
Olivia T. Luk
Examiner (ID: 10459)
| Most Active Art Unit | 2812 |
| Art Unit(s) | 2812 |
| Total Applications | 278 |
| Issued Applications | 256 |
| Pending Applications | 8 |
| Abandoned Applications | 14 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4309605
[patent_doc_number] => 06316277
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-13
[patent_title] => 'Tuning substrate/resist contrast to maximize defect inspection sensitivity for ultra-thin resist in DUV lithography'
[patent_app_type] => 1
[patent_app_number] => 9/580612
[patent_app_country] => US
[patent_app_date] => 2000-05-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 11
[patent_no_of_words] => 3169
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/316/06316277.pdf
[firstpage_image] =>[orig_patent_app_number] => 580612
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/580612 | Tuning substrate/resist contrast to maximize defect inspection sensitivity for ultra-thin resist in DUV lithography | May 29, 2000 | Issued |
Array
(
[id] => 4358618
[patent_doc_number] => 06255196
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-03
[patent_title] => 'Method for sawing wafers employing multiple indexing techniques for multiple die dimensions'
[patent_app_type] => 1
[patent_app_number] => 9/567262
[patent_app_country] => US
[patent_app_date] => 2000-05-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 3702
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 61
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/255/06255196.pdf
[firstpage_image] =>[orig_patent_app_number] => 567262
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/567262 | Method for sawing wafers employing multiple indexing techniques for multiple die dimensions | May 8, 2000 | Issued |
Array
(
[id] => 1459636
[patent_doc_number] => 06391796
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-05-21
[patent_title] => 'Method for heat-treating silicon wafer and silicon wafer'
[patent_app_type] => B1
[patent_app_number] => 09/530602
[patent_app_country] => US
[patent_app_date] => 2000-05-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5759
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/391/06391796.pdf
[firstpage_image] =>[orig_patent_app_number] => 09530602
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/530602 | Method for heat-treating silicon wafer and silicon wafer | May 2, 2000 | Issued |
Array
(
[id] => 4327354
[patent_doc_number] => 06319820
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-11-20
[patent_title] => 'Fabrication method for dual damascene structure'
[patent_app_type] => 1
[patent_app_number] => 9/561578
[patent_app_country] => US
[patent_app_date] => 2000-04-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 15
[patent_no_of_words] => 3871
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 173
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/319/06319820.pdf
[firstpage_image] =>[orig_patent_app_number] => 561578
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/561578 | Fabrication method for dual damascene structure | Apr 27, 2000 | Issued |
Array
(
[id] => 4408300
[patent_doc_number] => 06309943
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-10-30
[patent_title] => 'Precision marking and singulation method'
[patent_app_type] => 1
[patent_app_number] => 9/558392
[patent_app_country] => US
[patent_app_date] => 2000-04-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 11
[patent_no_of_words] => 7696
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 50
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/309/06309943.pdf
[firstpage_image] =>[orig_patent_app_number] => 558392
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/558392 | Precision marking and singulation method | Apr 24, 2000 | Issued |
Array
(
[id] => 1336640
[patent_doc_number] => 06593247
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-07-15
[patent_title] => 'Method of depositing low k films using an oxidizing plasma'
[patent_app_type] => B1
[patent_app_number] => 09/553461
[patent_app_country] => US
[patent_app_date] => 2000-04-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 8960
[patent_no_of_claims] => 63
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 74
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/593/06593247.pdf
[firstpage_image] =>[orig_patent_app_number] => 09553461
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/553461 | Method of depositing low k films using an oxidizing plasma | Apr 18, 2000 | Issued |
Array
(
[id] => 1446511
[patent_doc_number] => 06368884
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-09
[patent_title] => 'Die-based in-fab process monitoring and analysis system for semiconductor processing'
[patent_app_type] => B1
[patent_app_number] => 09/548142
[patent_app_country] => US
[patent_app_date] => 2000-04-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 22
[patent_no_of_words] => 12189
[patent_no_of_claims] => 36
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/368/06368884.pdf
[firstpage_image] =>[orig_patent_app_number] => 09548142
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/548142 | Die-based in-fab process monitoring and analysis system for semiconductor processing | Apr 12, 2000 | Issued |
Array
(
[id] => 4380369
[patent_doc_number] => 06261853
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-17
[patent_title] => 'Method and apparatus for preparing semiconductor wafers for measurement'
[patent_app_type] => 1
[patent_app_number] => 9/499478
[patent_app_country] => US
[patent_app_date] => 2000-02-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3831
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 49
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/261/06261853.pdf
[firstpage_image] =>[orig_patent_app_number] => 499478
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/499478 | Method and apparatus for preparing semiconductor wafers for measurement | Feb 6, 2000 | Issued |
Array
(
[id] => 4250303
[patent_doc_number] => 06207542
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-27
[patent_title] => 'Method for establishing ultra-thin gate insulator using oxidized nitride film'
[patent_app_type] => 1
[patent_app_number] => 9/478962
[patent_app_country] => US
[patent_app_date] => 2000-01-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 1621
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 50
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/207/06207542.pdf
[firstpage_image] =>[orig_patent_app_number] => 478962
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/478962 | Method for establishing ultra-thin gate insulator using oxidized nitride film | Jan 6, 2000 | Issued |
Array
(
[id] => 4302333
[patent_doc_number] => 06251762
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-26
[patent_title] => 'Method and device for improved salicide resistance on polysilicon gates'
[patent_app_type] => 1
[patent_app_number] => 9/458572
[patent_app_country] => US
[patent_app_date] => 1999-12-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 57
[patent_no_of_words] => 6188
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/251/06251762.pdf
[firstpage_image] =>[orig_patent_app_number] => 458572
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/458572 | Method and device for improved salicide resistance on polysilicon gates | Dec 8, 1999 | Issued |
Array
(
[id] => 1433314
[patent_doc_number] => 06340604
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-01-22
[patent_title] => 'Contactor and semiconductor device inspecting method'
[patent_app_type] => B1
[patent_app_number] => 09/455151
[patent_app_country] => US
[patent_app_date] => 1999-12-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 13
[patent_no_of_words] => 5477
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/340/06340604.pdf
[firstpage_image] =>[orig_patent_app_number] => 09455151
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/455151 | Contactor and semiconductor device inspecting method | Dec 5, 1999 | Issued |
Array
(
[id] => 1528105
[patent_doc_number] => 06479370
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-11-12
[patent_title] => 'Isolated structure and method of fabricating such a structure on a substrate'
[patent_app_type] => B2
[patent_app_number] => 09/440406
[patent_app_country] => US
[patent_app_date] => 1999-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 18
[patent_no_of_words] => 3831
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/479/06479370.pdf
[firstpage_image] =>[orig_patent_app_number] => 09440406
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/440406 | Isolated structure and method of fabricating such a structure on a substrate | Nov 14, 1999 | Issued |
Array
(
[id] => 1528105
[patent_doc_number] => 06479370
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-11-12
[patent_title] => 'Isolated structure and method of fabricating such a structure on a substrate'
[patent_app_type] => B2
[patent_app_number] => 09/440406
[patent_app_country] => US
[patent_app_date] => 1999-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 18
[patent_no_of_words] => 3831
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/479/06479370.pdf
[firstpage_image] =>[orig_patent_app_number] => 09440406
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/440406 | Isolated structure and method of fabricating such a structure on a substrate | Nov 14, 1999 | Issued |
Array
(
[id] => 1528105
[patent_doc_number] => 06479370
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-11-12
[patent_title] => 'Isolated structure and method of fabricating such a structure on a substrate'
[patent_app_type] => B2
[patent_app_number] => 09/440406
[patent_app_country] => US
[patent_app_date] => 1999-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 18
[patent_no_of_words] => 3831
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/479/06479370.pdf
[firstpage_image] =>[orig_patent_app_number] => 09440406
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/440406 | Isolated structure and method of fabricating such a structure on a substrate | Nov 14, 1999 | Issued |
Array
(
[id] => 1528105
[patent_doc_number] => 06479370
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-11-12
[patent_title] => 'Isolated structure and method of fabricating such a structure on a substrate'
[patent_app_type] => B2
[patent_app_number] => 09/440406
[patent_app_country] => US
[patent_app_date] => 1999-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 18
[patent_no_of_words] => 3831
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 52
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/479/06479370.pdf
[firstpage_image] =>[orig_patent_app_number] => 09440406
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/440406 | Isolated structure and method of fabricating such a structure on a substrate | Nov 14, 1999 | Issued |
Array
(
[id] => 4357255
[patent_doc_number] => 06190977
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-20
[patent_title] => 'Method for forming MOSFET with an elevated source/drain'
[patent_app_type] => 1
[patent_app_number] => 9/439431
[patent_app_country] => US
[patent_app_date] => 1999-11-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 7
[patent_no_of_words] => 3391
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 222
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/190/06190977.pdf
[firstpage_image] =>[orig_patent_app_number] => 439431
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/439431 | Method for forming MOSFET with an elevated source/drain | Nov 14, 1999 | Issued |
Array
(
[id] => 1494126
[patent_doc_number] => 06342399
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-01-29
[patent_title] => 'Testing integrated circuits'
[patent_app_type] => B1
[patent_app_number] => 09/435971
[patent_app_country] => US
[patent_app_date] => 1999-11-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 12
[patent_no_of_words] => 2697
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 102
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/342/06342399.pdf
[firstpage_image] =>[orig_patent_app_number] => 09435971
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/435971 | Testing integrated circuits | Nov 7, 1999 | Issued |
Array
(
[id] => 4318228
[patent_doc_number] => 06248602
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-19
[patent_title] => 'Method and apparatus for automated rework within run-to-run control semiconductor manufacturing'
[patent_app_type] => 1
[patent_app_number] => 9/430862
[patent_app_country] => US
[patent_app_date] => 1999-11-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 6723
[patent_no_of_claims] => 42
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/248/06248602.pdf
[firstpage_image] =>[orig_patent_app_number] => 430862
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/430862 | Method and apparatus for automated rework within run-to-run control semiconductor manufacturing | Oct 31, 1999 | Issued |
Array
(
[id] => 4420130
[patent_doc_number] => 06225170
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-05-01
[patent_title] => 'Self-aligned damascene gate with contact formation'
[patent_app_type] => 1
[patent_app_number] => 9/428481
[patent_app_country] => US
[patent_app_date] => 1999-10-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 10
[patent_no_of_words] => 2628
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 231
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/225/06225170.pdf
[firstpage_image] =>[orig_patent_app_number] => 428481
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/428481 | Self-aligned damascene gate with contact formation | Oct 27, 1999 | Issued |
Array
(
[id] => 4258049
[patent_doc_number] => 06258611
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-10
[patent_title] => 'Method for determining translation portion of misalignment error in a stepper'
[patent_app_type] => 1
[patent_app_number] => 9/422912
[patent_app_country] => US
[patent_app_date] => 1999-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 11
[patent_no_of_words] => 6255
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 117
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/258/06258611.pdf
[firstpage_image] =>[orig_patent_app_number] => 422912
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/422912 | Method for determining translation portion of misalignment error in a stepper | Oct 20, 1999 | Issued |