Search

Neel D. Shah

Examiner (ID: 15354, Phone: (571)270-3766 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2858, 2868
Total Applications
848
Issued Applications
698
Pending Applications
79
Abandoned Applications
87

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19705641 [patent_doc_number] => 12199691 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-01-14 [patent_title] => Waveguide component for high frequency testing [patent_app_type] => utility [patent_app_number] => 18/444425 [patent_app_country] => US [patent_app_date] => 2024-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8454 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18444425 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/444425
Waveguide component for high frequency testing Feb 15, 2024 Issued
Array ( [id] => 19282809 [patent_doc_number] => 20240219285 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-04 [patent_title] => Sensor for Particle Identification, Measurement Instrument, Computer Device, and System [patent_app_type] => utility [patent_app_number] => 18/439125 [patent_app_country] => US [patent_app_date] => 2024-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16030 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -1 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18439125 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/439125
Sensor for Particle Identification, Measurement Instrument, Computer Device, and System Feb 11, 2024 Abandoned
Array ( [id] => 19632486 [patent_doc_number] => 20240410935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => CHIP TEST PRESSING-DOWN APPARATUS AND FORMATION METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/432968 [patent_app_country] => US [patent_app_date] => 2024-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4918 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18432968 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/432968
Chip test pressing-down apparatus and formation method thereof Feb 4, 2024 Issued
Array ( [id] => 19739311 [patent_doc_number] => 12216139 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-02-04 [patent_title] => Adaptive flexible chip test socket and formation method thereof [patent_app_type] => utility [patent_app_number] => 18/432932 [patent_app_country] => US [patent_app_date] => 2024-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 5843 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 343 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18432932 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/432932
Adaptive flexible chip test socket and formation method thereof Feb 4, 2024 Issued
Array ( [id] => 19189038 [patent_doc_number] => 20240167951 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-23 [patent_title] => OPEN RESONATOR [patent_app_type] => utility [patent_app_number] => 18/426362 [patent_app_country] => US [patent_app_date] => 2024-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6454 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18426362 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/426362
Open resonator Jan 29, 2024 Issued
Array ( [id] => 20123033 [patent_doc_number] => 20250238064 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-24 [patent_title] => UNIVERSAL HIGH POWER/FAULT MANAGED POWER FRONT END [patent_app_type] => utility [patent_app_number] => 18/418721 [patent_app_country] => US [patent_app_date] => 2024-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3687 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18418721 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/418721
UNIVERSAL HIGH POWER/FAULT MANAGED POWER FRONT END Jan 21, 2024 Pending
Array ( [id] => 19319612 [patent_doc_number] => 20240241155 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-18 [patent_title] => PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS AND SYSTEMS THAT INCLUDE THE PROBE CARDS, TESTED DEVICES AND METHODS OF PRODUCING TESTED DEVICES BY UTILIZING THE PROBE CARDS [patent_app_type] => utility [patent_app_number] => 18/409008 [patent_app_country] => US [patent_app_date] => 2024-01-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9667 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18409008 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/409008
PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS AND SYSTEMS THAT INCLUDE THE PROBE CARDS, TESTED DEVICES AND METHODS OF PRODUCING TESTED DEVICES BY UTILIZING THE PROBE CARDS Jan 9, 2024 Pending
Array ( [id] => 19302173 [patent_doc_number] => 20240230750 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => Detection Method For Wiring Relationship Of Electrical Components [patent_app_type] => utility [patent_app_number] => 18/408034 [patent_app_country] => US [patent_app_date] => 2024-01-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3110 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -4 [patent_words_short_claim] => 761 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18408034 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/408034
Detection method for wiring relationship of electrical components Jan 8, 2024 Issued
Array ( [id] => 20034365 [patent_doc_number] => 20250172587 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-29 [patent_title] => PROBE CARD [patent_app_type] => utility [patent_app_number] => 18/406231 [patent_app_country] => US [patent_app_date] => 2024-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 214 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18406231 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/406231
Probe card Jan 7, 2024 Issued
Array ( [id] => 20086483 [patent_doc_number] => 20250216419 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-03 [patent_title] => PROBE HEAD FOR LOOPBACK TESTING AND METHODS OF FORMING THE SAME [patent_app_type] => utility [patent_app_number] => 18/402774 [patent_app_country] => US [patent_app_date] => 2024-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1131 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402774 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/402774
PROBE HEAD FOR LOOPBACK TESTING AND METHODS OF FORMING THE SAME Jan 2, 2024 Pending
Array ( [id] => 20086511 [patent_doc_number] => 20250216447 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-03 [patent_title] => PROCEDURE FOR MAKING ON-DIE-PARAMETRIC MEASUREMENTS OF CIRCUIT DEVICES [patent_app_type] => utility [patent_app_number] => 18/398399 [patent_app_country] => US [patent_app_date] => 2023-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2783 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18398399 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/398399
Procedure for making on-die-parametric measurements of circuit devices Dec 27, 2023 Issued
Array ( [id] => 19128570 [patent_doc_number] => 20240133923 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-25 [patent_title] => CURRENT SENSOR [patent_app_type] => utility [patent_app_number] => 18/395663 [patent_app_country] => US [patent_app_date] => 2023-12-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6271 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 298 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18395663 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/395663
Current sensor Dec 24, 2023 Issued
Array ( [id] => 19128570 [patent_doc_number] => 20240133923 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-25 [patent_title] => CURRENT SENSOR [patent_app_type] => utility [patent_app_number] => 18/395663 [patent_app_country] => US [patent_app_date] => 2023-12-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6271 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 298 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18395663 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/395663
Current sensor Dec 24, 2023 Issued
Array ( [id] => 20069979 [patent_doc_number] => 20250208201 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-06-26 [patent_title] => COPLANARITY ASSIST UNIT, SEMICONDUCTOR TESTING APPARATUS INCLUDING THE COPLANARITY ASSIST UNIT AND METHOD OF SETTING COPLANARITY [patent_app_type] => utility [patent_app_number] => 18/393846 [patent_app_country] => US [patent_app_date] => 2023-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6807 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18393846 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/393846
COPLANARITY ASSIST UNIT, SEMICONDUCTOR TESTING APPARATUS INCLUDING THE COPLANARITY ASSIST UNIT AND METHOD OF SETTING COPLANARITY Dec 21, 2023 Pending
Array ( [id] => 20635243 [patent_doc_number] => 12596115 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-04-07 [patent_title] => Systems and methods for capacitor activation of concrete sensors [patent_app_type] => utility [patent_app_number] => 18/389956 [patent_app_country] => US [patent_app_date] => 2023-12-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 0 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 256 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18389956 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/389956
Systems and methods for capacitor activation of concrete sensors Dec 19, 2023 Issued
Array ( [id] => 20344227 [patent_doc_number] => 12467954 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-11-11 [patent_title] => Probe card device [patent_app_type] => utility [patent_app_number] => 18/537972 [patent_app_country] => US [patent_app_date] => 2023-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 0 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 387 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18537972 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/537972
Probe card device Dec 12, 2023 Issued
Array ( [id] => 20757681 [patent_doc_number] => 12650445 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-06-09 [patent_title] => Probe head for wafer-level burn-in test (WLBI) and probe card comprising said probe head [patent_app_type] => utility [patent_app_number] => 18/530420 [patent_app_country] => US [patent_app_date] => 2023-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 0 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 201 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18530420 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/530420
Probe head for wafer-level burn-in test (WLBI) and probe card comprising said probe head Dec 5, 2023 Issued
Array ( [id] => 19557804 [patent_doc_number] => 20240369596 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-07 [patent_title] => SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD [patent_app_type] => utility [patent_app_number] => 18/519191 [patent_app_country] => US [patent_app_date] => 2023-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6667 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18519191 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/519191
Supporting device and protective case for probe card Nov 26, 2023 Issued
Array ( [id] => 20672764 [patent_doc_number] => 12613270 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-04-28 [patent_title] => Wafer acceptance test tool and test method using thereof [patent_app_type] => utility [patent_app_number] => 18/516518 [patent_app_country] => US [patent_app_date] => 2023-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 33 [patent_no_of_words] => 8104 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18516518 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/516518
Wafer acceptance test tool and test method using thereof Nov 20, 2023 Issued
Array ( [id] => 20549842 [patent_doc_number] => 12560628 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-02-24 [patent_title] => Probe card [patent_app_type] => utility [patent_app_number] => 18/511034 [patent_app_country] => US [patent_app_date] => 2023-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 141 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18511034 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/511034
Probe card Nov 15, 2023 Issued
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