Olivia T. Luk

Array ( [id] => 1389178 [patent_doc_number] => 06544807 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-08 [patent_title] => 'Process monitor with statistically selected ring oscillator' [patent_app_type] => B1 [patent_app_number] => 09/706286 [patent_app_country] => US [patent_app_date] => 2000-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 4247 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/544/06544807.pdf [firstpage_image] =>[orig_patent_app_number] => 09706286 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4366416 [patent_doc_number] => 06274462 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-14 [patent_title] => 'Method of fabrication of an infrared radiation detector and infrared detector device' [patent_app_type] => 1 [patent_app_number] => 9/702501 [patent_app_country] => US [patent_app_date] => 2000-10-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 17 [patent_no_of_words] => 4855 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/274/06274462.pdf [firstpage_image] =>[orig_patent_app_number] => 702501 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1435851 [patent_doc_number] => 06355494 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-12 [patent_title] => 'Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing' [patent_app_type] => B1 [patent_app_number] => 09/702052 [patent_app_country] => US [patent_app_date] => 2000-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 4663 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/355/06355494.pdf [firstpage_image] =>[orig_patent_app_number] => 09702052 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1297113 [patent_doc_number] => 06627463 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-30 [patent_title] => 'Situ measurement of film nitridation using optical emission spectroscopy' [patent_app_type] => B1 [patent_app_number] => 09/693582 [patent_app_country] => US [patent_app_date] => 2000-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 18 [patent_no_of_words] => 4990 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/627/06627463.pdf [firstpage_image] =>[orig_patent_app_number] => 09693582 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4270503 [patent_doc_number] => 06323049 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-27 [patent_title] => 'Method for manufacturing condenser microphone' [patent_app_type] => 1 [patent_app_number] => 9/679136 [patent_app_country] => US [patent_app_date] => 2000-10-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2661 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/323/06323049.pdf [firstpage_image] =>[orig_patent_app_number] => 679136 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1550567 [patent_doc_number] => 06399513 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-04 [patent_title] => 'Ozonated DI water process for organic residue and metal removal processes' [patent_app_type] => B1 [patent_app_number] => 09/666988 [patent_app_country] => US [patent_app_date] => 2000-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2179 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 93 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/399/06399513.pdf [firstpage_image] =>[orig_patent_app_number] => 09666988 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4274632 [patent_doc_number] => 06281027 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Spatial averaging technique for ellipsometry and reflectometry' [patent_app_type] => 1 [patent_app_number] => 9/658812 [patent_app_country] => US [patent_app_date] => 2000-09-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 4294 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281027.pdf [firstpage_image] =>[orig_patent_app_number] => 658812 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1375946 [patent_doc_number] => 06544033 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-08 [patent_title] => 'Wafer carrier' [patent_app_type] => B1 [patent_app_number] => 09/658362 [patent_app_country] => US [patent_app_date] => 2000-09-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1565 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 36 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/544/06544033.pdf [firstpage_image] =>[orig_patent_app_number] => 09658362 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4406745 [patent_doc_number] => 06238941 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-29 [patent_title] => 'Characterizing of silicon-germanium areas on silicon' [patent_app_type] => 1 [patent_app_number] => 9/652682 [patent_app_country] => US [patent_app_date] => 2000-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1753 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/238/06238941.pdf [firstpage_image] =>[orig_patent_app_number] => 652682 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1462539 [patent_doc_number] => 06350664 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-02-26 [patent_title] => 'Semiconductor device and method of manufacturing the same' [patent_app_type] => B1 [patent_app_number] => 09/645408 [patent_app_country] => US [patent_app_date] => 2000-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 22 [patent_no_of_words] => 3381 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/350/06350664.pdf [firstpage_image] =>[orig_patent_app_number] => 09645408 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7636673 [patent_doc_number] => 06379982 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-30 [patent_title] => 'Wafer on wafer packaging and method of fabrication for full-wafer burn-in and testing' [patent_app_type] => B1 [patent_app_number] => 09/640739 [patent_app_country] => US [patent_app_date] => 2000-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 9617 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 12 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/379/06379982.pdf [firstpage_image] =>[orig_patent_app_number] => 09640739 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1494931 [patent_doc_number] => 06403443 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-11 [patent_title] => 'Method for reducing surface humps of doped amorphous silicon layer' [patent_app_type] => B1 [patent_app_number] => 09/632028 [patent_app_country] => US [patent_app_date] => 2000-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 3219 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/403/06403443.pdf [firstpage_image] =>[orig_patent_app_number] => 09632028 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4368126 [patent_doc_number] => 06287878 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Method of fabricating chip scale package' [patent_app_type] => 1 [patent_app_number] => 9/619987 [patent_app_country] => US [patent_app_date] => 2000-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 4528 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/287/06287878.pdf [firstpage_image] =>[orig_patent_app_number] => 619987 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4353081 [patent_doc_number] => 06218200 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-17 [patent_title] => 'Multi-layer registration control for photolithography processes' [patent_app_type] => 1 [patent_app_number] => 9/616152 [patent_app_country] => US [patent_app_date] => 2000-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 11 [patent_no_of_words] => 2989 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/218/06218200.pdf [firstpage_image] =>[orig_patent_app_number] => 616152 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4318243 [patent_doc_number] => 06248603 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-19 [patent_title] => 'Method of measuring dielectric layer thickness using SIMS' [patent_app_type] => 1 [patent_app_number] => 9/615393 [patent_app_country] => US [patent_app_date] => 2000-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3469 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/248/06248603.pdf [firstpage_image] =>[orig_patent_app_number] => 615393 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1469853 [patent_doc_number] => 06406981 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-18 [patent_title] => 'Method for the manufacture of semiconductor devices and circuits' [patent_app_type] => B1 [patent_app_number] => 09/607252 [patent_app_country] => US [patent_app_date] => 2000-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 8 [patent_no_of_words] => 2730 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 27 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/406/06406981.pdf [firstpage_image] =>[orig_patent_app_number] => 09607252 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1595755 [patent_doc_number] => 06492271 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-10 [patent_title] => 'Semiconductor device and method of manufacturing the same' [patent_app_type] => B1 [patent_app_number] => 09/609711 [patent_app_country] => US [patent_app_date] => 2000-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 34 [patent_no_of_words] => 9510 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/492/06492271.pdf [firstpage_image] =>[orig_patent_app_number] => 09609711 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1536224 [patent_doc_number] => 06337288 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-01-08 [patent_title] => 'Process for the production of electronic parts' [patent_app_type] => B1 [patent_app_number] => 09/605388 [patent_app_country] => US [patent_app_date] => 2000-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6239 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 181 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/337/06337288.pdf [firstpage_image] =>[orig_patent_app_number] => 09605388 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4271653 [patent_doc_number] => 06323127 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-11-27 [patent_title] => 'Capacitor formed with Pt electrodes having a 3D cup-like shape with roughened inner and outer surfaces' [patent_app_type] => 1 [patent_app_number] => 9/599698 [patent_app_country] => US [patent_app_date] => 2000-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 11 [patent_no_of_words] => 3484 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 263 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/323/06323127.pdf [firstpage_image] =>[orig_patent_app_number] => 599698 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4378258 [patent_doc_number] => 06303482 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-16 [patent_title] => 'Method for cleaning the surface of a semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 9/597762 [patent_app_country] => US [patent_app_date] => 2000-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2717 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/303/06303482.pdf [firstpage_image] =>[orig_patent_app_number] => 597762 [rel_patent_id] =>[rel_patent_doc_number] =>)