
Olivia T. Luk
Examiner (ID: 10459)
| Most Active Art Unit | 2812 |
| Art Unit(s) | 2812 |
| Total Applications | 278 |
| Issued Applications | 256 |
| Pending Applications | 8 |
| Abandoned Applications | 14 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7630653
[patent_doc_number] => 06636283
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2003-10-21
[patent_title] => 'Front light, reflective liquid crystal display device and personal digital assistant'
[patent_app_type] => B2
[patent_app_number] => 09/819624
[patent_app_country] => US
[patent_app_date] => 2001-03-29
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[pdf_file] => patents/06/636/06636283.pdf
[firstpage_image] =>[orig_patent_app_number] => 09819624
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/819624 | Front light, reflective liquid crystal display device and personal digital assistant | Mar 28, 2001 | Issued |
Array
(
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[patent_doc_number] => 06531403
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[patent_issue_date] => 2003-03-11
[patent_title] => 'Method of etching an object, method of repairing pattern, nitride pattern and semiconductor device'
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[patent_app_number] => 09/819891
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Array
(
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[patent_doc_number] => 06472333
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[patent_issue_date] => 2002-10-29
[patent_title] => 'Silicon carbide cap layers for low dielectric constant silicon oxide layers'
[patent_app_type] => B2
[patent_app_number] => 09/820439
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[patent_app_date] => 2001-03-28
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/820439 | Silicon carbide cap layers for low dielectric constant silicon oxide layers | Mar 27, 2001 | Issued |
Array
(
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[patent_doc_number] => 06383953
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[patent_issue_date] => 2002-05-07
[patent_title] => 'Apparatus for fabricating semiconductor device and method for fabricating semiconductor using the same'
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[patent_app_number] => 09/804902
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Array
(
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[patent_title] => 'Film forming method and manufacturing method of semiconductor device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/804142 | Film forming method and manufacturing method of semiconductor device | Mar 12, 2001 | Issued |
Array
(
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[patent_issue_date] => 2002-05-07
[patent_title] => 'In-situ stack for high volume production of isolation regions'
[patent_app_type] => B1
[patent_app_number] => 09/800862
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Array
(
[id] => 4376913
[patent_doc_number] => 06303399
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[patent_kind] => NA
[patent_issue_date] => 2001-10-16
[patent_title] => 'Method of sample preparation for electron microscopy'
[patent_app_type] => 1
[patent_app_number] => 9/800441
[patent_app_country] => US
[patent_app_date] => 2001-03-06
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[pdf_file] => patents/06/303/06303399.pdf
[firstpage_image] =>[orig_patent_app_number] => 800441
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/800441 | Method of sample preparation for electron microscopy | Mar 5, 2001 | Issued |
| 09/743071 | Process for mapping metal contaminant concentration on a silicon wafer surface | Mar 4, 2001 | Abandoned |
Array
(
[id] => 1535953
[patent_doc_number] => 06337220
[patent_country] => US
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[patent_issue_date] => 2002-01-08
[patent_title] => 'Ion implanter vacuum integrity check process and apparatus'
[patent_app_type] => B1
[patent_app_number] => 09/796771
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/796771 | Ion implanter vacuum integrity check process and apparatus | Feb 27, 2001 | Issued |
Array
(
[id] => 6896059
[patent_doc_number] => 20010026849
[patent_country] => US
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[patent_issue_date] => 2001-10-04
[patent_title] => 'Method of improving moisture resistance of low dielectric constant films'
[patent_app_type] => new
[patent_app_number] => 09/792122
[patent_app_country] => US
[patent_app_date] => 2001-02-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/792122 | Method of improving moisture resistance of low dielectric constant films | Feb 20, 2001 | Issued |
Array
(
[id] => 4304333
[patent_doc_number] => 06326306
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[patent_kind] => NA
[patent_issue_date] => 2001-12-04
[patent_title] => 'Method of forming copper dual damascene structure'
[patent_app_type] => 1
[patent_app_number] => 9/783872
[patent_app_country] => US
[patent_app_date] => 2001-02-15
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[pdf_file] => patents/06/326/06326306.pdf
[firstpage_image] =>[orig_patent_app_number] => 783872
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/783872 | Method of forming copper dual damascene structure | Feb 14, 2001 | Issued |
Array
(
[id] => 1594477
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[patent_title] => 'Apparatus for manufacturing a semiconductor device in a CVD reactive chamber'
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Array
(
[id] => 6012328
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[patent_title] => 'Method for forming variable-K gate dielectric'
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Array
(
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Array
(
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[patent_title] => 'Method of forming a silicon nitride thin film'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/767682 | Method of forming a silicon nitride thin film | Jan 23, 2001 | Abandoned |
Array
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Array
(
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[patent_title] => 'Automated variation of stepper exposure dose based upon across wafer variations in device characteristics, and system for accomplishing same'
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Array
(
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Array
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Array
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