductor module inspection device with robot Jan 5, 2021 Issued
Array ( [id] => 18255380 [patent_doc_number] => 20230082419 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-16 [patent_title] => SEMICONDUCTOR DEVICE AND TEST SYSTEM [patent_app_type] => utility [patent_app_number] => 17/904723 [patent_app_country] => US [patent_app_date] => 2021-01-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13183 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17904723 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/904723
SEMICONDUCTOR DEVICE AND TEST SYSTEM Jan 4, 2021 Pending
Array ( [id] => 16949506 [patent_doc_number] => 20210208197 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-08 [patent_title] => ON-CHIP CURRENT SENSOR [patent_app_type] => utility [patent_app_number] => 17/139246 [patent_app_country] => US [patent_app_date] => 2020-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6814 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17139246 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/139246
ON-CHIP CURRENT SENSOR Dec 30, 2020 Pending
Array ( [id] => 16933825 [patent_doc_number] => 20210199714 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-01 [patent_title] => Correlation between Emission Spots Utilizing CAD Data in Combination with Emission Microscope Images [patent_app_type] => utility [patent_app_number] => 17/135240 [patent_app_country] => US [patent_app_date] => 2020-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10083 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17135240 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/135240
Correlation between emission spots utilizing CAD data in combination with emission microscope images Dec 27, 2020 Issued
Array ( [id] => 17801330 [patent_doc_number] => 11415626 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Method and apparatus comprising a semiconductor device and test apparatus [patent_app_type] => utility [patent_app_number] => 17/118828 [patent_app_country] => US [patent_app_date] => 2020-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 7687 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17118828 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/118828
Method and apparatus comprising a semiconductor device and test apparatus Dec 10, 2020 Issued
Array ( [id] => 18330229 [patent_doc_number] => 11635461 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-25 [patent_title] => Test apparatus and method for testing a semiconductor device [patent_app_type] => utility [patent_app_number] => 17/115236 [patent_app_country] => US [patent_app_date] => 2020-12-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 7932 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 234 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17115236 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/115236
Test apparatus and method for testing a semiconductor device Dec 7, 2020 Issued
Array ( [id] => 18143490 [patent_doc_number] => 20230017339 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-19 [patent_title] => SYSTEMS AND METHODS FOR STARTING A SENSORLESS MOTOR [patent_app_type] => utility [patent_app_number] => 17/783486 [patent_app_country] => US [patent_app_date] => 2020-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5809 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17783486 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/783486
SYSTEMS AND METHODS FOR STARTING A SENSORLESS MOTOR Dec 6, 2020 Pending
Array ( [id] => 17588849 [patent_doc_number] => 11327111 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-05-10 [patent_title] => Environment control apparatus and chip testing system [patent_app_type] => utility [patent_app_number] => 17/106186 [patent_app_country] => US [patent_app_date] => 2020-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 12576 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 452 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17106186 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/106186
Environment control apparatus and chip testing system Nov 29, 2020 Issued
Array ( [id] => 18014416 [patent_doc_number] => 11506708 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-11-22 [patent_title] => On-wafer tuner system and method [patent_app_type] => utility [patent_app_number] => 17/102936 [patent_app_country] => US [patent_app_date] => 2020-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 14 [patent_no_of_words] => 4320 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17102936 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/102936
On-wafer tuner system and method Nov 23, 2020 Issued
Array ( [id] => 18240304 [patent_doc_number] => 20230072615 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-03-09 [patent_title] => SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANALYSIS METHOD [patent_app_type] => utility [patent_app_number] => 17/798980 [patent_app_country] => US [patent_app_date] => 2020-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9661 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 308 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17798980 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/798980
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANALYSIS METHOD Nov 16, 2020 Pending
Array ( [id] => 18110913 [patent_doc_number] => 20230003793 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-05 [patent_title] => APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TESTING DEVICE HAVING FINE PITCH, AND DEVICE ALIGNMENT METHOD [patent_app_type] => utility [patent_app_number] => 17/783942 [patent_app_country] => US [patent_app_date] => 2020-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4549 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17783942 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/783942
Apparatus for aligning device having fine pitch, apparatus for testing device having fine pitch, and device alignment method Nov 2, 2020 Issued
Array ( [id] => 17816568 [patent_doc_number] => 11422175 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-23 [patent_title] => Live measurement method for three-winding transformer loss based on windowed frequency shift [patent_app_type] => utility [patent_app_number] => 17/081726 [patent_app_country] => US [patent_app_date] => 2020-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 4538 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 551 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17081726 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/081726
Live measurement method for three-winding transformer loss based on windowed frequency shift Oct 26, 2020 Issued
Array ( [id] => 17400962 [patent_doc_number] => 20220043052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-02-10 [patent_title] => SEMICONDUCTOR COMPONENT BURN-IN TEST MODULE AND BURN-IN TEST EQUIPMENT [patent_app_type] => utility [patent_app_number] => 17/078126 [patent_app_country] => US [patent_app_date] => 2020-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4849 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17078126 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/078126
Semiconductor component burn-in test module and burn-in test equipment Oct 22, 2020 Issued
Array ( [id] => 16729059 [patent_doc_number] => 20210096206 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-01 [patent_title] => PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWEEN AN OPTICAL PROBE OF A PROBE SYSTEM AND A CALIBRATION STRUCTURE [patent_app_type] => utility [patent_app_number] => 17/028102 [patent_app_country] => US [patent_app_date] => 2020-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14463 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17028102 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/028102
Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure Sep 21, 2020 Issued
Array ( [id] => 17038257 [patent_doc_number] => 20210255216 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-08-19 [patent_title] => PROBE SHEET FOR NON-INVASIVE NANOSCALE ELECTRICAL CHARACTERIZATION [patent_app_type] => utility [patent_app_number] => 17/023085 [patent_app_country] => US [patent_app_date] => 2020-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4891 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17023085 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/023085
PROBE SHEET FOR NON-INVASIVE NANOSCALE ELECTRICAL CHARACTERIZATION Sep 15, 2020 Abandoned
Array ( [id] => 16538773 [patent_doc_number] => 20200405186 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-12-31 [patent_title] => CAPACITANCE MEASURING AND IMAGING SENSOR SYSTEM [patent_app_type] => utility [patent_app_number] => 17/021509 [patent_app_country] => US [patent_app_date] => 2020-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7625 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 178 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17021509 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/021509
Capacitance measuring and imaging sensor system Sep 14, 2020 Issued
Array ( [id] => 17898446 [patent_doc_number] => 20220308108 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => SEMICONDUCTOR SAMPLE INSPECTION DEVICE AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 17/641504 [patent_app_country] => US [patent_app_date] => 2020-08-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14973 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17641504 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/641504
Semiconductor sample inspection device and inspection method Aug 26, 2020 Issued
Array ( [id] => 16438404 [patent_doc_number] => 20200355730 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-12 [patent_title] => THRU-LINE DIRECTIONAL POWER SENSOR HAVING MICROSTRIP COUPLER [patent_app_type] => utility [patent_app_number] => 16/941520 [patent_app_country] => US [patent_app_date] => 2020-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16969 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16941520 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/941520
Thru-line directional power sensor having microstrip coupler Jul 27, 2020 Issued
Array ( [id] => 16599403 [patent_doc_number] => 20210025934 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-01-28 [patent_title] => Combined Transmitted and Reflected Light Imaging of Internal Cracks in Semiconductor Devices [patent_app_type] => utility [patent_app_number] => 16/926757 [patent_app_country] => US [patent_app_date] => 2020-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7129 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16926757 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/926757
Combined transmitted and reflected light imaging of internal cracks in semiconductor devices Jul 11, 2020 Issued
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