
Nicole Marie Ippolito
Examiner (ID: 6952, Phone: (571)270-7449 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 4136, 2881 |
| Total Applications | 2428 |
| Issued Applications | 2117 |
| Pending Applications | 117 |
| Abandoned Applications | 234 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6310572
[patent_doc_number] => 20100193701
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-05
[patent_title] => 'MULTIPLE NOZZLE GAS CLUSTER ION BEAM SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 12/428945
[patent_app_country] => US
[patent_app_date] => 2009-04-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 12077
[patent_no_of_claims] => 58
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0193/20100193701.pdf
[firstpage_image] =>[orig_patent_app_number] => 12428945
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/428945 | Multiple nozzle gas cluster ion beam system | Apr 22, 2009 | Issued |
Array
(
[id] => 8283233
[patent_doc_number] => 08217340
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-10
[patent_title] => 'Mass spectrometry substrate and mass spectrometry method'
[patent_app_type] => utility
[patent_app_number] => 12/427583
[patent_app_country] => US
[patent_app_date] => 2009-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6404
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 42
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12427583
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/427583 | Mass spectrometry substrate and mass spectrometry method | Apr 20, 2009 | Issued |
Array
(
[id] => 5469640
[patent_doc_number] => 20090242806
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-01
[patent_title] => 'Electroactive polymers for lithography'
[patent_app_type] => utility
[patent_app_number] => 12/384478
[patent_app_country] => US
[patent_app_date] => 2009-04-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 10156
[patent_no_of_claims] => 52
[patent_no_of_ind_claims] => 20
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0242/20090242806.pdf
[firstpage_image] =>[orig_patent_app_number] => 12384478
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/384478 | Electroactive polymers for lithography | Apr 2, 2009 | Issued |
Array
(
[id] => 5567263
[patent_doc_number] => 20090250641
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-08
[patent_title] => 'Extreme ultra violet light source apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/385245
[patent_app_country] => US
[patent_app_date] => 2009-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4885
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0250/20090250641.pdf
[firstpage_image] =>[orig_patent_app_number] => 12385245
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/385245 | Extreme ultra violet light source apparatus | Apr 1, 2009 | Issued |
Array
(
[id] => 5567259
[patent_doc_number] => 20090250637
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-10-08
[patent_title] => 'System and methods for filtering out-of-band radiation in EUV exposure tools'
[patent_app_type] => utility
[patent_app_number] => 12/384171
[patent_app_country] => US
[patent_app_date] => 2009-03-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 9047
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0250/20090250637.pdf
[firstpage_image] =>[orig_patent_app_number] => 12384171
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/384171 | System and methods for filtering out-of-band radiation in EUV exposure tools | Mar 30, 2009 | Abandoned |
Array
(
[id] => 7997885
[patent_doc_number] => 08080790
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-12-20
[patent_title] => 'Scanning electron microscope'
[patent_app_type] => utility
[patent_app_number] => 12/392563
[patent_app_country] => US
[patent_app_date] => 2009-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 18
[patent_no_of_words] => 8915
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 83
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/080/08080790.pdf
[firstpage_image] =>[orig_patent_app_number] => 12392563
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/392563 | Scanning electron microscope | Feb 24, 2009 | Issued |
Array
(
[id] => 6477102
[patent_doc_number] => 20100213385
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-26
[patent_title] => 'DEVICE AND METHOD FOR ADMINISTERING PARTICLE BEAM THERAPY'
[patent_app_type] => utility
[patent_app_number] => 12/391831
[patent_app_country] => US
[patent_app_date] => 2009-02-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3123
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0213/20100213385.pdf
[firstpage_image] =>[orig_patent_app_number] => 12391831
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/391831 | Device and method for administering particle beam therapy | Feb 23, 2009 | Issued |
Array
(
[id] => 7997861
[patent_doc_number] => 08080778
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-12-20
[patent_title] => 'Channel cell system'
[patent_app_type] => utility
[patent_app_number] => 12/390669
[patent_app_country] => US
[patent_app_date] => 2009-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 4372
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/080/08080778.pdf
[firstpage_image] =>[orig_patent_app_number] => 12390669
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/390669 | Channel cell system | Feb 22, 2009 | Issued |
Array
(
[id] => 5511906
[patent_doc_number] => 20090212210
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-27
[patent_title] => 'Mass spectrometer system'
[patent_app_type] => utility
[patent_app_number] => 12/380002
[patent_app_country] => US
[patent_app_date] => 2009-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5845
[patent_no_of_claims] => 34
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0212/20090212210.pdf
[firstpage_image] =>[orig_patent_app_number] => 12380002
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/380002 | Mass spectrometer system | Feb 19, 2009 | Issued |
Array
(
[id] => 9026937
[patent_doc_number] => 08536519
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-09-17
[patent_title] => 'Adjusting the detector amplification in mass spectrometers'
[patent_app_type] => utility
[patent_app_number] => 12/389766
[patent_app_country] => US
[patent_app_date] => 2009-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 3512
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12389766
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/389766 | Adjusting the detector amplification in mass spectrometers | Feb 19, 2009 | Issued |
Array
(
[id] => 8270719
[patent_doc_number] => 08212224
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-03
[patent_title] => 'Charged particle beam device'
[patent_app_type] => utility
[patent_app_number] => 12/389838
[patent_app_country] => US
[patent_app_date] => 2009-02-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 5421
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 258
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12389838
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/389838 | Charged particle beam device | Feb 19, 2009 | Issued |
Array
(
[id] => 5511908
[patent_doc_number] => 20090212212
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-27
[patent_title] => 'Scanning Electron Microscope system and Method for Measuring Dimensions of Patterns Formed on Semiconductor Device By Using the System'
[patent_app_type] => utility
[patent_app_number] => 12/370870
[patent_app_country] => US
[patent_app_date] => 2009-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 21
[patent_no_of_words] => 6784
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0212/20090212212.pdf
[firstpage_image] =>[orig_patent_app_number] => 12370870
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/370870 | Scanning electron microscope system and method for measuring dimensions of patterns formed on semiconductor device by using the system | Feb 12, 2009 | Issued |
Array
(
[id] => 6469227
[patent_doc_number] => 20100207038
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-19
[patent_title] => 'Apparatus and method for laser irradiation'
[patent_app_type] => utility
[patent_app_number] => 12/378458
[patent_app_country] => US
[patent_app_date] => 2009-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5840
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0207/20100207038.pdf
[firstpage_image] =>[orig_patent_app_number] => 12378458
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/378458 | Apparatus and method for laser irradiation | Feb 12, 2009 | Abandoned |
Array
(
[id] => 6493253
[patent_doc_number] => 20100200775
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-12
[patent_title] => 'Real Time Monitoring Ion Beam'
[patent_app_type] => utility
[patent_app_number] => 12/370571
[patent_app_country] => US
[patent_app_date] => 2009-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3673
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0200/20100200775.pdf
[firstpage_image] =>[orig_patent_app_number] => 12370571
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/370571 | Real Time Monitoring Ion Beam | Feb 11, 2009 | Abandoned |
Array
(
[id] => 8717746
[patent_doc_number] => 20130068963
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-03-21
[patent_title] => 'SHIELDED CAPACITIVE ELECTRODE'
[patent_app_type] => utility
[patent_app_number] => 12/368541
[patent_app_country] => US
[patent_app_date] => 2009-02-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 2445
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12368541
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/368541 | Shielded capacitive electrode | Feb 9, 2009 | Issued |
Array
(
[id] => 6310576
[patent_doc_number] => 20100193702
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-08-05
[patent_title] => 'TANDEM IONIZER ION SOURCE FOR MASS SPECTROMETER AND METHOD OF USE'
[patent_app_type] => utility
[patent_app_number] => 12/363685
[patent_app_country] => US
[patent_app_date] => 2009-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4159
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0193/20100193702.pdf
[firstpage_image] =>[orig_patent_app_number] => 12363685
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/363685 | Tandem ionizer ion source for mass spectrometer and method of use | Jan 29, 2009 | Issued |
Array
(
[id] => 6126550
[patent_doc_number] => 20110078834
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-31
[patent_title] => 'Temperature-Dependent Nanoscale Contact Potential Measurement Technique and Device'
[patent_app_type] => utility
[patent_app_number] => 12/865490
[patent_app_country] => US
[patent_app_date] => 2009-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 6816
[patent_no_of_claims] => 41
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0078/20110078834.pdf
[firstpage_image] =>[orig_patent_app_number] => 12865490
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/865490 | Temperature-dependent nanoscale contact potential measurement technique and device | Jan 29, 2009 | Issued |
Array
(
[id] => 5388968
[patent_doc_number] => 20090206280
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-08-20
[patent_title] => 'CHARGED-BEAM EXPOSURE APPARATUS HAVING AN IMPROVED ALIGNMENT PRECISION AND EXPOSURE METHOD'
[patent_app_type] => utility
[patent_app_number] => 12/363123
[patent_app_country] => US
[patent_app_date] => 2009-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2441
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0206/20090206280.pdf
[firstpage_image] =>[orig_patent_app_number] => 12363123
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/363123 | CHARGED-BEAM EXPOSURE APPARATUS HAVING AN IMPROVED ALIGNMENT PRECISION AND EXPOSURE METHOD | Jan 29, 2009 | Abandoned |
Array
(
[id] => 6482786
[patent_doc_number] => 20100192267
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-29
[patent_title] => 'Scanning Probe Microscope with Independent Force Control and Displacement Measurements'
[patent_app_type] => utility
[patent_app_number] => 12/362359
[patent_app_country] => US
[patent_app_date] => 2009-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2981
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0192/20100192267.pdf
[firstpage_image] =>[orig_patent_app_number] => 12362359
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/362359 | Scanning probe microscope with independent force control and displacement measurements | Jan 28, 2009 | Issued |
Array
(
[id] => 5379261
[patent_doc_number] => 20090191100
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-07-30
[patent_title] => 'AREA STERILIZER AND METHOD OF DISINFECTION'
[patent_app_type] => utility
[patent_app_number] => 12/361810
[patent_app_country] => US
[patent_app_date] => 2009-01-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 4066
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0191/20090191100.pdf
[firstpage_image] =>[orig_patent_app_number] => 12361810
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/361810 | Area sterilizer and method of disinfection | Jan 28, 2009 | Issued |