Search

Neel D. Shah

Examiner (ID: 15354, Phone: (571)270-3766 , Office: P/2868 )

Most Active Art Unit
2868
Art Unit(s)
2858, 2868
Total Applications
848
Issued Applications
698
Pending Applications
79
Abandoned Applications
87

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19506058 [patent_doc_number] => 12117474 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-10-15 [patent_title] => Measuring radio frequency electromagnetic waves using Rydberg electrometry [patent_app_type] => utility [patent_app_number] => 18/503062 [patent_app_country] => US [patent_app_date] => 2023-11-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 39 [patent_no_of_words] => 28223 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18503062 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/503062
Measuring radio frequency electromagnetic waves using Rydberg electrometry Nov 5, 2023 Issued
Array ( [id] => 19173843 [patent_doc_number] => 20240159817 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-16 [patent_title] => MEASUREMENT PATTERN, MEASUREMENT PATTERN SET, CALCULATION METHOD, NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM AND CALCULATION DEVICE [patent_app_type] => utility [patent_app_number] => 18/499531 [patent_app_country] => US [patent_app_date] => 2023-11-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13466 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 289 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18499531 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/499531
Measurement pattern, measurement pattern set, calculation method, non-transitory computer-readable recording medium and calculation device Oct 31, 2023 Issued
Array ( [id] => 19999850 [patent_doc_number] => 20250138072 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-01 [patent_title] => SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM [patent_app_type] => utility [patent_app_number] => 18/498470 [patent_app_country] => US [patent_app_date] => 2023-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4434 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18498470 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/498470
Signal processing circuit and measurement system Oct 30, 2023 Issued
Array ( [id] => 19450282 [patent_doc_number] => 20240310412 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-19 [patent_title] => UNIVERSAL PROBE CARD AND TESTING METHOD [patent_app_type] => utility [patent_app_number] => 18/385417 [patent_app_country] => US [patent_app_date] => 2023-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12256 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -24 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18385417 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/385417
UNIVERSAL PROBE CARD AND TESTING METHOD Oct 30, 2023 Abandoned
Array ( [id] => 19174353 [patent_doc_number] => 20240160327 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-16 [patent_title] => RX ELECTRODE FOR CAPACITIVE TOUCH SENSOR, CAPACITIVE TOUCH SENSOR, AND NOISE REDUCTION METHOD [patent_app_type] => utility [patent_app_number] => 18/380735 [patent_app_country] => US [patent_app_date] => 2023-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 24099 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 264 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18380735 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/380735
RX electrode for capacitive touch sensor, capacitive touch sensor, and noise reduction method Oct 16, 2023 Issued
Array ( [id] => 19099107 [patent_doc_number] => 20240118335 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-11 [patent_title] => TEST DEVICE CAPABLE OF TESTING MICRO LED AND MANUFACTURING METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/485252 [patent_app_country] => US [patent_app_date] => 2023-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12278 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18485252 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/485252
Test device capable of testing micro LED and manufacturing method thereof Oct 10, 2023 Issued
Array ( [id] => 18924515 [patent_doc_number] => 20240027519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-25 [patent_title] => ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PARTS FOR ELECTRONIC COMPONENT TESTING APPARATUS [patent_app_type] => utility [patent_app_number] => 18/481760 [patent_app_country] => US [patent_app_date] => 2023-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9317 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18481760 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/481760
Electronic component testing apparatus, sockets, and replacement parts for electronic component testing apparatus Oct 4, 2023 Issued
Array ( [id] => 20493643 [patent_doc_number] => 12535510 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-01-27 [patent_title] => Current detection device, current sensor, and electric power conversion device [patent_app_type] => utility [patent_app_number] => 18/480131 [patent_app_country] => US [patent_app_date] => 2023-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 8119 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18480131 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/480131
Current detection device, current sensor, and electric power conversion device Oct 2, 2023 Issued
Array ( [id] => 19718427 [patent_doc_number] => 12203958 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-01-21 [patent_title] => Shielded socket and carrier for high-volume test of semiconductor devices [patent_app_type] => utility [patent_app_number] => 18/479030 [patent_app_country] => US [patent_app_date] => 2023-09-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 6699 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18479030 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/479030
Shielded socket and carrier for high-volume test of semiconductor devices Sep 29, 2023 Issued
Array ( [id] => 19863782 [patent_doc_number] => 20250102568 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-27 [patent_title] => SEMICONDUCTOR DEVICE TESTER [patent_app_type] => utility [patent_app_number] => 18/372290 [patent_app_country] => US [patent_app_date] => 2023-09-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6641 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18372290 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/372290
Semiconductor device tester Sep 24, 2023 Issued
Array ( [id] => 19978286 [patent_doc_number] => 12345760 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-01 [patent_title] => Apparatus for probing device-under-test [patent_app_type] => utility [patent_app_number] => 18/472212 [patent_app_country] => US [patent_app_date] => 2023-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 1150 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18472212 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/472212
Apparatus for probing device-under-test Sep 20, 2023 Issued
Array ( [id] => 19779560 [patent_doc_number] => 12228590 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-02-18 [patent_title] => Wafer probe device [patent_app_type] => utility [patent_app_number] => 18/470193 [patent_app_country] => US [patent_app_date] => 2023-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 16 [patent_no_of_words] => 3750 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18470193 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/470193
Wafer probe device Sep 18, 2023 Issued
Array ( [id] => 19307128 [patent_doc_number] => 20240235708 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-11 [patent_title] => ENCLOSURE FOR TESTING ELECTRONIC DEVICES [patent_app_type] => utility [patent_app_number] => 18/370334 [patent_app_country] => US [patent_app_date] => 2023-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5712 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18370334 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/370334
Enclosure for testing electronic devices Sep 18, 2023 Issued
Array ( [id] => 19052273 [patent_doc_number] => 20240094242 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => PNEUMATIC SEMICONDUCTOR SOCKET LID ASSEMBLY [patent_app_type] => utility [patent_app_number] => 18/464533 [patent_app_country] => US [patent_app_date] => 2023-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3740 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 183 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18464533 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/464533
Pneumatic semiconductor socket lid assembly Sep 10, 2023 Issued
Array ( [id] => 19021348 [patent_doc_number] => 20240077519 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-07 [patent_title] => PROBE CARD, METHOD FOR DESIGNING PROBE CARD, METHOD FOR PRODUCING TESTED SEMICONDUCTOR DEVICE METHOD FOR TESTING UNPACKAGED SEMICONDUCTOR BY PROBE CARD, DEVICE UNDER TEST AND PROBE SYSTEM [patent_app_type] => utility [patent_app_number] => 18/242586 [patent_app_country] => US [patent_app_date] => 2023-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11706 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18242586 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/242586
Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe system Sep 5, 2023 Issued
Array ( [id] => 18888961 [patent_doc_number] => 11867728 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-01-09 [patent_title] => Current sensor [patent_app_type] => utility [patent_app_number] => 18/449702 [patent_app_country] => US [patent_app_date] => 2023-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6233 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 325 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18449702 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/449702
Current sensor Aug 13, 2023 Issued
Array ( [id] => 18924519 [patent_doc_number] => 20240027523 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-25 [patent_title] => AUTOMATIC TEST EQUIPMENT [patent_app_type] => utility [patent_app_number] => 18/354789 [patent_app_country] => US [patent_app_date] => 2023-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5921 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18354789 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/354789
Automatic test equipment Jul 18, 2023 Issued
Array ( [id] => 20273059 [patent_doc_number] => 12442835 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-14 [patent_title] => Probe card system, method of manufacturing probe card system, method of using probe card system [patent_app_type] => utility [patent_app_number] => 18/355255 [patent_app_country] => US [patent_app_date] => 2023-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 53 [patent_no_of_words] => 9072 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18355255 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/355255
Probe card system, method of manufacturing probe card system, method of using probe card system Jul 18, 2023 Issued
Array ( [id] => 18924517 [patent_doc_number] => 20240027521 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-01-25 [patent_title] => AUTOMATIC TEST EQUIPMENT [patent_app_type] => utility [patent_app_number] => 18/354255 [patent_app_country] => US [patent_app_date] => 2023-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5946 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18354255 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/354255
Automatic test equipment Jul 17, 2023 Issued
Array ( [id] => 20594680 [patent_doc_number] => 12578388 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-03-17 [patent_title] => Circuit board for battery monitoring circuit and wire harness for connection therewith [patent_app_type] => utility [patent_app_number] => 18/699666 [patent_app_country] => US [patent_app_date] => 2023-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 0 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18699666 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/699666
Circuit board for battery monitoring circuit and wire harness for connection therewith Jul 13, 2023 Issued
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