
Nathan H. Empie
Examiner (ID: 15622)
| Most Active Art Unit | 1712 |
| Art Unit(s) | 1792, 1712 |
| Total Applications | 922 |
| Issued Applications | 375 |
| Pending Applications | 107 |
| Abandoned Applications | 453 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 9273395
[patent_doc_number] => 08637325
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2014-01-28
[patent_title] => 'Method and apparatus for pyrolysis-induced cleavage in peptides and proteins'
[patent_app_type] => utility
[patent_app_number] => 12/371893
[patent_app_country] => US
[patent_app_date] => 2009-02-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 51
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12371893
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/371893 | Method and apparatus for pyrolysis-induced cleavage in peptides and proteins | Feb 15, 2009 | Issued |
Array
(
[id] => 8871053
[patent_doc_number] => 08466431
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-06-18
[patent_title] => 'Techniques for improving extracted ion beam quality using high-transparency electrodes'
[patent_app_type] => utility
[patent_app_number] => 12/370555
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[patent_app_date] => 2009-02-12
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/370555 | Techniques for improving extracted ion beam quality using high-transparency electrodes | Feb 11, 2009 | Issued |
Array
(
[id] => 8982510
[patent_doc_number] => 08513627
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[patent_issue_date] => 2013-08-20
[patent_title] => 'Charged particle beam apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/378186
[patent_app_country] => US
[patent_app_date] => 2009-02-11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/378186 | Charged particle beam apparatus | Feb 10, 2009 | Issued |
Array
(
[id] => 8687622
[patent_doc_number] => RE044035
[patent_country] => US
[patent_kind] => E1
[patent_issue_date] => 2013-03-05
[patent_title] => 'Apparatus for correlating an optical image and a SEM image and method of use thereof'
[patent_app_type] => reissue
[patent_app_number] => 12/360920
[patent_app_country] => US
[patent_app_date] => 2009-01-28
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12360920
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/360920 | Apparatus for correlating an optical image and a SEM image and method of use thereof | Jan 27, 2009 | Issued |
Array
(
[id] => 8560460
[patent_doc_number] => 08334524
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-12-18
[patent_title] => 'Radiation detectable and protective articles'
[patent_app_type] => utility
[patent_app_number] => 12/351786
[patent_app_country] => US
[patent_app_date] => 2009-01-09
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/351786 | Radiation detectable and protective articles | Jan 8, 2009 | Issued |
| 12/330902 | MASS SPECTROMETER SYSTEM INCLUDING A DOUBLE ION GUIDE INTERFACE AND METHOD OF OPERATION | Dec 8, 2008 | Abandoned |
Array
(
[id] => 8581178
[patent_doc_number] => 08347410
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-01-01
[patent_title] => 'Method for examining a sample'
[patent_app_type] => utility
[patent_app_number] => 12/734492
[patent_app_country] => US
[patent_app_date] => 2008-11-07
[patent_effective_date] => 0000-00-00
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12734492
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/734492 | Method for examining a sample | Nov 6, 2008 | Issued |
| 12/289916 | CHARGED PARTICLE BEAM APPARATUS | Nov 5, 2008 | Abandoned |
Array
(
[id] => 5469599
[patent_doc_number] => 20090242765
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[patent_issue_date] => 2009-10-01
[patent_title] => 'SCANNING ELECTRON MICROSCOPE'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0242/20090242765.pdf
[firstpage_image] =>[orig_patent_app_number] => 12264605
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/264605 | Scanning electron microscope | Nov 3, 2008 | Issued |
Array
(
[id] => 6083240
[patent_doc_number] => 20110215239
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-09-08
[patent_title] => 'Mass Spectrometer'
[patent_app_type] => utility
[patent_app_number] => 13/126455
[patent_app_country] => US
[patent_app_date] => 2008-10-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0215/20110215239.pdf
[firstpage_image] =>[orig_patent_app_number] => 13126455
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/126455 | Mass spectrometer | Oct 29, 2008 | Issued |
Array
(
[id] => 5407228
[patent_doc_number] => 20090121126
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-05-14
[patent_title] => 'HIGH RESOLUTION EXCITATION/ISOLATION OF IONS IN A LOW PRESSURE LINEAR ION TRAP'
[patent_app_type] => utility
[patent_app_number] => 12/240060
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/240060 | High resolution excitation/isolation of ions in a low pressure linear ion trap | Sep 28, 2008 | Issued |
Array
(
[id] => 8533787
[patent_doc_number] => 08309944
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[patent_issue_date] => 2012-11-13
[patent_title] => 'Grazing incidence neutron optics'
[patent_app_type] => utility
[patent_app_number] => 12/240626
[patent_app_country] => US
[patent_app_date] => 2008-09-29
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/240626 | Grazing incidence neutron optics | Sep 28, 2008 | Issued |
Array
(
[id] => 6493201
[patent_doc_number] => 20100200769
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-12
[patent_title] => 'DRINKING WATER SERVER'
[patent_app_type] => utility
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[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/733846 | Drinking water server | Sep 25, 2008 | Issued |
Array
(
[id] => 8760506
[patent_doc_number] => 08421028
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[patent_title] => 'Device for deflecting or guiding in a particle beam'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/733931 | Device for deflecting or guiding in a particle beam | Sep 25, 2008 | Issued |
Array
(
[id] => 4484100
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[patent_title] => 'FIB milling of copper over organic dielectrics'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/239698 | FIB milling of copper over organic dielectrics | Sep 25, 2008 | Issued |
Array
(
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[patent_title] => 'Electrospray ion source with reduced analyte electrochemistry'
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[firstpage_image] =>[orig_patent_app_number] => 12237892
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/237892 | Electrospray ion source with reduced analyte electrochemistry | Sep 24, 2008 | Issued |
Array
(
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[patent_title] => 'Apparatus for an Irradiation Unit'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/682413 | Apparatus for an Irradiation Unit | Sep 22, 2008 | Abandoned |
Array
(
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[patent_issue_date] => 2011-08-09
[patent_title] => 'Method and apparatus for precipitation of nano-structured carbon solids'
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[firstpage_image] =>[orig_patent_app_number] => 12236240
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/236240 | Method and apparatus for precipitation of nano-structured carbon solids | Sep 22, 2008 | Issued |
Array
(
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[patent_issue_date] => 2010-03-25
[patent_title] => 'PLATINUM SILICIDE TIP APICES FOR PROBE-BASED TECHNOLOGIES'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/234816 | Platinum silicide tip apices for probe-based technologies | Sep 21, 2008 | Issued |
Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/733496 | Chopper for a particle beam | Sep 11, 2008 | Issued |