Search

Nicole Marie Ippolito

Examiner (ID: 6952, Phone: (571)270-7449 , Office: P/2881 )

Most Active Art Unit
2881
Art Unit(s)
4136, 2881
Total Applications
2428
Issued Applications
2117
Pending Applications
117
Abandoned Applications
234

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 10544411 [patent_doc_number] => 09269543 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-02-23 [patent_title] => 'Compensation of defective beamlets in a charged-particle multi-beam exposure tool' [patent_app_type] => utility [patent_app_number] => 14/631690 [patent_app_country] => US [patent_app_date] => 2015-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 20 [patent_no_of_words] => 14459 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 336 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14631690 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/631690
Compensation of defective beamlets in a charged-particle multi-beam exposure tool Feb 24, 2015 Issued
Array ( [id] => 10426017 [patent_doc_number] => 20150311028 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-10-29 [patent_title] => 'Apparatus and Method for Sample Preparation' [patent_app_type] => utility [patent_app_number] => 14/630719 [patent_app_country] => US [patent_app_date] => 2015-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5450 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14630719 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/630719
Apparatus and Method for Sample Preparation Feb 24, 2015 Abandoned
Array ( [id] => 10358470 [patent_doc_number] => 20150243474 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-08-27 [patent_title] => 'METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 14/629387 [patent_app_country] => US [patent_app_date] => 2015-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 10438 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14629387 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/629387
Method of examining a sample in a charged-particle microscope Feb 22, 2015 Issued
Array ( [id] => 10377850 [patent_doc_number] => 20150262857 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-09-17 [patent_title] => 'Electrostatic Chuck Mechanism and Charged Particle Beam Apparatus' [patent_app_type] => utility [patent_app_number] => 14/626116 [patent_app_country] => US [patent_app_date] => 2015-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 6465 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14626116 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/626116
Electrostatic chuck mechanism and charged particle beam apparatus Feb 18, 2015 Issued
Array ( [id] => 10388233 [patent_doc_number] => 20150273241 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-10-01 [patent_title] => 'CHARGED PARTICLE BEAM IRRADIATION SYSTEM' [patent_app_type] => utility [patent_app_number] => 14/625662 [patent_app_country] => US [patent_app_date] => 2015-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7564 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14625662 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/625662
Charged particle beam irradiation system Feb 18, 2015 Issued
Array ( [id] => 11213098 [patent_doc_number] => 09442132 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-09-13 [patent_title] => 'Atomic force microscope drying system and atomic force microscope' [patent_app_type] => utility [patent_app_number] => 14/626612 [patent_app_country] => US [patent_app_date] => 2015-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3416 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14626612 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/626612
Atomic force microscope drying system and atomic force microscope Feb 18, 2015 Issued
Array ( [id] => 11458304 [patent_doc_number] => 20170052211 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-23 [patent_title] => 'MEASURING DEVICE AND METHOD FOR DETERMINING MASS AND/OR MECHANICAL PROPERTIES OF A BIOLOGICAL SYSTEM' [patent_app_type] => utility [patent_app_number] => 15/119432 [patent_app_country] => US [patent_app_date] => 2015-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6381 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15119432 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/119432
Measuring device and method for determining mass and/or mechanical properties of a biological system Feb 16, 2015 Issued
Array ( [id] => 10555580 [patent_doc_number] => 09279779 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-03-08 [patent_title] => 'Method for identifying a crystallographic candidate phase of a crystal' [patent_app_type] => utility [patent_app_number] => 14/621580 [patent_app_country] => US [patent_app_date] => 2015-02-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3756 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14621580 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/621580
Method for identifying a crystallographic candidate phase of a crystal Feb 12, 2015 Issued
Array ( [id] => 10370240 [patent_doc_number] => 20150255245 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-09-10 [patent_title] => 'Charged Particle Beam System' [patent_app_type] => utility [patent_app_number] => 14/619134 [patent_app_country] => US [patent_app_date] => 2015-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 11079 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14619134 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/619134
Charged particle beam system Feb 10, 2015 Issued
Array ( [id] => 10518654 [patent_doc_number] => 09245708 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-01-26 [patent_title] => 'Method and apparatus for electron beam lithography' [patent_app_type] => utility [patent_app_number] => 14/618644 [patent_app_country] => US [patent_app_date] => 2015-02-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5250 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14618644 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/618644
Method and apparatus for electron beam lithography Feb 9, 2015 Issued
Array ( [id] => 10603980 [patent_doc_number] => 09324550 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2016-04-26 [patent_title] => 'Self-shielding flex-circuit drift tube, drift tube assembly and method of making' [patent_app_type] => utility [patent_app_number] => 14/615263 [patent_app_country] => US [patent_app_date] => 2015-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4948 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14615263 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/615263
Self-shielding flex-circuit drift tube, drift tube assembly and method of making Feb 4, 2015 Issued
Array ( [id] => 10259812 [patent_doc_number] => 20150144809 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-05-28 [patent_title] => 'TARGET SUPPLY DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS' [patent_app_type] => utility [patent_app_number] => 14/611914 [patent_app_country] => US [patent_app_date] => 2015-02-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 7150 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14611914 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/611914
TARGET SUPPLY DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS Feb 1, 2015 Abandoned
Array ( [id] => 14204827 [patent_doc_number] => 10269534 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2019-04-23 [patent_title] => Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device [patent_app_type] => utility [patent_app_number] => 15/547315 [patent_app_country] => US [patent_app_date] => 2015-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 25 [patent_no_of_words] => 8044 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15547315 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/547315
Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device Jan 29, 2015 Issued
Array ( [id] => 10328997 [patent_doc_number] => 20150214001 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2015-07-30 [patent_title] => 'CORRELATIVE OPTICAL AND CHARGED PARTICLE MICROSCOPE' [patent_app_type] => utility [patent_app_number] => 14/606850 [patent_app_country] => US [patent_app_date] => 2015-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3944 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14606850 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/606850
Correlative optical and charged particle microscope Jan 26, 2015 Issued
Array ( [id] => 11770236 [patent_doc_number] => 09378926 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-06-28 [patent_title] => 'Electron beam lithography methods including time division multiplex loading' [patent_app_type] => utility [patent_app_number] => 14/604488 [patent_app_country] => US [patent_app_date] => 2015-01-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6172 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14604488 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/604488
Electron beam lithography methods including time division multiplex loading Jan 22, 2015 Issued
Array ( [id] => 11257794 [patent_doc_number] => 09482690 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-11-01 [patent_title] => 'Scanning probe microscope' [patent_app_type] => utility [patent_app_number] => 14/603260 [patent_app_country] => US [patent_app_date] => 2015-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 23 [patent_no_of_words] => 9298 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14603260 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/603260
Scanning probe microscope Jan 21, 2015 Issued
Array ( [id] => 11491550 [patent_doc_number] => 20170065735 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-03-09 [patent_title] => 'POWER SUPPLY' [patent_app_type] => utility [patent_app_number] => 15/119996 [patent_app_country] => US [patent_app_date] => 2015-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5829 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15119996 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/119996
Power supply Jan 20, 2015 Issued
Array ( [id] => 12129153 [patent_doc_number] => 20180012740 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-01-11 [patent_title] => 'MASS SPECTROMETER' [patent_app_type] => utility [patent_app_number] => 15/544737 [patent_app_country] => US [patent_app_date] => 2015-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 5146 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15544737 [rel_patent_id] =>[rel_patent_doc_number] =>)
15/544737
Mass spectrometer Jan 20, 2015 Issued
Array ( [id] => 11775992 [patent_doc_number] => 09384941 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-07-05 [patent_title] => 'Charged particle beam apparatus and sample observation method' [patent_app_type] => utility [patent_app_number] => 14/601478 [patent_app_country] => US [patent_app_date] => 2015-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 43 [patent_no_of_words] => 6710 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14601478 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/601478
Charged particle beam apparatus and sample observation method Jan 20, 2015 Issued
Array ( [id] => 10652059 [patent_doc_number] => 09368323 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2016-06-14 [patent_title] => 'Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus' [patent_app_type] => utility [patent_app_number] => 14/601497 [patent_app_country] => US [patent_app_date] => 2015-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 5115 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14601497 [rel_patent_id] =>[rel_patent_doc_number] =>)
14/601497
Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus Jan 20, 2015 Issued
Menu