Olivia T. Luk

Array ( [id] => 1415919 [patent_doc_number] => 06509198 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-01-21 [patent_title] => 'Method of power IC inspection' [patent_app_type] => B2 [patent_app_number] => 09/969601 [patent_app_country] => US [patent_app_date] => 2001-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2167 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/509/06509198.pdf [firstpage_image] =>[orig_patent_app_number] => 09969601 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6209451 [patent_doc_number] => 20020072247 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-13 [patent_title] => 'Method of N2O growth of an oxide layer on a silicon carbide layer' [patent_app_type] => new [patent_app_number] => 09/968391 [patent_app_country] => US [patent_app_date] => 2001-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6389 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20020072247.pdf [firstpage_image] =>[orig_patent_app_number] => 09968391 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1574851 [patent_doc_number] => 06468921 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-22 [patent_title] => 'Thin-film forming method' [patent_app_type] => B1 [patent_app_number] => 09/967582 [patent_app_country] => US [patent_app_date] => 2001-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 1404 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/468/06468921.pdf [firstpage_image] =>[orig_patent_app_number] => 09967582 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6407313 [patent_doc_number] => 20020182760 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-05 [patent_title] => 'Methods and systems for determining a presence of macro defects and overlay of a specimen' [patent_app_type] => new [patent_app_number] => 09/956851 [patent_app_country] => US [patent_app_date] => 2001-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 24 [patent_no_of_words] => 94490 [patent_no_of_claims] => 6630 [patent_no_of_ind_claims] => 176 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0182/20020182760.pdf [firstpage_image] =>[orig_patent_app_number] => 09956851 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1104693 [patent_doc_number] => 06812045 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-02 [patent_title] => 'Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation' [patent_app_type] => B1 [patent_app_number] => 09/956842 [patent_app_country] => US [patent_app_date] => 2001-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 29 [patent_no_of_words] => 93809 [patent_no_of_claims] => 52 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/812/06812045.pdf [firstpage_image] =>[orig_patent_app_number] => 09956842 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1071866 [patent_doc_number] => 06841450 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-01-11 [patent_title] => 'Annealed wafer manufacturing method and annealed wafer' [patent_app_type] => utility [patent_app_number] => 10/130431 [patent_app_country] => US [patent_app_date] => 2001-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4276 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/841/06841450.pdf [firstpage_image] =>[orig_patent_app_number] => 10130431 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1165717 [patent_doc_number] => 06756318 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-29 [patent_title] => 'Nanolayer thick film processing system and method' [patent_app_type] => B2 [patent_app_number] => 09/954244 [patent_app_country] => US [patent_app_date] => 2001-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 19 [patent_no_of_words] => 8593 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/756/06756318.pdf [firstpage_image] =>[orig_patent_app_number] => 09954244 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1358163 [patent_doc_number] => 06573113 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-03 [patent_title] => 'Integrated circuit having dedicated probe pads for use in testing densely patterned bonding pads' [patent_app_type] => B1 [patent_app_number] => 09/946033 [patent_app_country] => US [patent_app_date] => 2001-09-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 3935 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 64 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/573/06573113.pdf [firstpage_image] =>[orig_patent_app_number] => 09946033 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6750491 [patent_doc_number] => 20030045011 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-06 [patent_title] => 'System and method for detecting flow in a mass flow controller' [patent_app_type] => new [patent_app_number] => 09/945161 [patent_app_country] => US [patent_app_date] => 2001-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6617 [patent_no_of_claims] => 55 [patent_no_of_ind_claims] => 16 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0045/20030045011.pdf [firstpage_image] =>[orig_patent_app_number] => 09945161 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1517123 [patent_doc_number] => 06500676 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-31 [patent_title] => 'Methods and apparatus for depositing magnetic films' [patent_app_type] => B1 [patent_app_number] => 09/933361 [patent_app_country] => US [patent_app_date] => 2001-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5385 [patent_no_of_claims] => 47 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/500/06500676.pdf [firstpage_image] =>[orig_patent_app_number] => 09933361 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6836640 [patent_doc_number] => 20030033980 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-20 [patent_title] => 'CVD apparatuses and methods of forming a layer over a semiconductor substrate' [patent_app_type] => new [patent_app_number] => 09/932711 [patent_app_country] => US [patent_app_date] => 2001-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3008 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20030033980.pdf [firstpage_image] =>[orig_patent_app_number] => 09932711 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7643895 [patent_doc_number] => 06429143 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-08-06 [patent_title] => 'Pattern formation method' [patent_app_type] => B1 [patent_app_number] => 09/924092 [patent_app_country] => US [patent_app_date] => 2001-08-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 13 [patent_no_of_words] => 1475 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 9 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/429/06429143.pdf [firstpage_image] =>[orig_patent_app_number] => 09924092 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1477943 [patent_doc_number] => 06451624 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-17 [patent_title] => 'Stackable semiconductor package having conductive layer and insulating layers and method of fabrication' [patent_app_type] => B1 [patent_app_number] => 09/923144 [patent_app_country] => US [patent_app_date] => 2001-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 25 [patent_no_of_words] => 6168 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/451/06451624.pdf [firstpage_image] =>[orig_patent_app_number] => 09923144 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1414938 [patent_doc_number] => 06521541 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-02-18 [patent_title] => 'Surface preparation of substances for continuous convective assembly of fine particles' [patent_app_type] => B2 [patent_app_number] => 09/922519 [patent_app_country] => US [patent_app_date] => 2001-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 3041 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/521/06521541.pdf [firstpage_image] =>[orig_patent_app_number] => 09922519 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1485060 [patent_doc_number] => 06365423 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-04-02 [patent_title] => 'Method of inspecting a depth of an opening of a dielectric material layer' [patent_app_type] => B1 [patent_app_number] => 09/921121 [patent_app_country] => US [patent_app_date] => 2001-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 4377 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/365/06365423.pdf [firstpage_image] =>[orig_patent_app_number] => 09921121 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6745328 [patent_doc_number] => 20030022511 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-30 [patent_title] => 'PLASMA ASHING PROCESS' [patent_app_type] => new [patent_app_number] => 09/911682 [patent_app_country] => US [patent_app_date] => 2001-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3231 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0022/20030022511.pdf [firstpage_image] =>[orig_patent_app_number] => 09911682 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1466869 [patent_doc_number] => 06458607 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-01 [patent_title] => 'Using UV/VIS spectrophotometry to regulate developer solution during a development process' [patent_app_type] => B1 [patent_app_number] => 09/911151 [patent_app_country] => US [patent_app_date] => 2001-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 4451 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/458/06458607.pdf [firstpage_image] =>[orig_patent_app_number] => 09911151 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1469946 [patent_doc_number] => 06407010 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-06-18 [patent_title] => 'Single-substrate-heat-processing apparatus and method for semiconductor process' [patent_app_type] => B1 [patent_app_number] => 09/906712 [patent_app_country] => US [patent_app_date] => 2001-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 5272 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 244 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/407/06407010.pdf [firstpage_image] =>[orig_patent_app_number] => 09906712 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1458939 [patent_doc_number] => 06426305 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-30 [patent_title] => 'Patterned plasma nitridation for selective epi and silicide formation' [patent_app_type] => B1 [patent_app_number] => 09/898202 [patent_app_country] => US [patent_app_date] => 2001-07-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 4037 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/426/06426305.pdf [firstpage_image] =>[orig_patent_app_number] => 09898202 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1290924 [patent_doc_number] => 06630361 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-07 [patent_title] => 'Use of scatterometry for in-situ control of gaseous phase chemical trim process' [patent_app_type] => B1 [patent_app_number] => 09/894701 [patent_app_country] => US [patent_app_date] => 2001-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 17 [patent_no_of_words] => 11072 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/630/06630361.pdf [firstpage_image] =>[orig_patent_app_number] => 09894701 [rel_patent_id] =>[rel_patent_doc_number] =>)