
Olivia T. Luk
Examiner (ID: 10459)
| Most Active Art Unit | 2812 |
| Art Unit(s) | 2812 |
| Total Applications | 278 |
| Issued Applications | 256 |
| Pending Applications | 8 |
| Abandoned Applications | 14 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4369693
[patent_doc_number] => 06287987
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-09-11
[patent_title] => 'Method and apparatus for deposition of porous silica dielectrics'
[patent_app_type] => 1
[patent_app_number] => 9/302832
[patent_app_country] => US
[patent_app_date] => 1999-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 3275
[patent_no_of_claims] => 25
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[patent_words_short_claim] => 67
[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/287/06287987.pdf
[firstpage_image] =>[orig_patent_app_number] => 302832
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/302832 | Method and apparatus for deposition of porous silica dielectrics | Apr 29, 1999 | Issued |
Array
(
[id] => 4357593
[patent_doc_number] => 06255125
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-03
[patent_title] => 'Method and apparatus for compensating for critical dimension variations in the production of a semiconductor wafer'
[patent_app_type] => 1
[patent_app_number] => 9/277093
[patent_app_country] => US
[patent_app_date] => 1999-03-26
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 4128
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[patent_words_short_claim] => 85
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[pdf_file] => patents/06/255/06255125.pdf
[firstpage_image] =>[orig_patent_app_number] => 277093
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/277093 | Method and apparatus for compensating for critical dimension variations in the production of a semiconductor wafer | Mar 25, 1999 | Issued |
Array
(
[id] => 4182090
[patent_doc_number] => 06150210
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-11-21
[patent_title] => 'Memory cell that includes a vertical transistor and a trench capacitor'
[patent_app_type] => 1
[patent_app_number] => 9/272218
[patent_app_country] => US
[patent_app_date] => 1999-03-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
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[patent_no_of_words] => 6154
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[pdf_file] => patents/06/150/06150210.pdf
[firstpage_image] =>[orig_patent_app_number] => 272218
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/272218 | Memory cell that includes a vertical transistor and a trench capacitor | Mar 17, 1999 | Issued |
Array
(
[id] => 4404317
[patent_doc_number] => 06271056
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-07
[patent_title] => 'Stacked semiconductor package and method of fabrication'
[patent_app_type] => 1
[patent_app_number] => 9/259861
[patent_app_country] => US
[patent_app_date] => 1999-03-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_words] => 5139
[patent_no_of_claims] => 21
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[pdf_file] => patents/06/271/06271056.pdf
[firstpage_image] =>[orig_patent_app_number] => 259861
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/259861 | Stacked semiconductor package and method of fabrication | Feb 28, 1999 | Issued |
Array
(
[id] => 4294136
[patent_doc_number] => 06184098
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-06
[patent_title] => 'Field effect transistor device and method of manufacturing the same'
[patent_app_type] => 1
[patent_app_number] => 9/252862
[patent_app_country] => US
[patent_app_date] => 1999-02-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 6
[patent_no_of_words] => 3411
[patent_no_of_claims] => 20
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[patent_words_short_claim] => 134
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/184/06184098.pdf
[firstpage_image] =>[orig_patent_app_number] => 252862
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/252862 | Field effect transistor device and method of manufacturing the same | Feb 17, 1999 | Issued |
Array
(
[id] => 4354044
[patent_doc_number] => 06200823
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-03-13
[patent_title] => 'Method for isolation of optical defect images'
[patent_app_type] => 1
[patent_app_number] => 9/247241
[patent_app_country] => US
[patent_app_date] => 1999-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2601
[patent_no_of_claims] => 4
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/200/06200823.pdf
[firstpage_image] =>[orig_patent_app_number] => 247241
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/247241 | Method for isolation of optical defect images | Feb 8, 1999 | Issued |
Array
(
[id] => 4311873
[patent_doc_number] => 06242270
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-05
[patent_title] => 'Method of manufacturing integrated circuits'
[patent_app_type] => 1
[patent_app_number] => 9/247783
[patent_app_country] => US
[patent_app_date] => 1999-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 3676
[patent_no_of_claims] => 7
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[patent_words_short_claim] => 185
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/242/06242270.pdf
[firstpage_image] =>[orig_patent_app_number] => 247783
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/247783 | Method of manufacturing integrated circuits | Feb 8, 1999 | Issued |
Array
(
[id] => 4357579
[patent_doc_number] => 06255124
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-07-03
[patent_title] => 'Test arrangement and method for thinned flip chip IC'
[patent_app_type] => 1
[patent_app_number] => 9/247002
[patent_app_country] => US
[patent_app_date] => 1999-02-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 3119
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 62
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/255/06255124.pdf
[firstpage_image] =>[orig_patent_app_number] => 247002
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/247002 | Test arrangement and method for thinned flip chip IC | Feb 7, 1999 | Issued |
Array
(
[id] => 4412614
[patent_doc_number] => 06239450
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-05-29
[patent_title] => 'Negative differential resistance device based on tunneling through microclusters, and method therefor'
[patent_app_type] => 1
[patent_app_number] => 9/231429
[patent_app_country] => US
[patent_app_date] => 1999-01-14
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/239/06239450.pdf
[firstpage_image] =>[orig_patent_app_number] => 231429
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/231429 | Negative differential resistance device based on tunneling through microclusters, and method therefor | Jan 13, 1999 | Issued |
Array
(
[id] => 4275985
[patent_doc_number] => 06281120
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-28
[patent_title] => 'Temperature control structure for integrated circuit'
[patent_app_type] => 1
[patent_app_number] => 9/216282
[patent_app_country] => US
[patent_app_date] => 1998-12-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 3415
[patent_no_of_claims] => 2
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[patent_words_short_claim] => 174
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/281/06281120.pdf
[firstpage_image] =>[orig_patent_app_number] => 216282
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/216282 | Temperature control structure for integrated circuit | Dec 17, 1998 | Issued |
Array
(
[id] => 4419200
[patent_doc_number] => 06177289
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-23
[patent_title] => 'Lateral trench optical detectors'
[patent_app_type] => 1
[patent_app_number] => 9/205433
[patent_app_country] => US
[patent_app_date] => 1998-12-04
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/177/06177289.pdf
[firstpage_image] =>[orig_patent_app_number] => 205433
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/205433 | Lateral trench optical detectors | Dec 3, 1998 | Issued |
Array
(
[id] => 4343235
[patent_doc_number] => 06284552
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-09-04
[patent_title] => 'Method and apparatus for evaluating surface roughness of an epitaxial growth layer, method and apparatus for measuring reflectance of an epitaxial growth layer, and manufacturing method of semiconductor device'
[patent_app_type] => 1
[patent_app_number] => 9/190461
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[patent_app_date] => 1998-11-13
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/284/06284552.pdf
[firstpage_image] =>[orig_patent_app_number] => 190461
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/190461 | Method and apparatus for evaluating surface roughness of an epitaxial growth layer, method and apparatus for measuring reflectance of an epitaxial growth layer, and manufacturing method of semiconductor device | Nov 12, 1998 | Issued |
Array
(
[id] => 1549577
[patent_doc_number] => 06346428
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-02-12
[patent_title] => 'Method and apparatus for minimizing semiconductor wafer arcing during semiconductor wafer processing'
[patent_app_type] => B1
[patent_app_number] => 09/135210
[patent_app_country] => US
[patent_app_date] => 1998-08-17
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[pdf_file] => patents/06/346/06346428.pdf
[firstpage_image] =>[orig_patent_app_number] => 09135210
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/135210 | Method and apparatus for minimizing semiconductor wafer arcing during semiconductor wafer processing | Aug 16, 1998 | Issued |