Search

Olivia T. Luk

Examiner (ID: 10459)

Most Active Art Unit
2812
Art Unit(s)
2812
Total Applications
278
Issued Applications
256
Pending Applications
8
Abandoned Applications
14

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4369693 [patent_doc_number] => 06287987 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-11 [patent_title] => 'Method and apparatus for deposition of porous silica dielectrics' [patent_app_type] => 1 [patent_app_number] => 9/302832 [patent_app_country] => US [patent_app_date] => 1999-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3275 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/287/06287987.pdf [firstpage_image] =>[orig_patent_app_number] => 302832 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/302832
Method and apparatus for deposition of porous silica dielectrics Apr 29, 1999 Issued
Array ( [id] => 4357593 [patent_doc_number] => 06255125 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-03 [patent_title] => 'Method and apparatus for compensating for critical dimension variations in the production of a semiconductor wafer' [patent_app_type] => 1 [patent_app_number] => 9/277093 [patent_app_country] => US [patent_app_date] => 1999-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 14 [patent_no_of_words] => 4128 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/255/06255125.pdf [firstpage_image] =>[orig_patent_app_number] => 277093 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/277093
Method and apparatus for compensating for critical dimension variations in the production of a semiconductor wafer Mar 25, 1999 Issued
Array ( [id] => 4182090 [patent_doc_number] => 06150210 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-11-21 [patent_title] => 'Memory cell that includes a vertical transistor and a trench capacitor' [patent_app_type] => 1 [patent_app_number] => 9/272218 [patent_app_country] => US [patent_app_date] => 1999-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 6154 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 310 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/150/06150210.pdf [firstpage_image] =>[orig_patent_app_number] => 272218 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/272218
Memory cell that includes a vertical transistor and a trench capacitor Mar 17, 1999 Issued
Array ( [id] => 4404317 [patent_doc_number] => 06271056 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-07 [patent_title] => 'Stacked semiconductor package and method of fabrication' [patent_app_type] => 1 [patent_app_number] => 9/259861 [patent_app_country] => US [patent_app_date] => 1999-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 7 [patent_no_of_words] => 5139 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/271/06271056.pdf [firstpage_image] =>[orig_patent_app_number] => 259861 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/259861
Stacked semiconductor package and method of fabrication Feb 28, 1999 Issued
Array ( [id] => 4294136 [patent_doc_number] => 06184098 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-06 [patent_title] => 'Field effect transistor device and method of manufacturing the same' [patent_app_type] => 1 [patent_app_number] => 9/252862 [patent_app_country] => US [patent_app_date] => 1999-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3411 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/184/06184098.pdf [firstpage_image] =>[orig_patent_app_number] => 252862 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/252862
Field effect transistor device and method of manufacturing the same Feb 17, 1999 Issued
Array ( [id] => 4354044 [patent_doc_number] => 06200823 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-03-13 [patent_title] => 'Method for isolation of optical defect images' [patent_app_type] => 1 [patent_app_number] => 9/247241 [patent_app_country] => US [patent_app_date] => 1999-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2601 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 270 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/200/06200823.pdf [firstpage_image] =>[orig_patent_app_number] => 247241 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/247241
Method for isolation of optical defect images Feb 8, 1999 Issued
Array ( [id] => 4311873 [patent_doc_number] => 06242270 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-05 [patent_title] => 'Method of manufacturing integrated circuits' [patent_app_type] => 1 [patent_app_number] => 9/247783 [patent_app_country] => US [patent_app_date] => 1999-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3676 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/242/06242270.pdf [firstpage_image] =>[orig_patent_app_number] => 247783 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/247783
Method of manufacturing integrated circuits Feb 8, 1999 Issued
Array ( [id] => 4357579 [patent_doc_number] => 06255124 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-03 [patent_title] => 'Test arrangement and method for thinned flip chip IC' [patent_app_type] => 1 [patent_app_number] => 9/247002 [patent_app_country] => US [patent_app_date] => 1999-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3119 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/255/06255124.pdf [firstpage_image] =>[orig_patent_app_number] => 247002 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/247002
Test arrangement and method for thinned flip chip IC Feb 7, 1999 Issued
Array ( [id] => 4412614 [patent_doc_number] => 06239450 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-05-29 [patent_title] => 'Negative differential resistance device based on tunneling through microclusters, and method therefor' [patent_app_type] => 1 [patent_app_number] => 9/231429 [patent_app_country] => US [patent_app_date] => 1999-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1122 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/239/06239450.pdf [firstpage_image] =>[orig_patent_app_number] => 231429 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/231429
Negative differential resistance device based on tunneling through microclusters, and method therefor Jan 13, 1999 Issued
Array ( [id] => 4275985 [patent_doc_number] => 06281120 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Temperature control structure for integrated circuit' [patent_app_type] => 1 [patent_app_number] => 9/216282 [patent_app_country] => US [patent_app_date] => 1998-12-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 3415 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 174 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281120.pdf [firstpage_image] =>[orig_patent_app_number] => 216282 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/216282
Temperature control structure for integrated circuit Dec 17, 1998 Issued
Array ( [id] => 4419200 [patent_doc_number] => 06177289 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-23 [patent_title] => 'Lateral trench optical detectors' [patent_app_type] => 1 [patent_app_number] => 9/205433 [patent_app_country] => US [patent_app_date] => 1998-12-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 1996 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/177/06177289.pdf [firstpage_image] =>[orig_patent_app_number] => 205433 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/205433
Lateral trench optical detectors Dec 3, 1998 Issued
Array ( [id] => 4343235 [patent_doc_number] => 06284552 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-09-04 [patent_title] => 'Method and apparatus for evaluating surface roughness of an epitaxial growth layer, method and apparatus for measuring reflectance of an epitaxial growth layer, and manufacturing method of semiconductor device' [patent_app_type] => 1 [patent_app_number] => 9/190461 [patent_app_country] => US [patent_app_date] => 1998-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 22 [patent_no_of_words] => 8148 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/284/06284552.pdf [firstpage_image] =>[orig_patent_app_number] => 190461 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/190461
Method and apparatus for evaluating surface roughness of an epitaxial growth layer, method and apparatus for measuring reflectance of an epitaxial growth layer, and manufacturing method of semiconductor device Nov 12, 1998 Issued
Array ( [id] => 1549577 [patent_doc_number] => 06346428 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-02-12 [patent_title] => 'Method and apparatus for minimizing semiconductor wafer arcing during semiconductor wafer processing' [patent_app_type] => B1 [patent_app_number] => 09/135210 [patent_app_country] => US [patent_app_date] => 1998-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2427 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/346/06346428.pdf [firstpage_image] =>[orig_patent_app_number] => 09135210 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/135210
Method and apparatus for minimizing semiconductor wafer arcing during semiconductor wafer processing Aug 16, 1998 Issued
Menu