Search

Neil Abrams

Examiner (ID: 3613, Phone: (571)272-2089 , Office: P/2831 )

Most Active Art Unit
3202
Art Unit(s)
3202, 2834, 2831, 1611, 2832, 2833, 2839, 3205
Total Applications
3838
Issued Applications
3183
Pending Applications
147
Abandoned Applications
527

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18570409 [patent_doc_number] => 20230260746 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-17 [patent_title] => MODULATION OF ROLLING K VECTORS OF ANGLED GRATINGS [patent_app_type] => utility [patent_app_number] => 18/139184 [patent_app_country] => US [patent_app_date] => 2023-04-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5075 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18139184 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/139184
Modulation of rolling k vectors of angled gratings Apr 24, 2023 Issued
Array ( [id] => 18712738 [patent_doc_number] => 20230335371 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-19 [patent_title] => Method for Beam Interference Compensation Based on Computer Vision [patent_app_type] => utility [patent_app_number] => 18/134528 [patent_app_country] => US [patent_app_date] => 2023-04-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7163 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18134528 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/134528
Method for Beam Interference Compensation Based on Computer Vision Apr 12, 2023 Pending
Array ( [id] => 18729273 [patent_doc_number] => 20230343569 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-26 [patent_title] => INTERACTIVE ANALYSIS OF MASS SPECTROMETRY DATA INCLUDING PEAK SELECTION AND DYNAMIC LABELING [patent_app_type] => utility [patent_app_number] => 18/298327 [patent_app_country] => US [patent_app_date] => 2023-04-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 16456 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18298327 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/298327
Interactive analysis of mass spectrometry data including peak selection and dynamic labeling Apr 9, 2023 Issued
Array ( [id] => 18712756 [patent_doc_number] => 20230335389 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-19 [patent_title] => LASER-SUSTAINED PLASMA SOURCE BASED ON COLLIDING LIQUID JETS [patent_app_type] => utility [patent_app_number] => 18/132162 [patent_app_country] => US [patent_app_date] => 2023-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6230 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18132162 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/132162
Laser-sustained plasma source based on colliding liquid jets Apr 6, 2023 Issued
Array ( [id] => 20389223 [patent_doc_number] => 12488957 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-02 [patent_title] => Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications [patent_app_type] => utility [patent_app_number] => 18/193545 [patent_app_country] => US [patent_app_date] => 2023-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 22 [patent_no_of_words] => 1167 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18193545 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/193545
Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications Mar 29, 2023 Issued
Array ( [id] => 18679753 [patent_doc_number] => 20230317410 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-05 [patent_title] => Method and system for analyzing three-dimensional features [patent_app_type] => utility [patent_app_number] => 18/128223 [patent_app_country] => US [patent_app_date] => 2023-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5331 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18128223 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/128223
Method and system for analyzing three-dimensional features Mar 29, 2023 Pending
Array ( [id] => 19137948 [patent_doc_number] => 11972922 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-30 [patent_title] => Method for calibrating a scanning charged particle microscope [patent_app_type] => utility [patent_app_number] => 18/126322 [patent_app_country] => US [patent_app_date] => 2023-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 27 [patent_no_of_words] => 16810 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18126322 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/126322
Method for calibrating a scanning charged particle microscope Mar 23, 2023 Issued
Array ( [id] => 19626985 [patent_doc_number] => 12165834 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-12-10 [patent_title] => Method and apparatus for Schottky TFE inspection [patent_app_type] => utility [patent_app_number] => 18/187966 [patent_app_country] => US [patent_app_date] => 2023-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 4987 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18187966 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/187966
Method and apparatus for Schottky TFE inspection Mar 21, 2023 Issued
Array ( [id] => 18514538 [patent_doc_number] => 20230230795 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-20 [patent_title] => CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/123216 [patent_app_country] => US [patent_app_date] => 2023-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 18043 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 16 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18123216 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/123216
Charged particle assessment tool, inspection method Mar 16, 2023 Issued
Array ( [id] => 18540742 [patent_doc_number] => 20230245852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-03 [patent_title] => MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE [patent_app_type] => utility [patent_app_number] => 18/185324 [patent_app_country] => US [patent_app_date] => 2023-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 43752 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18185324 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/185324
Multiple particle beam microscope and associated method with fast autofocus around an adjustable working distance Mar 15, 2023 Issued
Array ( [id] => 19972350 [patent_doc_number] => 12340969 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-06-24 [patent_title] => Electron gun and electron microscope [patent_app_type] => utility [patent_app_number] => 18/122388 [patent_app_country] => US [patent_app_date] => 2023-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 6038 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18122388 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/122388
Electron gun and electron microscope Mar 15, 2023 Issued
Array ( [id] => 20204044 [patent_doc_number] => 12406827 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-09-02 [patent_title] => Microscopic specimen and analysis method thereof using microscope [patent_app_type] => utility [patent_app_number] => 18/184761 [patent_app_country] => US [patent_app_date] => 2023-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 0 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18184761 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/184761
Microscopic specimen and analysis method thereof using microscope Mar 15, 2023 Issued
Array ( [id] => 18653012 [patent_doc_number] => 20230298852 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-21 [patent_title] => DELAY TIME MEASUREMENT METHOD AND SYSTEM [patent_app_type] => utility [patent_app_number] => 18/120278 [patent_app_country] => US [patent_app_date] => 2023-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8343 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18120278 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/120278
Delay time measurement method and system Mar 9, 2023 Issued
Array ( [id] => 18631724 [patent_doc_number] => 20230290629 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-14 [patent_title] => High resolution multi-reflection time-of-flight mass analyser [patent_app_type] => utility [patent_app_number] => 18/118461 [patent_app_country] => US [patent_app_date] => 2023-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13168 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 359 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18118461 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/118461
High resolution multi-reflection time-of-flight mass analyser Mar 6, 2023 Issued
Array ( [id] => 18472968 [patent_doc_number] => 20230207256 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => READOUT CIRCUIT FOR PIXELIZED ELECTRON DETECTOR [patent_app_type] => utility [patent_app_number] => 18/115712 [patent_app_country] => US [patent_app_date] => 2023-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15600 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18115712 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/115712
READOUT CIRCUIT FOR PIXELIZED ELECTRON DETECTOR Feb 27, 2023 Pending
Array ( [id] => 18857171 [patent_doc_number] => 11854762 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-12-26 [patent_title] => MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same [patent_app_type] => utility [patent_app_number] => 18/170526 [patent_app_country] => US [patent_app_date] => 2023-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 34 [patent_no_of_words] => 4789 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18170526 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/170526
MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same Feb 15, 2023 Issued
Array ( [id] => 20305325 [patent_doc_number] => 12451322 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-10-21 [patent_title] => Method of forming a multipole device, method of influencing an electron beam, and multipole device [patent_app_type] => utility [patent_app_number] => 18/110284 [patent_app_country] => US [patent_app_date] => 2023-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 4788 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18110284 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/110284
Method of forming a multipole device, method of influencing an electron beam, and multipole device Feb 14, 2023 Issued
Array ( [id] => 18555164 [patent_doc_number] => 20230253181 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-10 [patent_title] => Aberration Corrector and Electron Microscope [patent_app_type] => utility [patent_app_number] => 18/107042 [patent_app_country] => US [patent_app_date] => 2023-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6865 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18107042 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/107042
Aberration corrector and electron microscope Feb 7, 2023 Issued
Array ( [id] => 18408827 [patent_doc_number] => 20230170180 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => METHODS AND APPARATUSES FOR ADJUSTING BEAM CONDITION OF CHARGED PARTICLES [patent_app_type] => utility [patent_app_number] => 18/102766 [patent_app_country] => US [patent_app_date] => 2023-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9080 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18102766 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/102766
Methods and apparatuses for adjusting beam condition of charged particles Jan 29, 2023 Issued
Array ( [id] => 18408828 [patent_doc_number] => 20230170181 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-01 [patent_title] => MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION, METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION AND ASSOCIATED COMPUTER PROGRAM PRODUCT [patent_app_type] => utility [patent_app_number] => 18/159852 [patent_app_country] => US [patent_app_date] => 2023-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14046 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 461 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18159852 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/159852
MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION, METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION AND ASSOCIATED COMPUTER PROGRAM PRODUCT Jan 25, 2023 Pending
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