Paresh H. Patel

Array ( [id] => 20220983 [patent_doc_number] => 20250283914 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-09-11 [patent_title] => PROBE CARD DEVICE HAVING HEAT-DISSIPATION CONFIGURATION AND GUIDE BOARD MODULE THEREOF [patent_app_type] => utility [patent_app_number] => 19/007566 [patent_app_country] => US [patent_app_date] => 2025-01-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 19007566 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20137233 [patent_doc_number] => 20250244277 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-31 [patent_title] => METHOD OF EVALUATING ELECTRODE ACTIVITY [patent_app_type] => utility [patent_app_number] => 18/991738 [patent_app_country] => US [patent_app_date] => 2024-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 1016 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18991738 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19877920 [patent_doc_number] => 20250110177 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-04-03 [patent_title] => CHARGE/DISCHARGE INSPECTION DEVICE AND CHARGE/DISCHARGE INSPECTION EQUIPMENT [patent_app_type] => utility [patent_app_number] => 18/979745 [patent_app_country] => US [patent_app_date] => 2024-12-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5351 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18979745 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19863753 [patent_doc_number] => 20250102539 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-27 [patent_title] => PROBE SYSTEM AND MACHINE APPARATUS THEREOF [patent_app_type] => utility [patent_app_number] => 18/973444 [patent_app_country] => US [patent_app_date] => 2024-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14094 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18973444 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20034415 [patent_doc_number] => 20250172637 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-05-29 [patent_title] => SIGNAL PROCESSING CIRCUIT AND SENSOR UNIT [patent_app_type] => utility [patent_app_number] => 18/954622 [patent_app_country] => US [patent_app_date] => 2024-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2257 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18954622 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20051355 [patent_doc_number] => 20250189577 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-06-12 [patent_title] => TEST HANDLER CONTROL METHOD [patent_app_type] => utility [patent_app_number] => 18/946105 [patent_app_country] => US [patent_app_date] => 2024-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2375 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18946105 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20924360 [patent_doc_number] => 12719431 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-08-25 [patent_title] => Coil sensor circuit and method for operating a coil sensor circuit [patent_app_type] => utility [patent_app_number] => 18/894255 [patent_app_country] => US [patent_app_date] => 2024-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2059 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18894255 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20616029 [patent_doc_number] => 20260086120 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-03-26 [patent_title] => METHOD OF TESTING SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/890785 [patent_app_country] => US [patent_app_date] => 2024-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18890785 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20967419 [patent_doc_number] => 20260266901 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-09-10 [patent_title] => MEASUREMENT DEVICE [patent_app_type] => utility [patent_app_number] => 18/848640 [patent_app_country] => US [patent_app_date] => 2022-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2900 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18848640 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19616563 [patent_doc_number] => 20240402243 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-05 [patent_title] => SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE [patent_app_type] => utility [patent_app_number] => 18/799671 [patent_app_country] => US [patent_app_date] => 2024-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20515 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18799671 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19632489 [patent_doc_number] => 20240410938 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-12 [patent_title] => SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD OF USE [patent_app_type] => utility [patent_app_number] => 18/795619 [patent_app_country] => US [patent_app_date] => 2024-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20513 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18795619 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19602508 [patent_doc_number] => 20240393388 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE [patent_app_type] => utility [patent_app_number] => 18/795602 [patent_app_country] => US [patent_app_date] => 2024-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20512 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18795602 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19602507 [patent_doc_number] => 20240393387 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-28 [patent_title] => SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE [patent_app_type] => utility [patent_app_number] => 18/793292 [patent_app_country] => US [patent_app_date] => 2024-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20514 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18793292 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19771362 [patent_doc_number] => 20250052788 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-13 [patent_title] => SYSTEMS, APPARATUSES, AND METHODS FOR ON CHIP DYNAMIC IR DROP OSCILLOSCOPE [patent_app_type] => utility [patent_app_number] => 18/788967 [patent_app_country] => US [patent_app_date] => 2024-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10508 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18788967 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20512342 [patent_doc_number] => 20260036443 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2026-02-05 [patent_title] => SYSTEMS, METHODS, AND TECHNIQUES FOR VARYING OUTPUT RESOLUTION OF A SENSOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/788327 [patent_app_country] => US [patent_app_date] => 2024-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 15389 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18788327 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20789535 [patent_doc_number] => 12663446 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-06-23 [patent_title] => Current sensor [patent_app_type] => utility [patent_app_number] => 18/767125 [patent_app_country] => US [patent_app_date] => 2024-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 3175 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 273 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18767125 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19543993 [patent_doc_number] => 20240361029 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-31 [patent_title] => DAMPER INSPECTION SYSTEMS AND METHODS [patent_app_type] => utility [patent_app_number] => 18/767807 [patent_app_country] => US [patent_app_date] => 2024-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10536 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18767807 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19747129 [patent_doc_number] => 20250035694 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-30 [patent_title] => APPARATUS AND METHOD TO DETECT AND LOCATE A FAULT IN A SHIELDED CONDUCTOR [patent_app_type] => utility [patent_app_number] => 18/755313 [patent_app_country] => US [patent_app_date] => 2024-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11052 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18755313 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19513446 [patent_doc_number] => 20240345132 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING [patent_app_type] => utility [patent_app_number] => 18/748876 [patent_app_country] => US [patent_app_date] => 2024-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6792 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 305 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18748876 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20280840 [patent_doc_number] => 20250306082 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-10-02 [patent_title] => TESTING JIG AND METHOD FOR TESTING AT LEAST ONE ASSEMBLY INCLUDING CIRCUIT BOARD AND LASERS THEREON [patent_app_type] => utility [patent_app_number] => 18/740103 [patent_app_country] => US [patent_app_date] => 2024-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 0 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18740103 [rel_patent_id] =>[rel_patent_doc_number] =>)