
Nicole Marie Ippolito
Examiner (ID: 6952, Phone: (571)270-7449 , Office: P/2881 )
| Most Active Art Unit | 2881 |
| Art Unit(s) | 4136, 2881 |
| Total Applications | 2428 |
| Issued Applications | 2117 |
| Pending Applications | 117 |
| Abandoned Applications | 234 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 10544411
[patent_doc_number] => 09269543
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-02-23
[patent_title] => 'Compensation of defective beamlets in a charged-particle multi-beam exposure tool'
[patent_app_type] => utility
[patent_app_number] => 14/631690
[patent_app_country] => US
[patent_app_date] => 2015-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 20
[patent_no_of_words] => 14459
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 336
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14631690
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/631690 | Compensation of defective beamlets in a charged-particle multi-beam exposure tool | Feb 24, 2015 | Issued |
Array
(
[id] => 10426017
[patent_doc_number] => 20150311028
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-10-29
[patent_title] => 'Apparatus and Method for Sample Preparation'
[patent_app_type] => utility
[patent_app_number] => 14/630719
[patent_app_country] => US
[patent_app_date] => 2015-02-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5450
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14630719
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/630719 | Apparatus and Method for Sample Preparation | Feb 24, 2015 | Abandoned |
Array
(
[id] => 10358470
[patent_doc_number] => 20150243474
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-08-27
[patent_title] => 'METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE'
[patent_app_type] => utility
[patent_app_number] => 14/629387
[patent_app_country] => US
[patent_app_date] => 2015-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 10438
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14629387
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/629387 | Method of examining a sample in a charged-particle microscope | Feb 22, 2015 | Issued |
Array
(
[id] => 10377850
[patent_doc_number] => 20150262857
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-09-17
[patent_title] => 'Electrostatic Chuck Mechanism and Charged Particle Beam Apparatus'
[patent_app_type] => utility
[patent_app_number] => 14/626116
[patent_app_country] => US
[patent_app_date] => 2015-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 18
[patent_no_of_words] => 6465
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14626116
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/626116 | Electrostatic chuck mechanism and charged particle beam apparatus | Feb 18, 2015 | Issued |
Array
(
[id] => 10388233
[patent_doc_number] => 20150273241
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-10-01
[patent_title] => 'CHARGED PARTICLE BEAM IRRADIATION SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 14/625662
[patent_app_country] => US
[patent_app_date] => 2015-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 7564
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14625662
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/625662 | Charged particle beam irradiation system | Feb 18, 2015 | Issued |
Array
(
[id] => 11213098
[patent_doc_number] => 09442132
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-09-13
[patent_title] => 'Atomic force microscope drying system and atomic force microscope'
[patent_app_type] => utility
[patent_app_number] => 14/626612
[patent_app_country] => US
[patent_app_date] => 2015-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3416
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 155
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14626612
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/626612 | Atomic force microscope drying system and atomic force microscope | Feb 18, 2015 | Issued |
Array
(
[id] => 11458304
[patent_doc_number] => 20170052211
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-02-23
[patent_title] => 'MEASURING DEVICE AND METHOD FOR DETERMINING MASS AND/OR MECHANICAL PROPERTIES OF A BIOLOGICAL SYSTEM'
[patent_app_type] => utility
[patent_app_number] => 15/119432
[patent_app_country] => US
[patent_app_date] => 2015-02-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 6381
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15119432
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/119432 | Measuring device and method for determining mass and/or mechanical properties of a biological system | Feb 16, 2015 | Issued |
Array
(
[id] => 10555580
[patent_doc_number] => 09279779
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-03-08
[patent_title] => 'Method for identifying a crystallographic candidate phase of a crystal'
[patent_app_type] => utility
[patent_app_number] => 14/621580
[patent_app_country] => US
[patent_app_date] => 2015-02-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3756
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14621580
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/621580 | Method for identifying a crystallographic candidate phase of a crystal | Feb 12, 2015 | Issued |
Array
(
[id] => 10370240
[patent_doc_number] => 20150255245
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-09-10
[patent_title] => 'Charged Particle Beam System'
[patent_app_type] => utility
[patent_app_number] => 14/619134
[patent_app_country] => US
[patent_app_date] => 2015-02-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 11079
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14619134
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/619134 | Charged particle beam system | Feb 10, 2015 | Issued |
Array
(
[id] => 10518654
[patent_doc_number] => 09245708
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-01-26
[patent_title] => 'Method and apparatus for electron beam lithography'
[patent_app_type] => utility
[patent_app_number] => 14/618644
[patent_app_country] => US
[patent_app_date] => 2015-02-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5250
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 55
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14618644
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/618644 | Method and apparatus for electron beam lithography | Feb 9, 2015 | Issued |
Array
(
[id] => 10603980
[patent_doc_number] => 09324550
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2016-04-26
[patent_title] => 'Self-shielding flex-circuit drift tube, drift tube assembly and method of making'
[patent_app_type] => utility
[patent_app_number] => 14/615263
[patent_app_country] => US
[patent_app_date] => 2015-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 4948
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14615263
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/615263 | Self-shielding flex-circuit drift tube, drift tube assembly and method of making | Feb 4, 2015 | Issued |
Array
(
[id] => 10259812
[patent_doc_number] => 20150144809
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-05-28
[patent_title] => 'TARGET SUPPLY DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 14/611914
[patent_app_country] => US
[patent_app_date] => 2015-02-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 7150
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14611914
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/611914 | TARGET SUPPLY DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPARATUS | Feb 1, 2015 | Abandoned |
Array
(
[id] => 14204827
[patent_doc_number] => 10269534
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2019-04-23
[patent_title] => Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device
[patent_app_type] => utility
[patent_app_number] => 15/547315
[patent_app_country] => US
[patent_app_date] => 2015-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 25
[patent_no_of_words] => 8044
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15547315
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/547315 | Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device | Jan 29, 2015 | Issued |
Array
(
[id] => 10328997
[patent_doc_number] => 20150214001
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2015-07-30
[patent_title] => 'CORRELATIVE OPTICAL AND CHARGED PARTICLE MICROSCOPE'
[patent_app_type] => utility
[patent_app_number] => 14/606850
[patent_app_country] => US
[patent_app_date] => 2015-01-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3944
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14606850
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/606850 | Correlative optical and charged particle microscope | Jan 26, 2015 | Issued |
Array
(
[id] => 11770236
[patent_doc_number] => 09378926
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-06-28
[patent_title] => 'Electron beam lithography methods including time division multiplex loading'
[patent_app_type] => utility
[patent_app_number] => 14/604488
[patent_app_country] => US
[patent_app_date] => 2015-01-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 6172
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 65
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14604488
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/604488 | Electron beam lithography methods including time division multiplex loading | Jan 22, 2015 | Issued |
Array
(
[id] => 11257794
[patent_doc_number] => 09482690
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-11-01
[patent_title] => 'Scanning probe microscope'
[patent_app_type] => utility
[patent_app_number] => 14/603260
[patent_app_country] => US
[patent_app_date] => 2015-01-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 23
[patent_no_of_words] => 9298
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 196
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14603260
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/603260 | Scanning probe microscope | Jan 21, 2015 | Issued |
Array
(
[id] => 11491550
[patent_doc_number] => 20170065735
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2017-03-09
[patent_title] => 'POWER SUPPLY'
[patent_app_type] => utility
[patent_app_number] => 15/119996
[patent_app_country] => US
[patent_app_date] => 2015-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5829
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15119996
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/119996 | Power supply | Jan 20, 2015 | Issued |
Array
(
[id] => 12129153
[patent_doc_number] => 20180012740
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2018-01-11
[patent_title] => 'MASS SPECTROMETER'
[patent_app_type] => utility
[patent_app_number] => 15/544737
[patent_app_country] => US
[patent_app_date] => 2015-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 5146
[patent_no_of_claims] => 4
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15544737
[rel_patent_id] =>[rel_patent_doc_number] =>) 15/544737 | Mass spectrometer | Jan 20, 2015 | Issued |
Array
(
[id] => 11775992
[patent_doc_number] => 09384941
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-07-05
[patent_title] => 'Charged particle beam apparatus and sample observation method'
[patent_app_type] => utility
[patent_app_number] => 14/601478
[patent_app_country] => US
[patent_app_date] => 2015-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 43
[patent_no_of_words] => 6710
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 98
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14601478
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/601478 | Charged particle beam apparatus and sample observation method | Jan 20, 2015 | Issued |
Array
(
[id] => 10652059
[patent_doc_number] => 09368323
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2016-06-14
[patent_title] => 'Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus'
[patent_app_type] => utility
[patent_app_number] => 14/601497
[patent_app_country] => US
[patent_app_date] => 2015-01-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 5115
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 198
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 14601497
[rel_patent_id] =>[rel_patent_doc_number] =>) 14/601497 | Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus | Jan 20, 2015 | Issued |